Year |
Citation |
Score |
2023 |
Mahoney CM, Fahey AJ, Adib K, Yongsunthon R, Zhang MH. O2 vs. Ar Gas Cluster Ion Beam Sources for ToF-SIMS Depth Profiling of Thick Polymer and Metal Film Samples. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 751-752. PMID 37613731 DOI: 10.1093/micmic/ozad067.371 |
0.35 |
|
2016 |
Mahoney CM, Kelly RT, Alexander LM, Newburn M, Bader S, Ewing RG, Atkinson DA, Beagley N, Fahey AJ. Bayesian Integration and Classification of Composition C-4 Plastic Explosives Based on Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). Analytical Chemistry. PMID 26913559 DOI: 10.1021/acs.analchem.5b04151 |
0.322 |
|
2013 |
Mahoney C, Atkinson D, Ewing R. Forensics Applications of Secondary Ion Mass Spectrometry Microscopy and Microanalysis. 19: 678-679. DOI: 10.1017/S1431927613005382 |
0.342 |
|
2013 |
Wucher A, Fisher GL, Mahoney CM. Three-Dimensional Imaging with Cluster Ion Beams Cluster Secondary Ion Mass Spectrometry: Principles and Applications. 207-246. DOI: 10.1002/9781118589335.ch6 |
0.319 |
|
2013 |
Mahoney CM, Wucher A. Molecular Depth Profiling with Cluster Ion Beams Cluster Secondary Ion Mass Spectrometry: Principles and Applications. 117-205. DOI: 10.1002/9781118589335.ch5 |
0.334 |
|
2013 |
Mahoney CM. Surface Analysis of Organic Materials with Polyatomic Primary Ion Sources Cluster Secondary Ion Mass Spectrometry: Principles and Applications. 77-116. DOI: 10.1002/9781118589335.ch4 |
0.308 |
|
2013 |
Mahoney CM, Gillen G. An Introduction to Cluster Secondary Ion Mass Spectrometry (Cluster SIMS) Cluster Secondary Ion Mass Spectrometry: Principles and Applications. 1-11. DOI: 10.1002/9781118589335.ch1 |
0.315 |
|
2013 |
Mahoney CM. Cluster Secondary Ion Mass Spectrometry: Principles and Applications Cluster Secondary Ion Mass Spectrometry: Principles and Applications. DOI: 10.1002/9781118589335 |
0.361 |
|
2011 |
Mahoney CM, Fahey AJ, Belu AM, Gardella Jr. JA. Challenges of 3-D characterization of polymer-based drug delivery devices with cluster Secondary Ion Mass Spectrometry Journal of Surface Analysis. 17: 299-304. DOI: 10.1384/Jsa.17.299 |
0.466 |
|
2010 |
Bailey MM, Mahoney CM, Dempah KE, Davis JM, Becker ML, Khondee S, Munson EJ, Berkland C. Fluorinated copolymer nanoparticles for multimodal imaging applications. Macromolecular Rapid Communications. 31: 87-92. PMID 21590842 DOI: 10.1002/Marc.200900505 |
0.33 |
|
2010 |
Mahoney CM, Fahey AJ, Steffens KL, Benner BA, Lareau RT. Characterization of composition C4 explosives using time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy. Analytical Chemistry. 82: 7237-48. PMID 20698494 DOI: 10.1021/Ac101116R |
0.383 |
|
2010 |
McDermott MK, Saylor DM, Casas R, Dair BJ, Guo J, Kim CS, Mahoney CM, Ng K, Pollack SK, Patwardhan DV, Sweigart DA, Thomas T, Toy J, Williams CM, Witkowski CN. Microstructure and elution of tetracycline from block copolymer coatings. Journal of Pharmaceutical Sciences. 99: 2777-85. PMID 20091828 DOI: 10.1002/Jps.22050 |
0.406 |
|
2010 |
Mahoney CM. Cluster secondary ion mass spectrometry of polymers and related materials. Mass Spectrometry Reviews. 29: 247-93. PMID 19449334 DOI: 10.1002/Mas.20233 |
