| Year |
Citation |
Score |
| 2023 |
Matson JR, Alam MN, Varnavides G, Sohr P, Knight S, Darakchieva V, Stokey M, Schubert M, Said A, Beechem T, Narang P, Law S, Caldwell JD. The Role of Optical Phonon Confinement in the Infrared Dielectric Response of III-V Superlattices. Advanced Materials (Deerfield Beach, Fla.). e2305106. PMID 38039437 DOI: 10.1002/adma.202305106 |
0.602 |
|
| 2021 |
Armakavicius N, Kühne P, Eriksson J, Bouhafs C, Stanishev V, Ivanov IG, Yakimova R, Zakharov AA, Al-Temimy A, Coletti C, Schubert M, Darakchieva V. Resolving mobility anisotropy in quasi-free-standing epitaxial graphene by terahertz optical Hall effect Carbon. 172: 248-259. DOI: 10.1016/J.Carbon.2020.09.035 |
0.799 |
|
| 2020 |
Knight S, Schöche S, Kühne P, Hofmann T, Darakchieva V, Schubert M. Tunable cavity-enhanced terahertz frequency-domain optical Hall effect. The Review of Scientific Instruments. 91: 083903. PMID 32872950 DOI: 10.1063/5.0010267 |
0.809 |
|
| 2020 |
Ruder A, Wright B, Peev D, Feder R, Kilic U, Hilfiker M, Schubert E, Herzinger CM, Schubert M. Mueller matrix ellipsometer using dual continuously rotating anisotropic mirrors. Optics Letters. 45: 3541-3544. PMID 32630893 DOI: 10.1364/Ol.398060 |
0.349 |
|
| 2020 |
Kilic U, Mock A, Sekora D, Gilbert S, Valloppilly S, Ianno N, Langell M, Schubert E, Schubert M. Precursor-surface interactions revealed during plasma-enhanced atomic layer deposition of metal oxide thin films by in-situ spectroscopic ellipsometry. Scientific Reports. 10: 10392. PMID 32587273 DOI: 10.1038/S41598-020-66409-8 |
0.364 |
|
| 2020 |
Korlacki R, Mock A, Briley C, Darakchieva V, Monemar B, Kumagai Y, Goto K, Higashiwaki M, Schubert M. Comment on “Characteristics of Multi-photon Absorption in a β-Ga2O3 Single Crystal” [J. Phys. Soc. Jpn. 88, 113701 (2019)] Journal of the Physical Society of Japan. 89: 36001. DOI: 10.7566/Jpsj.89.036001 |
0.539 |
|
| 2020 |
Urban FK, Barton D, Schubert M. Numerical ellipsometry: Methods for selecting measurements and techniques for advanced analysis applied to β-gallium oxide Journal of Vacuum Science & Technology A. 38: 023406. DOI: 10.1116/1.5134790 |
0.337 |
|
| 2020 |
Stokey M, Korlacki R, Knight S, Hilfiker M, Galazka Z, Irmscher K, Darakchieva V, Schubert M. Brillouin zone center phonon modes in ZnGa2O4 Applied Physics Letters. 117: 052104. DOI: 10.1063/5.0012526 |
0.619 |
|
| 2020 |
Stokey M, Mock A, Korlacki R, Knight S, Darakchieva V, Schöche S, Schubert M. Infrared active phonons in monoclinic lutetium oxyorthosilicate Journal of Applied Physics. 127: 115702. DOI: 10.1063/1.5135016 |
0.578 |
|
| 2020 |
Persson I, Armakavicius N, Bouhafs C, Stanishev V, Kühne P, Hofmann T, Schubert M, Rosen J, Yakimova R, Persson POÅ, Darakchieva V. Origin of layer decoupling in ordered multilayer graphene grown by high-temperature sublimation on C-face 4H-SiC Apl Materials. 8: 011104. DOI: 10.1063/1.5134862 |
0.8 |
|
| 2019 |
Knight S, Prabhakaran D, Binek C, Schubert M. Electromagnon excitation in cupric oxide measured by Fabry-Pérot enhanced terahertz Mueller matrix ellipsometry. Scientific Reports. 9: 1353. PMID 30718629 DOI: 10.1038/S41598-018-37639-8 |
0.322 |
|
| 2019 |
Kılıç U, Mock A, Feder R, Sekora D, Hilfiker M, Korlacki R, Schubert E, Argyropoulos C, Schubert M. Tunable plasmonic resonances in Si-Au slanted columnar heterostructure thin films. Scientific Reports. 9: 71. PMID 30635603 DOI: 10.1038/S41598-018-37153-X |
0.398 |
|
| 2019 |
Mock A, Korlacki R, Knight S, Stokey M, Fritz A, Darakchieva V, Schubert M. Lattice dynamics of orthorhombic NdGaO3 Physical Review B. 99: 184302. DOI: 10.1103/Physrevb.99.184302 |
0.565 |
|
| 2019 |
Schubert M, Mock A, Korlacki R, Darakchieva V. Phonon order and reststrahlen bands of polar vibrations in crystals with monoclinic symmetry Physical Review B. 99: 41201. DOI: 10.1103/Physrevb.99.041201 |
0.588 |
|
| 2019 |
Hilfiker M, Kilic U, Mock A, Darakchieva V, Knight S, Korlacki R, Mauze A, Zhang Y, Speck J, Schubert M. Dielectric function tensor (1.5 eV to 9.0 eV), anisotropy, and band to band transitions of monoclinic β-(AlxGa1-x)2O3 (x ≤ 0.21) films Applied Physics Letters. 114: 231901. DOI: 10.1063/1.5097780 |
0.594 |
|
| 2019 |
Schubert M, Mock A, Korlacki R, Knight S, Galazka Z, Wagner G, Wheeler V, Tadjer M, Goto K, Darakchieva V. Longitudinal phonon plasmon mode coupling in β-Ga2O3 Applied Physics Letters. 114: 102102. DOI: 10.1063/1.5089145 |
0.608 |
|
| 2019 |
Chen S, Kühne P, Stanishev V, Knight S, Brooke R, Petsagkourakis I, Crispin X, Schubert M, Darakchieva V, Jonsson MP. On the anomalous optical conductivity dispersion of electrically conducting polymers: ultra-wide spectral range ellipsometry combined with a Drude–Lorentz model Journal of Materials Chemistry C. 7: 4350-4362. DOI: 10.1039/C8Tc06302H |
0.78 |
|
| 2019 |
Kananizadeh N, Lee J, Mousavi ES, Rodenhausen KB, Sekora D, Schubert M, Bartelt-Hunt S, Schubert E, Zhang J, Li Y. Deposition of titanium dioxide nanoparticles onto engineered rough surfaces with controlled heights and properties Colloids and Surfaces a: Physicochemical and Engineering Aspects. 571: 125-133. DOI: 10.1016/J.Colsurfa.2019.03.088 |
0.746 |
|
| 2018 |
Oyelade A, Yost AJ, Benker N, Dong B, Knight S, Schubert M, Dowben PA, Kelber JA. Composition-dependent charge transport in boron carbides alloyed with aromatics: PECVD aniline/orthocarborane films. Langmuir : the Acs Journal of Surfaces and Colloids. PMID 30179498 DOI: 10.1021/Acs.Langmuir.8B02114 |
0.361 |
|
| 2018 |
Phan HTM, Bartz JC, Ayers J, Giasson BI, Schubert M, Rodenhausen KB, Kananizadeh N, Li Y, Bartelt-Hunt SL. Adsorption and decontamination of α-synuclein from medically and environmentally-relevant surfaces. Colloids and Surfaces. B, Biointerfaces. 166: 98-107. PMID 29550546 DOI: 10.1016/J.Colsurfb.2018.03.011 |
0.723 |
|
| 2018 |
König M, Rodenhausen KB, Rauch S, Bittrich E, Eichhorn KJ, Schubert MM, Stamm M, Uhlmann P. Salt-sensitivity of the thermoresponsive behavior of PNIPAAm-Brushes. Langmuir : the Acs Journal of Surfaces and Colloids. PMID 29356537 DOI: 10.1021/Acs.Langmuir.7B03919 |
0.743 |
|
| 2018 |
Dugan CL, Peterson GG, Mock A, Young C, Mann JM, Nastasi M, Schubert M, Wang L, Mei W, Tanabe I, Dowben PA, Petrosky J. Electrical and material properties of hydrothermally grown single crystal (111) UO2 The European Physical Journal B. 91. DOI: 10.1140/Epjb/E2018-80489-X |
0.37 |
|
| 2018 |
Kuhne P, Armakavicius N, Stanishev V, Herzinger CM, Schubert M, Darakchieva V. Advanced Terahertz Frequency-Domain Ellipsometry Instrumentation for In Situ and Ex Situ Applications Ieee Transactions On Terahertz Science and Technology. 8: 257-270. DOI: 10.1109/Tthz.2018.2814347 |
0.798 |
|
| 2018 |
Mock A, Korlacki R, Knight S, Schubert M. Anisotropy and phonon modes from analysis of the dielectric function tensor and the inverse dielectric function tensor of monoclinic yttrium orthosilicate Physical Review B. 97. DOI: 10.1103/Physrevb.97.165203 |
0.321 |
|
| 2018 |
Kılıç U, Sekora D, Mock A, Korlacki R, Valloppilly S, Echeverría EM, Ianno N, Schubert E, Schubert M. Critical-point model dielectric function analysis of WO3 thin films deposited by atomic layer deposition techniques Journal of Applied Physics. 124: 115302. DOI: 10.1063/1.5038746 |
0.373 |
|
| 2018 |
Armakavicius N, Stanishev V, Knight S, Kühne P, Schubert M, Darakchieva V. Electron effective mass in In0.33Ga0.67N determined by mid-infrared optical Hall effect Applied Physics Letters. 112: 082103. DOI: 10.1063/1.5018247 |
0.791 |
|
| 2018 |
Knight S, Mock A, Korlacki R, Darakchieva V, Monemar B, Kumagai Y, Goto K, Higashiwaki M, Schubert M. Electron effective mass in Sn-doped monoclinic single crystal β-gallium oxide determined by mid-infrared optical Hall effect Applied Physics Letters. 112: 012103. DOI: 10.1063/1.5011192 |
0.612 |
|
| 2018 |
