Jacob A. Abraham - Publications

Affiliations: 
Electrical and Computer Engineering University of Texas at Austin, Austin, Texas, U.S.A. 
Area:
Electronics and Electrical Engineering

186 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Kim B, Abraham JA. Built-in Harmonic Prediction Scheme for Embedded Segmented-Data-Converters Ieee Access. 8: 7851-7860. DOI: 10.1109/Access.2020.2964632  1
2019 Kim B, Abraham JA. Spectral Leakage-Driven Loopback Scheme for Prediction of Mixed-Signal Circuit Specifications Ieee Transactions On Industrial Electronics. 66: 586-594. DOI: 10.1109/Tie.2018.2829667  1
2019 Banerjee S, Samynathan B, Abraham J, Chatterjee A. Real-Time Error Detection in Nonlinear Control Systems Using Machine Learning Assisted State-Space Encoding Ieee Transactions On Dependable and Secure Computing. 1-1. DOI: 10.1109/Tdsc.2019.2903049  1
2019 Fang J, Zhang C, Singor FW, Abraham JA. A Broadband CMOS RF Front End for Direct Sampling Satellite Receivers Ieee Journal of Solid-State Circuits. 54: 2140-2148. DOI: 10.1109/Jssc.2019.2915619  1
2018 Abraham JA, Kenneally B, Amer K, Geller DS. Can Navigation-assisted Surgery Help Achieve Negative Margins in Resection of Pelvic and Sacral Tumors? Clinical Orthopaedics and Related Research. 476: 499-508. PMID 29529631 DOI: 10.1007/s11999.0000000000000064  0.4
2017 Vargas E, Barrett DW, Saucedo CL, Huang LD, Abraham JA, Tanaka H, Haley AP, Gonzalez-Lima F. Beneficial neurocognitive effects of transcranial laser in older adults. Lasers in Medical Science. PMID 28466195 DOI: 10.1007/S10103-017-2221-Y  0.36
2017 Fang J, Thirunakkarasu S, Yu X, Silva-Rivas F, Zhang C, Singor F, Abraham J. A 5-GS/s 10-b 76-mW Time-Interleaved SAR ADC in 28 nm CMOS Ieee Transactions On Circuits and Systems. 64: 1673-1683. DOI: 10.1109/Tcsi.2017.2661481  1
2016 Gutowski CJ, Basu-Mallick A, Abraham JA. Management of Bone Sarcoma. The Surgical Clinics of North America. 96: 1077-106. PMID 27542644 DOI: 10.1016/j.suc.2016.06.002  0.4
2016 Palisch A, Patel RG, Gutowski C, Zoga AC, Colucci P, O'Hara BJ, Roberts CC, Abraham J. Analysis of needle type for musculoskeletal lesion biopsy: Results of a novel steerable needle Current Orthopaedic Practice. 27: 393-399. DOI: 10.1097/BCO.0000000000000399  0.4
2016 Pagare G, Abraham JA, Sanyal SP. Theoretical study of phase stability, structural, magnetic, mechanical and thermal behavior of gadolinium-based intermetallic compounds in cubic AuCu3 structure Indian Journal of Physics. 90: 57-65. DOI: 10.1007/s12648-015-0729-1  0.01
2015 Kenneally BE, Gutowski CJ, Reynolds AW, Morrison WB, Abraham JA. Utility of opposed-phase magnetic resonance imaging in differentiating sarcoma from benign bone lesions. Journal of Bone Oncology. 4: 110-4. PMID 26730359 DOI: 10.1016/j.jbo.2015.10.001  0.4
2015 Merema MR, Sullivan DL, Pollard CM, Abraham JA, Tomlin SM, Radomiljac AL. Parents' perception of their child's weight status and intention to intervene: a Western Australian cross-sectional population survey, 2009-12. Australian and New Zealand Journal of Public Health. PMID 26559494 DOI: 10.1111/1753-6405.12483  0.04
2015 Shallop B, Starks A, Greenbaum S, Geller DS, Lee A, Ready J, Merli G, Maltenfort M, Abraham JA. Thromboembolism After Intramedullary Nailing for Metastatic Bone Lesions. The Journal of Bone and Joint Surgery. American Volume. 97: 1503-11. PMID 26378266 DOI: 10.2106/JBJS.N.01067  0.4
2015 Karam JA, Huang RC, Abraham JA, Parvizi J. Total joint arthroplasty in cancer patients. The Journal of Arthroplasty. 30: 758-61. PMID 25583683 DOI: 10.1016/J.Arth.2014.12.017  0.08
2015 Jang EJ, Chung J, Abraham JA. Delay defect diagnosis methodology using path delay measurements Ieice Transactions On Electronics. 991-994. DOI: 10.1587/Transele.E98.C.991  1
2015 Pagare G, Abraham JA, Sanyal SP. A DFT based study of structural, electronic and elastic properties of PrPb3 intermetallic compound Advanced Science Letters. 21: 2868-2870. DOI: 10.1166/asl.2015.6346  0.01
2015 Mirkhani S, Samynathan B, Abraham JA. In-depth soft error vulnerability analysis using synthetic benchmarks Proceedings of the Ieee Vlsi Test Symposium. 2015. DOI: 10.1109/VTS.2015.7116254  1
2015 Raja I, Banerjee G, Zeidan MA, Abraham JA. A 0.1-3.5-GHz Duty-Cycle Measurement and Correction Technique in 130-nm CMOS Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. DOI: 10.1109/Tvlsi.2015.2478804  1
2015 Mirkhani S, Abraham JA. EAGLE: A regression model for fault coverage estimation using a simulation based metric Proceedings - International Test Conference. 2015. DOI: 10.1109/TEST.2014.7035347  1
2015 Abdulla SS, Nam H, Abraham JA. A novel algorithm for sparse FFT pruning and its applications to OFDMA technology 2014 Ieee 33rd International Performance Computing and Communications Conference, Ipccc 2014. DOI: 10.1109/PCCC.2014.7017080  1
2015 Kalyanam VK, Saint-Laurent M, Abraham JA. Power-Aware multi-voltage custom memory models for enhancing RTL and low power verification Proceedings of the 33rd Ieee International Conference On Computer Design, Iccd 2015. 24-31. DOI: 10.1109/ICCD.2015.7357080  1
