Mathias Schubert - Publications

Affiliations: 
Electrical Engineering The University of Nebraska - Lincoln, Lincoln, NE 
Area:
Electronics and Electrical Engineering

125 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2021 Ruder A, Wright B, Feder R, Kilic U, Hilfiker M, Schubert E, Herzinger CM, Schubert M. Mueller matrix imaging microscope using dual continuously rotating anisotropic mirrors. Optics Express. 29: 28704-28724. PMID 34614995 DOI: 10.1364/OE.435972  1
2021 Chae S, Choi WJ, Fotev I, Bittrich E, Uhlmann P, Schubert M, Makarov D, Wagner J, Pashkin A, Fery A. Stretchable Thin Film Mechanical-Strain-Gated Switches and Logic Gate Functions Based on a Soft Tunneling Barrier. Advanced Materials (Deerfield Beach, Fla.). e2104769. PMID 34486188 DOI: 10.1002/adma.202104769  1
2021 Kilic U, Mock A, Sekora D, Gilbert S, Valloppilly S, Melendez G, Ianno N, Langell M, Schubert E, Schubert M. Author Correction: Precursor-surface interactions revealed during plasma-enhanced atomic layer deposition of metal oxide thin films by in-situ spectroscopic ellipsometry. Scientific Reports. 11: 7157. PMID 33762652 DOI: 10.1038/s41598-021-86624-1  1
2020 Knight S, Schöche S, Kühne P, Hofmann T, Darakchieva V, Schubert M. Tunable cavity-enhanced terahertz frequency-domain optical Hall effect. The Review of Scientific Instruments. 91: 083903. PMID 32872950 DOI: 10.1063/5.0010267  1
2020 Ruder A, Wright B, Peev D, Feder R, Kilic U, Hilfiker M, Schubert E, Herzinger CM, Schubert M. Mueller matrix ellipsometer using dual continuously rotating anisotropic mirrors. Optics Letters. 45: 3541-3544. PMID 32630893 DOI: 10.1364/Ol.398060  1
2020 Kilic U, Mock A, Sekora D, Gilbert S, Valloppilly S, Ianno N, Langell M, Schubert E, Schubert M. Precursor-surface interactions revealed during plasma-enhanced atomic layer deposition of metal oxide thin films by in-situ spectroscopic ellipsometry. Scientific Reports. 10: 10392. PMID 32587273 DOI: 10.1038/S41598-020-66409-8  1
2020 Korlacki R, Mock A, Briley C, Darakchieva V, Monemar B, Kumagai Y, Goto K, Higashiwaki M, Schubert M. Comment on “Characteristics of Multi-photon Absorption in a β-Ga2O3 Single Crystal” [J. Phys. Soc. Jpn. 88, 113701 (2019)] Journal of the Physical Society of Japan. 89: 36001. DOI: 10.7566/Jpsj.89.036001  1
2020 Stokey M, Mock A, Korlacki R, Knight S, Darakchieva V, Schöche S, Schubert M. Infrared active phonons in monoclinic lutetium oxyorthosilicate Journal of Applied Physics. 127: 115702. DOI: 10.1063/1.5135016  1
2019 Mantz A, Rosenthal A, Farris E, Kozisek T, Bittrich E, Nazari S, Schubert E, Schubert M, Stamm M, Uhlmann P, Pannier AK. Free Polyethylenimine Enhances Substrate-Mediated Gene Delivery on Titanium Substrates Modified With RGD-Functionalized Poly(acrylic acid) Brushes. Frontiers in Chemistry. 7: 51. PMID 30792979 DOI: 10.3389/Fchem.2019.00051  1
2019 Knight S, Prabhakaran D, Binek C, Schubert M. Electromagnon excitation in cupric oxide measured by Fabry-Pérot enhanced terahertz Mueller matrix ellipsometry. Scientific Reports. 9: 1353. PMID 30718629 DOI: 10.1038/S41598-018-37639-8  1
2019 Kılıç U, Mock A, Feder R, Sekora D, Hilfiker M, Korlacki R, Schubert E, Argyropoulos C, Schubert M. Tunable plasmonic resonances in Si-Au slanted columnar heterostructure thin films. Scientific Reports. 9: 71. PMID 30635603 DOI: 10.1038/S41598-018-37153-X  1
2019 Mock A, Korlacki R, Knight S, Stokey M, Fritz A, Darakchieva V, Schubert M. Lattice dynamics of orthorhombic NdGaO3 Physical Review B. 99: 184302. DOI: 10.1103/Physrevb.99.184302  1
2019 Schubert M, Mock A, Korlacki R, Darakchieva V. Phonon order and reststrahlen bands of polar vibrations in crystals with monoclinic symmetry Physical Review B. 99: 41201. DOI: 10.1103/Physrevb.99.041201  1
2019 Hilfiker M, Kilic U, Mock A, Darakchieva V, Knight S, Korlacki R, Mauze A, Zhang Y, Speck J, Schubert M. Dielectric function tensor (1.5 eV to 9.0 eV), anisotropy, and band to band transitions of monoclinic β-(AlxGa1-x)2O3 (x ≤ 0.21) films Applied Physics Letters. 114: 231901. DOI: 10.1063/1.5097780  1