Mock A, VanDerslice J, Korlacki R, Woollam JA, Schubert M. Elevated temperature dependence of the anisotropic visible-to-ultraviolet dielectric function of monoclinic β-Ga2O3 Applied Physics Letters. 112: 041905. DOI: 10.1063/1.5010936 |
0.505 |
|
| 2017 |
Knight S, Hofmann T, Bouhafs C, Armakavicius N, Kühne P, Stanishev V, Ivanov IG, Yakimova R, Wimer S, Schubert M, Darakchieva V. In-situ terahertz optical Hall effect measurements of ambient effects on free charge carrier properties of epitaxial graphene. Scientific Reports. 7: 5151. PMID 28698648 DOI: 10.1038/S41598-017-05333-W |
0.804 |
|
| 2017 |
Sekora D, Lai RY, Schmidt D, Schubert M, Schubert E. Structural and optical properties of alumina passivated amorphous Si slanted columnar thin films during electrochemical Li-ion intercalation and deintercalation observed byin situgeneralized spectroscopic ellipsometry Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena. 35: 031401. DOI: 10.1116/1.4982880 |
0.396 |
|
| 2017 |
Mock A, Korlacki R, Briley C, Darakchieva V, Monemar B, Kumagai Y, Goto K, Higashiwaki M, Schubert M. Band-to-band transitions, selection rules, effective mass, and excitonic contributions in monoclinic
β−Ga2O3 Physical Review B. 96. DOI: 10.1103/Physrevb.96.245205 |
0.583 |
|
| 2017 |
Mock A, Korlacki R, Knight S, Schubert M. Anisotropy, phonon modes, and lattice anharmonicity from dielectric function tensor analysis of monoclinic cadmium tungstate Physical Review B. 95. DOI: 10.1103/Physrevb.95.165202 |
0.334 |
|
| 2017 |
Schöche S, Hofmann T, Nilsson D, Kakanakova-Georgieva A, Janzén E, Kühne P, Lorenz K, Schubert M, Darakchieva V. Infrared dielectric functions, phonon modes, and free-charge carrier properties of high-Al-content AlxGa1−xN alloys determined by mid infrared spectroscopic ellipsometry and optical Hall effect Journal of Applied Physics. 121: 205701. DOI: 10.1063/1.4983765 |
0.798 |
|
| 2017 |
Bouhafs C, Zakharov A, Ivanov I, Giannazzo F, Eriksson J, Stanishev V, Kühne P, Iakimov T, Hofmann T, Schubert M, Roccaforte F, Yakimova R, Darakchieva V. Multi-scale investigation of interface properties, stacking order and decoupling of few layer graphene on C-face 4H-SiC Carbon. 116: 722-732. DOI: 10.1016/J.Carbon.2017.02.026 |
0.795 |
|
| 2017 |
Rice C, Mock A, Sekora D, Schmidt D, Hofmann T, Schubert E, Schubert M. Control of slanting angle, porosity, and anisotropic optical constants of slanted columnar thin films via in situ nucleation layer tailoring Applied Surface Science. 421: 766-771. DOI: 10.1016/J.Apsusc.2017.03.134 |
0.413 |
|
| 2017 |
Adam S, Koenig M, Rodenhausen KB, Eichhorn K, Oertel U, Schubert M, Stamm M, Uhlmann P. Quartz crystal microbalance with coupled spectroscopic ellipsometry-study of temperature-responsive polymer brush systems Applied Surface Science. 421: 843-851. DOI: 10.1016/J.Apsusc.2017.02.078 |
0.737 |
|
| 2017 |
Hofmann T, Knight S, Sekora D, Schmidt D, Herzinger CM, Woollam JA, Schubert E, Schubert M. Screening effects in metal sculptured thin films studied with terahertz Mueller matrix ellipsometry Applied Surface Science. 421: 513-517. DOI: 10.1016/J.Apsusc.2016.12.200 |
0.573 |
|
| 2017 |
Briley C, Mock A, Korlacki R, Hofmann T, Schubert E, Schubert M. Effects of annealing and conformal alumina passivation on anisotropy and hysteresis of magneto-optical properties of cobalt slanted columnar thin films Applied Surface Science. 421: 320-324. DOI: 10.1016/J.Apsusc.2016.12.198 |
0.408 |
|
| 2017 |
Sekora D, Briley C, Schubert M, Schubert E. Optical and structural properties of cobalt-permalloy slanted columnar heterostructure thin films Applied Surface Science. 421: 783-787. DOI: 10.1016/J.Apsusc.2016.10.104 |
0.426 |
|
| 2017 |
Armakavicius N, Bouhafs C, Stanishev V, Kühne P, Yakimova R, Knight S, Hofmann T, Schubert M, Darakchieva V. Cavity-enhanced optical Hall effect in epitaxial graphene detected at terahertz frequencies Applied Surface Science. 421: 357-360. DOI: 10.1016/J.Apsusc.2016.10.023 |
0.806 |
|
| 2017 |
Mock A, Carlson T, VanDerslice J, Mohrmann J, Woollam JA, Schubert E, Schubert M. Multiple-layered effective medium approximation approach to modeling environmental effects on alumina passivated highly porous silicon nanostructured thin films measured by in-situ Mueller matrix ellipsometry Applied Surface Science. 421: 663-666. DOI: 10.1016/J.Apsusc.2016.10.004 |
0.586 |
|
| 2016 |
Peev D, Hofmann T, Kananizadeh N, Beeram S, Rodriguez E, Wimer S, Rodenhausen KB, Herzinger CM, Kasputis T, Pfaunmiller E, Nguyen A, Korlacki R, Pannier A, Li Y, Schubert E, ... ... Schubert M, et al. Anisotropic contrast optical microscope. The Review of Scientific Instruments. 87: 113701. PMID 27910407 DOI: 10.1063/1.4965878 |
0.756 |
|
| 2016 |
Schubert M, Kühne P, Darakchieva V, Hofmann T. Optical Hall effect-model description: tutorial. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 33: 1553-68. PMID 27505654 DOI: 10.1364/Josaa.33.001553 |
0.803 |
|
| 2016 |
Kananizadeh N, Rice C, Lee J, Rodenhausen KB, Sekora D, Schubert M, Schubert E, Bartelt-Hunt S, Li Y. Combined quartz crystal microbalance with dissipation (QCM-D) and generalized ellipsometry (GE) to characterize the deposition of titanium dioxide nanoparticles on model rough surfaces. Journal of Hazardous Materials. PMID 27041442 DOI: 10.1016/J.Jhazmat.2016.03.048 |
0.754 |
|
| 2016 |
Schubert M, Korlacki R, Knight S, Hofmann T, Schöche S, Darakchieva V, Janzén E, Monemar B, Gogova D, Thieu QT, Togashi R, Murakami H, Kumagai Y, Goto K, Kuramata A, et al. Anisotropy, phonon modes, and free charge carrier parameters in monoclinic β -gallium oxide single crystals Physical Review B - Condensed Matter and Materials Physics. 93. DOI: 10.1103/Physrevb.93.125209 |
0.636 |
|
| 2016 |
Bouhafs C, Stanishev V, Zakharov AA, Hofmann T, Kühne P, Iakimov T, Yakimova R, Schubert M, Darakchieva V. Decoupling and ordering of multilayer graphene on C-face 3C-SiC(111) Applied Physics Letters. 109: 203102. DOI: 10.1063/1.4967525 |
0.787 |
|
| 2016 |
Mock A, Korlacki R, Briley C, Sekora D, Hofmann T, Wilson P, Sinitskii A, Schubert E, Schubert M. Anisotropy, band-to-band transitions, phonon modes, and oxidation properties of cobalt-oxide core-shell slanted columnar thin films Applied Physics Letters. 108. DOI: 10.1063/1.4941399 |
0.345 |
|
| 2015 |
Phan HT, Bartelt-Hunt S, Rodenhausen KB, Schubert M, Bartz JC. Investigation of Bovine Serum Albumin (BSA) Attachment onto Self-Assembled Monolayers (SAMs) Using Combinatorial Quartz Crystal Microbalance with Dissipation (QCM-D) and Spectroscopic Ellipsometry (SE). Plos One. 10: e0141282. PMID 26505481 DOI: 10.1371/Journal.Pone.0141282 |
0.739 |
|
| 2015 |
Knight S, Schöche S, Darakchieva V, Kühne P, Carlin JF, Grandjean N, Herzinger CM, Schubert M, Hofmann T. Cavity-enhanced optical Hall effect in two-dimensional free charge carrier gases detected at terahertz frequencies. Optics Letters. 40: 2688-91. PMID 26076237 DOI: 10.1364/Ol.40.002688 |
0.802 |
|
| 2015 |
Rodenhausen KB, Davis RS, Sekora D, Liang D, Mock A, Neupane R, Schmidt D, Hofmann T, Schubert E, Schubert M. The retention of liquid by columnar nanostructured surfaces during quartz crystal microbalance measurements and the effects of adsorption thereon. Journal of Colloid and Interface Science. 455: 226-35. PMID 26072447 DOI: 10.1016/J.Jcis.2015.05.038 |
0.738 |
|
| 2015 |
Kasputis T, Pieper A, Rodenhausen KB, Schmidt D, Sekora D, Rice C, Schubert E, Schubert M, Pannier AK. Use of precisely sculptured thin film (STF) substrates with generalized ellipsometry to determine spatial distribution of adsorbed fibronectin to nanostructured columnar topographies and effect on cell adhesion. Acta Biomaterialia. 18: 88-99. PMID 25712389 DOI: 10.1016/J.Actbio.2015.02.016 |
0.759 |
|
| 2015 |
Koenig M, Kasputis T, Schmidt D, Rodenhausen KB, Eichhorn KJ, Pannier AK, Schubert M, Stamm M, Uhlmann P. Erratum to: Combined QCM-D/GE as a tool to characterize stimuli-responsive swelling of and protein adsorption on polymer brushes grafted onto 3D-nanostructures. Analytical and Bioanalytical Chemistry. 407: 1275-6. PMID 25432305 DOI: 10.1007/S00216-014-8343-1 |
