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Korhan Demirkan, Ph.D. - Publications

Affiliations: 
2008 Department of Materials Science and Engineering University of Delaware, Newark, DE, United States 
Area:
Materials Science Engineering, Electronics and Electrical Engineering, Physical Chemistry
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8 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2012 Hannigan K, Reid M, Collins MN, Dalton E, Xu C, Wright B, Demirkan K, Opila RL, Reents WD, Franey JP, Fleming DA, Punch J. Corrosion of RoHS-compliant surface finishes in corrosive mixed flowing gas environments Journal of Electronic Materials. 41: 611-623. DOI: 10.1007/S11664-011-1799-2  0.542
2010 Demirkan K, Derkits GE, Fleming DA, Franey JP, Hannigan K, Opila RL, Punch J, Reents WD, Reid M, Wright B, Xu C. Corrosion of Cu under highly corrosive environments Journal of the Electrochemical Society. 157. DOI: 10.1149/1.3258288  0.45
2008 Demirkan K, Mathew A, Weiland C, Yao Y, Rawlett AM, Tour JM, Opila RL. Energy level alignment at organic semiconductor/metal interfaces: effect of polar self-assembled monolayers at the interface. The Journal of Chemical Physics. 128: 074705. PMID 18298162 DOI: 10.1063/1.2832306  0.625
2008 Demirkan K, Mathew A, Weiland C, Reid M, Opila RL. Reactivity and morphology of vapor-deposited Al/polymer interfaces for organic semiconductor devices Journal of Applied Physics. 103. DOI: 10.1063/1.2837883  0.624
2008 Lu P, Demirkan K, Opila RL, Walker AV. Room-temperature chemical vapor deposition of aluminum and aluminum oxides on alkanethiolate self-assembled monolayers Journal of Physical Chemistry C. 112: 2091-2098. DOI: 10.1021/Jp077100C  0.575
2005 Mathew A, Demirkan K, Wang CG, Wilk GD, Watson DG, Opila RL. X-ray photoelectron spectroscopy of high-κ dielectrics Aip Conference Proceedings. 788: 85-91. DOI: 10.1063/1.2062943  0.583
2005 Mathew A, Demirkan K, Opila RL, Wang CG, Maes JW, Wilk G. Investigation of nitrided hafnium silicates for high-k dielectrics using photoelectron spectroscopy Proceedings - Electrochemical Society. 360-365.  0.556
2003 Demirkan K, Mathew A, Opila RL. Photoelectron spectroscopy investigation of high-k dielectrics Proceedings - Electrochemical Society. 22: 299-306.  0.61
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