2015 Lee HC, Abraham JA. Digital Calibration for 8-bit Delay Line ADC Using Harmonic Distortion Correction Journal of Electronic Testing: Theory and Applications (Jetta). 31: 127-138. DOI: 10.1007/S10836-015-5516-6  1
2015 Offodile AC, Abraham JA, Guo L. Mesh reconstruction of the inguinal ligament with bone anchors following radical oncologic excision: a case series Hernia. 19: 1005-1009. DOI: 10.1007/s10029-014-1254-4  0.4
2014 Wong JC, Abraham JA. Upper extremity considerations for oncologic surgery. The Orthopedic Clinics of North America. 45: 541-64. PMID 25199424 DOI: 10.1016/j.ocl.2014.06.007  0.4
2014 Shallop B, Abraham JA. Synovial chondromatosis of pes anserine bursa secondary to osteochondroma. Orthopedics. 37: e735-8. PMID 25102510 DOI: 10.3928/01477447-20140728-90  0.4
2014 Kirsch JM, Rosenberg AE, O'Hara BJ, Abraham JA. Aggressive tibial lesion in a 70-year-old man. Clinical Orthopaedics and Related Research. 472: 2555-60. PMID 24867455 DOI: 10.1007/s11999-014-3704-9  0.4
2014 Zhang I, Zaorsky NG, Abraham JA, Tuluc M, Curry JM, Bar-Ad V. Chondrosarcoma of the hyoid bone: case report and review of current management options. Head & Neck. 36: E65-72. PMID 23720060 DOI: 10.1002/hed.23373  0.4
2014 Schlichtmann U, Kleeberger VB, Abraham JA, Evans A, Gimmler-Dumon C, Glaß M, Herkersdorf A, Nassif SR, Wehn N. Connecting different worlds - Technology abstraction for reliability-aware design and Test Proceedings -Design, Automation and Test in Europe, Date. DOI: 10.7873/DATE2014.265  1
2014 Lee HC, Abraham JA. A novel low power 11-bit hybrid ADC using flash and delay line architectures Proceedings -Design, Automation and Test in Europe, Date. DOI: 10.7873/DATE2014.028  1
2014 Snir M, Wisniewski RW, Abraham JA, Adve SV, Bagchi S, Balaji P, Belak J, Bose P, Cappello F, Carlson B, Chien AA, Coteus P, Debardeleben NA, Diniz PC, Engelmann C, et al. Addressing failures in exascale computing International Journal of High Performance Computing Applications. 28: 129-173. DOI: 10.1177/1094342014522573  1
2014 Abraham JA, Gu X, MacLaurin T, Rajski J, Ryan PG, Gizopoulos D, Reorda MS. Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players? Proceedings of the Ieee Vlsi Test Symposium. DOI: 10.1109/VTS.2014.6818780  1
2014 Mirkhani S, Abraham JA. Fast evaluation of test vector sets using a simulation-based statistical metric Proceedings of the Ieee Vlsi Test Symposium. DOI: 10.1109/VTS.2014.6818739  1
2014 Kim B, Abraham JA. Bitstream-driven built-in characterization for analog and mixed-signal embedded circuits Ieee Transactions On Circuits and Systems Ii: Express Briefs. 61: 743-747. DOI: 10.1109/Tcsii.2014.2335436  1
2014 Kim B, Abraham JA. Dynamic performance characterization of embedded single-ended mixed-signal circuits Ieee Transactions On Circuits and Systems Ii: Express Briefs. 61: 329-333. DOI: 10.1109/Tcsii.2014.2312639  1
2014 Lee HC, Abraham JA. Harmonic distortion correction for 8-bit delay line ADC using gray code Latw 2014 - 15th Ieee Latin-American Test Workshop. DOI: 10.1109/LATW.2014.6841928  1
2014 Banerjee S, Chatterjee A, Abraham JA. Real-time correction of dc servo motor and controller failures using analog checksums 19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop, Ims3tw 2014 - Proceedings. DOI: 10.1109/IMS3TW.2014.6997391  1
2014 Banerjee S, Gomez-Pau A, Chatterjee A, Abraham JA. Error resilient real-time state variable systems for signal processing and control Proceedings of the Asian Test Symposium. 39-44. DOI: 10.1109/ATS.2014.19  1
2014 Mirkhani S, Cho H, Mitra S, Abraham JA. Rethinking error injection for effective resilience Proceedings of the Asia and South Pacific Design Automation Conference, Asp-Dac. 390-393. DOI: 10.1109/ASPDAC.2014.6742922  1
2014 Kim B, Abraham JA. Designing nonlinearity characterization for mixed-signal circuits in system-on-chip Analog Integrated Circuits and Signal Processing. 82: 341-348. DOI: 10.1007/S10470-014-0461-3  1
2014 Abraham JA, Neuman B, Hornicek FJ. Clinical features and pathobiology of chordoma The Intervertebral Disc: Molecular and Structural Studies of the Disc in Health and Disease. 277-288. DOI: 10.1007/978-3-7091-1535-0_17  0.4
2013 Maceroli M, Ponnappan R, Shallop B, Vaccaro A, Abraham J. Sacral Foraminal Osteochondroma Causing Radiculopathy: A Case Report. Jbjs Case Connector. 3: 3e70. PMID 29252470 DOI: 10.2106/JBJS.CC.M.00001  0.32
2013 Starks A, Guo L, Abraham JA. Resection of soft tissue tumors extending through the obturator ring Orthopedics. 36: e1220-e1224. PMID 24025018 DOI: 10.3928/01477447-20130821-29  0.4
2013 Karanjia H, Abraham JA, O'Hara B, Shallop B, Daniel J, Taweel N, Schick FA. Distal fibula metastasis of cholangiocarcinoma Journal of Foot and Ankle Surgery. 52: 659-662. PMID 23578566 DOI: 10.1053/j.jfas.2013.02.017  0.4
2013 Cho H, Mirkhani S, Cher CY, Abraham JA, Mitra S. Quantitative evaluation of soft error injection techniques for robust system dsesign Proceedings - Design Automation Conference. DOI: 10.1145/2463209.2488859  1
2013 Han K, Yang JS, Abraham JA. Enhanced algorithm of combining trace and scan signals in post-silicon validation Proceedings of the Ieee Vlsi Test Symposium. DOI: 10.1109/VTS.2013.6548915  1