0.756 |
|
| 2015 |
Ben Sedrine N, Zukauskaite A, Birch J, Jensen J, Hultman L, Schöche S, Schubert M, Darakchieva V. Infrared dielectric functions and optical phonons of wurtzite YxAl1-xN (0 x 0.22) Journal of Physics D: Applied Physics. 48. DOI: 10.1088/0022-3727/48/41/415102 |
0.651 |
|
| 2015 |
Liang D, Sekora D, Rice C, Schubert E, Schubert M. Optical anisotropy of porous polymer film with inverse slanted nanocolumnar structure revealed via generalized spectroscopic ellipsometry Applied Physics Letters. 107. DOI: 10.1063/1.4929367 |
0.369 |
|
| 2015 |
Wilson PM, Lipatov A, Schmidt D, Schubert E, Schubert M, Sinitskii A, Hofmann T. Structural and optical properties of cobalt slanted nanopillars conformally coated with few-layer graphene Applied Physics Letters. 106. DOI: 10.1063/1.4922199 |
0.399 |
|
| 2015 |
Briley C, Schmidt D, Hofmann T, Schubert E, Schubert M. Anisotropic magneto-optical hysteresis of permalloy slanted columnar thin films determined by vector magneto-optical generalized ellipsometry Applied Physics Letters. 106. DOI: 10.1063/1.4916669 |
0.403 |
|
| 2015 |
Bouhafs C, Darakchieva V, Persson IL, Tiberj A, Persson POÅ, Paillet M, Zahab AA, Landois P, Juillaguet S, Schöche S, Schubert M, Yakimova R. Structural properties and dielectric function of graphene grown by high-temperature sublimation on 4H-SiC(000-1) Journal of Applied Physics. 117. DOI: 10.1063/1.4908216 |
0.61 |
|
| 2014 |
Koenig M, Kasputis T, Schmidt D, Rodenhausen KB, Eichhorn KJ, Pannier AK, Schubert M, Stamm M, Uhlmann P. Combined QCM-D/GE as a tool to characterize stimuli-responsive swelling of and protein adsorption on polymer brushes grafted onto 3D-nanostructures Analytical and Bioanalytical Chemistry. 406: 7233-7242. PMID 25240934 DOI: 10.1007/s00216-014-8154-4 |
0.742 |
|
| 2014 |
Kühne P, Herzinger CM, Schubert M, Woollam JA, Hofmann T. Invited article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument. The Review of Scientific Instruments. 85: 071301. PMID 25085120 DOI: 10.1063/1.4889920 |
0.786 |
|
| 2014 |
Xie MY, Schubert M, Lu J, Persson POA, Stanishev V, Hsiao CL, Chen LC, Schaff WJ, Darakchieva V. Assessing structural, free-charge carrier, and phonon properties of mixed-phase epitaxial films: The case of InN Physical Review B - Condensed Matter and Materials Physics. 90. DOI: 10.1103/Physrevb.90.195306 |
0.637 |
|
| 2014 |
Xie MY, Ben Sedrine N, Schöche S, Hofmann T, Schubert M, Hung L, Monemar B, Wang X, Yoshikawa A, Wang K, Araki T, Nanishi Y, Darakchieva V. Effect of Mg doping on the structural and free-charge carrier properties of InN films Journal of Applied Physics. 115. DOI: 10.1063/1.4871975 |
0.623 |
|
| 2014 |
Schöche S, Hofmann T, Darakchieva V, Wang X, Yoshikawa A, Wang K, Araki T, Nanishi Y, Schubert M. Free-charge carrier parameters of n-type, p-type and compensated InN:Mg determined by infrared spectroscopic ellipsometry Thin Solid Films. 571: 384-388. DOI: 10.1016/J.Tsf.2014.01.051 |
0.625 |
|
| 2014 |
Kasputis T, Pieper A, Schubert M, Pannier AK. Dynamic analysis of DNA nanoparticle immobilization to model biomaterial substrates using combinatorial spectroscopic ellipsometry and quartz crystal microbalance with dissipation Thin Solid Films. 571: 637-643. DOI: 10.1016/J.Tsf.2014.01.046 |
0.306 |
|
| 2014 |
Yakimova R, Iakimov T, Yazdi G, Bouhafs C, Eriksson J, Zakharov A, Boosalis A, Schubert M, Darakchieva V. Morphological and electronic properties of epitaxial graphene on SiC Physica B: Condensed Matter. 439: 54-59. DOI: 10.1016/J.Physb.2013.12.048 |
0.594 |
|
| 2014 |
Rodenhausen KB, Schmidt D, Rice C, Hofmann T, Schubert E, Schubert M. Detection of Organic Attachment onto Highly Ordered Three-Dimensional Nanostructure Thin Films by Generalized Ellipsometry and Quartz Crystal Microbalance with Dissipation Techniques Springer Series in Surface Sciences. 52: 135-154. DOI: 10.1007/978-3-642-40128-2_7 |
0.74 |
|
| 2013 |
Kühne P, Darakchieva V, Yakimova R, Tedesco JD, Myers-Ward RL, Eddy CR, Gaskill DK, Herzinger CM, Woollam JA, Schubert M, Hofmann T. Polarization selection rules for inter-Landau-level transitions in epitaxial graphene revealed by the infrared optical Hall effect. Physical Review Letters. 111: 077402. PMID 23992081 DOI: 10.1103/Physrevlett.111.077402 |
0.799 |
|
| 2013 |
Kühne P, Boosalis A, Herzinger CM, Nyakiti LO, Wheeler VD, Myers-Ward RL, Eddy CR, Gaskill DK, Schubert M, Hofmann T. Optical Hall effect measurement of coupled phonon mode - Landau level transitions in epitaxial graphene on silicon carbide Materials Research Society Symposium Proceedings. 1505: 211-217. DOI: 10.1557/Opl.2013.811 |
0.751 |
|
| 2013 |
Boosalis A, Elmquist R, Real M, Nguyen N, Schubert M, Hofmann T. A Model Dielectric Function for Graphene from the Infrared to the Ultraviolet Mrs Proceedings. 1505. DOI: 10.1557/Opl.2013.525 |
0.33 |
|
| 2013 |
Schöche S, Kühne P, Hofmann T, Schubert M, Nilsson D, Kakanakova-Georgieva A, Janzén E, Darakchieva V. Electron effective mass in Al0.72Ga0.28N alloys determined by mid-infrared optical Hall effect Applied Physics Letters. 103: 212107. DOI: 10.1063/1.4833195 |
0.785 |
|
| 2013 |
Liang D, Schmidt D, Wang H, Schubert E, Schubert M. Generalized ellipsometry effective medium approximation analysis approach for porous slanted columnar thin films infiltrated with polymer Applied Physics Letters. 103. DOI: 10.1063/1.4821159 |
0.387 |
|
| 2013 |
Schmidt D, Schubert M. Anisotropic Bruggeman effective medium approaches for slanted columnar thin films Journal of Applied Physics. 114: 083510. DOI: 10.1063/1.4819240 |
0.374 |
|
| 2013 |
Darakchieva V, Boosalis A, Zakharov AA, Hofmann T, Schubert M, Tiwald TE, Iakimov T, Vasiliauskas R, Yakimova R. Large-area microfocal spectroscopic ellipsometry mapping of thickness and electronic properties of epitaxial graphene on Si- and C-face of 3C-SiC(111) Applied Physics Letters. 102: 213116. DOI: 10.1063/1.4808379 |
0.614 |
|
| 2013 |
Schöche S, Hofmann T, Korlacki R, Tiwald TE, Schubert M. Infrared dielectric anisotropy and phonon modes of rutile TiO2 Journal of Applied Physics. 113: 164102. DOI: 10.1063/1.4802715 |
0.368 |
|
| 2013 |
Schmidt D, Briley C, Schubert E, Schubert M. Vector magneto-optical generalized ellipsometry for sculptured thin films Applied Physics Letters. 102: 123109. DOI: 10.1063/1.4799365 |
0.372 |
|
| 2013 |
Schöche S, Hofmann T, Darakchieva V, Ben Sedrine N, Wang X, Yoshikawa A, Schubert M. Infrared to vacuum-ultraviolet ellipsometry and optical Hall-effect study of free-charge carrier parameters in Mg-doped InN Journal of Applied Physics. 113: 013502. DOI: 10.1063/1.4772625 |
0.646 |
|
| 2013 |
Kasputis T, Koenig M, Schmidt D, Sekora D, Rodenhausen KB, Eichhorn KJ, Uhlmann P, Schubert E, Pannier AK, Schubert M, Stamm M. Slanted columnar thin films prepared by glancing angle deposition functionalized with polyacrylic acid polymer brushes Journal of Physical Chemistry C. 117: 13971-13980. DOI: 10.1021/Jp402055H |
0.758 |
|
| 2013 |
Koenig M, Rodenhausen KB, Schmidt D, Eichhorn KJ, Schubert M, Stamm M, Uhlmann P. In situ synthesis of palladium nanoparticles in polymer brushes followed by QCM-D coupled with spectroscopic ellipsometry Particle and Particle Systems Characterization. 30: 931-935. DOI: 10.1002/Ppsc.201300155 |
0.729 |
|
| 2012 |
Rodenhausen KB, Schmidt D, Kasputis T, Pannier AK, Schubert E, Schubert M. Generalized ellipsometry in-situ quantification of organic adsorbate attachment within slanted columnar thin films. Optics Express. 20: 5419-28. PMID 22418349 DOI: 10.1364/Oe.20.005419 |
0.781 |
|
| 2012 |
Zhou M, Pasquale FL, Dowben PA, Boosalis A, Schubert M, Darakchieva V, Yakimova R, Kong L, Kelber JA. Direct graphene growth on Co3O4(111) by molecular beam epitaxy. Journal of Physics. Condensed Matter : An Institute of Physics Journal. 24: 072201. PMID 22223630 DOI: 10.1088/0953-8984/24/7/072201 |
