Year |
Citation |
Score |
2020 |
Siddiqui MSM, Ruchi S, Le LV, Yoo T, Chang I, Kim TT. SRAM Radiation Hardening Through Self-Refresh Operation and Error Correction Ieee Transactions On Device and Materials Reliability. 20: 468-474. DOI: 10.1109/Tdmr.2020.2994769 |
0.383 |
|
2019 |
Ro D, Min C, Kang M, Chang IJ, Lee HM. A Radiation-Hardened SAR ADC with Delay-Based Dual Feedback Flip-Flops for Sensor Readout Systems. Sensors (Basel, Switzerland). 20. PMID 31892184 DOI: 10.3390/S20010171 |
0.307 |
|
2019 |
Kim M, Chang I, Lee H. Segmented Tag Cache: A Novel Cache Organization for Reducing Dynamic Read Energy Ieee Transactions On Computers. 68: 1546-1552. DOI: 10.1109/Tc.2019.2906872 |
0.317 |
|
2018 |
Seo D, Trang LD, Han J, Kim J, Lee S, Chang I. Total Ionizing Dose Effect on Ring Oscillator Frequency in 28-nm FD-SOI Technology Ieee Electron Device Letters. 39: 1728-1731. DOI: 10.1109/Led.2018.2872345 |
0.33 |
|
2018 |
Kim H, Chang IJ, Lee H. Optimal Selection of SRAM Bit-Cell Size for Power Reduction in Video Compression Ieee Journal On Emerging and Selected Topics in Circuits and Systems. 8: 431-443. DOI: 10.1109/Jetcas.2018.2828129 |
0.451 |
|
2017 |
Dang LDT, Kim JS, Chang IJ. We-Quatro: Radiation-Hardened SRAM Cell With Parametric Process Variation Tolerance Ieee Transactions On Nuclear Science. 64: 2489-2496. DOI: 10.1109/Tns.2017.2728180 |
0.48 |
|
2017 |
Chang IJ, Park SY, Choi JW. Design of Low-Power Voltage Scalable Arithmetic Units with Perfect Timing Error Cancelation Circuits Systems and Signal Processing. 36: 4309-4325. DOI: 10.1007/S00034-017-0534-5 |
0.42 |
|
2016 |
Lee T, Chang IJ, Lee C, Yang JS. Physical-Aware approaches for speeding up scan shift operations in SoCs Etri Journal. 38: 479-486. DOI: 10.4218/Etrij.16.0115.0779 |
0.328 |
|
2016 |
Chang IJ, Yang JS. Subthreshold 8t sram sizing utilizing short-channel vt roll-off and inverse narrow-width effect Ieice Electronics Express. 13. DOI: 10.1587/Elex.13.20160020 |
0.432 |
|
2016 |
Trang Dang LD, Kang M, Kim J, Chang IJ. Studying the Variation Effects of Radiation Hardened Quatro SRAM Bit-Cell Ieee Transactions On Nuclear Science. 63: 2399-2401. DOI: 10.1109/Tns.2016.2590426 |
0.452 |
|
2016 |
Choi M, Chang IJ, Kim JS. Optimal reference view selection algorithm for low complexity disparity estimation Ieee Transactions On Consumer Electronics. 62: 45-52. DOI: 10.1109/Tce.2016.7448562 |
0.33 |
|
2016 |
Jeon J, Chang IJ, Kang M. Accurate Estimation Technique of Low-Frequency Noise in NAND Flash Cell Array Ieee Electron Device Letters. 37: 724-727. DOI: 10.1109/Led.2016.2553174 |
0.367 |
|
2016 |
Kang M, Yang JS, Chang IJ. Studying trapped tunneling-electron migration due to program and erase cycles in NAND flash Ieee Electron Device Letters. 37: 284-286. DOI: 10.1109/Led.2016.2527919 |
0.327 |
|
2016 |
