Gerard M. Schmid, Ph.D. - Publications

Affiliations: 
2003 University of Texas at Austin, Austin, Texas, U.S.A. 
Area:
Chemical Engineering, Polymer Chemistry, Condensed Matter Physics

32/64 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2014 Farrell RA, Hosler ER, Schmid GM, Xu J, Preil ME, Rastogi V, Mohanty N, Kumar K, Cicoria MJ, Hetzer DR, Devilliers AJ. Manufacturability considerations for DSA Proceedings of Spie - the International Society For Optical Engineering. 9051. DOI: 10.1117/12.2048396  1
2010 Resnick DJ, Haase G, Singh L, Curran D, Schmid GM, Luo K, Brooks C, Selinidis K, Fretwell J, Sreenivasan SV. Inspection of imprint lithography patterns for semiconductor and patterned media Proceedings of Spie - the International Society For Optical Engineering. 7637. DOI: 10.1117/12.848391  1
2009 Schmid GM, Brooks C, Ye Z, Johnson S, LaBrake D, Sreenivasan SV, Resnick DJ. Jet and Flash Imprint Lithography for the fabrication of patterned media drives Proceedings of Spie - the International Society For Optical Engineering. 7488. DOI: 10.1117/12.833366  1
2009 Brooks C, Schmid GM, Miller M, Johnson S, Khusnatdinov N, Labrake D, Resniek DJ, Sreenivasan SV. Step and flash imprint lithography for manufacturing patterned media Proceedings of Spie - the International Society For Optical Engineering. 7271. DOI: 10.1117/12.815016  1
2008 Schmid GM, Khusnatdinov N, Brooks CB, LaBrake D, Thompson E, Resnick DJ, Owens J, Ford A, Sasaki S, Toyama N, Kurihara M, Hayashi N, Kobayashi H, Sato T, Nagarekawa O, et al. Controlling linewidth roughness in step and flash imprint lithography Proceedings of Spie - the International Society For Optical Engineering. 6792. DOI: 10.1117/12.798936  1
2008 Schmid GM, Khusnatdinov N, Brooks CB, LaBrake D, Thompson E, Resnick DJ. Linewidth roughness characterization in step and flash imprint lithography Proceedings of Spie - the International Society For Optical Engineering. 7028. DOI: 10.1117/12.796015  1
2008 Schmid GM, Khusnatdinov N, Brooks CB, Labrake D, Thompson E, Resnick DJ. Minimizing linewidth roughness for 22-nm node patterning with step-and-flash imprint lithography Proceedings of Spie - the International Society For Optical Engineering. 6921. DOI: 10.1117/12.772956  1
2008 Khusnatdinov N, Schmid GM, Brooks CB, LaBrake D, Resnick DJ, Hart MW, Gopalakrishnan K, Shenoy R, Jih R, Zhang Y, Sikorski E, Rothwell MB, Owens J, Ford A. Minimizing linewidth roughness in Step and Flash Imprint Lithography Microelectronic Engineering. 85: 856-860. DOI: 10.1016/j.mee.2008.01.041  1
2007 Schmid GM, Resnick DJ, Fettig R, Edinger K, Young SR, Dauksher WJ. Electron beam directed repair of fused silica imprint templates Proceedings of Spie - the International Society For Optical Engineering. 6533. DOI: 10.1117/12.736921  1
2007 Schmid GM, Thompson E, Stacey N, Resnick DJ, Olynick DL, Anderson EH. Toward 22 nm for unit process development using step and flash imprint lithography Proceedings of Spie - the International Society For Optical Engineering. 6517. DOI: 10.1117/12.718155  1
2007 Schmid GM, Thompson E, Stacey N, Resnick DJ, Olynick DL, Anderson EH. Template fabrication for the 32 nm node and beyond Microelectronic Engineering. 84: 853-859. DOI: 10.1016/j.mee.2007.01.038  1
2006 Schmid GM, Stewart MD, Wetzel J, Palmieri F, Hao J, Nishimura Y, Jen K, Kim EK, Resnick DJ, Liddle JA, Willson CG. Implementation of an imprint damascene process for interconnect fabrication Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 24: 1283-1291. DOI: 10.1116/1.2197508  1
2006 Resnick DJ, Thompson E, Myron LJ, Schmid GM. A template infrastructure for step-and-flash imprint lithography Microlithography World. 15.  1
