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Eric Lifshin

Affiliations: 
State University of New York, Albany, Albany, NY, United States 
Area:
Materials Science Engineering
Website:
https://sunypoly.edu/faculty-and-staff/eric-lifshin.html
Google:
"Eric Lifshin"
Bio:

https://books.google.com/books?id=4a7dNwAACAAJ

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Michael S. Hatzistergos grad student 2007 SUNY Albany

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Publications

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Zotta MD, Nevins MC, Hailstone RK, et al. (2018) The Determination and Application of the Point Spread Function in the Scanning Electron Microscope. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 24: 396-405
Lifshin E, Kandel YP, Moore RL. (2014) Improving scanning electron microscope resolution for near planar samples through the use of image restoration. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20: 78-89
Rizzolo M, Novak S, Lifshin E, et al. (2012) Correlating surface segregation and microstructural evolution of electrochemically deposited copper Applied Physics Letters. 101
Horny P, Lifshin E, Campbell H, et al. (2010) Development of a new quantitative X-ray microanalysis method for electron microscopy. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 16: 821-30
Demers H, Lifshin E. (2009) Secondary Electron Grain Contrast Induced by Incident Electrons in a Electroplated Copper Thin Film Microscopy and Microanalysis. 15: 672-673
Demers H, Emekli U, Lifshin E, et al. (2009) Characterization of electrodeposited copper films with time-of-flight SIMS Microscopy and Microanalysis. 15: 492-493
Gauvin R, Lifshin E, Demers H, et al. (2006) Win X-ray: a new Monte Carlo program that computes X-ray spectra obtained with a scanning electron microscope. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 12: 49-64
Lifshin E. (2006) Electron Microprobe Analysis Materials Science and Technology. 2563-2569
Lifshin E, Thiel B, Gauvin R. (2005) The Validation of Monte Carlo Methods for Scanning Electron Microscopy and Electron Microprobe Analysis Microscopy and Microanalysis. 11: 1346-1347
Horny P, Gauvin R, Lifshin E, et al. (2004) Theoretical Effect of Thin Films on the Detectability of Elements in the Substrate by X-Ray Microanalysis Microscopy and Microanalysis. 10: 100-101
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