2019 Mock A, Dugan CL, Knight S, Korlacki R, Mann JM, Kimani MM, Petrosky JC, Dowben PA, Schubert M. Band-to-band transitions and critical points in the near-infrared to vacuum ultraviolet dielectric functions of single crystal urania and thoria Applied Physics Letters. 114: 211901. DOI: 10.1063/1.5087059  1
2018 Oyelade A, Yost AJ, Benker N, Dong B, Knight S, Schubert M, Dowben PA, Kelber JA. Composition-dependent charge transport in boron carbides alloyed with aromatics: PECVD aniline/orthocarborane films. Langmuir : the Acs Journal of Surfaces and Colloids. PMID 30179498 DOI: 10.1021/Acs.Langmuir.8B02114  1
2018 Rosenthal A, Mantz A, Nguyen AL, Bittrich E, Schubert E, Schubert MM, Stamm M, Pannier AK, Uhlmann P. Biofunctionalization of Titanium Substrates using Nanoscale Polymer Brushes with Cell Adhesion Peptides. The Journal of Physical Chemistry. B. PMID 29878775 DOI: 10.1021/Acs.Jpcb.8B02407  1
2018 Phan HTM, Bartz JC, Ayers J, Giasson BI, Schubert M, Rodenhausen KB, Kananizadeh N, Li Y, Bartelt-Hunt SL. Adsorption and decontamination of α-synuclein from medically and environmentally-relevant surfaces. Colloids and Surfaces. B, Biointerfaces. 166: 98-107. PMID 29550546 DOI: 10.1016/J.Colsurfb.2018.03.011  1
2018 König M, Rodenhausen KB, Rauch S, Bittrich E, Eichhorn KJ, Schubert MM, Stamm M, Uhlmann P. Salt-sensitivity of the thermoresponsive behavior of PNIPAAm-Brushes. Langmuir : the Acs Journal of Surfaces and Colloids. PMID 29356537 DOI: 10.1021/Acs.Langmuir.7B03919  1
2018 Kılıç U, Sekora D, Mock A, Korlacki R, Valloppilly S, Echeverría EM, Ianno N, Schubert E, Schubert M. Critical-point model dielectric function analysis of WO3 thin films deposited by atomic layer deposition techniques Journal of Applied Physics. 124: 115302. DOI: 10.1063/1.5038746  1
2017 Knight S, Hofmann T, Bouhafs C, Armakavicius N, Kühne P, Stanishev V, Ivanov IG, Yakimova R, Wimer S, Schubert M, Darakchieva V. In-situ terahertz optical Hall effect measurements of ambient effects on free charge carrier properties of epitaxial graphene. Scientific Reports. 7: 5151. PMID 28698648 DOI: 10.1038/S41598-017-05333-W  1
2017 Hofmann T, Knight S, Sekora D, Schmidt D, Herzinger CM, Woollam JA, Schubert E, Schubert M. Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry Applied Surface Science. 421: 513-517. DOI: 10.1016/J.Apsusc.2016.12.200  1
2017 Briley C, Mock A, Korlacki R, Hofmann T, Schubert E, Schubert M. Effects of annealing and conformal alumina passivation on anisotropy and hysteresis of magneto-optical properties of cobalt slanted columnar thin films Applied Surface Science. 421: 320-324. DOI: 10.1016/J.Apsusc.2016.12.198  1
2016 Schubert M. Coordinate-Invariant Lyddane-Sachs-Teller Relationship for Polar Vibrations in Materials with Monoclinic and Triclinic Crystal Systems. Physical Review Letters. 117: 215502. PMID 27911546 DOI: 10.1103/Physrevlett.117.215502  0.01
2016 Peev D, Hofmann T, Kananizadeh N, Beeram S, Rodriguez E, Wimer S, Rodenhausen KB, Herzinger CM, Kasputis T, Pfaunmiller E, Nguyen A, Korlacki R, Pannier A, Li Y, Schubert E, ... ... Schubert M, et al. Anisotropic contrast optical microscope. The Review of Scientific Instruments. 87: 113701. PMID 27910407 DOI: 10.1063/1.4965878  1
2016 Schubert M, Kühne P, Darakchieva V, Hofmann T. Optical Hall effect-model description: tutorial. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 33: 1553-68. PMID 27505654 DOI: 10.1364/Josaa.33.001553  1
2016 Kananizadeh N, Rice C, Lee J, Rodenhausen KB, Sekora D, Schubert M, Schubert E, Bartelt-Hunt S, Li Y. Combined quartz crystal microbalance with dissipation (QCM-D) and generalized ellipsometry (GE) to characterize the deposition of titanium dioxide nanoparticles on model rough surfaces. Journal of Hazardous Materials. PMID 27041442 DOI: 10.1016/J.Jhazmat.2016.03.048  1
2016 Fischer R, Bock A, Dunne M, Fuchs JC, Giannone L, Lackner K, McCarthy PJ, Poli E, Preuss R, Rampp M, Schubert M, Stober J, Suttrop W, Tardini G, Weiland M. Coupling of the flux diffusion equation with the equilibrium reconstruction at ASDEX Upgrade Fusion Science and Technology. 69: 526-536. DOI: 10.13182/FST15-185  1