0.481 |
|
2010 |
Mahoney CM, Kushmerick JG, Steffens KL. Investigation of damage mechanisms in PMMA during ToF-SIMS depth profiling with 5 and 8 keV SF5 + primary ions Journal of Physical Chemistry C. 114: 14510-14519. DOI: 10.1021/Jp103938Y |
0.533 |
|
2010 |
Mahoney CM. Cluster SIMS depth profiling of stereo-specific PMMA thin films on Si Surface and Interface Analysis. 42: 1393-1401. DOI: 10.1002/Sia.3115 |
0.406 |
|
2009 |
Fisher GL, Belu AM, Mahoney CM, Wormuth K, Sanada N. Three-dimensional time-of-flight secondary ion mass spectrometry imaging of a pharmaceutical in a coronary stent coating as a function of elution time. Analytical Chemistry. 81: 9930-40. PMID 19919043 DOI: 10.1021/Ac901587K |
0.498 |
|
2009 |
Yu J, Mahoney CM, Fahey AJ, Hicks WL, Hard R, Bright FV, Gardella JA. Phase separation at the surface of poly(ethylene oxide)-containing biodegradable poly(L-lactic acid) blends. Langmuir : the Acs Journal of Surfaces and Colloids. 25: 11467-71. PMID 19715326 DOI: 10.1021/La901239V |
0.388 |
|
2008 |
Belu A, Mahoney C, Wormuth K. Chemical imaging of drug eluting coatings: Combining surface analysis and confocal Raman microscopy Journal of Controlled Release. 126: 111-121. PMID 18201791 DOI: 10.1016/J.Jconrel.2007.11.015 |
0.393 |
|
2008 |
Mahoney CM, Fahey AJ, Belu AM. Three-dimensional compositional analysis of drug eluting stent coatings using cluster secondary ion mass spectrometry. Analytical Chemistry. 80: 624-32. PMID 18179243 DOI: 10.1021/Ac701644J |
0.498 |
|
2008 |
Vogel BM, DeLongchamp DM, Mahoney CM, Lucas LA, Fischer DA, Lin EK. Interfacial modification of silica surfaces through γ-isocyanatopropyl triethoxy silane-amine coupling reactions Applied Surface Science. 254: 1789-1796. DOI: 10.1016/J.Apsusc.2007.07.170 |
0.325 |
|
2007 |
Gillen G, Mahoney C, Wight S, Lareau R. Characterization of high explosive particles using cluster secondary ion mass spectrometry. Rapid Communications in Mass Spectrometry : Rcm. 20: 1949-53. PMID 16718673 DOI: 10.1002/rcm.2531 |
0.408 |
|
2007 |
Mahoney CM, Fahey AJ, Gillen G, Xu C, Batteas JD. Temperature-controlled depth profiling of poly(methyl methacrylate) using cluster secondary ion mass spectrometry. 2. Investigation of sputter-induced topography, chemical damage, and depolymerization effects Analytical Chemistry. 79: 837-845. DOI: 10.1021/Ac061357+ |
0.467 |
|
2007 |
Mahoney CM, Fahey AJ, Gillen G. Temperature-controlled depth profiling of poly(methyl methacrylate) using cluster secondary ion mass spectrometry. 1. Investigation of depth profile characteristics Analytical Chemistry. 79: 828-836. DOI: 10.1021/Ac061356H |
0.425 |
|
2006 |
Holbrook RD, Wagner MS, Mahoney CM, Wight SA. Investigating activated sludge flocs using microanalytical techniques: demonstration of environmental scanning electron microscopy and time-of-flight secondary ion mass spectrometry for wastewater applications. Water Environment Research : a Research Publication of the Water Environment Federation. 78: 381-91. PMID 16749306 DOI: 10.2175/106143005X90092 |
