Yanxia Xie, Ph.D.

Affiliations: 
2002 University of California, Berkeley, Berkeley, CA, United States 
Area:
Geology
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"Yanxia Xie"

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H.-R Wenk grad student 2002 UC Berkeley
 (Quantitative texture analysis using time -of -flight neutron diffraction and electron back scatter diffraction.)
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Publications

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Xie Y, Lutterotti L, Wenk HR, et al. (2004) Texture analysis of ancient coins with TOF neutron diffraction Journal of Materials Science. 39: 3329-3337
Xie Y, Wenk H, Matthies S. (2003) Plagioclase preferred orientation by TOF neutron diffraction and SEM-EBSD Tectonophysics. 370: 269-286
Wenk H, Cont L, Xie Y, et al. (2001) Rietveld texture analysis of Dabie Shan eclogite from TOF neutron diffraction spectra Journal of Applied Crystallography. 34: 442-453
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