Year |
Citation |
Score |
2011 |
Matocha K, Tilak V. Understanding the inversion-layer properties of the 4H-SiC/SiO2 interface Materials Science Forum. 679: 318-325. DOI: 10.4028/Www.Scientific.Net/Msf.679-680.318 |
0.311 |
|
2009 |
Tilak V, Matocha K. Comment on A. Agarwal and S. Haney, "some critical materials and processing issues in SiC power devices" [J. Electron. Mater. 37, 646 (2008)] Journal of Electronic Materials. 38: 618-620. DOI: 10.1007/s11664-009-0661-2 |
0.317 |
|
2006 |
Tucker JB, Matocha K, Tilak V, Balaji S, Arthur S, Rao R, Beaupre R. 1500V SiC DIMOSFET development Ecs Transactions. 3: 367-372. DOI: 10.1149/1.2357226 |
0.341 |
|
2006 |
Tilak V, Vertiatchikh A, Jiang J, Reeves N, Dasgupta S. Piezoresistive and piezoelectric effects in GaN Physica Status Solidi (C) Current Topics in Solid State Physics. 3: 2307-2311. DOI: 10.1002/Pssc.200565217 |
0.687 |
|
2005 |
Danylyuk SV, Vitusevich SA, Kaper V, Tilak V, Klein N, Eastman LF, Shealy JR. Phase noise study of AlGaN/GaN HEMT X-band oscillator Physica Status Solidi C: Conferences. 2: 2615-2618. DOI: 10.1002/Pssc.200461457 |
0.702 |
|
2003 |
Lee S, Webb KJ, Tilak V, Eastman LF. Intrinsic noise equivalent-circuit parameters for AlGaN/GaN HEMTs Ieee Transactions On Microwave Theory and Techniques. 51: 1567-1577. DOI: 10.1109/Tmtt.2003.810140 |
0.528 |
|
2003 |
Green BM, Tilak V, Kaper VS, Smart JA, Shealy JR, Eastman LF. Microwave power limits of AlGaN/GaN HEMTs under pulsed-bias conditions Ieee Transactions On Microwave Theory and Techniques. 51: 618-623. DOI: 10.1109/Tmtt.2002.807680 |
0.795 |
|
2003 |
Sahoo DK, Lal RK, Kim H, Tilak V, Eastman LF. High-field effects in silicon nitride passivated GaN MODFETs Ieee Transactions On Electron Devices. 50: 1163-1170. DOI: 10.1109/Ted.2003.813221 |
0.636 |
|
2003 |
Koley G, Tilak V, Eastman LF, Spencer MG. Slow transients observed in AlGaN/GaN HFETs: Effects of SiNx passivation and UV illumination Ieee Transactions On Electron Devices. 50: 886-893. DOI: 10.1109/Ted.2003.812489 |
0.66 |
|
2003 |
Kim H, Thompson RM, Tilak V, Prunty TR, Shealy JR, Eastman LF. Effects of SiN passivation and high-electric field on AlGaN-GaN HFET degradation Ieee Electron Device Letters. 24: 421-423. DOI: 10.1109/Led.2003.813375 |
0.748 |
|
2003 |
Kaper VS, Tilak V, Kim H, Vertiatchikh AV, Thompson RM, Prunty TR, Eastman LF, Shealy JR. High-Power Monolithic AlGaN/GaN HEMT Oscillator Ieee Journal of Solid-State Circuits. 38: 1457-1461. DOI: 10.1109/Jssc.2003.815934 |
0.806 |
|
2003 |
Matulionis A, Liberis J, Matulionienė I, Ramonas M, Eastman LF, Shealy JR, Tilak V, Vertiatchikh A. Hot-phonon temperature and lifetime in a biased Al x Ga 1 − x N / G a N channel estimated from noise analysis Physical Review B. 68: 35338. DOI: 10.1103/Physrevb.68.035338 |
0.794 |
|
2003 |
Vitusevich SA, Danylyuk SV, Klein N, Petrychuk MV, Avksentyev AY, Sokolov VN, Kochelap VA, Belyaev AE, Tilak V, Smart J, Vertiatchikh A, Eastman LF. Separation of hot-electron and self-heating effects in two-dimensional AlGaN/GaN-based conducting channels Applied Physics Letters. 82: 748-750. DOI: 10.1063/1.1542928 |
