Brent C. Bergner, Ph.D. - Publications
Affiliations: | 2009 | Optical Science and Engineering (PhD) | University of North Carolina, Charlotte, Charlotte, NC, United States |
Area:
Optics Physics, NanotechnologyYear | Citation | Score | |||
---|---|---|---|---|---|
2012 | Bergner B, Kumar P, Cook D, Avrutsky I. Compact low-cost waveguide-based optical spectrometer for detection of chemical/biological agents Proceedings of Spie. 8374. DOI: 10.1117/12.919622 | 0.433 | |||
2011 | Kumar P, Bergner B, Cook D, Avrutsky I. Light focusing by chirped waveguide grating coupler Proceedings of Spie. 8032: 803203. DOI: 10.1117/12.884071 | 0.376 | |||
2011 | Foldyna M, Germer TA, Bergner BC. Mueller matrix ellipsometry of artificial non-periodic line edge roughness in presence of finite numerical aperture Proceedings of Spie. 7971. DOI: 10.1117/12.879518 | 0.505 | |||
2011 | Foldyna M, Germer TA, Bergner BC, Dixson RG. Generalized ellipsometry of artificially designed line width roughness Thin Solid Films. 519: 2633-2636. DOI: 10.1016/J.Tsf.2010.11.085 | 0.51 | |||
2010 | Bergner BC, Germer TA, Suleski TJ. Effective medium approximations for modeling optical reflectance from gratings with rough edges. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 27: 1083-90. PMID 20448775 DOI: 10.1364/Josaa.27.001083 | 0.495 | |||
2009 | Bergner BC, Germer TA, Suleski TJ. Effect of line-width roughness on optical scatterometry measurements Proceedings of Spie. 7272. DOI: 10.1117/12.813770 | 0.499 | |||
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