2016 Schubert M, Korlacki R, Knight S, Hofmann T, Schöche S, Darakchieva V, Janzén E, Monemar B, Gogova D, Thieu QT, Togashi R, Murakami H, Kumagai Y, Goto K, Kuramata A, et al. Anisotropy, phonon modes, and free charge carrier parameters in monoclinic β -gallium oxide single crystals Physical Review B - Condensed Matter and Materials Physics. 93. DOI: 10.1103/Physrevb.93.125209  1
2016 Mock A, Korlacki R, Briley C, Sekora D, Hofmann T, Wilson P, Sinitskii A, Schubert E, Schubert M. Anisotropy, band-to-band transitions, phonon modes, and oxidation properties of cobalt-oxide core-shell slanted columnar thin films Applied Physics Letters. 108. DOI: 10.1063/1.4941399  1
2016 Lautenschläger T, Feder R, Neumann H, Rice C, Schubert M, Bundesmann C. Ion beam sputtering of Ti: Influence of process parameters on angular and energy distribution of sputtered and backscattered particles Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions With Materials and Atoms. 385: 30-39. DOI: 10.1016/J.Nimb.2016.08.017  1
2015 Phan HT, Bartelt-Hunt S, Rodenhausen KB, Schubert M, Bartz JC. Investigation of Bovine Serum Albumin (BSA) Attachment onto Self-Assembled Monolayers (SAMs) Using Combinatorial Quartz Crystal Microbalance with Dissipation (QCM-D) and Spectroscopic Ellipsometry (SE). Plos One. 10: e0141282. PMID 26505481 DOI: 10.1371/Journal.Pone.0141282  1
2015 Knight S, Schöche S, Darakchieva V, Kühne P, Carlin JF, Grandjean N, Herzinger CM, Schubert M, Hofmann T. Cavity-enhanced optical Hall effect in two-dimensional free charge carrier gases detected at terahertz frequencies. Optics Letters. 40: 2688-91. PMID 26076237 DOI: 10.1364/Ol.40.002688  1
2015 Rodenhausen KB, Davis RS, Sekora D, Liang D, Mock A, Neupane R, Schmidt D, Hofmann T, Schubert E, Schubert M. The retention of liquid by columnar nanostructured surfaces during quartz crystal microbalance measurements and the effects of adsorption thereon. Journal of Colloid and Interface Science. 455: 226-35. PMID 26072447 DOI: 10.1016/J.Jcis.2015.05.038  1
2015 Kasputis T, Pieper A, Rodenhausen KB, Schmidt D, Sekora D, Rice C, Schubert E, Schubert M, Pannier AK. Use of precisely sculptured thin film (STF) substrates with generalized ellipsometry to determine spatial distribution of adsorbed fibronectin to nanostructured columnar topographies and effect on cell adhesion. Acta Biomaterialia. 18: 88-99. PMID 25712389 DOI: 10.1016/J.Actbio.2015.02.016  1
2015 Koenig M, Kasputis T, Schmidt D, Rodenhausen KB, Eichhorn KJ, Pannier AK, Schubert M, Stamm M, Uhlmann P. Erratum to: Combined QCM-D/GE as a tool to characterize stimuli-responsive swelling of and protein adsorption on polymer brushes grafted onto 3D-nanostructures. Analytical and Bioanalytical Chemistry. 407: 1275-6. PMID 25432305 DOI: 10.1007/S00216-014-8343-1  1
2015 Ben Sedrine N, Zukauskaite A, Birch J, Jensen J, Hultman L, Schöche S, Schubert M, Darakchieva V. Infrared dielectric functions and optical phonons of wurtzite YxAl1-xN (0 x 0.22) Journal of Physics D: Applied Physics. 48. DOI: 10.1088/0022-3727/48/41/415102  1
2015 Liang D, Sekora D, Rice C, Schubert E, Schubert M. Optical anisotropy of porous polymer film with inverse slanted nanocolumnar structure revealed via generalized spectroscopic ellipsometry Applied Physics Letters. 107. DOI: 10.1063/1.4929367  1
2015 Wilson PM, Lipatov A, Schmidt D, Schubert E, Schubert M, Sinitskii A, Hofmann T. Structural and optical properties of cobalt slanted nanopillars conformally coated with few-layer graphene Applied Physics Letters. 106. DOI: 10.1063/1.4922199  1
2015 Briley C, Schmidt D, Hofmann T, Schubert E, Schubert M. Anisotropic magneto-optical hysteresis of permalloy slanted columnar thin films determined by vector magneto-optical generalized ellipsometry Applied Physics Letters. 106. DOI: 10.1063/1.4916669  1
2015 Bouhafs C, Darakchieva V, Persson IL, Tiberj A, Persson POÅ, Paillet M, Zahab AA, Landois P, Juillaguet S, Schöche S, Schubert M, Yakimova R. Structural properties and dielectric function of graphene grown by high-temperature sublimation on 4H-SiC(000-1) Journal of Applied Physics. 117. DOI: 10.1063/1.4908216  1
2014 Koenig M, Kasputis T, Schmidt D, Rodenhausen KB, Eichhorn KJ, Pannier AK, Schubert M, Stamm M, Uhlmann P. Combined QCM-D/GE as a tool to characterize stimuli-responsive swelling of and protein adsorption on polymer brushes grafted onto 3D-nanostructures Analytical and Bioanalytical Chemistry. 406: 7233-7242. PMID 25240934 DOI: 10.1007/s00216-014-8154-4  1