0.766 |
|
2003 |
Kim H, Vertiatchikh A, Thompson RM, Tilak V, Prunty TR, Shealy JR, Eastman LF. Hot electron induced degradation of undoped AlGaN/GaN HFETs Microelectronics Reliability. 43: 823-827. DOI: 10.1016/S0026-2714(03)00066-0 |
0.802 |
|
2003 |
Danylyuk SV, Vitusevich SA, Podor B, Belyaev AE, Avksentyev AY, Tilak V, Smart J, Vertiatchikh A, Eastman LF. The investigation of properties of electron transport in AlGaN/GaN heterostructures Microelectronics Journal. 34: 575-577. DOI: 10.1016/S0026-2692(03)00052-1 |
0.764 |
|
2003 |
Zhang AP, Rowland LB, Kaminsky EB, Tilak V, Grande JC, Teetsov J, Vertiatchikh A, Eastman LF. Correlation of device performance and defects in AlGaN/GaN high-electron mobility transistors Journal of Electronic Materials. 32: 388-394. DOI: 10.1007/S11664-003-0163-6 |
0.779 |
|
2003 |
Ambacher O, Eickhoff M, Link A, Hermann M, Stutzmann M, Bernardini F, Fiorentini V, Smorchkova Y, Speck J, Mishra U, Schaff W, Tilak V, Eastman LF. Electronics and sensors based on pyroelectric AlGaN/GaN heterostructures: Part A: Polarization and pyroelectronics Physica Status Solidi C: Conferences. 1878-1907. DOI: 10.1002/Pssc.200303138 |
0.669 |
|
2003 |
Vitusevich SA, Klein N, Belyaev AE, Danylyuk SV, Petrychuk MV, Konakova RV, Kurakin AM, Rengevich AE, Avksentyev AY, Danilchenko BA, Tilak V, Smart J, Vertiatchikh A, Eastman LF. Effects of γ-irradiation on AlGaN/GaN-based HEMTs Physica Status Solidi (a) Applied Research. 195: 101-105. DOI: 10.1002/Pssa.200306264 |
0.77 |
|
2003 |
Matulionis A, Liberis J, Matulioniene I, Ramonas M, Eastman LF, Shealy JR, Tilak V, Vertiatchikh A. Hot-phonon temperature and lifetime in a biased AlxGa 1-xN/GaN channel estimated from noise analysis Physical Review B - Condensed Matter and Materials Physics. 68: 353381-353387. |
0.762 |
|
2003 |
Zhang AP, Rowland LB, Kaminsky EB, Kretchmer JW, Tilak V, Alien AF, Edward BJ. Performance of AlGaN/GaN HEMTs for 2.8 GHz and 10 GHz power amplifier applications Ieee Mtt-S International Microwave Symposium Digest. 1: 251-254. |
0.351 |
|
2003 |
Tilak V, Kaper V, Thompson R, Prunty T, Kim H, Smart J, Shealy JR, Eastman L. Correlation of pulsed IV measurements and high power performance of AlGaN/GaN HEMTs Institute of Physics Conference Series. 174: 287-290. |
0.587 |
|
2003 |
Eastman LF, Tilak V, Thompson R, Green B, Kaper V, Prunty T, Shealy R, Smart J, Kim H. High power AlGaN/GaN HEMT's Institute of Physics Conference Series. 174: 227-230. |
0.677 |
|
2003 |
Vitusevich SA, Petrychuk MV, Klein N, Danylyuk SV, Belyaev AE, Konakova RV, Avksentyev AY, Kurakin AM, Lytvyn PM, Danilchenko BA, Tilak V, Smart J, Vertiatchikh A, Eastman LF. Barrier material improvement in AlGaN/GaN microwave transistors under gamma irradiation treatment Materials Research Society Symposium - Proceedings. 764: 183-188. |
0.718 |
|
2002 |