2005 Stewart MD, Wetzel JT, Schmid GM, Palmieri F, Thompson E, Kim EK, Wang D, Sotodeh K, Jen K, Johnson SC, Hao J, Dickey MD, Nishimura Y, Laine RM, Resnick DJ, et al. Direct imprinting of dielectric materials for dual damascene processing Progress in Biomedical Optics and Imaging - Proceedings of Spie. 5751: 210-218. DOI: 10.1117/12.599977  1
2005 Meiring JE, Michaelson TB, Jamieson AT, Schmid GM, Willson CG. Using mesoscale simulation to explore photoresist line edge roughness Progress in Biomedical Optics and Imaging - Proceedings of Spie. 5753: 350-360. DOI: 10.1117/12.599736  1
2005 Tsiartas PC, Schmid GM, Johnson HF, Stewart MD, Willson CG. Quantifying acid generation efficiency for photoresist applications Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 23: 224-228. DOI: 10.1116/1.1851537  1
2005 Stewart MD, Wetzel J, Palmieri F, Hao J, Schmid GM, Jen K, Nishimura Y, Willson CG. Interconnect patterning in a single step with multi-level nanoimprint lithography 2005 Proceedings - 22nd International Vlsi Multilevel Interconnection Conference, Vmic 2005. 497-502.  1
2004 Schmid GM, Stewart MD, Burns SD, Willson CG. Mesoscale Monte Carlo Simulation of Photoresist Processing Journal of the Electrochemical Society. 151: G155-G161. DOI: 10.1149/1.1637359  1
2004 Schmid GM, Stewart MD, Wang CY, Vogt BD, Prabhu VM, Lin EK, Willson CG. Resolution limitations in chemically amplified photoresist systems Proceedings of Spie - the International Society For Optical Engineering. 5376: 333-342. DOI: 10.1117/12.536656  1
2004 Burns RL, Johnson SC, Schmid GM, Kim EK, Dickey MD, Meiring J, Burns SD, Stacey NA, Willson CG, Convey D, Wei Y, Fejes P, Gehoski K, Mancini D, Nordquist K, et al. Mesoscale modeling for SFIL simulating polymerization kinetics and densification Proceedings of Spie - the International Society For Optical Engineering. 5374: 348-360. DOI: 10.1117/12.536216  1
2004 Schmid GM, Carpenter LE, Liddle JA. Nonaqueous development of silsesquioxane electron beam resist Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 22: 3497-3502. DOI: 10.1116/1.1825014  1
2004 Jones RL, Hu T, Lin EK, Wu WL, Goldfarb DL, Angelopoulos M, Trinque BC, Schmid GM, Stewart MD, Willson CG. Formation of deprotected fuzzy blobs in chemically amplified resists Journal of Polymer Science, Part B: Polymer Physics. 42: 3063-3069. DOI: 10.1002/polb.20168  1
2003 Stewart MD, Schmid GM, Goldfarb DL, Angelopoulos M, Willson CG. Diffusion induced line edge roughness Proceedings of Spie - the International Society For Optical Engineering. 5039: 415-422. DOI: 10.1117/12.483734  1
2002 Schmid GM, Burns SD, Stewart MD, Willson CG. Mesoscale simulation of positive tone chemically amplified photoresists Proceedings of Spie - the International Society For Optical Engineering. 4690: 381-390. DOI: 10.1117/12.474237  1
2002 Stewart MD, Becker DJ, Stachowiak TB, Schmid GM, Michaelson TB, Tran HV, Willson CG. Acid mobility in chemically amplified photoresists Proceedings of Spie - the International Society For Optical Engineering. 4690: 943-951. DOI: 10.1117/12.474168  1
2002 Stewart MD, Tran HV, Schmid GM, Stachowiak TB, Becker DJ, Willson CG. Acid catalyst mobility in resist resins Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 20: 2946-2952. DOI: 10.1116/1.1523027  1
2002 Schmid GM, Burns SD, Tsiartas PC, Willson CG. Electrostatic effects during dissolution of positive tone photoresists Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 20: 2913-2919. DOI: 10.1116/1.1521735  1
