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Atif Imtiaz, Ph.D. - Publications

Affiliations: 
2005 University of Maryland, College Park, College Park, MD 
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27 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2015 Coakley KJ, Imtiaz A, Wallis TM, Weber JC, Berweger S, Kabos P. Adaptive and robust statistical methods for processing near-field scanning microwave microscopy images. Ultramicroscopy. 150: 1-9. PMID 25463325 DOI: 10.1016/J.Ultramic.2014.11.014  0.349
2014 Weber JC, Blanchard PT, Sanders AW, Gertsch JC, George SM, Berweger S, Imtiaz A, Coakley KJ, Wallis TM, Bertness KA, Kabos P, Sanford NA, Bright VM. GaN nanowire coated with atomic layer deposition of tungsten: a probe for near-field scanning microwave microscopy. Nanotechnology. 25: 415502. PMID 25258349 DOI: 10.1088/0957-4484/25/41/415502  0.368
2014 Imtiaz A, Wallis TM, Kabos P. Near-field scanning microwave microscopy: An emerging research tool for nanoscale metrology Ieee Microwave Magazine. 15: 52-64. DOI: 10.1109/Mmm.2013.2288711  0.31
2014 Imtiaz A, Wallis TM, Weber JC, Coakley KJ, Brubaker MD, Blanchard PT, Bertness KA, Sanford NA, Kabos P. Imaging the p-n junction in a gallium nitride nanowire with a scanning microwave microscope Applied Physics Letters. 104. DOI: 10.1063/1.4886963  0.355
2014 Weber JC, Blanchard PT, Sanders AW, Imtiaz A, Wallis TM, Coakley KJ, Bertness KA, Kabos P, Sanford NA, Bright VM. Gallium nitride nanowire probe for near-field scanning microwave microscopy Applied Physics Letters. 104. DOI: 10.1063/1.4861862  0.362
2013 Imtiaz A, Wallis TM, Kabos P. Near-field scanning microwave microscope (NSMM) Access Science. DOI: 10.1036/1097-8542.Yb130175  0.372
2012 Weber JC, Schlager JB, Sanford NA, Imtiaz A, Wallis TM, Mansfield LM, Coakley KJ, Bertness KA, Kabos P, Bright VM. A near-field scanning microwave microscope for characterization of inhomogeneous photovoltaics. The Review of Scientific Instruments. 83: 083702. PMID 22938298 DOI: 10.1063/1.4740513  0.503
2012 Imtiaz A, Wallis TM, Lim SH, Tanbakuchi H, Huber HP, Hornung A, Hinterdorfer P, Smoliner J, Kienberger F, Kabos P. Frequency-selective contrast on variably doped p-type silicon with a scanning microwave microscope Journal of Applied Physics. 111. DOI: 10.1063/1.4716026  0.465
2012 Huber HP, Humer I, Hochleitner M, Fenner M, Moertelmaier M, Rankl C, Imtiaz A, Wallis TM, Tanbakuchi H, Hinterdorfer P, Kabos P, Smoliner J, Kopanski JJ, Kienberger F. Calibrated nanoscale dopant profiling using a scanning microwave microscope Journal of Applied Physics. 111. DOI: 10.1063/1.3672445  0.444
2011 Wallis TM, Gu D, Imtiaz A, Smith CS, Chiang CJ, Kabos P, Blanchard PT, Sanford NA, Bertness KA. Electrical characterization of photoconductive gan nanowires from 50 MHz to 33 GHz Ieee Transactions On Nanotechnology. 10: 832-838. DOI: 10.1109/TNANO.2010.2084588  0.301
2011 Kim K, Wallis TM, Rice P, Gu D, Lim SH, Imtiaz A, Kabos P, Filipovic DS. High-frequency characterization of contact resistance and conductivity of platinum nanowires Ieee Transactions On Microwave Theory and Techniques. 59: 2647-2654. DOI: 10.1109/Tmtt.2011.2163417  0.368
2011 Weber JC, Bertness KA, Schlager JB, Sanford NA, Imtiaz A, Wallis TM, Kabos P, Coakley KJ, Bright VM, Mansfield LM. Microwave near-field probes for photovoltaic applications Conference Record of the Ieee Photovoltaic Specialists Conference. 001978-001982. DOI: 10.1109/PVSC.2011.6186341  0.361