Kim H, Vertiatchikh A, Tilak V, Thompson RM, Prunty T, Shealy JR, Eastman LF. Hot electron effects on undoped AlGaN/GaN high electron mobility transistors Gaas Reliability Workshop, Proceedings. 2002: 5-6. DOI: 10.1109/GAAS.2002.1167856 |
0.8 |
|
2002 |
Kaper V, Tilak V, Green B, Thompson R, Prunty T, Eastman LF, Shealy JR. Time-domain characterization of nonlinear operation of an AlGaN/GaN HEMT 61st Arftg Conference Digest Spring 2003: Measurement Accuracy, Arftg Spring 2003. 97-102. DOI: 10.1109/ARFTGS.2003.1216872 |
0.687 |
|
2002 |
Shealy JR, Kaper V, Tilak V, Prunty T, Smart JA, Green B, Eastman LF. An AlGaN/GaN high-electron-mobility transistor with an AlN sub-buffer layer Journal of Physics Condensed Matter. 14: 3499-3509. DOI: 10.1088/0953-8984/14/13/308 |
0.81 |
|
2002 |
Balkan N, Arikan MC, Gokden S, Tilak V, Schaff B, Shealy RJ. Energy and momentum relaxation of hot electrons in GaN/AlGaN Journal of Physics Condensed Matter. 14: 3457-3468. DOI: 10.1088/0953-8984/14/13/305 |
0.407 |
|
2002 |
Ambacher O, Majewski J, Miskys C, Link A, Hermann M, Eickhoff M, Stutzmann M, Bernardini F, Fiorentini V, Tilak V, Schaff B, Eastman LF. Pyroelectric properties of Al(In)GaN/GaN hetero- and quantum well structures Journal of Physics Condensed Matter. 14: 3399-3434. DOI: 10.1088/0953-8984/14/13/302 |
0.509 |
|
2002 |
Vitusevich SA, Danylyuk SV, Klein N, Petrychuk MV, Sokolov VN, Kochelap VA, Belyaev AE, Tilak V, Smart J, Vertiatchikh A, Eastman LF. Excess low-frequency noise in AlGaN/GaN-based high-electron-mobility transistors Applied Physics Letters. 80: 2126-2128. DOI: 10.1063/1.1463202 |
0.772 |
|
2002 |
Vitusevich SA, Klein N, Petrychuk MV, Belyaev AE, Danylyuk SV, Konakova RV, Avksentyev AY, Danilchenko BA, Tilak V, Smart J, Vertiatchikh A, Eastman LF. Low-frequency noise in AlGaN/GaN high electron mobility transistors irradiated by γ-ray quanta Physica Status Solidi C: Conferences. 78-81. DOI: 10.1002/Pssc.200390121 |
0.757 |
|
2002 |
Vitusevich SA, Danylyuk SV, Klein N, Petrychuk MV, Avksentyev AY, Sokolov VN, Kochelap VA, Belyaev AE, Tilak V, Smart J, Vertiatchikh A, Eastman LF. Two-dimensional electron dynamics in GaN/AlGaN heterostructures Physica Status Solidi C: Conferences. 401-404. DOI: 10.1002/Pssc.200390073 |
0.764 |
|
2002 |
Eastman LF, Tilak V, Kaper V, Smart J, Thompson R, Green B, Shealy JR, Prunty T. Progress in high-power, high frequency AlGaN/GaN HEMTs Physica Status Solidi (a) Applied Research. 194: 433-438. DOI: 10.1002/1521-396X(200212)194:2<433::Aid-Pssa433>3.0.Co;2-R |
0.784 |
|
2002 |
Koley G, Cha HY, Tilak V, Eastman LF, Spencer MG. Modulation of surface barrier in AlGaN/GaN heterostructures Physica Status Solidi (B) Basic Research. 234: 734-737. DOI: 10.1002/1521-3951(200212)234:3<734::Aid-Pssb734>3.0.Co;2-C |
0.644 |
|
2002 |
Brar B, Boutros K, DeWames RE, Tilak V, Shealy R, Eastman L. Impact Ionization in High Performance AlGaN/GaN HEMTs Proceedings Ieee Lester Eastman Conference On High Performance Devices. 487-491. |