2002 Burns SD, Schmid GM, Tsiartas PC, Willson CG, Flanagin L. Advancements to the critical ionization dissolution model Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 20: 537-543. DOI: 10.1116/1.1450593  1
2002 Schmid GM, Stewart MD, Singh VK, Willson CG. Spatial distribution of reaction products in positive tone chemically amplified resists Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 20: 185-190. DOI: 10.1116/1.1431954  1
2001 Burns SD, Gardiner AB, Krukonis VJ, Wetmore PM, Lutkenhaus J, Schmid GM, Flanagin LW, Willson CG. Understanding nonlinear dissolution rates in photoresists Proceedings of Spie - the International Society For Optical Engineering. 4345: 37-49. DOI: 10.1117/12.436876  1
2001 Stewart MD, Schmid GM, Postnikov SV, Willson CG. Mechanistic understanding of line end shortening Proceedings of Spie - the International Society For Optical Engineering. 4345: 10-18. DOI: 10.1117/12.436844  1
2001 Schmid GM, Smith MD, Mack CA, Singh VK, Burns SD, Grant Willson C. Understanding molecular level effects during post exposure processing Proceedings of Spie - the International Society For Optical Engineering. 4345: 1037-1047. DOI: 10.1117/12.436829  1
Low-probability matches
2015 Brühlmann F, Schmid GM. How to measure the game experience? Analysis of the factor structure of two questionnaires Conference On Human Factors in Computing Systems - Proceedings. 18: 1181-1186. DOI: 10.1145/2702613.2732831  0.01
2015 Papetti S, Jarvelainen H, Schmid GM. Vibrotactile sensitivity in active finger pressing Ieee World Haptics Conference, Whc 2015. 457-462. DOI: 10.1109/WHC.2015.7177754  0.01
2007 Schmid GM, Meda P, Caille D, Wargent E, O'Dowd J, Hochstrasser DF, Cawthorne MA, Sanchez JC. Inhibition of insulin secretion by betagranin, an N-terminal chromogranin A fragment. The Journal of Biological Chemistry. 282: 12717-24. PMID 17289672 DOI: 10.1074/jbc.M700788200  0.01
2004 Schmid GM, Converset V, Walter N, Sennitt MV, Leung KY, Byers H, Ward M, Hochstrasser DF, Cawthorne MA, Sanchez JC. Effect of high-fat diet on the expression of proteins in muscle, adipose tissues, and liver of C57BL/6 mice. Proteomics. 4: 2270-82. PMID 15274121 DOI: 10.1002/pmic.200300810  0.01
1999 Flake JC, Rieger MM, Schmid GM, Kohl PA. Electrochemical etching of silicon in nonaqueous electrolytes containing hydrogen fluoride or fluoroborate Journal of the Electrochemical Society. 146: 1960-1965. DOI: 10.1149/1.1391873  0.01
1995 Schmid GM, Zanardi EM, Gomez Llórente JM. On new measures of reliability, stability and complexity in quantum mechanics Epl. 30: 451-456. DOI: 10.1209/0295-5075/30/8/002  0.01
1995 Schmid GM, Coy SL, Field RW, Silbey RJ. How robust are molecular properties? A stability criterion for eigenstates The Journal of Chemical Physics. 102: 337-345.  0.01
1994 Schmid GM, Coy S, Field RW, Silbey RJ. Duffing's oscillator and the normal to local mode transition in AB2 triatomic molecules Chemical Physics Letters. 219: 331-338. DOI: 10.1016/0009-2614(94)00115-4  0.01
1994 Schmid GM, Coy SL, Field RW, Silbey RJ. The normal to local mode transition in AB2 triatomic molecules: The susceptibility of eigenstates to symmetry breaking perturbations The Journal of Chemical Physics. 101: 869-875.  0.01
1986 Schmid GM, Atherton DR. VOLTAMMETRIC DETERMINATION OF PLATINUM FROM AQUEOUS SOLUTIONS AND FROM URINE Analytical Chemistry. 58: 1956-1959. PMID 3752518  0.01
1984 Everett KG, Walck SD, Schmid GM, Hren JJ. A field ion microscope - imaging atom probe study of the underpotential deposition of copper on platinum Surface Science. 145. DOI: 10.1016/0039-6028(84)90759-3  0.01
1984 Anderson CR, Schmid GM. The effect of adsorption of 4,7-diphenyl-1,10-phenanthroline on the polarization of 304 stainless steel Corrosion Science. 24: 825-830. DOI: 10.1016/0010-938X(84)90030-1  0.01