2014 Kühne P, Herzinger CM, Schubert M, Woollam JA, Hofmann T. Invited article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument. The Review of Scientific Instruments. 85: 071301. PMID 25085120 DOI: 10.1063/1.4889920  1
2014 Xie MY, Schubert M, Lu J, Persson POA, Stanishev V, Hsiao CL, Chen LC, Schaff WJ, Darakchieva V. Assessing structural, free-charge carrier, and phonon properties of mixed-phase epitaxial films: The case of InN Physical Review B - Condensed Matter and Materials Physics. 90. DOI: 10.1103/Physrevb.90.195306  1
2014 Xie MY, Ben Sedrine N, Schöche S, Hofmann T, Schubert M, Hung L, Monemar B, Wang X, Yoshikawa A, Wang K, Araki T, Nanishi Y, Darakchieva V. Effect of Mg doping on the structural and free-charge carrier properties of InN films Journal of Applied Physics. 115. DOI: 10.1063/1.4871975  1
2014 Kasputis T, Pieper A, Schubert M, Pannier AK. Dynamic analysis of DNA nanoparticle immobilization to model biomaterial substrates using combinatorial spectroscopic ellipsometry and quartz crystal microbalance with dissipation Thin Solid Films. 571: 637-643. DOI: 10.1016/J.Tsf.2014.01.046  1
2014 Rodenhausen KB, Schmidt D, Rice C, Hofmann T, Schubert E, Schubert M. Detection of Organic Attachment onto Highly Ordered Three-Dimensional Nanostructure Thin Films by Generalized Ellipsometry and Quartz Crystal Microbalance with Dissipation Techniques Springer Series in Surface Sciences. 52: 135-154. DOI: 10.1007/978-3-642-40128-2_7  1
2013 Kühne P, Darakchieva V, Yakimova R, Tedesco JD, Myers-Ward RL, Eddy CR, Gaskill DK, Herzinger CM, Woollam JA, Schubert M, Hofmann T. Polarization selection rules for inter-Landau-level transitions in epitaxial graphene revealed by the infrared optical Hall effect. Physical Review Letters. 111: 077402. PMID 23992081 DOI: 10.1103/Physrevlett.111.077402  1
2013 Kühne P, Boosalis A, Herzinger CM, Nyakiti LO, Wheeler VD, Myers-Ward RL, Eddy CR, Gaskill DK, Schubert M, Hofmann T. Optical Hall effect measurement of coupled phonon mode - Landau level transitions in epitaxial graphene on silicon carbide Materials Research Society Symposium Proceedings. 1505: 211-217. DOI: 10.1557/Opl.2013.811  1
2013 Liang D, Schmidt D, Wang H, Schubert E, Schubert M. Generalized ellipsometry effective medium approximation analysis approach for porous slanted columnar thin films infiltrated with polymer Applied Physics Letters. 103. DOI: 10.1063/1.4821159  1
2013 Darakchieva V, Boosalis A, Zakharov AA, Hofmann T, Schubert M, Tiwald TE, Iakimov T, Vasiliauskas R, Yakimova R. Large-area microfocal spectroscopic ellipsometry mapping of thickness and electronic properties of epitaxial graphene on Si- and C-face of 3C-SiC(111) Applied Physics Letters. 102: 213116. DOI: 10.1063/1.4808379  1
2013 Kasputis T, Koenig M, Schmidt D, Sekora D, Rodenhausen KB, Eichhorn KJ, Uhlmann P, Schubert E, Pannier AK, Schubert M, Stamm M. Slanted columnar thin films prepared by glancing angle deposition functionalized with polyacrylic acid polymer brushes Journal of Physical Chemistry C. 117: 13971-13980. DOI: 10.1021/Jp402055H  1
2013 Koenig M, Rodenhausen KB, Schmidt D, Eichhorn KJ, Schubert M, Stamm M, Uhlmann P. In situ synthesis of palladium nanoparticles in polymer brushes followed by QCM-D coupled with spectroscopic ellipsometry Particle and Particle Systems Characterization. 30: 931-935. DOI: 10.1002/Ppsc.201300155  1
2012 Rodenhausen KB, Schmidt D, Kasputis T, Pannier AK, Schubert E, Schubert M. Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films. Optics Express. 20: 5419-28. PMID 22418349 DOI: 10.1364/Oe.20.005419  1
2012 Zhou M, Pasquale FL, Dowben PA, Boosalis A, Schubert M, Darakchieva V, Yakimova R, Kong L, Kelber JA. Direct graphene growth on Co3O4(111) by molecular beam epitaxy. Journal of Physics. Condensed Matter : An Institute of Physics Journal. 24: 072201. PMID 22223630 DOI: 10.1088/0953-8984/24/7/072201  1
2012 Boosalis A, Hofmann T, Darakchieva V, Yakimova R, Schubert M. Visible to vacuum ultraviolet dielectric functions of epitaxial graphene on 3C and 4H SiC polytypes determined by spectroscopic ellipsometry Applied Physics Letters. 101: 11912. DOI: 10.1063/1.4732159  1
