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John C. Bean

Affiliations: 
1997 Materials Science Research Bell Laboratories, Murray Hill, NJ, United States 
 1997- Engineering & Applied Science University of Virginia, Charlottesville, VA 
Area:
Materials Science
Website:
https://wecanfigurethisout.org/ABOUT/About.php#:~:text=I%20went%20south,in%20Applied%20Physics
Google:
"John Condon Bean" OR "John C. Bean"
Bio:

https://books.google.com/books?id=6OZGAAAAIAAJ

Cross-listing: Materials Tree

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Parents

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James F. Gibbons grad student 1976 Stanford
 (Ion Implantation in Cadmium Telluride)

Children

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Thomas Vandervelde grad student 2004 UVA

Collaborators

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BETA: Related publications

Publications

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Stach EA, Hull R, Bean JC, et al. (1998) In Situ Studies of the Interaction of Dislocations with Point Defects during Annealing of Ion Implanted Si/SiGe/Si (001) Heterostructures. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 4: 294-307
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