0.318 |
|
2002 |
Green BM, Kaper VS, Tilak V, Shealy JR, Eastman LF. Dynamic loadline analysis of AlGaN/GaN HEMTS Proceedings Ieee Lester Eastman Conference On High Performance Devices. 443-452. |
0.705 |
|
2002 |
Lee S, Tilak V, Webb KJ, Eastman LF. Intrinsic noise characteristics of AlGaN/GaN HEMTs Ieee Mtt-S International Microwave Symposium Digest. 3: 1415-1418. |
0.422 |
|
2002 |
Kaper V, Tilak V, Kim H, Thompson R, Prunty T, Smart J, Eastman LF, Shealy JR. High power monolithic AlGaN/GaN HEMT oscillator Technical Digest - Gaas Ic Symposium (Gallium Arsenide Integrated Circuit). 251-254. |
0.663 |
|
2002 |
Vitusevich SA, Klein N, Belyaev AE, Danylyuk SV, Petrychuk MV, Konakova RV, Kurakin AM, Rengevich AE, Avksentyev AY, Danilchenko BA, Tilak V, Smart J, Vertiatchikh A, Eastman LF. Radiation hardness of AlGaN/GaN based HEMTs Materials Research Society Symposium - Proceedings. 719: 133-138. |
0.701 |
|
2002 |
Kaper V, Tilak V, Green B, Prunty T, Smart J, Eastman LF, Shealy JR. Dependence of Power and Efficiency of AlGaN/GaN HEMT's on the Load Resistance for Class B Bias Proceedings Ieee Lester Eastman Conference On High Performance Devices. 118-125. |
0.721 |
|
2002 |
Koley G, Tilak V, Cha HY, Eastman LF, Spencer MG. Surface trapping effects observed in AlGAN/GaN HFETs and heterostructures Proceedings Ieee Lester Eastman Conference On High Performance Devices. 470-476. |
0.58 |
|
2001 |
Kim H, Tilak V, Green BM, Cha HY, Smart JA, Shealy JR, Eastman LF. Degradation characteristics of AlGaN-GaN high electron mobility transistors Ieee International Reliability Physics Symposium Proceedings. 2001: 214-218. DOI: 10.1109/RELPHY.2001.922904 |
0.796 |
|
2001 |
Lee JW, Green BM, Tilak V, Lee S, Shealy JR, Eastman LF, Webb KJ. A broadband GaN push-pull distributed microwave power amplifier 2001 International Semiconductor Device Research Symposium, Isdrs 2001 - Proceedings. 391-393. DOI: 10.1109/ISDRS.2001.984526 |
0.747 |
|
2001 |
Tilak V, Green B, Kaper V, Kim H, Prunty T, Smart J, Shealy J, Eastman L. Influence of barrier thickness on the high-power performance of AlGaN/GaN HEMTs Ieee Electron Device Letters. 22: 504-506. DOI: 10.1109/55.962644 |
0.811 |
|
2001 |
Green BM, Tilak V, Lee S, Kim H, Smart JA, Webb KJ, Shealy JR, Eastman LF. High-power broad-band AlGaN/GaN HEMT MMICs on SiC substrates Ieee Transactions On Microwave Theory and Techniques. 49: 2486-2493. DOI: 10.1109/22.971640 |
0.773 |
|
2001 |
Eastman LF, Tilak V, Smart J, Green BM, Chumbes EM, Dimitrov R, Kim H, Ambacher OS, Weimann N, Prunty T, Murphy M, Schaff WJ, Shealy JR. Undoped AlGaN/GaN HEMTs for microwave power amplification Ieee Transactions On Electron Devices. 48: 479-485. DOI: 10.1109/16.906439 |
0.827 |
|
2001 |
Kim H, Tilak V, Green BM, Smart JA, Schaff WJ, Shealy JR, Eastman LF. Reliability Evaluation of High Power AlGaN/GaN HEMTs on SiC Substrate Physica Status Solidi (a) Applied Research. 188: 203-206. DOI: 10.1002/1521-396X(200111)188:1<203::Aid-Pssa203>3.0.Co;2-C |