0.617 |
|
| 2012 |
Schöche S, Hofmann T, Ben Sedrine N, Darakchieva V, Wang X, Yoshikawa A, Schubert M. Infrared ellipsometry and near-infrared-to-vacuum-ultraviolet ellipsometry study of free-charge carrier properties in In-polar p-type InN Mrs Proceedings. 1396. DOI: 10.1557/Opl.2012.86 |
0.636 |
|
| 2012 |
Hofmann T, Schmidt D, Boosalis A, Kühne P, Herzinger C, Woollam J, Schubert E, Schubert M. Metal slanted columnar thin film THz optical sensors Mrs Proceedings. 1409. DOI: 10.1557/Opl.2012.780 |
0.782 |
|
| 2012 |
Boosalis A, Hofmann T, Darakchieva V, Yakimova R, Tiwald T, Schubert M. Spectroscopic Mapping Ellipsometry of Graphene Grown on 3C SiC Mrs Proceedings. 1407. DOI: 10.1557/Opl.2012.457 |
0.621 |
|
| 2012 |
Schmidt D, Schubert E, Schubert M. Aging Effects of As-deposited and Passivated Cobalt Slanted Columnar Thin Films Mrs Proceedings. 1409. DOI: 10.1557/Opl.2012.393 |
0.415 |
|
| 2012 |
Schmidt D, Briley C, Schubert E, Schubert M. Vector Magneto-Optical Generalized Ellipsometry on Passivated Permalloy Slanted Columnar Thin Films Mrs Proceedings. 1408. DOI: 10.1557/Opl.2012.39 |
0.407 |
|
| 2012 |
Hofmann T, Kühne P, Schöche S, Chen J, Forsberg U, Janzén E, Ben Sedrine N, Herzinger CM, Woollam JA, Schubert M, Darakchieva V. Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures Applied Physics Letters. 101: 192102. DOI: 10.1063/1.4765351 |
0.801 |
|
| 2012 |
Boosalis A, Hofmann T, Darakchieva V, Yakimova R, Schubert M. Visible to vacuum ultraviolet dielectric functions of epitaxial graphene on 3C and 4H SiC polytypes determined by spectroscopic ellipsometry Applied Physics Letters. 101: 11912. DOI: 10.1063/1.4732159 |
0.607 |
|
| 2012 |
Schmidt D, Schubert E, Schubert M. Optical properties of cobalt slanted columnar thin films passivated by atomic layer deposition Applied Physics Letters. 100: 011912. DOI: 10.1063/1.3675549 |
0.414 |
|
| 2011 |
Rodenhausen KB, Kasputis T, Pannier AK, Gerasimov JY, Lai RY, Solinsky M, Tiwald TE, Wang H, Sarkar A, Hofmann T, Ianno N, Schubert M. Combined optical and acoustical method for determination of thickness and porosity of transparent organic layers below the ultra-thin film limit. The Review of Scientific Instruments. 82: 103111. PMID 22047284 DOI: 10.1063/1.3653880 |
0.771 |
|
| 2011 |
Hofmann T, Schmidt D, Boosalis A, Kühne P, Skomski R, Herzinger CM, Woollam JA, Schubert M, Schubert E. THz dielectric anisotropy of metal slanted columnar thin films Applied Physics Letters. 99: 081903. DOI: 10.1063/1.3626846 |
0.796 |
|
| 2011 |
Schöche S, Shi J, Boosalis A, Kühne P, Herzinger CM, Woollam JA, Schaff WJ, Eastman LF, Schubert M, Hofmann T. Terahertz optical-Hall effect characterization of two-dimensional electron gas properties in AlGaN/GaN high electron mobility transistor structures Applied Physics Letters. 98. DOI: 10.1063/1.3556617 |
0.795 |
|
| 2011 |
Hofmann T, Boosalis A, Kühne P, Herzinger CM, Woollam JA, Gaskill DK, Tedesco JL, Schubert M. Hole-channel conductivity in epitaxial graphene determined by terahertz optical-Hall effect and midinfrared ellipsometry Applied Physics Letters. 98: 041906. DOI: 10.1063/1.3548543 |
0.801 |
|
| 2011 |
Schmidt D, Müller C, Hofmann T, Inganäs O, Arwin H, Schubert E, Schubert M. Optical properties of hybrid titanium chevron sculptured thin films coated with a semiconducting polymer Thin Solid Films. 519: 2645-2649. DOI: 10.1016/J.Tsf.2010.12.111 |
0.401 |
|
| 2011 |
Ben Sedrine N, Bouhafs C, Schubert M, Harmand J, Chtourou R, Darakchieva V. Optical properties of GaAs0.9-xNxSb0.1 alloy films studied by spectroscopic ellipsometry Thin Solid Films. 519: 2838-2842. DOI: 10.1016/J.Tsf.2010.12.056 |
0.587 |
|
| 2011 |
Boosalis A, Hofmann T, Šik J, Schubert M. Free-charge carrier profile of iso- and aniso-type Si homojunctions determined by terahertz and mid-infrared ellipsometry Thin Solid Films. 519: 2604-2607. DOI: 10.1016/J.Tsf.2010.11.092 |
0.36 |
|
| 2011 |
Kühne P, Hofmann T, Herzinger C, Schubert M. Terahertz optical-Hall effect for multiple valley band materials: n-type silicon Thin Solid Films. 519: 2613-2616. DOI: 10.1016/J.Tsf.2010.11.087 |
0.761 |
|
| 2011 |
Montgomery E, Krahmer C, Streubel K, Hofmann T, Schubert E, Schubert M. Temperature dependent model dielectric function of highly disordered Ga0.52In0.48P Thin Solid Films. 519: 2859-2862. DOI: 10.1016/J.Tsf.2010.11.086 |
0.319 |
|
| 2011 |
Rodenhausen KB, Duensing BA, Kasputis T, Pannier AK, Hofmann T, Schubert M, Tiwald TE, Solinsky M, Wagner M. In-situ monitoring of alkanethiol self-assembled monolayer chemisorption with combined spectroscopic ellipsometry and quartz crystal microbalance techniques Thin Solid Films. 519: 2817-2820. DOI: 10.1016/J.Tsf.2010.11.081 |
0.752 |
|
| 2011 |
Rodenhausen K, Schubert M. Virtual separation approach to study porous ultra-thin films by combined spectroscopic ellipsometry and quartz crystal microbalance methods Thin Solid Films. 519: 2772-2776. DOI: 10.1016/J.Tsf.2010.11.079 |
0.767 |
|
| 2011 |
Rodenhausen K, Guericke M, Sarkar A, Hofmann T, Ianno N, Schubert M, Tiwald T, Solinsky M, Wagner M. Micelle-assisted bilayer formation of cetyltrimethylammonium bromide thin films studied with combinatorial spectroscopic ellipsometry and quartz crystal microbalance techniques Thin Solid Films. 519: 2821-2824. DOI: 10.1016/J.Tsf.2010.11.078 |
0.772 |
|
| 2011 |
Hofmann T, Herzinger C, Tedesco J, Gaskill D, Woollam J, Schubert M. Terahertz ellipsometry and terahertz optical-Hall effect Thin Solid Films. 519: 2593-2600. DOI: 10.1016/J.Tsf.2010.11.069 |
0.585 |
|
| 2010 |
Bittrich E, Rodenhausen KB, Eichhorn KJ, Hofmann T, Schubert M, Stamm M, Uhlmann P. Protein adsorption on and swelling of polyelectrolyte brushes: A simultaneous ellipsometry-quartz crystal microbalance study. Biointerphases. 5: 159-67. PMID 21219037 DOI: 10.1116/1.3530841 |
0.747 |
|
| 2010 |
Hofmann T, Herzinger CM, Boosalis A, Tiwald TE, Woollam JA, Schubert M. Variable-wavelength frequency-domain terahertz ellipsometry. The Review of Scientific Instruments. 81: 023101. PMID 20192479 DOI: 10.1063/1.3297902 |
0.548 |
|
| 2010 |
Voora VM, Hofmann T, Brandt M, Lorenz M, Grundmann M, Ashkenov N, Schmidt H, Ianno NJ, Schubert M. Interface polarization coupling in piezoelectric-semiconductor ferroelectric heterostructures Physical Review B. 81: 195307. DOI: 10.1103/Physrevb.81.195307 |
0.779 |
|
| 2010 |
Makinistian L, Albanesi EA, Gonzalez Lemus NV, Petukhov AG, Schmidt D, Schubert E, Schubert M, Losovyj YB, Galiy P, Dowben P. Ab initio calculations and ellipsometry measurements of the optical properties of the layered semiconductor In4 Se3 Physical Review B - Condensed Matter and Materials Physics. 81. DOI: 10.1103/Physrevb.81.075217 |
0.397 |
|
| 2010 |
Schmidt D, Hofmann T, Herzinger CM, Schubert E, Schubert M. Magneto-optical properties of cobalt slanted columnar thin films Applied Physics Letters. 96: 091906. DOI: 10.1063/1.3340913 |
0.424 |
|
| 2010 |
Darakchieva V, Lorenz K, Barradas NP, Alves E, Monemar B, Schubert M, Franco N, Hsiao CL, Chen LC, Schaff WJ, Tu LW, Yamaguchi T, Nanishi Y. Hydrogen in InN: A ubiquitous phenomenon in molecular beam epitaxy grown material Applied Physics Letters. 96. DOI: 10.1063/1.3327333 |
0.605 |
|
| 2010 |
Saenger M, Sun J, Schädel M, Hilfiker J, Schubert M, Woollam J. Spectroscopic ellipsometry characterization of SiNx antireflection films on textured multicrystalline and monocrystalline silicon solar cells Thin Solid Films. 518: 1830-1834. DOI: 10.1016/J.Tsf.2009.09.042 |
0.576 |
|
| 2010 |
Scarlat C, Mok KM, Zhou S, Vinnichenko M, Lorenz M, Grundmann M, Helm M, Schubert M, Schmidt H. Voigt effect measurement on PLD grown NiO thin films Physica Status Solidi (C). 7: 334-337. DOI: 10.1002/Pssc.200982504 |
0.377 |
|
| 2009 |
Schmidt D, Booso B, Hofmann T, Schubert E, Sarangan A, Schubert M. Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films. Optics Letters. 34: 992-4. PMID 19340195 DOI: 10.1364/Ol.34.000992 |