Do AT, Lee ZC, Wang B, Chang IJ, Liu X, Kim TTH. 0.2 V 8T SRAM with PVT-Aware Bitline Sensing and Column-Based Data Randomization Ieee Journal of Solid-State Circuits. DOI: 10.1109/Jssc.2016.2540799 |
0.469 |
|
2015 |
Galib MH, Chang IJ, Kim J. Supply Voltage Decision Methodology to Minimize SRAM Standby Power Under Radiation Environment Ieee Transactions On Nuclear Science. 62: 1349-1356. DOI: 10.1109/Tns.2015.2420094 |
0.397 |
|
2013 |
Choi M, Chang IJ, Kim J. High Performance and Hardware Efficient Multiview Video Coding Frame Scheduling Algorithms and Architectures Ieee Transactions On Circuits and Systems For Video Technology. 23: 1312-1321. DOI: 10.1109/Tcsvt.2013.2242552 |
0.361 |
|
2013 |
Phan ND, Chang IJ, Lee J. A 2-Kb One-Time Programmable Memory for UHF Passive RFID Tag IC in a Standard 0.18 $\mu$m CMOS Process Ieee Transactions On Circuits and Systems I: Regular Papers. 60: 1810-1822. DOI: 10.1109/Tcsi.2012.2230500 |
0.421 |
|
2013 |
Nguyen TN, Chang I, Lee J. A K‐band current‐reuse differential armstrong voltage‐controlled oscillator in 90 nm CMOS technology Microwave and Optical Technology Letters. 55: 112-115. DOI: 10.1002/Mop.27238 |
0.38 |
|
2012 |
Kwon J, Chang IJ, Lee I, Park H, Park J. Heterogeneous SRAM Cell Sizing for Low-Power H.264 Applications Ieee Transactions On Circuits and Systems I: Regular Papers. 59: 2275-2284. DOI: 10.1109/Tcsi.2012.2185335 |
0.598 |
|
2012 |
Kang M, Park IH, Chang IJ, Lee K, Seo S, Park B, Shin H. An Accurate Compact Model Considering Direct-Channel Interference of Adjacent Cells in Sub-30-nm nand Flash Technologies Ieee Electron Device Letters. 33: 1114-1116. DOI: 10.1109/Led.2012.2201442 |
0.362 |
|
2011 |
Chang IJ, Kim J, Kim K, Roy K. Robust Level Converter for Sub-Threshold/Super-Threshold Operation:100 mV to 2.5 V Ieee Transactions On Very Large Scale Integration Systems. 19: 1429-1437. DOI: 10.1109/Tvlsi.2010.2051240 |
0.613 |
|
2011 |
Chang IJ, Mohapatra D, Roy K. A Priority-Based 6T/8T Hybrid SRAM Architecture for Aggressive Voltage Scaling in Video Applications Ieee Transactions On Circuits and Systems For Video Technology. 21: 101-112. DOI: 10.1109/Tcsvt.2011.2105550 |
0.633 |
|
2010 |
Chang IJ, Park SP, Roy K. Exploring Asynchronous Design Techniques for Process-Tolerant and Energy-Efficient Subthreshold Operation Ieee Journal of Solid-State Circuits. 45: 401-410. DOI: 10.1109/Jssc.2009.2036764 |
0.497 |
|
2010 |
Chang I, Park J, Kang K, Roy K. Fast and accurate estimation of SRAM read and hold failure probability using critical point sampling Iet Circuits, Devices & Systems. 4: 469. DOI: 10.1049/Iet-Cds.2010.0137 |
0.568 |
|
2009 |
Chang IJ, Kim J, Park SP, Roy K. A 32 kb 10T Sub-Threshold SRAM Array With Bit-Interleaving and Differential Read Scheme in 90 nm CMOS Ieee Journal of Solid-State Circuits. 44: 650-658. DOI: 10.1109/Jssc.2008.2011972 |
0.657 |
|
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