Year |
Citation |
Score |
2011 |
Rumyantsev S, Stillman W, Shur M, Heeg T, Schlom DG, Koveshnikov S, Kambhampati R, Tokranov V, Oktyabrsky S. Low frequency noise and interface density of traps in InGaAs MOSFETs with GdScO3 high-K dielectric International Journal of High Speed Electronics and Systems. 20: 105-113. DOI: 10.1142/S0129156411006441 |
0.654 |
|
2011 |
Oktyabrsky S, Nagaiah P, Tokranov V, Yakimov M, Kambhampati R, Koveshnikov S, Veksler D, Goel N, Bersuker G. Electron scattering in buried InGaAs/high-K MOS channels International Journal of High Speed Electronics and Systems. 20: 95-103. DOI: 10.1142/S012915641100643X |
0.55 |
|
2010 |
Ali A, Madan H, Koveshnikov S, Oktyabrsky S, Kambhampati R, Heeg T, Schlom D, Datta S. Small-signal response of inversion layers in high-mobility In 0.53Ga0.47As MOSFETs made with thin high-κ dielectrics Ieee Transactions On Electron Devices. 57: 742-748. DOI: 10.1109/Ted.2010.2041855 |
0.646 |
|
2009 |
Oktyabrsky S, Tokranov V, Koveshnikov S, Yakimov M, Kambhampati R, Bakhru H, Moore R, Tsai W. Interface properties of MBE-grown MOS structures with InGaAs/InAlAs buried channel and in-situ high-k oxide Journal of Crystal Growth. 311: 1950-1953. DOI: 10.1016/J.Jcrysgro.2008.11.037 |
0.721 |
|
2008 |
Oktyabrsky S, Yakimov M, Tokranov V, Kambhampati R, Bakhru H, Koveshnikov S, Tsai W, Zhu F, Lee J. Challanges and progrss in III-V MOSFETs for CMOS circuits International Journal of High Speed Electronics and Systems. 18: 761-772. DOI: 10.1142/S0129156408005746 |
0.714 |
|
2006 |
Yakimov M, Tokranov V, Kambhampati R, Koveshnikov S, Tsai W, Zhu F, Lee J, Oktyabrsky S. Enhancement Mode GaAs n-MOSFET with High-k Dielectric The Japan Society of Applied Physics. 2006: 946-947. DOI: 10.7567/Ssdm.2006.E-8-1 |
0.627 |
|
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