0.447 |
|
2006 |
Bailey LO, Becker ML, Stephens JS, Gallant ND, Mahoney CM, Washburn NR, Rege A, Kohn J, Amis EJ. Cellular response to phase-separated blends of tyrosine-derived polycarbonates. Journal of Biomedical Materials Research. Part A. 76: 491-502. PMID 16278865 DOI: 10.1002/Jbm.A.30527 |
0.368 |
|
2006 |
Mahoney CM, Gillen G, Fahey AJ. Characterization of gunpowder samples using time-of-flight secondary ion mass spectrometry (TOF-SIMS). Forensic Science International. 158: 39-51. PMID 16005590 DOI: 10.1016/J.Forsciint.2005.02.036 |
0.396 |
|
2006 |
Fahey AJ, Gillen G, Chi P, Mahoney CM. Performance of a C60 + ion source on a dynamic SIMS instrument Applied Surface Science. 252: 7312-7314. DOI: 10.1016/J.Apsusc.2006.02.263 |
0.415 |
|
2006 |
Mahoney CM, Yu J, Fahey A, Gardella JA. SIMS depth profiling of polymer blends with protein based drugs Applied Surface Science. 252: 6609-6614. DOI: 10.1016/J.Apsusc.2006.02.251 |
0.467 |
|
2006 |
Gillen G, Fahey A, Wagner M, Mahoney C. 3D molecular imaging SIMS Applied Surface Science. 252: 6537-6541. DOI: 10.1016/J.Apsusc.2006.02.235 |
0.478 |
|
2006 |
Mahoney CM, Patwardhan DV, Ken McDermott M. Characterization of drug-eluting stent (DES) materials with cluster secondary ion mass spectrometry (SIMS) Applied Surface Science. 252: 6554-6557. DOI: 10.1016/J.Apsusc.2006.02.107 |
0.53 |
|
2006 |
Mahoney CM, Fahey AJ, Gillen G, Xu C, Batteas JD. Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS) Applied Surface Science. 252: 6502-6505. DOI: 10.1016/J.Apsusc.2006.02.078 |
0.479 |
|
2006 |
Gillen G, Mahoney C, Wight S, Lareau R. Characterization of high explosive particles using cluster secondary ion mass spectrometry Rapid Communications in Mass Spectrometry. 20: 1949-1953. DOI: 10.1002/Rcm.2531 |
0.476 |
|
2005 |
Mahoney CM, Yu J, Gardella JA. Depth profiling of poly(L-lactic acid)/triblock copolymer blends with time-of-flight secondary ion mass spectrometry. Analytical Chemistry. 77: 3570-8. PMID 15924391 DOI: 10.1021/Ac048274I |
0.544 |
|
2004 |
Mahoney CM, Roberson SV, Gillen G. Depth profiling of 4-acetamindophenol-doped poly(lactic acid) films using cluster secondary ion mass spectrometry. Analytical Chemistry. 76: 3199-207. PMID 15167802 DOI: 10.1021/Ac035532N |
0.537 |
|
2004 |
Gillen G, Zeissler C, Mahoney C, Lindstrom A, Fletcher R, Chi P, Verkouteren J, Bright D, Lareau RT, Boldman M. Automated analysis of organic particles using cluster SIMS Applied Surface Science. 231: 186-190. DOI: 10.1016/J.Apsusc.2004.03.114 |
0.488 |
|
2004 |
Mahoney CM, Roberson S, Gillen G. Dynamic SIMS utilizing SF5 + polyatomic primary ion beams for drug delivery applications Applied Surface Science. 231: 174-178. DOI: 10.1016/J.Apsusc.2004.03.109 |
0.503 |
|
2004 |
Gardella JA, Mahoney CM. Determination of oligomeric chain length distributions at surfaces using ToF-SIMS: Segregation effects and polymer properties Applied Surface Science. 231: 283-288. DOI: 10.1016/J.Apsusc.2004.03.061 |
0.385 |
|
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