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Polina V. Burmistrova, Ph.D. - Publications

Affiliations: 
2012 Electrical and Computer Engineering Purdue University, West Lafayette, IN, United States 
Area:
Electronics and Electrical Engineering, Materials Science Engineering
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7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2015 Burmistrova PV, Zakharov DN, Favaloro T, Mohammed A, Stach EA, Shakouri A, Sands TD. Effect of deposition pressure on the microstructure and thermoelectric properties of epitaxial ScN(001) thin films sputtered onto MgO(001) substrates Journal of Materials Research. 30: 626-634. DOI: 10.1557/Jmr.2015.30  0.44
2014 Bo SH, Veith GM, Saccomanno MR, Huang H, Burmistrova PV, Malingowski AC, Sacci RL, Kittilstved KR, Grey CP, Khalifah PG. Thin-film and bulk investigations of LiCoBO₃ as a Li-ion battery cathode. Acs Applied Materials & Interfaces. 6: 10840-8. PMID 24809458 DOI: 10.1021/Am500860A  0.436
2013 Burmistrova PV, Maassen J, Favaloro T, Saha B, Salamat S, Rui Koh Y, Lundstrom MS, Shakouri A, Sands TD. Thermoelectric properties of epitaxial ScN films deposited by reactive magnetron sputtering onto MgO(001) substrates Journal of Applied Physics. 113. DOI: 10.1063/1.4801886  0.438
2003 Zhigalina OM, Burmistrova PV, Vasiliev AL, Roddatis VV, Sigov AS, Vorotilov KA. Microstructure of PZT capacitor structures Ferroelectrics. 286: 311-320. DOI: 10.1080/00150190390206509  0.421
2003 Burmistrova PV, Sigov AS, Vorotilov KA, Zakharov DN, Zhigalina OM. Microstructure and dielectric properties of (Ba0.7Sr 0.3)TiO3 thin films Ferroelectrics. 286: 261-265. DOI: 10.1080/00150190390206455  0.579
2002 Burmistrova PV, Sigov AS, Vasiliev AL, Vorotilov KA, Zhigalina OM. Effect of lead content on the microstructure and electrical properties of sol-gel PZT thin films Ferroelectrics. 271: 51-56. DOI: 10.1080/00150190211506  0.609
2001 Zhigalina OM, Burmistrova PV, Vasil'ev AL, Roddatis VV, Vorotilov KA, Sigov AS. Electron Microscopy Study of Ferroelectric Memory Based on Si-SiO2-Ti-Pt-PZT Multilayer Structure Russian Microelectronics. 30: 175-186. DOI: 10.1023/A:1011314710094  0.545
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