2011 Rodenhausen KB, Kasputis T, Pannier AK, Gerasimov JY, Lai RY, Solinsky M, Tiwald TE, Wang H, Sarkar A, Hofmann T, Ianno N, Schubert M. Combined optical and acoustical method for determination of thickness and porosity of transparent organic layers below the ultra-thin film limit. The Review of Scientific Instruments. 82: 103111. PMID 22047284 DOI: 10.1063/1.3653880  1
2011 Schöche S, Shi J, Boosalis A, Kühne P, Herzinger CM, Woollam JA, Schaff WJ, Eastman LF, Schubert M, Hofmann T. Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures Applied Physics Letters. 98. DOI: 10.1063/1.3556617  1
2011 Rodenhausen KB, Duensing BA, Kasputis T, Pannier AK, Hofmann T, Schubert M, Tiwald TE, Solinsky M, Wagner M. In-situ monitoring of alkanethiol self-assembled monolayer chemisorption with combined spectroscopic ellipsometry and quartz crystal microbalance techniques Thin Solid Films. 519: 2817-2820. DOI: 10.1016/J.Tsf.2010.11.081  1
2010 Bittrich E, Rodenhausen KB, Eichhorn KJ, Hofmann T, Schubert M, Stamm M, Uhlmann P. Protein adsorption on and swelling of polyelectrolyte brushes: A simultaneous ellipsometry-quartz crystal microbalance study. Biointerphases. 5: 159-67. PMID 21219037 DOI: 10.1116/1.3530841  1
2010 Hofmann T, Herzinger CM, Boosalis A, Tiwald TE, Woollam JA, Schubert M. Variable-wavelength frequency-domain terahertz ellipsometry. The Review of Scientific Instruments. 81: 023101. PMID 20192479 DOI: 10.1063/1.3297902  1
2010 Voora VM, Hofmann T, Brandt M, Lorenz M, Grundmann M, Ashkenov N, Schmidt H, Ianno NJ, Schubert M. Interface polarization coupling in piezoelectric-semiconductor ferroelectric heterostructures Physical Review B. 81: 195307. DOI: 10.1103/Physrevb.81.195307  1
2010 Makinistian L, Albanesi EA, Gonzalez Lemus NV, Petukhov AG, Schmidt D, Schubert E, Schubert M, Losovyj YB, Galiy P, Dowben P. Ab initio calculations and ellipsometry measurements of the optical properties of the layered semiconductor In4 Se3 Physical Review B - Condensed Matter and Materials Physics. 81. DOI: 10.1103/Physrevb.81.075217  1
2010 Darakchieva V, Lorenz K, Barradas NP, Alves E, Monemar B, Schubert M, Franco N, Hsiao CL, Chen LC, Schaff WJ, Tu LW, Yamaguchi T, Nanishi Y. Hydrogen in InN: A ubiquitous phenomenon in molecular beam epitaxy grown material Applied Physics Letters. 96. DOI: 10.1063/1.3327333  1
2009 Schmidt D, Booso B, Hofmann T, Schubert E, Sarangan A, Schubert M. Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films. Optics Letters. 34: 992-4. PMID 19340195 DOI: 10.1364/Ol.34.000992  1
2009 Hofmann T, Herzinger CM, Woollam JA, Schubert M. Materials characterization using THz ellipsometry Materials Research Society Symposium Proceedings. 1163: 19-24. DOI: 10.1557/Proc-1163-K08-04  1
2009 Voora VM, Hofmann T, Brandt M, Lorenz M, Ashkenov N, Grundmann M, Schubert M. Electrical properties of ZnO–BaTiO3–ZnO heterostructures with asymmetric interface charge distribution Applied Physics Letters. 95: 82902. DOI: 10.1063/1.3211914  1
2009 Billa RB, Hofmann T, Schubert M, Robertson BW. Annealing effects on the optical properties of semiconducting boron carbide Journal of Applied Physics. 106. DOI: 10.1063/1.3190679  1
2009 Hofmann T, Herzinger CM, Tiwald TE, Woollam JA, Schubert M. Hole diffusion profile in a p- p+ silicon homojunction determined by terahertz and midinfrared spectroscopic ellipsometry Applied Physics Letters. 95. DOI: 10.1063/1.3184567  1
2009 Darakchieva V, Hofmann T, Schubert M, Sernelius BE, Monemar B, Persson POA, Giuliani F, Alves E, Lu H, Schaff WJ. Free electron behavior in InN: On the role of dislocations and surface electron accumulation Applied Physics Letters. 94: 22109. DOI: 10.1063/1.3065030  1
2009 Schmidt D, Booso B, Hofmann T, Schubert E, Sarangan A, Schubert M. Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry Applied Physics Letters. 94. DOI: 10.1063/1.3062996  1
2009 Darakchieva V, Barradas NP, Xie MY, Lorenz K, Alves E, Schubert M, Persson POA, Giuliani F, Munnik F, Hsiao CL, Tu LW, Schaff WJ. Role of impurities and dislocations for the unintentional n-type conductivity in InN Physica B: Condensed Matter. 404: 4476-4481. DOI: 10.1016/J.Physb.2009.09.042  1