0.403 |
|
| 2009 |
Dressel M, Gompf B, Faltermeier D, Tripathi AK, Pflaum J, Schubert M. Kramers-Kronig-consistent optical functions of anisotropic crystals: generalized spectroscopic ellipsometry on pentacene. Optics Express. 16: 19770-8. PMID 19030062 DOI: 10.1364/Oe.16.019770 |
0.378 |
|
| 2009 |
Hofmann T, Herzinger CM, Woollam JA, Schubert M. Materials Characterization using THz Ellipsometry Mrs Proceedings. 1163. DOI: 10.1557/PROC-1163-K08-04 |
0.542 |
|
| 2009 |
Hofmann T, Herzinger CM, Woollam JA, Schubert M. Materials characterization using THz ellipsometry Materials Research Society Symposium Proceedings. 1163: 19-24. DOI: 10.1557/Proc-1163-K08-04 |
0.591 |
|
| 2009 |
Darakchieva V, Schubert M, Hofmann T, Monemar B, Hsiao C, Liu T, Chen L, Schaff WJ, Takagi Y, Nanishi Y. Electron accumulation at nonpolar and semipolar surfaces of wurtzite InN from generalized infrared ellipsometry Applied Physics Letters. 95: 202103. DOI: 10.1063/1.3261731 |
0.604 |
|
| 2009 |
Voora VM, Hofmann T, Brandt M, Lorenz M, Ashkenov N, Grundmann M, Schubert M. Electrical properties of ZnO–BaTiO3–ZnO heterostructures with asymmetric interface charge distribution Applied Physics Letters. 95: 82902. DOI: 10.1063/1.3211914 |
0.784 |
|
| 2009 |
Billa RB, Hofmann T, Schubert M, Robertson BW. Annealing effects on the optical properties of semiconducting boron carbide Journal of Applied Physics. 106. DOI: 10.1063/1.3190679 |
0.357 |
|
| 2009 |
Hofmann T, Herzinger CM, Tiwald TE, Woollam JA, Schubert M. Hole diffusion profile in a p- p+ silicon homojunction determined by terahertz and midinfrared spectroscopic ellipsometry Applied Physics Letters. 95. DOI: 10.1063/1.3184567 |
0.494 |
|
| 2009 |
Voora VM, Hofmann T, Brandt M, Lorenz M, Grundmann M, Ashkenov N, Schubert M. Publisher’s Note: “Resistive hysteresis and interface charge coupling in BaTiO3-ZnO heterostructures” [Appl. Phys. Lett. 94, 142904 (2009)] Applied Physics Letters. 94: 199902. DOI: 10.1063/1.3142982 |
0.773 |
|
| 2009 |
Schmidt D, Kjerstad AC, Hofmann T, Skomski R, Schubert E, Schubert M. Optical, structural, and magnetic properties of cobalt nanostructure thin films Journal of Applied Physics. 105: 113508. DOI: 10.1063/1.3138809 |
0.399 |
|
| 2009 |
Voora VM, Hofmann T, Schubert M, Brandt M, Lorenz M, Grundmann M, Ashkenov N, Schubert M. Resistive hysteresis and interface charge coupling in BaTiO3-ZnO heterostructures Applied Physics Letters. 94: 142904. DOI: 10.1063/1.3116122 |
0.791 |
|
| 2009 |
Darakchieva V, Hofmann T, Schubert M, Sernelius BE, Monemar B, Persson POA, Giuliani F, Alves E, Lu H, Schaff WJ. Free electron behavior in InN: On the role of dislocations and surface electron accumulation Applied Physics Letters. 94: 22109. DOI: 10.1063/1.3065030 |
0.62 |
|
| 2009 |
Schmidt D, Booso B, Hofmann T, Schubert E, Sarangan A, Schubert M. Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry Applied Physics Letters. 94. DOI: 10.1063/1.3062996 |
0.41 |
|
| 2009 |
Darakchieva V, Barradas NP, Xie MY, Lorenz K, Alves E, Schubert M, Persson POA, Giuliani F, Munnik F, Hsiao CL, Tu LW, Schaff WJ. Role of impurities and dislocations for the unintentional n-type conductivity in InN Physica B: Condensed Matter. 404: 4476-4481. DOI: 10.1016/J.Physb.2009.09.042 |
0.619 |
|
| 2008 |
Sarkar A, Viitala T, Hofmann T, Tiwald TE, Woollam JA, Kjerstad A, Laderian B, Schubert M. Monitoring Organic Thin Film Growth In Aqueous Solution In-situ With A Combined Quartz Crystal Microbalance and Ellipsometry Mrs Proceedings. 1146. DOI: 10.1557/Proc-1146-Nn09-02 |
0.541 |
|
| 2008 |
Saenger MF, Schädel M, Hofmann T, Hilfiker J, Sun J, Tiwald T, Schubert M, Woollam JA. Infrared ellipsometric characterization of silicon nitride films on textured Si photovoltaic cells Mrs Proceedings. 1123. DOI: 10.1557/Proc-1123-1123-P02-02 |
0.552 |
|
| 2008 |
Hofmann T, Herzinger CM, Schade U, Mross M, Woollam JA, Schubert M. Terahertz Ellipsometry Using Electron-Beam Based Sources Mrs Proceedings. 1108. DOI: 10.1557/Proc-1108-A08-04 |
0.547 |
|
| 2008 |
Hofmann T, Schubert M, Schmidt D, Schubert E. Infrared behavior of aluminum nanostructure sculptured thin films Mrs Proceedings. 1080. DOI: 10.1557/Proc-1080-O04-16 |
0.377 |
|
| 2008 |
Voora V, Hofmann T, Kjerstad A, Brandt M, Lorenz M, Grundmann M, Schubert M. Interface-charge-coupled polarization response model of Pt-BaTiO3-ZnO-Pt heterojunctions: Physical parameters variation Mrs Proceedings. 1074. DOI: 10.1557/Proc-1074-I01-11 |
0.791 |
|
| 2008 |
Saenger MF, Höing T, Robertson BW, Billa RB, Hofmann T, Schubert E, Schubert M. Polaron and phonon properties in proton intercalated amorphous tungsten oxide thin films Physical Review B - Condensed Matter and Materials Physics. 78. DOI: 10.1103/Physrevb.78.245205 |
0.362 |
|
| 2008 |
Darakchieva V, Monemar B, Usui A, Saenger M, Schubert M. Lattice parameters of bulk GaN fabricated by halide vapor phase epitaxy Journal of Crystal Growth. 310: 959-965. DOI: 10.1016/J.Jcrysgro.2007.11.130 |
0.623 |
|
| 2008 |
Voora VM, Hofmann T, Brandt M, Lorenz M, Grundmann M, Ashkenov N, Schubert M. Interface-Charge-Coupled Polarization Response of Pt-BaTiO3-ZnO-Pt Heterojunctions: A Physical Model Approach Journal of Electronic Materials. 37: 1029-1034. DOI: 10.1007/S11664-008-0461-0 |
0.802 |
|
| 2008 |
Hofmann T, Darakchieva V, Monemar B, Lu H, Schaff W, Schubert M. Optical Hall Effect in Hexagonal InN Journal of Electronic Materials. 37: 611-615. DOI: 10.1007/S11664-008-0385-8 |
0.661 |
|
| 2008 |
Voora VM, Hofmann T, Brandt M, Lorenz M, Grundmann M, Schubert M. Electrooptic ellipsometry study of piezoelectric BaTiO3-ZnO heterostructures Physica Status Solidi (C). 5: 1328-1331. DOI: 10.1002/Pssc.200777908 |
0.805 |
|
| 2008 |
Saenger MF, Hetterich M, Hofmann T, Kirby RD, Sellmyer DJ, Schubert M. Dielectric and magnetic birefringence in low-chlorine-doped n-type Zn 1-xMnxSe Physica Status Solidi (C) Current Topics in Solid State Physics. 5: 1007-1011. DOI: 10.1002/Pssc.200777907 |
0.397 |
|
| 2008 |
Hofmann T, von Middendorff C, Gottschalch V, Schubert M. Optical Hall effect studies on modulation-doped AlxGa1–xAs:Si/GaAs quantum wells Physica Status Solidi (C). 5: 1386-1390. DOI: 10.1002/Pssc.200777905 |
0.325 |
|
| 2008 |
Sturm C, Chavdarov T, Schmidt-Grund R, Rheinländer B, Bundesmann C, Hochmuth H, Lorenz M, Schubert M, Grundmann M. Investigation of the free charge carrier properties at the ZnO-sapphire interface in a-plane ZnO films studied by generalized infrared ellipsometry Physica Status Solidi (C). 5: 1350-1353. DOI: 10.1002/Pssc.200777853 |
0.401 |
|
| 2008 |
Schmidt D, Schubert E, Schubert M. Generalized ellipsometry determination of non-reciprocity in chiral silicon sculptured thin films Physica Status Solidi (a). 205: 748-751. DOI: 10.1002/Pssa.200777906 |
0.386 |
|
| 2008 |
Hofmann T, Herzinger CM, Krahmer C, Streubel K, Schubert M. The optical Hall effect Physica Status Solidi (a). 205: 779-783. DOI: 10.1002/Pssa.200777904 |
0.396 |
|
| 2008 |
Saenger MF, Höing T, Hofmann T, Schubert M. Polaron transitions in charge intercalated amorphous tungsten oxide thin films Physica Status Solidi (a). 205: 914-917. DOI: 10.1002/Pssa.200777894 |
0.314 |
|
| 2007 |
Darakchieva V, Paskova T, Schubert M, Arwin H, Paskov PP, Monemar B, Hommel D, Heuken M, Off J, Scholz F, Haskell BA, Fini PT, Speck JS, Nakamura S. Anisotropic strain and phonon deformation potentials in GaN Physical Review B - Condensed Matter and Materials Physics. 75. DOI: 10.1103/Physrevb.75.195217 |
0.584 |
|
| 2007 |
Bundesmann C, Buiu O, Hall S, Schubert M. Dielectric constants and phonon modes of amorphous hafnium aluminate deposited by metal organic chemical vapor deposition Applied Physics Letters. 91: 121916. DOI: 10.1063/1.2787962 |
0.388 |
|
| 2007 |
Hofmann T, Gottschalch V, Schubert M. Dielectric anisotropy and phonon modes of ordered indirect-gap Al0.52In0.48P studied by far-infrared ellipsometry Applied Physics Letters. 91: 121908. DOI: 10.1063/1.2785949 |