2013 Han K, Yang JS, Abraham JA. Dynamic trace signal selection for post-silicon validation Proceedings of the Ieee International Conference On Vlsi Design. 302-307. DOI: 10.1109/VLSID.2013.205  1
2013 Chung J, Abraham JA. Concurrent path selection algorithm in statistical timing analysis Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 21: 1715-1726. DOI: 10.1109/Tvlsi.2012.2218136  1
2013 Chung J, Park J, Abraham JA. A built-in repair analyzer with optimal repair rate for word-oriented memories Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 21: 281-291. DOI: 10.1109/Tvlsi.2011.2182217  1
2013 Prabhu M, Abraham JA. Application of under-approximation techniques to functional test generation targeting hard to detect stuck-at faults Proceedings - International Test Conference. DOI: 10.1109/TEST.2013.6651915  1
2013 Kim B, Abraham JA. Capacitor-coupled built-off self-test in analog and mixed-signal embedded systems Ieee Transactions On Circuits and Systems Ii: Express Briefs. 60: 257-261. DOI: 10.1109/Tcsii.2013.2251953  1
2013 Zeidan MA, Banerjee G, Abraham JA. Asynchronous measurement of transient phase-shift resulting from rf receiver state-change Ieee Transactions On Circuits and Systems I: Regular Papers. 60: 2740-2751. DOI: 10.1109/Tcsi.2013.2249179  1
2013 Viswanath V, Muralidhar R, Seshadri H, Abraham JA. On a rewriting strategy for dynamically managing power constraints and power dissipation in SoCs Proceedings - International Symposium On Quality Electronic Design, Isqed. 128-134. DOI: 10.1109/ISQED.2013.6523600  1
2013 Banerjee S, Banerjee A, Chatterjee A, Abraham JA. Real-time checking of linear control systems using analog checksums Proceedings of the 2013 Ieee 19th International On-Line Testing Symposium, Iolts 2013. 122-127. DOI: 10.1109/IOLTS.2013.6604062  1
2013 Park J, Chaudhari A, Abraham JA. Non-speculative double-sampling technique to increase energy-efficiency in a high-performance processor Proceedings -Design, Automation and Test in Europe, Date. 254-257.  1
2012 Lall A, Hohn E, Kim MY, Gorlick RG, Abraham JA, Geller DS. Comparison of Surface Area across the Allograft-Host Junction Site Using Conventional and Navigated Osteotomy Technique. Sarcoma. 2012: 197540. PMID 23319879 DOI: 10.1155/2012/197540  0.4
2012 Abraham JA, Weaver MJ, Hornick JL, Zurakowski D, Ready JE. Outcomes and prognostic factors for a consecutive case series of 115 patients with somatic leiomyosarcoma. The Journal of Bone and Joint Surgery. American Volume. 94: 736-44. PMID 22517390 DOI: 10.2106/JBJS.K.00460  0.4
2012 Viswanath V, Abraham JA. Automatic and correct register transfer level annotations for low power microprocessor design Journal of Low Power Electronics. 8: 424-439. DOI: 10.1166/Jolpe.2012.1204  1
2012 Chun JH, Lim SM, Ong SC, Lee JW, Abraham JA. Test of phase interpolators in high speed I/Os using a sliding window search Proceedings of the Ieee Vlsi Test Symposium. 134-139. DOI: 10.1109/VTS.2012.6231092  1
2012 Jang EJ, Gattiker A, Nassif S, Abraham JA. An oscillation-based test structure for timing information extraction Proceedings of the Ieee Vlsi Test Symposium. 74-79. DOI: 10.1109/VTS.2012.6231083  1
2012 Kim H, Abraham JA. A built-in self-test scheme for DDR memory output timing test and measurement Proceedings of the Ieee Vlsi Test Symposium. 7-12. DOI: 10.1109/VTS.2012.6231072  1
2012 Park J, Abraham JA. An aging-aware flip-flop design based on accurate, run-time failure prediction Proceedings of the Ieee Vlsi Test Symposium. 294-299. DOI: 10.1109/VTS.2012.6231069  1
2012 Park J, Ustun HM, Abraham JA. Run-time prediction of the optimal performance point in DVS-based dynamic thermal management Proceedings of the Ieee International Conference On Vlsi Design. 155-160. DOI: 10.1109/VLSID.2012.63  1
2012 Mirkhani S, Abraham JA, Vo T, Jun H, Eklow B. FALCON: Rapid statistical fault coverage estimation for complex designs Proceedings - International Test Conference. DOI: 10.1109/TEST.2012.6401584  1
2012 Kim B, Abraham JA. Imbalance-based self-test for high-speed mixed-signal embedded systems Ieee Transactions On Circuits and Systems Ii: Express Briefs. 59: 785-789. DOI: 10.1109/Tcsii.2012.2220693  1
2012 Zeidan MA, Banerjee G, Gharpurey R, Abraham JA. Phase-aware multitone digital signal based test for RF receivers Ieee Transactions On Circuits and Systems I: Regular Papers. 59: 2097-2110. DOI: 10.1109/Tcsi.2012.2185309  1
2012 Chung J, Abraham JA. On computing criticality in refactored timing graphs Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 1935-1939. DOI: 10.1109/Tcad.2012.2213819  1
2012 Chung J, Xiong J, Zolotov V, Abraham JA. Testability-driven statistical path selection Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 1275-1287. DOI: 10.1109/Tcad.2012.2190067  1
2012 Chung J, Xiong J, Zolotov V, Abraham JA. Path criticality computation in parameterized statistical timing analysis using a novel operator Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 497-508. DOI: 10.1109/Tcad.2011.2179042  1
