Darren Dale, Ph.D.

Affiliations: 
2006 Cornell University, Ithaca, NY, United States 
Area:
Materials Science Engineering, Condensed Matter Physics
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"Darren Dale"

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Yuri Suzuki grad student 2006 Cornell
 (In-situ X-ray diffraction studies of pulsed laser deposition: Growth of epitaxial manganite thin films.)
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Publications

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Bucsek AN, Dale D, Ko JYP, et al. (2018) Measuring stress-induced martensite microstructures using far-field high-energy diffraction microscopy. Acta Crystallographica. Section a, Foundations and Advances. 74: 425-446
Pagan DC, Bernier JV, Dale D, et al. (2018) Measuring Ti-7Al slip system strengths at elevated temperature using high-energy X-ray diffraction Scripta Materialia. 142: 96-100
McCluskey PJ, Xiao K, Gregoire JM, et al. (2015) Application of in-situ nano-scanning calorimetry and X-ray diffraction to characterize Ni-Ti-Hf high-temperature shape memory alloys Thermochimica Acta. 603: 53-62
Gregoire JM, Xiao K, McCluskey PJ, et al. (2013) In-situ X-ray diffraction combined with scanning AC nanocalorimetry applied to a Fe0.84Ni0.16 thin-film sample. Applied Physics Letters. 102: 201902
Xiao K, Gregoire JM, McCluskey PJ, et al. (2013) Scanning AC nanocalorimetry combined with in-situ x-ray diffraction Journal of Applied Physics. 113
Gregoire JM, McCluskey PJ, Dale D, et al. (2012) Combining combinatorial nanocalorimetry and X-ray diffraction techniques to study the effects of composition and quench rate on Au-Cu-Si metallic glasses Scripta Materialia. 66: 178-181
Thorne RE, Geil EC, Hudson K, et al. (2011) X-ray fluorescence imaging of ancient artifacts Acta Crystallographica Section A. 67: 762-762
Cultrera L, Maxson J, Bazarov I, et al. (2011) Photocathode behavior during high current running in the Cornell energy recovery linac photoinjector Physical Review Special Topics - Accelerators and Beams. 14
Dale D, Gruner SM, Brock J, et al. (2011) Science at the Hard X-ray Diffraction Limit (XDL2011), Part 1 Synchrotron Radiation News. 24: 4-11
Gregoire JM, Dale D, Kazimirov A, et al. (2010) Cosputtered composition-spread reproducibility established by high-throughput x-ray fluorescence. Journal of Vacuum Science & Technology. a, Vacuum, Surfaces, and Films : An Official Journal of the American Vacuum Society. 28: 1279-1280
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