Year |
Citation |
Score |
2011 |
Lu DD, Dunga MV, Lin CH, Niknejad AM, Hu C. A computationally efficient compact model for fully-depleted SOI MOSFETs with independently-controlled front- and back-gates Solid-State Electronics. 62: 31-39. DOI: 10.1016/J.Sse.2010.12.015 |
0.675 |
|
2009 |
Lin CH, Dunga MV, Lu DD, Niknejad AM, Hu C. Performance-aware corner model for design for manufacturing Ieee Transactions On Electron Devices. 56: 595-600. DOI: 10.1109/Ted.2008.2011845 |
0.548 |
|
2009 |
Morshed TH, Dunga MV, Zhang J, Lu DD, Niknejad AM, Hu C. Compact modeling of flicker noise variability in small size MOSFETs Technical Digest - International Electron Devices Meeting, Iedm. 30.6.1-30.6.4. DOI: 10.1109/IEDM.2009.5424237 |
0.52 |
|
2008 |
Lin CH, Dunga MV, Lu D, Niknejad AM, Hu C. Statistical compact modeling of variations in nano MOSFETs International Symposium On Vlsi Technology, Systems, and Applications, Proceedings. 165-166. DOI: 10.1109/VTSA.2008.4530849 |
0.566 |
|
2008 |
Dunga MV, Lin CH, Niknejad AM, Hu C. BSIM-CMG: A compact model for multi-gate transistors Finfets and Other Multi-Gate Transistors. 113-153. DOI: 10.1007/978-0-387-71752-4_3 |
0.675 |
|
2007 |
Dunga MV, Lin CH, Lu DD, Xiong W, Cleavelin CR, Patruno P, Hwang JR, Yang FL, Niknejad AM, Hu C. BSIM-MG: A versatile multi-gate FET model for mixed-signal design Digest of Technical Papers - Symposium On Vlsi Technology. 60-61. DOI: 10.1109/VLSIT.2007.4339727 |
0.396 |
|
2007 |
Lu DD, Dunga MV, Lin CH, Niknejad AM, Hu C. A multi-gate MOSFET compact model featuring independent-gate operation Technical Digest - International Electron Devices Meeting, Iedm. 565-568. DOI: 10.1109/IEDM.2007.4419001 |
0.511 |
|
2007 |
Lin CH, Dunga MV, Niknejad AM, Hu C. A compact quantum-mechanical model for double-gate MOSFET Icsict-2006: 2006 8th International Conference On Solid-State and Integrated Circuit Technology, Proceedings. 1272-1274. DOI: 10.1109/ICSICT.2006.306111 |
0.354 |
|
2007 |
He J, Xi X, Wan H, Dunga M, Chan M, Niknejad AM. BSIM5: An advanced charge-based MOSFET model for nanoscale VLSI circuit simulation Solid-State Electronics. 51: 433-444. DOI: 10.1016/J.Sse.2006.12.006 |
0.709 |
|
2007 |
Hu C, Dunga M, Lin CH, Lu D, Niknejad A. Compact modeling for new transistor structures 2007 International Conference On Simulation of Semiconductor Processes and Devices, Sispad 2007. 285-288. |
0.484 |
|
2007 |
Hu C, Lin CH, Dunga M, Lu D, Niknejad A. A versatile multi-gate MOSFET compact model: BSIM-MG 2007 Nsti Nanotechnology Conference and Trade Show - Nsti Nanotech 2007, Technical Proceedings. 3: 512-514. |
0.453 |
|
2006 |
Dunga MV, Lin CH, Xi X, Lu DD, Niknejad AM, Hu C. Modeling advanced FET technology in a compact model Ieee Transactions On Electron Devices. 53: 1971-1977. DOI: 10.1109/Ted.2005.881001 |
0.664 |
|
2006 |
Dunga MV, Lin CH, Xi X, Chen S, Lu DD, Niknejad AM, Hu C. BSIM4 and BSIM multi-gate progress 2006 Nsti Nanotechnology Conference and Trade Show - Nsti Nanotech 2006 Technical Proceedings. 3: 658-661. |
0.526 |
|
2006 |
Dunga MV, Xi X, Niknejad AM, Hu C. Dynamic behavior model for high-k MOSFETs 2006 Nsti Nanotechnology Conference and Trade Show - Nsti Nanotech 2006 Technical Proceedings. 3: 835-838. |
0.423 |
|
2005 |
He J, Xi J, Chan M, Wan H, Dunga M, Heydari B, Niknejad AM, Hu C. Charge-based core and the model architecture of BSIM5 Proceedings - International Symposium On Quality Electronic Design, Isqed. 96-101. DOI: 10.1109/ISQED.2005.30 |
0.703 |
|
2005 |
Niknejad AM, Doan C, Emami S, Dunga M, Xi X, He J, Brodersen R, Hu C. Next generation CMOS compact models for RF and microwave applications Digest of Papers - Ieee Radio Frequency Integrated Circuits Symposium. 141-144. |
0.321 |
|
2004 |
Xi X, He J, Dunga M, Lin CH, Heydari B, Wan H, Chan M, Niknejad AM, Hu C. The next generation BSIM for sub-100nm mixed-signal circuit simulation Proceedings of the Custom Integrated Circuits Conference. 13-16. |
0.716 |
|
2004 |
Xi X, He J, Dunga M, Wau H, Chan M, Lin CH, Heydari B, Niknejad AM, Hu C. BSIM5 MOSFET model International Conference On Solid-State and Integrated Circuits Technology Proceedings, Icsict. 2: 920-923. |
0.705 |
|
2004 |
Xi X, He J, Dunga M, Lin CH, Heydari B, Wan H, Chan M, Niknejad AM, Hu C. The development of the next generation BSIM for sub-100nm mixed-signal circuit simulation 2004 Nsti Nanotechnology Conference and Trade Show - Nsti Nanotech 2004. 2: 70-73. |
0.733 |
|
2003 |
Chan M, Xi X, He J, Cao KM, Dunga MV, Niknejad AM, Ko PK, Hu C. Practical compact modeling approaches and options for sub-0.1 μm CMOS technologies Microelectronics Reliability. 43: 399-404. DOI: 10.1016/S0026-2714(02)00278-0 |
0.654 |
|
2003 |
Niknejad AM, Chan M, Hu C, Brodersen B, Xi X, He J, Emami S, Doan C, Cao Y, Su P, Wan H, Dunga M, Lin CH. Compact modeling for RF and microwave integrated circuits 2003 Nanotechnology Conference and Trade Show - Nanotech 2003. 2: 294-297. |
0.523 |
|
2003 |
Dunga MV, Xi X, He J, Polishchuk I, Lu Q, Chan M, Niknejad AM, Hu C. Modeling of direct tunneling current in multi-layer gate stacks 2003 Nanotechnology Conference and Trade Show - Nanotech 2003. 2: 306-309. |
0.321 |
|
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