2012 Chung J, Abraham JA. Refactoring of timing graphs and its use in capturing topological correlation in SSTA Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 31: 485-496. DOI: 10.1109/Tcad.2011.2176731  1
2012 Venuto DD, Fang W, Abraham J. Guest Editorial Special Issue of IEEE Sensors on the 4th IEEE International Workshop on Advances in Sensors and Interfaces 2011 (IWASI 2011) Ieee Sensors Journal. 12: 3299-3300. DOI: 10.1109/Jsen.2012.2219914  0.72
2012 Dasnurkar SD, Abraham JA. Frequency-independent parametric built in test solution for PLLs with low speed test resources Proceedings of the 2012 Ieee 18th International Mixed-Signal, Sensors, and Systems Test Workshop, Ims3tw 2012. 73-78. DOI: 10.1109/IMS3TW.2012.24  1
2012 Lee HC, Abraham JA. Testing and fault diagnosis of time-interleaved ΣΔ modulators using checksums Proceedings of the 2012 Ieee 18th International Mixed-Signal, Sensors, and Systems Test Workshop, Ims3tw 2012. 11-16. DOI: 10.1109/IMS3TW.2012.13  1
2012 Lee JW, Chun JH, Abraham JA. Indirect method for random jitter measurement on SoCs using critical path characterization Proceedings - 2012 17th Ieee European Test Symposium, Ets 2012. DOI: 10.1109/ETS.2012.6233022  1
2012 Prabhu M, Abraham JA. Functional test generation for hard to detect stuck-at faults using RTL model checking Proceedings - 2012 17th Ieee European Test Symposium, Ets 2012. DOI: 10.1109/ETS.2012.6233016  1
2012 Abraham JA, Weaver MJ, Ready JE, Raskin KA, O'Brien E, Hornicek FJ. Short-term outcomes of cementless modular endoprostheses in lower extremity reconstruction Current Orthopaedic Practice. 23: 213-217. DOI: 10.1097/BCO.0b013e3182512156  0.4
2012 Mohammad B, Abraham J. A reduced voltage swing circuit using a single supply to enable lower voltage operation for SRAM-based memory Microelectronics Journal. 43: 110-118. DOI: 10.1016/J.Mejo.2011.11.006  0.72
2012 Dasnurkar SD, Abraham JA. Calibration enabled scalable current Sensor module for quiescent current testing Journal of Electronic Testing: Theory and Applications (Jetta). 28: 697-704. DOI: 10.1007/S10836-012-5327-Y  1
2012 Kim HJ, Abraham JA. A Built-In Self-Test scheme for memory interfaces timing Test and measurement Journal of Electronic Testing: Theory and Applications (Jetta). 28: 585-597. DOI: 10.1007/S10836-012-5324-1  1
2012 Zhang C, Gharpurey R, Abraham JA. Built-in self test of RF subsystems with integrated detectors Journal of Electronic Testing: Theory and Applications (Jetta). 28: 557-569. DOI: 10.1007/S10836-012-5315-2  1
2011 Banffy MB, Vrahas MS, Ready JE, Abraham JA. Nonoperative versus prophylactic treatment of bisphosphonate-associated femoral stress fractures. Clinical Orthopaedics and Related Research. 469: 2028-34. PMID 21350886 DOI: 10.1007/s11999-011-1828-8  0.4
2011 Jang EJ, Gattiker A, Nassif S, Abraham JA. Efficient and product-representative timing model validation Proceedings of the Ieee Vlsi Test Symposium. 90-95. DOI: 10.1109/VTS.2011.5783761  1
2011 Kim B, Abraham JA. Transformer-coupled loopback test for differential mixed-signal dynamic specifications Ieee Transactions On Instrumentation and Measurement. 60: 2014-2024. DOI: 10.1109/Tim.2011.2113128  1
2011 Kim B, Abraham JA. Efficient loopback test for aperture jitter in embedded mixed-signal circuits Ieee Transactions On Circuits and Systems I: Regular Papers. 58: 1773-1784. DOI: 10.1109/Tcsi.2011.2106030  1
2011 Vemu R, Abraham J. CEDA: Control-flow error detection using assertions Ieee Transactions On Computers. 60: 1233-1245. DOI: 10.1109/Tc.2011.101  1
2011 Park J, Abraham JA. A fast, accurate and simple critical path monitor for improving energy-delay product in DVS systems Proceedings of the International Symposium On Low Power Electronics and Design. 391-396. DOI: 10.1109/ISLPED.2011.5993672  1
2011 Dasnurkar SD, Abraham JA. Arbitrary waveform generator response shaping method to enable ADC linearity testing on Very Low Cost automatic test equipment Proceedings - 2011 Ieee 17th International Mixed-Signals, Sensors and Systems Test Workshop, Ims3tw 2011. 67-71. DOI: 10.1109/IMS3TW.2011.18  1
2011 Jang EJ, Chung J, Gattiker A, Nassif S, Abraham JA. Post-silicon timing validation method using path delay measurements Proceedings of the Asian Test Symposium. 232-237. DOI: 10.1109/ATS.2011.32  1
2011 Kim H, Abraham JA. On-chip programmable dual-capture for double data rate interface timing test Proceedings of the Asian Test Symposium. 15-20. DOI: 10.1109/ATS.2011.31  1
2011 Wu TY, Hu SH, Abraham JA. Robust power gating reactivation by dynamic wakeup sequence throttling Proceedings of the Asia and South Pacific Design Automation Conference, Asp-Dac. 615-620. DOI: 10.1109/ASPDAC.2011.5722263  1
2011 Kim J, Lee J, Abraham JA. System accuracy estimation of SRAM-based device authentication Proceedings of the Asia and South Pacific Design Automation Conference, Asp-Dac. 37-42. DOI: 10.1109/ASPDAC.2011.5722216  1
2011 Abraham JA. Recent advances in navigation-assisted musculoskeletal tumor resection Current Orthopaedic Practice. 22: 297-302. DOI: 10.1097/BCO.0b013e318221b1a3  0.4