2008 Hofstetter D, Bonetti Y, Baumann E, Giorgetta FR, El-Shaer AH, Bakin A, Waag A, Schmidt-Grund R, Grundmann M, Schubert M. Characterization of an optically pumped ZnO-based 3rd order distributed feedback laser Proceedings of Spie - the International Society For Optical Engineering. 6895. DOI: 10.1117/12.762128  1
2008 Saenger MF, Höing T, Robertson BW, Billa RB, Hofmann T, Schubert E, Schubert M. Polaron and phonon properties in proton intercalated amorphous tungsten oxide thin films Physical Review B - Condensed Matter and Materials Physics. 78. DOI: 10.1103/Physrevb.78.245205  1
2008 Arwin H, Beck U, Schubert M. Preface: phys. stat. sol. (c) 5/5 Physica Status Solidi (C). 5: 1000-1002. DOI: 10.1002/Pssc.200860016  1
2008 Saenger MF, Hetterich M, Hofmann T, Kirby RD, Sellmyer DJ, Schubert M. Dielectric and magnetic birefringence in low-chlorine-doped n-type Zn 1-xMnxSe Physica Status Solidi (C) Current Topics in Solid State Physics. 5: 1007-1011. DOI: 10.1002/Pssc.200777907  1
2007 Darakchieva V, Paskova T, Schubert M, Arwin H, Paskov PP, Monemar B, Hommel D, Heuken M, Off J, Scholz F, Haskell BA, Fini PT, Speck JS, Nakamura S. Anisotropic strain and phonon deformation potentials in GaN Physical Review B - Condensed Matter and Materials Physics. 75. DOI: 10.1103/Physrevb.75.195217  1
2007 Hofstetter D, Bonetti Y, Giorgetta FR, El-Shaer AH, Bakin A, Waag A, Schmidt-Grund R, Schubert M, Grundmann M. Demonstration of an ultraviolet ZnO-based optically pumped third order distributed feedback laser Applied Physics Letters. 91. DOI: 10.1063/1.2783965  1
2007 Darakchieva V, Paskova T, Schubert M, Paskov PP, Arwin H, Monemar B, Hommel D, Heuken M, Off J, Haskell BA, Fini PT, Speck JS, Nakamura S. Effect of anisotropic strain on phonons in a-plane and c-plane GaN layers Journal of Crystal Growth. 300: 233-238. DOI: 10.1016/J.Jcrysgro.2006.11.023  1
2007 Schubert E, Frost F, Neumann H, Rauschenbach B, Fuhrmann B, Heyroth F, Rivory J, Charron E, Gallas B, Schubert M. Ion beam assisted growth of sculptured thin films: Structure alignment and optical fingerprints Advances in Solid State Physics. 46: 309-320. DOI: 10.1007/978-3-540-38235-5_23  1
2006 Bundesmann C, Lorenz M, Grundmann M, Schubert M. Phonon modes, dielectric constants, and exciton mass parameters in ternary MgxZn1−xO Mrs Proceedings. 928: 13-17. DOI: 10.1557/Proc-0928-Gg05-03  1
2006 Hofmann T, Chavdarov T, Darakchieva V, Lu H, Schaff WJ, Schubert M. Anisotropy of the Γ-point effective mass and mobility in hexagonal InN Physica Status Solidi (C). 3: 1854-1857. DOI: 10.1002/Pssc.200565467  1
2006 Paskova T, Darakchieva V, Paskov PP, Monemar B, Bukowski M, Suski T, Ashkenov N, Schubert M, Hommel D. Bending in HVPE GaN free-standing films: Effects of laser lift-off, polishing and high-pressure annealing Physica Status Solidi (C) Current Topics in Solid State Physics. 3: 1475-1478. DOI: 10.1002/Pssc.200565412  1
2006 Darakchieva V, Paskova T, Paskov PP, Arwin H, Schubert M, Monemar B, Figge S, Homme D, Haskell BA, Fini PT, Nakamura S. Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN Physica Status Solidi (B) Basic Research. 243: 1594-1598. DOI: 10.1002/Pssb.200565400  1
2006 Schubert M. Another century of ellipsometry Annalen Der Physik. 15: 480-497. DOI: 10.1002/Andp.200510204  0.01
2004 Karlsson LM, Schubert M, Ashkenov N, Arwin H. Protein adsorption in porous silicon gradients monitored by spatially-resolved spectroscopic ellipsometry Thin Solid Films. 455: 726-730. DOI: 10.1016/J.Tsf.2004.01.062  1
2004 Bundesmann C, Ashkenov N, Schubert M, Rahm A, Wenckstern Hv, Kaidashev EM, Lorenz M, Grundmann M. Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry Thin Solid Films. 455: 161-166. DOI: 10.1016/J.Tsf.2003.11.226  1
2004 Schubert M, Hofmann T, Herzinger CM. Far-infrared magnetooptic generalized ellipsometry: determination of free-charge-carrier parameters in semiconductor thin film structures Thin Solid Films. 455: 563-570. DOI: 10.1016/J.Tsf.2003.11.215  1
2004 Leibiger G, Gottschalch V, Razek N, Schindler A, Schubert M. Hydrogen implantation in InGaNAs studied by spectroscopic ellipsometry Thin Solid Films. 455: 231-234. DOI: 10.1016/J.Tsf.2003.11.203  1
