Yongjune Kim, Ph.D.
Affiliations: | 2020-2022 | Electrical Engineering and Computer Science | Daegu Gyeongbuk Institute of Science and Technology (DGIST), Daegu Metropolitan City, Republic of Korea |
2022- | Electrical Engineering | Pohang University of Science and Technology (POSTECH), Pohang, Gyeongsangbuk-do, South Korea |
Area:
coding theory, information theory, machine learningWebsite:
https://iil.postech.ac.krGoogle:
"Yongjune Kim"Parents
Sign in to add mentorVijayakumar Bhagavatula | grad student | 2011-2016 | Carnegie Mellon (Computer Science Tree) |
Naresh R. Shanbhag | post-doc | 2016-2018 | UIUC |
Lav R. Varshney | post-doc | 2016-2018 | UIUC (Neurotree) |
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Publications
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Kim Y, Raman RK, Kim Y, et al. (2019) Efficient Local Secret Sharing for Distributed Blockchain Systems Ieee Communications Letters. 23: 282-285 |
Sakr C, Kim Y, Shanbhag N. (2019) Minimum Precision Requirements of General Margin Hyperplane Classifiers Ieee Journal On Emerging and Selected Topics in Circuits and Systems. 9: 253-266 |
Kim Y, Kang M, Varshney LR, et al. (2018) Generalized Water-Filling for Source-Aware Energy-Efficient SRAMs Ieee Transactions On Communications. 66: 4826-4841 |
Kim Y, Kumar BVKV. (2018) Redundancy allocation in finite-length nested codes for nonvolatile memories Journal of Communications and Networks. 20: 354-365 |
Kim Y, Sharma AA, Mateescu R, et al. (2016) Locally Rewritable Codes for Resistive Memories Ieee Journal On Selected Areas in Communications. 34: 2470-2485 |
Kim Y, Vijaya Kumar BVK, Cho KL, et al. (2013) Modulation coding for flash memories 2013 International Conference On Computing, Networking and Communications, Icnc 2013. 961-967 |
Kim Y, Kim J, Kong JJ, et al. (2012) Verify level control criteria for multi-level cell flash memories and their applications Coding and Signal Processing for Non-Volatile Memories Eurasip Journal On Advances in Signal Processing. 2012 |
Kim Y, Kim H, Rim M, et al. (2009) On the Optimal Cyclic Delay Value in Cyclic Delay Diversity Ieee Transactions On Broadcasting. 55: 790-795 |