2011 Park J, Shin H, Abraham JA. Pseudorandom test of nonlinear analog and mixed-signal circuits based on a volterra series model Journal of Electronic Testing: Theory and Applications (Jetta). 27: 321-334. DOI: 10.1007/S10836-011-5227-6  1
2011 Han K, Park J, Lee JW, Chung J, Byun E, Woo CJ, Oh S, Abraham JA. Off-chip Skew Measurement and Compensation Module (SMCM) design for built-off test chip Journal of Electronic Testing: Theory and Applications (Jetta). 27: 429-439. DOI: 10.1007/S10836-011-5213-Z  1
2010 Elco CP, Mariño-Enríquez A, Abraham JA, Cin PD, Hornick JL. Hybrid myxoinflammatory fibroblastic sarcoma/hemosiderotic fibrolipomatous tumor: Report of a case providing further evidence for a pathogenetic link American Journal of Surgical Pathology. 34: 1723-1727. PMID 20871391 DOI: 10.1097/PAS.0b013e3181f17d51  0.4
2010 Abraham JA, Baldini EH, Butrynski JE. Management of adult soft-tissue sarcoma of the extremities and trunk Expert Review of Anticancer Therapy. 10: 233-248. PMID 20131999 DOI: 10.1586/ERA.09.193  0.4
2010 Lee JW, Chun JH, Abraham JA. A delay measurement method using a shrinking clock signal Proceedings of the Acm Great Lakes Symposium On Vlsi, Glsvlsi. 139-142. DOI: 10.1145/1785481.1785515  1
2010 Chung J, Park J, Abraham JA, Byun E, Woo CJ. Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate Proceedings of the Ieee Vlsi Test Symposium. 33-38. DOI: 10.1109/VTS.2010.5469625  1
2010 Zeidan MA, Banerjee G, Gharpurey R, Abraham JA. Multitone digital signal based test for RF receivers Proceedings of the Ieee Vlsi Test Symposium. 343-348. DOI: 10.1109/VTS.2010.5469537  1
2010 Wu TY, Sambamurthy S, Abraham JA. Estimation of maximum application-level power supply noise Proceedings - Ieee International Soc Conference, Socc 2010. 213-218. DOI: 10.1109/SOCC.2010.5784738  1
2010 Abdulla SS, Nam H, Swartzlander EE, Abraham JA. High speed recursion-free CORDIC architecture Proceedings - Ieee International Soc Conference, Socc 2010. 65-70. DOI: 10.1109/SOCC.2010.5784666  1
2010 Dasnurkar SD, Abraham JA. Real-time dynamic hybrid BiST solution for very-low-cost ATE production testing of A/D converters with controlled DPPM Proceedings of the 11th International Symposium On Quality Electronic Design, Isqed 2010. 562-569. DOI: 10.1109/ISQED.2010.5450520  1
2010 Dasnurkar SD, Abraham JA. PLL lock time prediction and parametric testing by lock waveform characterization Proceedings of the 2010 Ieee 16th International Mixed-Signals, Sensors and Systems Test Workshop, Ims3tw 2010. DOI: 10.1109/IMS3TW.2010.5503002  1
2010 Kim J, Lee J, Abraham JA. Toward reliable SRAM-based device identification Proceedings - Ieee International Conference On Computer Design: Vlsi in Computers and Processors. 313-320. DOI: 10.1109/ICCD.2010.5647724  1
2010 Dasnurkar SD, Abraham JA. Calibration-enabled scalable built-in current sensor compatible with Very Low Cost ATE 2010 15th Ieee European Test Symposium, Ets'10. 119-124. DOI: 10.1109/ETSYM.2010.5512770  1
2010 Kim H, Chung J, Abraham JA, Byun E, Woo CJ. A Built-in Self-Test scheme for high speed I/O using cycle-by-cycle edge control 2010 15th Ieee European Test Symposium, Ets'10. 145-150. DOI: 10.1109/ETSYM.2010.5512766  1
2010 Park J, Lee JW, Chung J, Han K, Abraham JA, Byun E, Woo CJ, Oh S. At-speed test of high-speed DUT using Built-off Test Interface Proceedings of the Asian Test Symposium. 269-274. DOI: 10.1109/ATS.2010.54  1
2010 Kim H, Abraham JA. A low cost built-in self-test circuit for high-speed source synchronous memory interfaces Proceedings of the Asian Test Symposium. 123-128. DOI: 10.1109/ATS.2010.30  1
2010 Chun JH, Lee JW, Abraham JA. A novel characterization technique for high speed I/O mixed signal circuit components using random jitter injection Proceedings of the Asia and South Pacific Design Automation Conference, Asp-Dac. 312-317. DOI: 10.1109/ASPDAC.2010.5419875  1
2010 Datta R, Sebastine A, Raghunathan A, Carpenter G, Nowka K, Abraham JA. On-chip delay measurement based response analysis for timing characterization Journal of Electronic Testing: Theory and Applications (Jetta). 26: 599-619. DOI: 10.1007/S10836-010-5188-1  1
2010 Shin H, Park J, Abraham JA. Spectral prediction for specification-based loopback test of embedded mixed-signal circuits Journal of Electronic Testing: Theory and Applications (Jetta). 26: 73-86. DOI: 10.1007/S10836-009-5136-0  1
2009 Kaufman AM, Abraham JA, Kattapuram SV, Hornicek FJ. Orthopaedic • Radiology • Pathology Conference: Chronic multifocal chest and leg pain in a 34-year-old woman Clinical Orthopaedics and Related Research. 467: 1112-1117. PMID 18810567 DOI: 10.1007/S11999-008-0516-9  0.4
2009 Viswanath V, Vasudevan S, Abraham JA. Dedicated rewriting: Automatic verification of low power transformations in Register Transfer Level Journal of Low Power Electronics. 5: 339-353. DOI: 10.1166/Jolpe.2009.1034  1
2009 Chung J, Abraham JA. Recursive path selection for delay fault testing Proceedings of the Ieee Vlsi Test Symposium. 65-70. DOI: 10.1109/VTS.2009.50  1
2009 Zhang C, Gharpurey R, Abraham JA. On-line calibration and power optimization of RF systems using a built-in detector Proceedings of the Ieee Vlsi Test Symposium. 285-290. DOI: 10.1109/VTS.2009.23  1