2004 Kvietkova J, Daniel B, Hetterich M, Schubert M, Spemann D. Optical properties of ZnSe and Zn0.87Mn0.13Se epilayers determined by spectroscopic ellipsometry Thin Solid Films. 455: 228-230. DOI: 10.1016/J.Tsf.2003.11.201  1
2004 Schubert M, Bundesmann C, Jakopic G, Maresch H, Arwin H, Persson N-, Zhang F, Inganäs O. Infrared ellipsometry characterization of conducting thin organic films Thin Solid Films. 455: 295-300. DOI: 10.1016/J.Tsf.2003.11.194  1
2003 Schubert M, Hofmann T, Herzinger CM. Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in n-type GaAs. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 20: 347-56. PMID 12570302 DOI: 10.1364/Josaa.20.000347  1
2003 Schubert M, Hofmann T. Phonons and polaritons in semiconductor layer structures Proceedings of Spie - the International Society For Optical Engineering. 5218: 210-222. DOI: 10.1117/12.505863  1
2003 Darakchieva V, Schubert M, Birch J, Kasic A, Tungasmita S, Paskova T, Monemar B. Generalized infrared ellipsometry study of thin epitaxial AlN layers with complex strain behavior Physica B-Condensed Matter. 340: 416-420. DOI: 10.1016/J.Physb.2003.09.059  1
2003 Darakchieva V, Paskov PP, Schubert M, Paskova T, Monemar B, Kamiyama S, Iwaya M, Amano H, Akasaki I. Optical properties of undoped AlN/GaN superlattices grown by metalorganic vapor phase epitaxy Physica Status Solidi (C). 2614-2617. DOI: 10.1002/Pssc.200303408  1
2003 Kasic A, Schubert M, Off J, Kuhn B, Scholz F, Einfeldt S, Böttcher T, Hommel D, As DJ, Köhler U, Dadgar A, Krost A, Saito Y, Nanishi Y, Correia MR, et al. Phonons and free-carrier properties of binary, ternary, and quaternary group-III nitride layers measured by infrared Spectroscopic Ellipsometry Physica Status Solidi C: Conferences. 1750-1769. DOI: 10.1002/Pssc.200303135  1
2003 Dadgar A, Strittmatter A, Bläsing J, Poschenrieder M, Contreras O, Veit P, Riemann T, Bertram F, Reiher A, Krtschil A, Diez A, Hempel T, Finger T, Kasic A, Schubert M, et al. Metalorganic chemical vapor phase epitaxy of gallium-nitride on silicon Physica Status Solidi (C). 1583-1606. DOI: 10.1002/Pssc.200303122  1
2002 Schubert M, Dollase W. Generalized ellipsometry for biaxial absorbing materials: determination of crystal orientation and optical constants of Sb(2)S(3). Optics Letters. 27: 2073-5. PMID 18033445 DOI: 10.1364/Ol.27.002073  0.01
2002 Hofmann T, Gottschalch V, Schubert M. Far-infrared dielectric function and phonon modes of spontaneously ordered (AlxGa 1-x ) 0.52 In 0.48 P Mrs Proceedings. 744. DOI: 10.1557/Proc-744-M5.33  1
2002 Hofmann T, Gottschalch V, Schubert M. Far-Infrared dielectric anisotropy and phonon modes in spontaneously CuPt-orderedGa0.52In0.48P Physical Review B. 66: 195204. DOI: 10.1103/Physrevb.66.195204  1
2002 Kasic A, Schubert M, Saito Y, Nanishi Y, Wagner G. Effective electron mass and phonon modes in n-type hexagonal InN Physical Review B. 65: 115206. DOI: 10.1103/Physrevb.65.115206  1
2002 Franke E, Neumann H, Schubert M, Trimble CL, Yan L, Woollam JA. Low-orbit-environment protective coating for all-solid-state electrochromic surface heat radiation control devices Surface & Coatings Technology. 285-288. DOI: 10.1016/S0257-8972(01)01608-5  1
2001 Zangooie S, Schubert M, Trimble C, Thompson DW, Woollam JA. Infrared ellipsometry characterization of porous silicon bragg reflectors. Applied Optics. 40: 906-12. PMID 18357071 DOI: 10.1364/Ao.40.000906  1
2001 Zangooie S, Schubert M, Tiwald TE, Woollam JA. Infrared optical properties of aged porous GaAs Journal of Materials Research. 16: 1241-1244. DOI: 10.1557/Jmr.2001.0173  1
2001 Hofmann T, Leibiger G, Gottschalch V, Pietzonka I, Schubert M. Infrared dielectric function and phonon modes of highly disordered ( Al x Ga 1 − x ) 0.52 In 0.48 P Physical Review B. 64: 155206. DOI: 10.1103/Physrevb.64.155206  1
2001 Zangooie S, Schubert M, Thompson DW, Woollam JA. Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs Applied Physics Letters. 78: 937-939. DOI: 10.1063/1.1343490  1