0.335 |
|
| 2007 |
Hofstetter D, Bonetti Y, Giorgetta FR, El-Shaer AH, Bakin A, Waag A, Schmidt-Grund R, Schubert M, Grundmann M. Demonstration of an ultraviolet ZnO-based optically pumped third order distributed feedback laser Applied Physics Letters. 91. DOI: 10.1063/1.2783965 |
0.342 |
|
| 2007 |
Hofmann T, Schubert M, Leibiger G, Gottschalch V. Electron effective mass and phonon modes in GaAs incorporating boron and indium Applied Physics Letters. 90: 182110. DOI: 10.1063/1.2735669 |
0.345 |
|
| 2007 |
Darakchieva V, Paskova T, Schubert M, Paskov PP, Arwin H, Monemar B, Hommel D, Heuken M, Off J, Haskell BA, Fini PT, Speck JS, Nakamura S. Effect of anisotropic strain on phonons in a-plane and c-plane GaN layers Journal of Crystal Growth. 300: 233-238. DOI: 10.1016/J.Jcrysgro.2006.11.023 |
0.632 |
|
| 2007 |
Krahmer C, Philippens M, Schubert M, Streubel K. MOVPE growth investigations of doping and ordering in AlGaAs and GaInP with reflectance anisotropy spectroscopy Journal of Crystal Growth. 298: 18-22. DOI: 10.1016/J.Jcrysgro.2006.10.001 |
0.317 |
|
| 2006 |
Bundesmann C, Lorenz M, Grundmann M, Schubert M. Phonon modes, dielectric constants, and exciton mass parameters in ternary MgxZn1−xO Mrs Proceedings. 928: 13-17. DOI: 10.1557/Proc-0928-Gg05-03 |
0.305 |
|
| 2006 |
Schubert E, Fahlteich J, Rauschenbach B, Schubert M, Lorenz M, Grundmann M, Wagner G. Recrystallization behavior in chiral sculptured thin films from silicon Journal of Applied Physics. 100: 016107. DOI: 10.1063/1.2207728 |
0.364 |
|
| 2006 |
Schmidt-Grund R, Carstens A, Rheinländer B, Spemann D, Hochmut H, Zimmermann G, Lorenz M, Grundmann M, Herzinger CM, Schubert M. Refractive indices and band-gap properties of rocksalt MgxZn1−xO (0.68⩽x⩽1) Journal of Applied Physics. 99: 123701. DOI: 10.1063/1.2205350 |
0.321 |
|
| 2006 |
Paskova T, Hommel D, Paskov PP, Darakchieva V, Monemar B, Bockowski M, Suski T, Grzegory I, Tuomisto F, Saarinen K, Ashkenov N, Schubert M. Effect of high-temperature annealing on the residual strain and bending of freestanding GaN films grown by hydride vapor phase epitaxy Applied Physics Letters. 88: 141909. DOI: 10.1063/1.2192149 |
0.618 |
|
| 2006 |
Hofmann T, Schade U, Agarwal KC, Daniel B, Klingshirn C, Hetterich M, Herzinger CM, Schubert M. Conduction-band electron effective mass in Zn0.87Mn0.13Se measured by terahertz and far-infrared magnetooptic ellipsometry Applied Physics Letters. 88: 042105. DOI: 10.1063/1.2168258 |
0.408 |
|
| 2006 |
Heitsch S, Bundesmann C, Wagner G, Zimmermann G, Rahm A, Hochmuth H, Benndorf G, Schmidt H, Schubert M, Lorenz M, Grundmann M. Low temperature photoluminescence and infrared dielectric functions of pulsed laser deposited ZnO thin films on silicon Thin Solid Films. 496: 234-239. DOI: 10.1016/J.Tsf.2005.08.305 |
0.415 |
|
| 2006 |
Hofmann T, Chavdarov T, Darakchieva V, Lu H, Schaff WJ, Schubert M. Anisotropy of the Γ-point effective mass and mobility in hexagonal InN Physica Status Solidi (C). 3: 1854-1857. DOI: 10.1002/Pssc.200565467 |
0.613 |
|
| 2006 |
Paskova T, Darakchieva V, Paskov PP, Monemar B, Bukowski M, Suski T, Ashkenov N, Schubert M, Hommel D. Bending in HVPE GaN free-standing films: Effects of laser lift-off, polishing and high-pressure annealing Physica Status Solidi (C) Current Topics in Solid State Physics. 3: 1475-1478. DOI: 10.1002/Pssc.200565412 |
0.621 |
|
| 2006 |
Darakchieva V, Paskova T, Paskov PP, Arwin H, Schubert M, Monemar B, Figge S, Homme D, Haskell BA, Fini PT, Nakamura S. Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN Physica Status Solidi (B) Basic Research. 243: 1594-1598. DOI: 10.1002/Pssb.200565400 |
0.611 |
|
| 2006 |
Agarwal KC, Daniel B, Hofmann T, Schubert M, Klingshirn C, Hetterich M. Phonon properties and doping of Zn1–xMnxSe epilayers grown by molecular-beam epitaxy Physica Status Solidi (B). 243: 914-918. DOI: 10.1002/Pssb.200564622 |
0.338 |
|
| 2006 |
Schubert M. Another century of ellipsometry Annalen Der Physik. 15: 480-497. DOI: 10.1002/Andp.200510204 |
0.34 |
|
| 2005 |
Darakchieva V, Valcheva E, Paskov PP, Schubert M, Paskova T, Monemar B, Amano H, Akasaki I. Phonon mode behavior in strained wurtziteAlN∕GaNsuperlattices Physical Review B. 71. DOI: 10.1103/Physrevb.71.115329 |
0.597 |
|
| 2005 |
Schubert M, Hofmann T, Šik J. Long-wavelength interface modes in semiconductor layer structures Physical Review B. 71. DOI: 10.1103/Physrevb.71.035324 |
0.376 |
|
| 2005 |
Mbenkum BN, Ashkenov N, Schubert M, Lorenz M, Hochmuth H, Michel D, Grundmann M, Wagner G. Temperature-dependent dielectric and electro-optic properties of a ZnO-BaTiO3-ZnO heterostructure grown by pulsed-laser deposition Applied Physics Letters. 86: 091904. DOI: 10.1063/1.1862778 |
0.418 |
|
| 2005 |
Darakchieva V, Paskova T, Paskov PP, Monemar B, Ashkenov N, Schubert M. Structural characteristics and lattice parameters of hydride vapor phase epitaxial GaN free-standing quasisubstrates Journal of Applied Physics. 97: 013517. DOI: 10.1063/1.1823024 |
0.6 |
|
| 2005 |
Ashkenov N, Schubert M, Twerdowski E, Wenckstern Hv, Mbenkum B, Hochmuth H, Lorenz M, Grill W, Grundmann M. Rectifying semiconductor-ferroelectric polarization loops and offsets in Pt–BaTiO3–ZnO–Pt thin film capacitor structures Thin Solid Films. 486: 153-157. DOI: 10.1016/J.Tsf.2004.11.226 |
0.382 |
|
| 2005 |
Makhova LV, Konovalov I, Szargan R, Aschkenov N, Schubert M, Chassé T. Composition and properties of ZnS thin films prepared by chemical bath deposition from acidic and basic solutions Physica Status Solidi (C). 2: 1206-1211. DOI: 10.1002/Pssc.200460663 |
0.351 |
|
| 2004 |
Paskova T, Suski T, Bockowski M, Paskov P, Darakchieva V, Monemar B, Tuomisto F, Saarinen K, Ashkenov N, Schubert M, Roder C, Hommel D. High pressure annealing of HVPE GaN free-standing films: redistribution of defects and stress Mrs Proceedings. 831. DOI: 10.1557/Proc-831-E8.18 |
0.627 |
|
| 2004 |
Gogova D, Kasic A, Larsson H, Pécz B, Yakimova R, Magnusson B, Monemar B, Tuomisto F, Saarinen K, Miskys C, Stutzmann M, Bundesmann C, Schubert M. Optical and Structural Characteristics of Virtually Unstrained Bulk-Like GaN Japanese Journal of Applied Physics. 43: 1264-1268. DOI: 10.1143/Jjap.43.1264 |
0.388 |
|
| 2004 |
Darakchieva V, Birch J, Schubert M, Paskova T, Tungasmita S, Wagner G, Kasic A, Monemar B. Strain-related structural and vibrational properties of thin epitaxialAlNlayers Physical Review B. 70. DOI: 10.1103/Physrevb.70.045411 |
0.614 |
|
| 2004 |
Kvietkova J, Daniel B, Hetterich M, Schubert M, Spemann D, Litvinov D, Gerthsen D. Near-band-gap dielectric function ofZn1−xMnxSethin films determined by spectroscopic ellipsometry Physical Review B. 70. DOI: 10.1103/Physrevb.70.045316 |
0.352 |
|
| 2004 |
Darakchieva V, Paskov PP, Valcheva E, Paskova T, Monemar B, Schubert M, Lu H, Schaff WJ. Deformation potentials of the E1(TO) and E2 modes of InN Applied Physics Letters. 84: 3636-3638. DOI: 10.1063/1.1738520 |
0.563 |
|
| 2004 |
Bundesmann C, Ashkenov N, Schubert M, Rahm A, Wenckstern Hv, Kaidashev EM, Lorenz M, Grundmann M. Infrared dielectric functions and crystal orientation of a-plane ZnO thin films on r-plane sapphire determined by generalized ellipsometry Thin Solid Films. 455: 161-166. DOI: 10.1016/J.Tsf.2003.11.226 |
0.415 |
|
| 2004 |
Schubert M, Hofmann T, Herzinger CM. Far-infrared magnetooptic generalized ellipsometry: determination of free-charge-carrier parameters in semiconductor thin film structures Thin Solid Films. 455: 563-570. DOI: 10.1016/J.Tsf.2003.11.215 |
0.389 |
|
| 2004 |
Leibiger G, Gottschalch V, Razek N, Schindler A, Schubert M. Hydrogen implantation in InGaNAs studied by spectroscopic ellipsometry Thin Solid Films. 455: 231-234. DOI: 10.1016/J.Tsf.2003.11.203 |
0.301 |
|
| 2004 |
