Yanxia Xie, Ph.D.
Affiliations: | 2002 | University of California, Berkeley, Berkeley, CA, United States |
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"Yanxia Xie"Parents
Sign in to add mentorH.-R Wenk | grad student | 2002 | UC Berkeley | |
(Quantitative texture analysis using time -of -flight neutron diffraction and electron back scatter diffraction.) |
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Publications
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Xie Y, Lutterotti L, Wenk HR, et al. (2004) Texture analysis of ancient coins with TOF neutron diffraction Journal of Materials Science. 39: 3329-3337 |
Xie Y, Wenk H, Matthies S. (2003) Plagioclase preferred orientation by TOF neutron diffraction and SEM-EBSD Tectonophysics. 370: 269-286 |
Wenk H, Cont L, Xie Y, et al. (2001) Rietveld texture analysis of Dabie Shan eclogite from TOF neutron diffraction spectra Journal of Applied Crystallography. 34: 442-453 |