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Florence Nelson, Ph.D. - Publications

Affiliations: 
2012 Nanoscale Science and Engineering-Nanoscale Engineering State University of New York, Albany, Albany, NY, United States 
Area:
Nanoscience
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5 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2014 Nelson FJ, Idrobo JC, Fite JD, Mišković ZL, Pennycook SJ, Pantelides ST, Lee JU, Diebold AC. Electronic excitations in graphene in the 1-50 eV range: the π and π + σ peaks are not plasmons. Nano Letters. 14: 3827-31. PMID 24884760 DOI: 10.1021/Nl500969T  0.552
2013 An YQ, Nelson F, Lee JU, Diebold AC. Enhanced optical second-harmonic generation from the current-biased graphene/SiO2/Si(001) structure. Nano Letters. 13: 2104-9. PMID 23581964 DOI: 10.1021/Nl4004514  0.598
2012 Nelson F, Sandin A, Dougherty DB, Aspnes DE, Rowe JE, Diebold AC. Optical and structural characterization of epitaxial graphene on vicinal 6H-SiC(0001)-Si by spectroscopic ellipsometry, Auger spectroscopy, and STM Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 30. DOI: 10.1116/1.4726199  0.63
2010 Nelson F, Diebold AC, Hull R. Simulation study of aberration-corrected high-resolution transmission electron microscopy imaging of few-layer-graphene stacking. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 16: 194-9. PMID 20100382 DOI: 10.1017/S1431927609991309  0.605
2010 Diebold AC, Nelson F. Graphene metrology and devices International Journal of Materials Research. 101: 175-181. DOI: 10.3139/146.110263  0.619
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