Kvietkova J, Daniel B, Hetterich M, Schubert M, Spemann D. Optical properties of ZnSe and Zn0.87Mn0.13Se epilayers determined by spectroscopic ellipsometry Thin Solid Films. 455: 228-230. DOI: 10.1016/J.Tsf.2003.11.201 |
0.359 |
|
| 2004 |
Schubert M, Bundesmann C, Jakopic G, Maresch H, Arwin H, Persson N-, Zhang F, Inganäs O. Infrared ellipsometry characterization of conducting thin organic films Thin Solid Films. 455: 295-300. DOI: 10.1016/J.Tsf.2003.11.194 |
0.405 |
|
| 2004 |
Darakchieva V, Paskov P, Valcheva E, Paskova T, Schubert M, Bundesmann C, Lu H, Schaff W, Monemar B. Infrared ellipsometry and Raman studies of hexagonal InN films: correlation between strain and vibrational properties Superlattices and Microstructures. 36: 573-580. DOI: 10.1016/J.Spmi.2004.09.014 |
0.615 |
|
| 2004 |
Persson N, Schubert M, Inganäs O. Optical modelling of a layered photovoltaic device with a polyfluorene derivative/fullerene as the active layer Solar Energy Materials and Solar Cells. 83: 169-186. DOI: 10.1016/J.Solmat.2004.02.023 |
0.415 |
|
| 2004 |
Kasic A, Gogova D, Larsson H, Hemmingsson C, Ivanov I, Monemar B, Bundesmann C, Schubert M. Micro-Raman scattering profiling studies on HVPE-grown free-standing GaN Phys. Stat. Sol. (a). 201: 2773-2776. DOI: 10.1002/Pssa.200405013 |
0.397 |
|
| 2004 |
Schubert M, Ashkenov N, Hofmann T, Lorenz M, Hochmuth H, v. Wenckstern H, Grundmann M, Wagner G. Electro-optical properties of ZnO-BaTiO3-ZnO heterostructures grown by pulsed laser deposition Annalen Der Physik. 13: 61-62. DOI: 10.1002/Andp.200310047 |
0.386 |
|
| 2003 |
Schubert M, Hofmann T, Herzinger CM. Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in n-type GaAs. Journal of the Optical Society of America. a, Optics, Image Science, and Vision. 20: 347-56. PMID 12570302 DOI: 10.1364/Josaa.20.000347 |
0.442 |
|
| 2003 |
Darakchieva V, Paskov PP, Schubert M, Valcheva E, Paskova T, Arwin H, Monemar B, Amano H, Akasaki I. Strain evolution and phonons in AlN/GaN superlattices Mrs Proceedings. 798. DOI: 10.1557/Proc-798-Y5.60 |
0.618 |
|
| 2003 |
Bundesmann C, Ashkenov N, Schubert M, Spemann D, Butz T, Kaidashev EM, Lorenz M, Grundmann M. Raman scattering in ZnO thin films doped with Fe, Sb, Al, Ga, and Li Applied Physics Letters. 83: 1974-1976. DOI: 10.1063/1.1609251 |
0.347 |
|
| 2003 |
Ashkenov N, Mbenkum BN, Bundesmann C, Riede V, Lorenz M, Spemann D, Kaidashev EM, Kasic A, Schubert M, Grundmann M, Wagner G, Neumann H, Darakchieva V, Arwin H, Monemar B. Infrared dielectric functions and phonon modes of high-quality ZnO films Journal of Applied Physics. 93: 126-133. DOI: 10.1063/1.1526935 |
0.655 |
|
| 2003 |
Darakchieva V, Schubert M, Birch J, Kasic A, Tungasmita S, Paskova T, Monemar B. Generalized infrared ellipsometry study of thin epitaxial AlN layers with complex strain behavior Physica B-Condensed Matter. 340: 416-420. DOI: 10.1016/J.Physb.2003.09.059 |
0.635 |
|
| 2003 |
Darakchieva V, Paskov PP, Schubert M, Paskova T, Monemar B, Kamiyama S, Iwaya M, Amano H, Akasaki I. Optical properties of undoped AlN/GaN superlattices grown by metalorganic vapor phase epitaxy Physica Status Solidi (C). 2614-2617. DOI: 10.1002/Pssc.200303408 |
0.624 |
|
| 2003 |
Kasic A, Schubert M, Off J, Kuhn B, Scholz F, Einfeldt S, Böttcher T, Hommel D, As DJ, Köhler U, Dadgar A, Krost A, Saito Y, Nanishi Y, Correia MR, et al. Phonons and free-carrier properties of binary, ternary, and quaternary group-III nitride layers measured by infrared Spectroscopic Ellipsometry Physica Status Solidi C: Conferences. 1750-1769. DOI: 10.1002/Pssc.200303135 |
0.66 |
|
| 2003 |
Dadgar A, Strittmatter A, Bläsing J, Poschenrieder M, Contreras O, Veit P, Riemann T, Bertram F, Reiher A, Krtschil A, Diez A, Hempel T, Finger T, Kasic A, Schubert M, et al. Metalorganic chemical vapor phase epitaxy of gallium-nitride on silicon Physica Status Solidi (C). 1583-1606. DOI: 10.1002/Pssc.200303122 |
0.337 |
|
| 2003 |
Darakchieva V, Paskova T, Paskov PP, Monemar B, Ashkenov N, Schubert M. Residual strain in HVPE GaN free-standing and re-grown homoepitaxial layers Physica Status Solidi (a). 195: 516-522. DOI: 10.1002/Pssa.200306145 |
0.6 |
|
| 2002 |
Schubert M, Dollase W. Generalized ellipsometry for biaxial absorbing materials: determination of crystal orientation and optical constants of Sb(2)S(3). Optics Letters. 27: 2073-5. PMID 18033445 DOI: 10.1364/Ol.27.002073 |
0.374 |
|
| 2002 |
Hofmann T, Gottschalch V, Schubert M. Far-infrared dielectric function and phonon modes of spontaneously ordered (AlxGa 1-x ) 0.52 In 0.48 P Mrs Proceedings. 744. DOI: 10.1557/Proc-744-M5.33 |
0.331 |
|
| 2002 |
Hofmann T, Grundmann M, Herzinger CM, Schubert M, Grill W. Far-infrared magnetooptical generalized ellipsometry determination of free-carrier parameters in semiconductor thin film structures Mrs Proceedings. 744. DOI: 10.1557/Proc-744-M5.32 |
0.415 |
|
| 2002 |
Hofmann T, Gottschalch V, Schubert M. Far-Infrared dielectric anisotropy and phonon modes in spontaneously CuPt-orderedGa0.52In0.48P Physical Review B. 66: 195204. DOI: 10.1103/Physrevb.66.195204 |
0.307 |
|
| 2002 |
Kasic A, Schubert M, Saito Y, Nanishi Y, Wagner G. Effective electron mass and phonon modes in n-type hexagonal InN Physical Review B. 65: 115206. DOI: 10.1103/Physrevb.65.115206 |
0.365 |
|
| 2002 |
Kasic A, Schubert M, Einfeldt S, Hommel D. Infrared spectroscopic ellipsometry—a new tool for characterization of semiconductor heterostructures Vibrational Spectroscopy. 29: 121-124. DOI: 10.1016/S0924-2031(01)00197-7 |
0.422 |
|
| 2002 |
Franke E, Neumann H, Schubert M, Trimble CL, Yan L, Woollam JA. Low-orbit-environment protective coating for all-solid-state electrochromic surface heat radiation control devices Surface & Coatings Technology. 285-288. DOI: 10.1016/S0257-8972(01)01608-5 |
0.509 |
|
| 2002 |
Hofmann T, Gottschalch V, Schubert M. Far-infrared dielectric function and phonon modes of spontaneously ordered (AlxGa1-x)0.52In0.48P Mrs Proceedings. 744. DOI: 10.1016/J.Tsf.2003.11.308 |
0.331 |
|
| 2001 |
Zangooie S, Schubert M, Trimble C, Thompson DW, Woollam JA. Infrared ellipsometry characterization of porous silicon bragg reflectors. Applied Optics. 40: 906-12. PMID 18357071 DOI: 10.1364/Ao.40.000906 |
0.538 |
|
| 2001 |
Zangooie S, Schubert M, Tiwald TE, Woollam JA. Infrared optical properties of aged porous GaAs Journal of Materials Research. 16: 1241-1244. DOI: 10.1557/JMR.2001.0173 |
0.469 |
|
| 2001 |
Zangooie S, Schubert M, Tiwald TE, Woollam JA. Infrared optical properties of aged porous GaAs Journal of Materials Research. 16: 1241-1244. DOI: 10.1557/Jmr.2001.0173 |
0.548 |
|
| 2001 |
Leibiger G, Gottschalch V, Schubert M. Optical functions, phonon properties, and composition of InGaAsN single layers derived from far- and near-infrared spectroscopic ellipsometry Journal of Applied Physics. 90: 5951-5958. DOI: 10.1063/1.1416859 |
0.418 |
|
| 2001 |
Kasic A, Schubert M, Kuhn B, Scholz F, Einfeldt S, Hommel D. Disorder-activated infrared modes and surface depletion layer in highly Si-doped hexagonal GaN Journal of Applied Physics. 89: 3720-3724. DOI: 10.1063/1.1344913 |
0.387 |
|
| 2001 |
Zangooie S, Schubert M, Thompson DW, Woollam JA. Infrared response of multiple-component free-carrier plasma in heavily doped p-type GaAs Applied Physics Letters. 78: 937-939. DOI: 10.1063/1.1343490 |
0.521 |
|
| 2001 |
Kreuter A, Wagner G, Otte K, Lippold G, Schindler A, Schubert M. Anisotropic dielectric function spectra from single-crystal CuInSe2 with orientation domains Applied Physics Letters. 78: 195-197. DOI: 10.1063/1.1334354 |
0.329 |
|
| 2001 |
Kasic A, Schubert M, Rheinländer B, Riede V, Einfeldt S, Hommel D, Kuhn B, Off J, Scholz F. Effective carrier mass and mobility versus carrier concentration in p- and n-type α-GaN determined by infrared ellipsometry and Hall resistivity measurements Materials Science and Engineering B-Advanced Functional Solid-State Materials. 82: 74-76. DOI: 10.1016/S0921-5107(00)00753-4 |
0.385 |
|
| 2001 |