2009 Viswanath V, Vasudevan S, Abraham JA. Dedicated rewriting: Automatic verification of low power transformations in RTL Proceedings: 22nd International Conference On Vlsi Design - Held Jointly With 7th International Conference On Embedded Systems. 77-82. DOI: 10.1109/VLSI.Design.2009.85  1
2009 Sundareswaran S, Abraham JA, Panda R, Ardelea A. Characterization of standard cells for intra-cell mismatch variations Ieee Transactions On Semiconductor Manufacturing. 22: 40-49. DOI: 10.1109/Tsm.2008.2011666  1
2009 Sambamurthy S, Gurumurthy S, Vemu R, Abraham JA. Functionally valid gate-level peak power estimation for processors Proceedings of the 10th International Symposium On Quality Electronic Design, Isqed 2009. 753-758. DOI: 10.1109/ISQED.2009.4810387  1
2009 Sundareswaran S, Abraham JA, Panda R, Zhang Y, Mittal A. Characterization of Sequential Cells for Constraint Sensitivities Proceedings of the 10th International Symposium On Quality Electronic Design, Isqed 2009. 74-79. DOI: 10.1109/ISQED.2009.4810272  1
2009 Wu TY, Gharahi S, Abraham JA. An area efficient on-chip static IR drop detector/evaluator Proceedings - Ieee International Symposium On Circuits and Systems. 2009-2012. DOI: 10.1109/ISCAS.2009.5118186  1
2009 Dasnurkar S, Abraham JA. Hybrid BiST solution for analog to digital converters with low-cost automatic test equipment compatibility Proceedings - Ieee International Symposium On Circuits and Systems. 9-12. DOI: 10.1109/ISCAS.2009.5117672  1
2009 Hu SH, Abraham JA. Error detection in 2-D discrete wavelet lifting transforms 2009 15th Ieee International On-Line Testing Symposium, Iolts 2009. 170-175. DOI: 10.1109/IOLTS.2009.5196003  1
2009 Dasnurkar SD, Abraham JA. Vector based analog to digital converter sequential testing methodology to minimize ATE memory and analysis requirements 2009 Ieee 15th International Mixed-Signals, Sensors, and Systems Test Workshop, Ims3tw '09. DOI: 10.1109/IMS3TW.2009.5158697  1
2009 Park J, Madhavapeddi S, Paglieri A, Barr C, Abraham JA. Defect-based analog fault coverage analysis using mixed-mode fault simulation 2009 Ieee 15th International Mixed-Signals, Sensors, and Systems Test Workshop, Ims3tw '09. DOI: 10.1109/IMS3TW.2009.5158688  1
2009 Abdullah SS, Nam H, McDermott M, Abraham JA. A high throughput FFT processor with no multipliers Proceedings - Ieee International Conference On Computer Design: Vlsi in Computers and Processors. 485-490. DOI: 10.1109/ICCD.2009.5413113  1
2009 Han K, Park J, Lee JW, Abraham JA, Byun E, Woo CJ, Oh S. Low-complexity off-chip skew measurement and compensation module (SMCM) design for built-off test chip Proceedings of the 14th Ieee European Test Symposium, Ets 2009. 129-134. DOI: 10.1109/ETS.2009.20  1
2009 Hu SH, Wu TY, Abraham JA. SNR-aware error detection for low-power discrete wavelet lifting transform in JPEG 2000 Proceedings - Ieee International Symposium On Defect and Fault Tolerance in Vlsi Systems. 136-144. DOI: 10.1109/DFT.2009.17  1
2009 Park J, Chung J, Abraham JA. LFSR-based performance characterization of nonlinear analog and mixed-signal circuits Proceedings of the Asian Test Symposium. 373-378. DOI: 10.1109/ATS.2009.66  1
2009 Lee JW, Chun JH, Abraham JA. A random jitter RMS estimation technique for BIST applications Proceedings of the Asian Test Symposium. 9-14. DOI: 10.1109/ATS.2009.38  1
2009 Tayade R, Abraham JA. Critical path selection for delay test considering coupling noise Proceedings of the 14th Ieee European Test Symposium, Ets 2009. 163-168. DOI: 10.1007/S10836-009-5105-7  1
2009 Tayade R, Abraham JA. Critical path selection for delay testing considering coupling noise Journal of Electronic Testing: Theory and Applications (Jetta). 25: 213-223. DOI: 10.1007/s10836-009-5105-7  1
2009 Chung J, Abraham JA. A hierarchy of subgraphs underlying a timing graph and its use in capturing topological Correlation in SSTA Ieee/Acm International Conference On Computer-Aided Design, Digest of Technical Papers, Iccad. 321-327.  1
2008 Gurumurthy S, Vemu R, Abraham JA, Natarajan S. On efficient generation of instruction sequences to test for delay defects in a processor Proceedings of the Acm Great Lakes Symposium On Vlsi, Glsvlsi. 279-284. DOI: 10.1145/1366110.1366178  1
2008 Dou Q, Abraham JA. Low-cost test of timing mismatch among time-interleaved A/D converters in high-speed communication systems Proceedings of the Ieee Vlsi Test Symposium. 3-8. DOI: 10.1109/VTS.2008.57  1
2008 Zhang C, Gharpurey R, Abraham JA. Low cost RF receiver parameter measurement with on-chip amplitude detectors Proceedings of the Ieee Vlsi Test Symposium. 203-208. DOI: 10.1109/VTS.2008.56  1
2008 Park J, Shin H, Abraham JA. Parallel loopback test of mixed-signal circuits Proceedings of the Ieee Vlsi Test Symposium. 309-316. DOI: 10.1109/VTS.2008.53  1
2008 Sambamurthy S, Abraham JA, Tupuri RS. A robust top-down dynamic power estimation methodology for delay constrained register transfer level sequential circuits Proceedings of the Ieee International Frequency Control Symposium and Exposition. 521-526. DOI: 10.1109/VLSI.2008.56  1
