Year |
Citation |
Score |
2017 |
Garbrecht M, Saha B, Schroeder JL, Hultman L, Sands TD. Dislocation-pipe diffusion in nitride superlattices observed in direct atomic resolution. Scientific Reports. 7: 46092. PMID 28382949 DOI: 10.1038/Srep46092 |
0.527 |
|
2016 |
Saha B, Koh YR, Comparan J, Sadasivam S, Schroeder JL, Garbrecht M, Mohammed A, Birch J, Fisher T, Shakouri A, Sands TD. Cross-plane thermal conductivity of (Ti,W)N/(Al,Sc)N metal/semiconductor superlattices Physical Review B - Condensed Matter and Materials Physics. 93. DOI: 10.1103/Physrevb.93.045311 |
0.572 |
|
2016 |
Garbrecht M, Schroeder JL, Hultman L, Birch J, Saha B, Sands TD. Microstructural evolution and thermal stability of HfN/ScN, ZrN/ScN, and Hf0.5Zr0.5N/ScN metal/semiconductor superlattices Journal of Materials Science. 1-9. DOI: 10.1007/S10853-016-0102-6 |
0.617 |
|
2015 |
Schroeder JL, Thomson W, Howard B, Schell N, Näslund LÅ, Rogström L, Johansson-Jõesaar MP, Ghafoor N, Odén M, Nothnagel E, Shepard A, Greer J, Birch J. Industry-relevant magnetron sputtering and cathodic arc ultra-high vacuum deposition system for in situ x-ray diffraction studies of thin film growth using high energy synchrotron radiation. The Review of Scientific Instruments. 86: 095113. PMID 26429486 DOI: 10.1063/1.4930243 |
0.332 |
|
2015 |
Rogström L, Ghafoor N, Schroeder J, Schell N, Birch J, Ahlgren M, Odén M. Thermal stability of wurtzite Zr1-xAlxN coatings studied by in situ high-energy x-ray diffraction during annealing Journal of Applied Physics. 118. DOI: 10.1063/1.4927156 |
0.385 |
|
2015 |
Schroeder JL, Ingason AS, Rosén J, Birch J. Beware of poor-quality MgO substrates: A study of MgO substrate quality and its effect on thin film quality Journal of Crystal Growth. 420: 22-31. DOI: 10.1016/J.Jcrysgro.2015.03.010 |
0.33 |
|
2015 |
Schroeder JL, Saha B, Garbrecht M, Schell N, Sands TD, Birch J. Thermal stability of epitaxial cubic-TiN/(Al,Sc)N metal/semiconductor superlattices Journal of Materials Science. DOI: 10.1007/S10853-015-8884-5 |
0.577 |
|
2015 |
Paul B, Schroeder JL, Kerdsongpanya S, Van Nong N, Schell N, Ostach D, Lu J, Birch J, Eklund P. Mechanism of Formation of the Thermoelectric Layered Cobaltate Ca3Co4O9 by Annealing of CaO–CoO Thin Films Advanced Electronic Materials. 1. DOI: 10.1002/Aelm.201400022 |
0.423 |
|
2014 |
Schroeder JL, Ewoldt DA, Amatya R, Ram RJ, Shakouri A, Sands TD. Bulk-like laminated nitride Metal/Semiconductor superlattices for thermoelectric devices Journal of Microelectromechanical Systems. 23: 672-680. DOI: 10.1109/Jmems.2013.2282743 |
0.684 |
|
2014 |
Saha B, Lawrence SK, Schroeder JL, Birch J, Bahr DF, Sands TD. Enhanced hardness in epitaxial TiAlScN alloy thin films and rocksalt TiN/(Al,Sc)N superlattices Applied Physics Letters. 105. DOI: 10.1063/1.4898067 |
0.562 |
|
2012 |
Naik GV, Schroeder JL, Ni X, Kildishev AV, Sands TD, Boltasseva A. Titanium nitride as a plasmonic material for visible and near-infrared wavelengths Optical Materials Express. 2: 478-489. DOI: 10.1364/Ome.2.000478 |
0.459 |
|
2010 |
Zide JMO, Lu H, Onishi T, Schroeder JL, Bowers JE, Kobayashi NP, Sands TD, Gossard AC, Shakouri A. Novel metal/semiconductor nanocomposite and superlattice materials and devices for thermoelectrics Proceedings of Spie - the International Society For Optical Engineering. 7683. DOI: 10.1117/12.850058 |
0.516 |
|
2009 |
Biswas KG, El Matbouly H, Rawat V, Schroeder JL, Sands TD. Self-supporting nanowire arrays templated in sacrificial branched porous anodic alumina for thermoelectric devices Applied Physics Letters. 95. DOI: 10.1063/1.3207756 |
0.612 |
|
2008 |
Oliver MH, Schroeder JL, Ewoldt DA, Wildeson IH, Rawat V, Colby R, Cantwell PR, Stach EA, Sands TD. Organometallic vapor phase epitaxial growth of GaN on ZrNAlNSi substrates Applied Physics Letters. 93. DOI: 10.1063/1.2953541 |
0.553 |
|
2008 |
Kim S, Schroeder JL, Sands TD. Pulsed selective epitaxial growth of hexagonal GaN microprisms Journal of Crystal Growth. 310: 1107-1111. DOI: 10.1016/J.Jcrysgro.2007.12.014 |
0.641 |
|
2003 |
Jang HW, Kim JK, Lee JL, Schroeder J, Sands T. Electrical properties of metal contacts on laser-irradiated n-type GaN Applied Physics Letters. 82: 580-582. DOI: 10.1063/1.1537515 |
0.573 |
|
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