0.805 |
|
2001 |
Green BM, Tilak V, Lee S, Kim H, Smart JA, Webb KJ, Shealy JR, Eastman LF. High-power broadband AlGaN/GaN HEMT MMIC's on SiC substrates Ieee Mtt-S International Microwave Symposium Digest. 2: 1059-1062. |
0.751 |
|
2001 |
Kim H, Tilak V, Green BM, Cha H, Smart JA, Shealy JR, Eastman LF. Degradation characteristics of AlGaN/GaN high electron mobility transistors Annual Proceedings - Reliability Physics (Symposium). 214-218. |
0.774 |
|
2000 |
Tilak V, Dimitrov R, Murphy M, Green B, Smart J, Schaff WJ, Shealy JR, Eastman LF. Electric and morphology studies of ohmic contacts on AlGaN/GaN Materials Research Society Symposium - Proceedings. 622: T741-T746. DOI: 10.1557/Proc-622-T7.4.1 |
0.775 |
|
2000 |
Dimitrov R, Tilak V, Murphy M, Schaff WJ, Eastman LF, Lima AP, Miskys C, Ambacher O, Stutzmann M. Lateral polarity heterostructures by overgrowth of patterned AlxGa1-xN nucleation layers Materials Research Society Symposium - Proceedings. 622: T461-T466. DOI: 10.1557/Proc-622-T4.6.1 |
0.601 |
|
2000 |
Green BM, Chu KK, Smart JA, Tilak V, Kim H, Shealy JR, Eastman LF. Cascode connected AlGaN/GaN HEMTs on SiC substrates Ieee Microwave and Guided Wave Letters. 10: 316-318. DOI: 10.1109/75.862226 |
0.806 |
|
2000 |
Dimitrov R, Tilak V, Yeo W, Green B, Kim H, Smart J, Chumbes E, Shealy JR, Schaff W, Eastman LF, Miskys C, Ambacher O, Stutzmann M. Influence of oxygen and methane plasma on the electrical properties of undoped AlGaN/GaN heterostructures for high power transistors Solid-State Electronics. 44: 1361-1365. DOI: 10.1016/S0038-1101(00)00085-X |
0.797 |
|
2000 |
Eastman LF, Green B, Smart J, Tilak V, Chumbes E, Kim H, Prunty T, Weimann N, Dimitrov R, Ambacher O, Schaff WJ, Shealy JR. Power limits of polarization-induced AlGaN/GaN HEMT's Proceedings of the Ieee Cornell Conference On Advanced Concepts in High Speed Semiconductor Devices and Circuits. 242-246. |
0.732 |
|
2000 |
Green BM, Kim H, Chu KK, Lin HS, Tilak V, Shealy JR, Smart JA, Eastman LF. Validation of an analytical large signal model for AlGaN/GaN HEMTs Ieee Mtt-S International Microwave Symposium Digest. 2: 761-764. |
0.611 |
|
2000 |
Tilak V, Green B, Kim H, Dimitrov R, Smart J, Schaff WJ, Shealy JR, Eastman LF. Effect of passivation on AlGaN/GaN HEMT device performance Ieee International Symposium On Compound Semiconductors, Proceedings. 357-363. |
0.752 |
|
1999 |
Foutz BE, Murphy MJ, Ambacher O, Tilak V, Smart JA, Shealy JR, Schaff WJ, Eastman LF. The Influence of Spontaneous and Piezoelectric Polarization on Novel AlGaN/GaN/InGaN Device Structures Mrs Proceedings. 572: 501. DOI: 10.1557/Proc-572-501 |
0.747 |
|
1999 |
Foutz BE, Ambacher O, Murphy MJ, Tilak V, Eastman LF. Polarization Induced Charge at Heterojunctions of the III–V Nitrides and Their Alloys Physica Status Solidi B-Basic Solid State Physics. 216: 415-418. DOI: 10.1002/(Sici)1521-3951(199911)216:1<415::Aid-Pssb415>3.0.Co;2-W |
0.582 |
|
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