2008 Tayade R, Abraham JA. On-chip programmable capture for accurate path delay test and characterization Proceedings - International Test Conference. DOI: 10.1109/TEST.2008.4700564  1
2008 Vemu R, Gurumurthy S, Abraham JA. ACCE: Automatic correction of control-flow errors Proceedings - International Test Conference. DOI: 10.1109/TEST.2007.4437639  1
2008 Sundareswaran S, Nechanicka L, Panda R, Gavrilov S, Solovyev R, Abraham JA. A timing methodology considering within-die clock skew variations 2008 Ieee International Soc Conference, Socc. 351-356. DOI: 10.1109/SOCC.2008.4641543  1
2008 Yang Y, Sculley T, Abraham J. A Single-Die 124 dB Stereo Audio Delta-Sigma ADC With 111 dB THD Ieee Journal of Solid-State Circuits. 43: 1657-1665. DOI: 10.1109/Jssc.2008.923731  0.72
2008 Vemu R, Abraham JA. Budget-dependent control-flow error detection Proceedings - 14th Ieee International On-Line Testing Symposium, Iolts 2008. 73-78. DOI: 10.1109/IOLTS.2008.52  1
2008 Dou Q, Abraham JA. Jitter decomposition in high-speed communication systems Proceedings - 13th Ieee European Test Symposium, Ets 2008. 157-162. DOI: 10.1109/ETS.2008.35  1
2008 Zhang C, Abraham JA, Hassibi A. A 6-bit 300-MS/s 2.7D1W ADC based on linear voltage controlled delay line Proceedings of the 2008 Ieee Dallas Circuits and Systems Workshop On System-On-Chip, Soc: Design, Applications, Integration, and Software, Dcas 2008. DOI: 10.1109/DCAS.2008.4695930  1
2008 Abraham JA. Implications of technology trends on system dependability Proceedings -Design, Automation and Test in Europe, Date. 940. DOI: 10.1109/DATE.2008.4484800  1
2008 Vemu R, Jas A, Abraham JA, Patil S, Galivanche R. A low-cost concurrent error detection technique for processor control logic Proceedings -Design, Automation and Test in Europe, Date. 897-902. DOI: 10.1109/DATE.2008.4484788  1
2008 Tayade R, Abraham J. Small-delay defect detection in the presence of process variations Microelectronics Journal. 39: 1093-1100. DOI: 10.1016/J.Mejo.2008.01.003  0.72
2008 Datta R, Gupta R, Sebastine A, Abraham JA, D'Abreu M. Controllability of static CMOS circuits for timing characterization Journal of Electronic Testing: Theory and Applications (Jetta). 24: 481-496. DOI: 10.1007/S10836-007-5059-6  1
2008 Datta R, Abraham JA, Utku Diril A, Chatterjee A, Nowka KJ. Performance-optimized design for parametric reliability Journal of Electronic Testing: Theory and Applications (Jetta). 24: 129-141. DOI: 10.1007/S10836-007-5001-Y  1
2008 Vasudevan S, Viswanath V, Abraham JA, Tu J. Sequential equivalence checking between system level and RTL descriptions Design Automation For Embedded Systems. 12: 377-396. DOI: 10.1007/S10617-008-9033-Z  1
2007 Abraham JA, Hornicek FJ, Kaufman AM, Harmon DC, Springfield DS, Raskin KA, Mankin HJ, Kirsch DG, Rosenberg AE, Nielsen GP, Desphpande V, Suit HD, DeLaney TF, Yoon SS. Treatment and outcome of 82 patients with angiosarcoma. Annals of Surgical Oncology. 14: 1953-67. PMID 17356953 DOI: 10.1245/S10434-006-9335-Y  0.4
2007 Kim B, Fu Z, Abraham JA. Transformer-coupled loopback test for differential mixed-signal specifications Proceedings of the Ieee Vlsi Test Symposium. 291-296. DOI: 10.1109/VTS.2007.82  1
2007 Ou JC, Saab DG, Abraham JA. HDL program slicing to reduce bounded model checking search overhead Proceedings - International Test Conference. DOI: 10.1109/TEST.2006.297665  1
2007 Vasudevan S, Viswanath V, Sumners RW, Abraham JA. Automatic verification of arithmetic circuits in RTL using stepwise refinement of term rewriting systems Ieee Transactions On Computers. 56: 1401-1414. DOI: 10.1109/Tc.2007.1073  1
2007 Vasudevan S, Emerson EA, Abraham JA. Improved verification of hardware designs through antecedent conditioned slicing International Journal On Software Tools For Technology Transfer. 9: 89-101. DOI: 10.1007/S10009-006-0022-X  1
2005 Vasudevan S, Emerson EA, Abraham JA. Efficient model checking of hardware using conditioned slicing Electronic Notes in Theoretical Computer Science. 128: 279-294. DOI: 10.1016/J.Entcs.2005.04.017  1
2004 Roh J, Abraham JA. Subband Filtering for Time and Frequency Analysis of Mixed-Signal Circuit Testing Ieee Transactions On Instrumentation and Measurement. 53: 602-611. DOI: 10.1109/Tim.2003.820494  1
2003 Hwang S, Abraham JA. Test data compression and test time reduction using an embedded microprocessor Ieee Transactions On Very Large Scale Integration Systems. 11: 853-862. DOI: 10.1109/Tvlsi.2003.817140  1
2003 Roh J, Abraham JA. A comprehensive signature analysis scheme for oscillation-test Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 22: 1409-1423. DOI: 10.1109/Tcad.2003.818133  1
2003 Vedula VM, Abraham JA, Bhadra J, Tupuri R. A hierarchical test generation approach using program slicing techniques on hardware description languages Journal of Electronic Testing: Theory and Applications (Jetta). 19: 149-160. DOI: 10.1023/A:1022885523034  1
2001 Krishnamurthy N, Abadir MS, Martin AK, Abraham JA. Design and development paradigm for industrial formal verification CAD tools Ieee Design & Test of Computers. 18: 26-35. DOI: 10.1109/54.936246  0.6