1982 Schmid GM. CATHODIC PROTECTION OF MILD STEEL IN FLOWING NATURAL SEA WATER Corrosion. 38: 233-234.  0.01
1981 Schmid GM, Holmes TA. Adsorption of Benzo-(f)-Quinoline on Gold and the Kinetics of the Quinone-Hydroquinone and the Lron(III)/Iron(II) Systems Journal of the Electrochemical Society. 128: 2582-2588. DOI: 10.1149/1.2127296  0.01
1980 Schmid GM, Huang HJ. Spectro-electrochemical studies of the inhibition effect of 4, 7-diphenyl -1, 10-phenanthroline on the corrosion of 304 stainless steel Corrosion Science. 20: 1041-1057. DOI: 10.1016/0010-938X(80)90083-9  0.01
1980 Curley-Fiorino ME, Schmid GM. The effect of the Cl- ion on the passive film on anodically polarized 304 stainless steel Corrosion Science. 20: 313-329. DOI: 10.1016/0010-938X(80)90002-5  0.01
1978 Everett KG, Drew LA, Ericson SJ, Schmid GM. The Fe(II)-Fe(III) and Hydroquinone-Quinone Reactions on Oxygen-Covered Rhodium Electrodes Journal of the Electrochemical Society. 125: 389-394. DOI: 10.1149/1.2131456  0.01
1973 Schmid GM, Bolger GW. Determination of gold in drugs and serum by use of anodic stripping voltammetry Clinical Chemistry. 19: 1002-1005. PMID 4200766  0.01
1971 Nitis GJ, Schmid GM. Differential capacitance and frequency dispersion on solid and liquid mercury in liquid ammonia Electrochimica Acta. 16: 463-470. DOI: 10.1016/0013-4686(71)85183-6  0.01
1970 Bonewitz RA, Schmid GM. Oxygen Adsorption on Gold and the Ce(III)/Ce(IV) Reaction Journal of the Electrochemical Society. 117: 1367-1372. DOI: 10.1149/1.2407322  0.01
1970 Gaur JN, Schmid GM. Electrochemical behavior of gold in acidic chloride solutions Journal of Electroanalytical Chemistry. 24: 279-286. DOI: 10.1016/S0022-0728(70)80152-8  0.01
1970 Schmid GM. Interfacial impedance and roughness of solid electrodes; gold in perchloric acid Electrochimica Acta. 15: 65-71. DOI: 10.1016/0013-4686(70)90008-3  0.01
1968 Schmid GM. A D-C Pulsed Bridge for Differential Capacity Measurements Journal of the Electrochemical Society. 115: 1033-1036. DOI: 10.1149/1.2410854  0.01
1967 Schmid GM. Hydrogen overvoltage on gold Electrochimica Acta. 12: 449-459.  0.01
1966 Goodrich JD, Schmid GM. Adsorption of Perchlorate Ions on Gold Journal of the Electrochemical Society. 113: 626-627. DOI: 10.1149/1.2424045  0.01
1964 Schmid GM, O'Brien RN. “Oxygen” Adsorption and Double Layer Capacities; Gold in Perchloric Acid Journal of the Electrochemical Society. 111: 832-837. DOI: 10.1149/1.2426264  0.01
1963 Schmid GM, Hackerman N. Electrical Double Layer Capacities and Adsorption of Alcohols on Gold Journal of the Electrochemical Society. 110: 440-444. DOI: 10.1149/1.2425782  0.01
1962 Hurd RM, Schmid GM, Snavely ES. Electrostatic Fields: Their Effect on the Surface Tension of Aqueous Salt Solutions. Science (New York, N.Y.). 135: 791-2. PMID 17758757 DOI: 10.1126/science.135.3506.791  0.01
1962 Snavely ES, Schmid GM, Hurd RM. Simple experimental method for verification of the Gibbs adsorption equation Nature. 194: 439-441. DOI: 10.1038/194439a0  0.01
1962 Hurd RM, Schmid GM, Snavely ES. Electrostatic fields: Their effect on the surface tension of aqueous salt solutions Science. 135: 791-792.  0.01
1961 Riney JS, Schmid GM, Hackerman N. Single pulse method for measurement of electrical double layer parameters Review of Scientific Instruments. 32: 588-592. DOI: 10.1063/1.1717446  0.01
1960 Schmid GM, Hackerman N. The A-C Resistance of a Polarized Stainless Steel Wire Cathode Journal of the Electrochemical Society. 107: 142-143. DOI: 10.1149/1.2427626  0.01
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