2001 Kasic A, Schubert M, Rheinländer B, Riede V, Einfeldt S, Hommel D, Kuhn B, Off J, Scholz F. Effective carrier mass and mobility versus carrier concentration in p- and n-type α-GaN determined by infrared ellipsometry and Hall resistivity measurements Materials Science and Engineering B-Advanced Functional Solid-State Materials. 82: 74-76. DOI: 10.1016/S0921-5107(00)00753-4  1
2001 Franke E, Schubert M, Trimble CL, DeVries MJ, Woollam JA. Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV Thin Solid Films. 388: 283-289. DOI: 10.1016/S0040-6090(00)01881-2  1
2000 Klimek T, Atai E, Schubert M, Glanz H. Inverted papilloma of the nasal cavity and paranasal sinuses: clinical data, surgical strategy and recurrence rates. Acta Oto-Laryngologica. 120: 267-272. PMID 11603788 DOI: 10.1080/000164800750001071  0.01
2000 Pluta M, Schubert M, Jahny J, Grill W. Angular spectrum approach for the computation of group and phase velocity surfaces of acoustic waves in anisotropic materials Ultrasonics. 38: 232-6. PMID 10829665 DOI: 10.1016/S0041-624X(99)00123-7  0.01
2000 Šik J, Schubert M, Hofmann T, Gottschalch V. Free-carrier effects and optical phonons in GaNAs/GaAs superlattice heterostructures measured by infrared spectroscopic ellipsometry Mrs Internet Journal of Nitride Semiconductor Research. 5. DOI: 10.1557/S109257830000003X  1
2000 Schubert M, Kasic A, Tiwald TE, Woollam JA, Harle V, Scholz F. Phonons and free carriers in a strained hexagonal GaN-AlN superlattice measured by infrared ellipsometry and Raman spectroscopy Materials Research Society Symposium - Proceedings. 595. DOI: 10.1557/Proc-595-F99W11.39  1
2000 Schubert M, Tiwald TE, Herzinger CM. Infrared dielectric anisotropy and phonon modes of sapphire Physical Review B. 61: 8187-8201. DOI: 10.1103/Physrevb.61.8187  1
2000 Franke EB, Trimble CL, Hale JS, Schubert M, Woollam JA. Infrared switching electrochromic devices based on tungsten oxide Journal of Applied Physics. 88: 5777-5784. DOI: 10.1063/1.1319325  1
2000 Franke EB, Trimble CL, Schubert M, Woollam JA, Hale JS. All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region Applied Physics Letters. 77: 930-932. DOI: 10.1063/1.1288810  1
1999 Schubert M, Tiwald TE, Woollam JA. Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry. Applied Optics. 38: 177-87. PMID 18305601 DOI: 10.1364/Ao.38.000177  1
1999 Schubert M, Hofmann T, Rheinländer B, Pietzonka I, Sass T, Gottschalch V, Woollam JA. Near-band-gap CuPt-order-induced birefringence in Al 0.48 Ga 0.52 InP 2 Physical Review B. 60: 16618-16634. DOI: 10.1103/Physrevb.60.16618  1
1999 Kojro Z, Riede A, Schubert M, Grill W. Systematic and statistical errors in correlation estimators obtained from various digital correlators Review of Scientific Instruments. 70: 4487-4496. DOI: 10.1063/1.1150101  0.04
1999 Grill W, Hillmann K, Kim TJ, Lenkeit O, Ndop J, Schubert M. Scanning acoustic microscopy with vector contrast Physica B-Condensed Matter. 263: 553-558. DOI: 10.1016/S0921-4526(98)01478-1  0.04
1999 Kim TJ, Kojro Z, Pluta M, Schmachtl M, Schubert M, Gudra T, Grill W. Confocal scanning acoustic microscopy in air at normal conditions at frequencies close to the phonon cut-off regime Physica B-Condensed Matter. 263: 588-594. DOI: 10.1016/S0921-4526(98)01431-8  0.01
1998 Schubert M, Franke E, Neumann H, Tiwald TE, Thompson DW, Woollam JA, Hahn J. Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry Thin Solid Films. 692-696. DOI: 10.1016/S0040-6090(97)00979-6  1
1998 Schubert M. Generalized ellipsometry and complex optical systems Thin Solid Films. 313: 323-332. DOI: 10.1016/S0040-6090(97)00841-9  0.01
1996 Schubert M, Rheinländer B, Franke E, Pietzonka I, Škriniarová J, Gottschalch V. Direct-gap reduction and valence-band splitting of ordered indirect-gap AlInP2 studied by dark-field spectroscopy. Physical Review B. 54: 17616-17619. PMID 9985887 DOI: 10.1103/Physrevb.54.17616  1
1996 Schubert M. Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems. Physical Review B. 53: 4265-4274. PMID 9983979 DOI: 10.1103/Physrevb.53.4265  0.01
1996 Cramer C, Binder H, Schubert M, Rheinländer B, Schmiedel H. Optical Properties Of Microconfined Liquid Crystals Molecular Crystals and Liquid Crystals. 282: 395-405. DOI: 10.1080/10587259608037593  1
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