2001 Bhadra J, Martin A, Abraham JA, Abadir MS. Using Abstract Specifications to Verify PowerPCTM Custom Memories by Symbolic Trajectory Evaluation Lecture Notes in Computer Science. 386-402. DOI: 10.1007/3-540-44798-9_30  1
2000 Krishnamurthy N, Martin AK, Abadir MS, Abraham JA. Validating PowerPC microprocessor custom memories Ieee Design & Test of Computers. 17: 61-76. DOI: 10.1109/54.895007  0.6
1999 Alkhalifa Z, Nair VSS, Krishnamurthy N, Abraham JA. Design and evaluation of system-level checks for on-line control flow error detection Ieee Transactions On Parallel and Distributed Systems. 10: 627-641. DOI: 10.1109/71.774911  0.6
1999 Mukherjee R, Jain J, Takayama K, Fujita M, Abraham JA, Fussell DS. An efficient filter-based approach for combinational verification Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 18: 1542-1557. DOI: 10.1109/43.806801  0.4
1998 Nagi N, Chatterjee A, Yoon H, Abraham JA. Signature analysis for analog and mixed-signal circuit test response compaction Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 17: 540-546. DOI: 10.1109/43.703834  1
1997 Jain J, Bitner J, Abadir MS, Abraham JA, Fussell DS. Indexed BDDs: Algorithmic advances in techniques to represent and verify Boolean functions Ieee Transactions On Computers. 46: 1230-1245. DOI: 10.1109/12.644298  1
1996 Balivada A, Chen J, Abraham J. Analog testing with time response parameters Ieee Design & Test of Computers. 13: 18-25. DOI: 10.1109/54.500197  0.72
1996 Saab DG, Saab YG, Abraham JA. Automatic test vector cultivation for sequential VLSI circuits using genetic algorithms Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 15: 1278-1285. DOI: 10.1109/43.541447  1
1996 Balivada A, Zheng H, Nagi N, Chatterjee A, Abraham JA. A unified approach for fault simulation of linear mixed-signal circuits Journal of Electronic Testing. 9: 29-41. DOI: 10.1007/Bf00137563  1
1994 Chang H, Abraham JA. An efficient critical path tracing algorithm for sequential circuits Microprocessing and Microprogramming. 40: 913-916. DOI: 10.1016/0165-6074(94)90068-X  0.56
1993 Narain P, Saab DG, Kunda RP, Abraham JA. A High-Level Approach to Test Generation Ieee Transactions On Circuits and Systems I: Fundamental Theory and Applications. 40: 483-492. DOI: 10.1109/81.257304  1
1993 Mueller-Thuns RB, Saab DG, Damianc RF, Abraham JA. Benchmarking Parallel Processing Platforms: An Applications Perspective Ieee Transactions On Parallel and Distributed Systems. 4: 947-954. DOI: 10.1109/71.238628  1
1993 Mueller-Thuns RB, Saab DG, Damiano RF, Abraham JA. VLSI Logic and Fault Simulation on General-Purpose Parallel Computers Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 12: 446-460. DOI: 10.1109/43.215006  1
1993 Nagi N, Chatterjee A, Abraham JA. Fault simulation of linear analog circuits Journal of Electronic Testing. 4: 345-360. DOI: 10.1007/Bf00972159  1
1992 Niermann TM, Roy RK, Patel JH, Abraham JA. Test Compaction for Sequential Circuits Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 11: 260-267. DOI: 10.1109/43.124404  1
1991 Chatterjee A, Roy RK, Abraham JA, Patel JH. Efficient testing strategies for bit- and digit-serial arrays used in digital signal processors Digital Signal Processing. 1: 231-244. DOI: 10.1016/1051-2004(91)90115-2  1
1991 Chatterjee A, Abraham JA. Test generation, design-for-testability and built-in self-test for arithmetic units based on graph labeling Journal of Electronic Testing. 2: 351-372. DOI: 10.1007/Bf00135230  1
1990 Mazumder P, Patel JH, Abraham JA. A Reconfigurable Parallel Signature Analyzer for Concurrent Error Correction in DRAM Ieee Journal of Solid-State Circuits. 25: 866-870. DOI: 10.1109/4.102687  1
1990 Saab DG, Mueller-Thuns RB, Blaauw D, Rahmeh JT, Abraham JA. Hierarchical multi-level fault simulation of large systems Journal of Electronic Testing. 1: 139-149. DOI: 10.1007/Bf00137390  1
1987 Fuchs WK, Wu K, Abraham JA. Companson and Diagnosis of Large Replicated Files Ieee Transactions On Software Engineering. 13: 15-22. DOI: 10.1109/Tse.1987.232561  0.4
1987 Chatterjee A, Abraham JA. On the C-Testability of Generalized Counters Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 6: 713-726. DOI: 10.1109/Tcad.1987.1270317  1
1987 Fuchs WK, Chen C-R, Abraham JA. Concurrent error detection in highly structured logic arrays Ieee Journal of Solid-State Circuits. 22: 583-594. DOI: 10.1109/Jssc.1987.1052776  0.4
1986 Shih H, Rahmeh JT, Abraham JA. FAUST: An MOS Fault Simulator with Timing Information Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 5: 557-563. DOI: 10.1109/Tcad.1986.1270226  0.36
1985 Jha NK, Abraham JA. Design of Testable CMOS Logic Circuits Under Arbitrary Delays Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 4: 264-269. DOI: 10.1109/Tcad.1985.1270122  1
1984 Banerjee P, Abraham JA. Characterization and Testing of Physical Failures in MOS Logic Circuits Ieee Design & Test of Computers. 1: 76-86. DOI: 10.1109/Mdt.1984.5005655  0.36
1983 Abraham JA, Davidson ES, Patel JH. Memory system design for tolerating single event upsets Ieee Transactions On Nuclear Science. 30: 4339-4344. DOI: 10.1109/Tns.1983.4333134  1
Show low-probability matches.