Schubert M, Kasic A, Šik J, Einfeldt S, Hommel D, Härle V, Off J, Scholz F. Phonons and free carriers in strained hexagonal GaN/AlGaN superlattices measured by infrared ellipsometry and Raman spectroscopy Materials Science and Engineering: B. 82: 178-181. DOI: 10.1016/S0921-5107(00)00722-4 |
0.385 |
|
| 2001 |
Franke E, Schubert M, Trimble CL, DeVries MJ, Woollam JA. Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV Thin Solid Films. 388: 283-289. DOI: 10.1016/S0040-6090(00)01881-2 |
0.588 |
|
| 2001 |
Schubert M, Herzinger C. Ellipsometry on Anisotropic Materials: Bragg Conditions and Phonons in Dielectric Helical Thin Films Physica Status Solidi (a). 188: 1563-1575. DOI: 10.1002/1521-396X(200112)188:4<1563::Aid-Pssa1563>3.0.Co;2-8 |
0.356 |
|
| 2000 |
Šik J, Schubert M, Hofmann T, Gottschalch V. Free-carrier effects and optical phonons in GaNAs/GaAs superlattice heterostructures measured by infrared spectroscopic ellipsometry Mrs Internet Journal of Nitride Semiconductor Research. 5. DOI: 10.1557/S109257830000003X |
0.389 |
|
| 2000 |
Leibiger G, Gottschalch V, Kasik A, Rheinländer B, Šik J, Schubert M. Optical Constants, Critical Points, and Phonon Modes of GaAsN Single Layers Mrs Proceedings. 639. DOI: 10.1557/Proc-639-G6.35 |
0.349 |
|
| 2000 |
Schubert M, Kasic A, Tiwald TE, Woollam JA, Harle V, Scholz F. Phonons and free carriers in a strained hexagonal GaN-AlN superlattice measured by infrared ellipsometry and Raman spectroscopy Materials Research Society Symposium - Proceedings. 595. DOI: 10.1557/Proc-595-F99W11.39 |
0.558 |
|
| 2000 |
Kasic A, Schubert M, Einfeldt S, Hommel D, Tiwald TE. Free-carrier and phonon properties ofn- andp-type hexagonal GaN films measured by infrared ellipsometry Physical Review B. 62: 7365-7377. DOI: 10.1103/Physrevb.62.7365 |
0.409 |
|
| 2000 |
Schubert M, Tiwald TE, Herzinger CM. Infrared dielectric anisotropy and phonon modes of sapphire Physical Review B. 61: 8187-8201. DOI: 10.1103/Physrevb.61.8187 |
0.368 |
|
| 2000 |
Franke E, Schubert M, Woollam JA, Hecht J, Wagner G, Neumann H, Bigl F. In situ ellipsometry growth characterization of dual ion beam deposited boron nitride thin films Journal of Applied Physics. 87: 2593-2599. DOI: 10.1063/1.372224 |
0.56 |
|
| 2000 |
Franke EB, Trimble CL, Hale JS, Schubert M, Woollam JA. Infrared switching electrochromic devices based on tungsten oxide Journal of Applied Physics. 88: 5777-5784. DOI: 10.1063/1.1319325 |
0.49 |
|
| 2000 |
Franke E, Trimble CL, DeVries MJ, Woollam JA, Schubert M, Frost F. Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry Journal of Applied Physics. 88: 5166-5174. DOI: 10.1063/1.1313784 |
0.558 |
|
| 2000 |
Franke EB, Trimble CL, Schubert M, Woollam JA, Hale JS. All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region Applied Physics Letters. 77: 930. DOI: 10.1063/1.1288810 |
0.397 |
|
| 2000 |
Franke EB, Trimble CL, Schubert M, Woollam JA, Hale JS. All-solid-state electrochromic reflectance device for emittance modulation in the far-infrared spectral region Applied Physics Letters. 77: 930-932. DOI: 10.1063/1.1288810 |
0.513 |
|
| 2000 |
Šik J, Schubert M, Leibiger G, Gottschalch V, Kirpal G, Humlı́ček J. Near-band-gap optical functions spectra and band-gap energies of GaNAs/GaAs superlattice heterostructures measured by spectroscopic ellipsometry Applied Physics Letters. 76: 2859-2861. DOI: 10.1063/1.126497 |
0.375 |
|
| 1999 |
Schubert M, Tiwald TE, Woollam JA. Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry. Applied Optics. 38: 177-87. PMID 18305601 DOI: 10.1364/Ao.38.000177 |
0.588 |
|
| 1999 |
Schubert M, Kasic A, Tiwald T, Woollam J, Harle V, Scholz F. Phonons and Free Carriers in a Strained Hexagonal GaN-AlN Superlattice Measured by Infrared Ellipsometry and Raman Spectroscopy Mrs Proceedings. 595. DOI: 10.1557/PROC-595-F99W11.39 |
0.5 |
|
| 1999 |
Schubert M, Hofmann T, Rheinländer B, Pietzonka I, Sass T, Gottschalch V, Woollam JA. Near-band-gap CuPt-order-induced birefringence in Al 0.48 Ga 0.52 InP 2 Physical Review B. 60: 16618-16634. DOI: 10.1103/Physrevb.60.16618 |
0.533 |
|
| 1999 |
Schubert M, Woollam J, Kasic A, Rheinländer B, Off J, Kuhn B, Scholz F. Free-Carrier Response and Lattice Modes of Group III-Nitride Heterostructures Measured by Infrared Ellipsometry Physica Status Solidi (B). 216: 655-658. DOI: 10.1002/(Sici)1521-3951(199911)216:1<655::Aid-Pssb655>3.0.Co;2-8 |
0.583 |
|
| 1998 |
Hecht J, Eifler A, Riede V, Schubert M, Krauß G, Krämer V. Birefringence and reflectivity of single-crystalCdAl2Se4by generalized ellipsometry Physical Review B. 57: 7037-7042. DOI: 10.1103/Physrevb.57.7037 |
0.333 |
|
| 1998 |
Franke E, Schubert M, Hecht J, Neumann H, Tiwald TE, Thompson DW, Yao H, Woollam JA, Hahn J. In situ infrared and visible-light ellipsometric investigations of boron nitride thin films at elevated temperatures Journal of Applied Physics. 84: 526-532. DOI: 10.1063/1.368083 |
0.564 |
|
| 1998 |
Schubert M, Franke E, Neumann H, Tiwald TE, Thompson DW, Woollam JA, Hahn J. Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry Thin Solid Films. 692-696. DOI: 10.1016/S0040-6090(97)00979-6 |
0.563 |
|
| 1998 |
Schubert M. Generalized ellipsometry and complex optical systems Thin Solid Films. 313: 323-332. DOI: 10.1016/S0040-6090(97)00841-9 |
0.406 |
|
| 1997 |
Schubert M, Rheinländer B, Franke E, Neumann H, Tiwald TE, Woollam JA, Hahn J, Richter F. Infrared optical properties of mixed-phase thin films studied by spectroscopic ellipsometry using boron nitride as an example Physical Review B. 56: 13306-13313. DOI: 10.1103/Physrevb.56.13306 |
0.59 |
|
| 1997 |
Franke E, Schubert M, Neumann H, Tiwald TE, Thompson DW, Woollam JA, Hahn J, Richter F. Phase and microstructure investigations of boron nitride thin films by spectroscopic ellipsometry in the visible and infrared spectral range Journal of Applied Physics. 82: 2906-2911. DOI: 10.1063/1.366123 |
0.583 |
|
| 1997 |
Schubert M, Rheinländer B, Franke E, Neumann H, Hahn J, Röder M, Richter F. Anisotropy of boron nitride thin-film reflectivity spectra by generalized ellipsometry Applied Physics Letters. 70: 1819-1821. DOI: 10.1063/1.118701 |
0.356 |
|
| 1997 |
Franke E, Neumann H, Schubert M, Tiwald TE, Woollam JA, Hahn J. Infrared ellipsometry on hexagonal and cubic boron nitride thin films Applied Physics Letters. 70: 1668-1670. DOI: 10.1063/1.118655 |
0.582 |
|
| 1996 |
Schubert M. Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems. Physical Review B. 53: 4265-4274. PMID 9983979 DOI: 10.1103/Physrevb.53.4265 |
0.346 |
|
| 1996 |
Schubert M, Cramer C, Woollam JA, Herzinger CM, Johs B, Schmiedel H, Rheinländer B. Generalized transmission ellipsometry for twisted biaxial dielectric media: application to chiral liquid crystals Journal of the Optical Society of America A. 13: 1930. DOI: 10.1364/Josaa.13.001930 |
0.527 |
|
| 1996 |
Schubert M, Woollam JA, Johs B, Herzinger CM, Rheinländer B. Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO_2 Journal of the Optical Society of America A. 13: 875. DOI: 10.1364/Josaa.13.000875 |
0.566 |
|
| 1996 |
Cramer C, Binder H, Schubert M, Rheinländer B, Schmiedel H. Optical Properties Of Microconfined Liquid Crystals Molecular Crystals and Liquid Crystals. 282: 395-405. DOI: 10.1080/10587259608037593 |
0.347 |
|
| 1995 |
Schubert M, Gottschalch V, Herzinger CM, Yao H, Snyder PG, Woollam JA. Optical constants of GaxIn1−xP lattice matched to GaAs Journal of Applied Physics. 77: 3416-3419. DOI: 10.1063/1.358632 |
0.565 |
|
| 1995 |
Schubert M, Rheinländer B, Gottschalch V. Band-gap reduction and valence band splitting in spontaneously ordered GaInP2 studied by dark-field spectroscopy Solid State Communications. 95: 723-727. DOI: 10.1016/0038-1098(95)00349-5 |
0.312 |
|
| 1995 |
Rheinländer B, Schubert M, Gottschalch V. Dark-field spectroscopy on spontaneously ordered GaInP2 Physica Status Solidi (a). 152: 287-292. DOI: 10.1002/Pssa.2211520129 |
0.332 |
|
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