2011 Lim SH, Wallis TM, Imtiaz A, Gu D, Krivosik P, Kabos P. Influence of periodic patterning on the magnetization response of micromagnetic structures Ieee Magnetics Letters. 2. DOI: 10.1109/Lmag.2011.2119394  0.339
2011 Gu D, Wallis TM, Blanchard P, Lim SH, Imtiaz A, Bertness KA, Sanford NA, Kabos P. De-embedding parasitic elements of GaN nanowire metal semiconductor field effect transistors by use of microwave measurements Applied Physics Letters. 98. DOI: 10.1063/1.3597408  0.364
2011 Lim SH, Wallis TM, Imtiaz A, Gu D, Krivosik P, Kabos P. Comparison of electrical techniques for magnetization dynamics measurements in micro/nanoscale structures Journal of Applied Physics. 109. DOI: 10.1063/1.3544480  0.312
2010 Huber HP, Moertelmaier M, Wallis TM, Chiang CJ, Hochleitner M, Imtiaz A, Oh YJ, Schilcher K, Dieudonne M, Smoliner J, Hinterdorfer P, Rosner SJ, Tanbakuchi H, Kabos P, Kienberger F. Calibrated nanoscale capacitance measurements using a scanning microwave microscope. The Review of Scientific Instruments. 81: 113701. PMID 21133472 DOI: 10.1063/1.3491926  0.478
2010 Bertness KA, Schlager JB, Sanford NA, Imtiaz A, Wallis TM, Weber JC, Kabos P, Mansfield LM. Application of microwave scanning probes to photovoltaic materials Conference Record of the Ieee Photovoltaic Specialists Conference. 1669-1674. DOI: 10.1109/PVSC.2010.5616057  0.315
2010 Kim K, Wallis TM, Rice P, Chiang CJ, Imtiaz A, Kabos P, Filipovic DS. A framework for broadband characterization of individual nanowires Ieee Microwave and Wireless Components Letters. 20: 178-180. DOI: 10.1109/Lmwc.2010.2040224  0.396
2010 Kuepferling M, Serpico C, Pufall M, Rippard W, Wallis TM, Imtiaz A, Krivosik P, Pasquale M, Kabos P. Two modes behavior of vortex oscillations in spin-transfer nanocontacts subject to in-plane magnetic fields Applied Physics Letters. 96. DOI: 10.1063/1.3455883  0.301
2010 Chiang CJ, Wallis TM, Gu D, Imtiaz A, Kabos P, Blanchard PT, Bertness KA, Sanford NA, Kim K, Filipovic D. High frequency characterization of a Schottky contact to a GaN nanowire bundle Journal of Applied Physics. 107. DOI: 10.1063/1.3428391  0.406
2010 Imtiaz A, Wallis TM, Lim SH, Chisum J, Popovic Z, Kabos P. Near-field antenna as a Scanning Microwave Probe for characterization of materials and devices Eucap 2010 - the 4th European Conference On Antennas and Propagation.  0.357
2009 Chang YJ, Gray JM, Imtiaz A, Seghete D, Mitch Wallis T, George SM, Kabos P, Rogers CT, Bright VM. Micromachined resonators of high Q-factor based on atomic layer deposited alumina Sensors and Actuators, a: Physical. 154: 229-237. DOI: 10.1016/J.Sna.2008.11.015  0.381
2007 Wallis TM, Imtiaz A, Nembach HT, Rice P, Kabos P. Metrology for high-frequency nanoelectronics Aip Conference Proceedings. 931: 525-529. DOI: 10.1063/1.2799429  0.31
2007 Imtiaz A, Anlage SM, Barry JD, Melngailis J. Nanometer-scale material contrast imaging with a near-field microwave microscope Applied Physics Letters. 90. DOI: 10.1063/1.2719164  0.587
2006 Imtiaz A, Anlage SM. Effect of tip geometry on contrast and spatial resolution of the near-field microwave microscope Journal of Applied Physics. 100. DOI: 10.1063/1.2234801  0.569
2005 Imtiaz A, Pollak M, Anlage SM, Barry JD, Melngailis J. Near-field microwave microscopy on nanometer length scales Journal of Applied Physics. 97. DOI: 10.1063/1.1844614  0.606
2003 Imtiaz A, Anlage SM. A novel STM-assisted microwave microscope with capacitance and loss imaging capability. Ultramicroscopy. 94: 209-16. PMID 12524191 DOI: 10.1016/S0304-3991(02)00291-7  0.613
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