James Christofferson, Ph.D. - Publications

Affiliations: 
2004 University of California, Santa Cruz, Santa Cruz, CA, United States 
Area:
Electronics and Electrical Engineering

53 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2013 Yazawa K, Kendig D, Christofferson J, Shakouri A. A method for failure analysis for devices with simultaneous imaging of electron emission and near IR thermoreflectance Asme 2013 International Technical Conference and Exhibition On Packaging and Integration of Electronic and Photonic Microsystems, Interpack 2013. 2. DOI: 10.1115/IPACK2013-73104  0.6
2013 Vermeersch B, Bahk JH, Christofferson J, Shakouri A. Thermoreflectance imaging of sub 100 ns pulsed cooling in high-speed thermoelectric microcoolers Journal of Applied Physics. 113. DOI: 10.1063/1.4794166  0.565
2012 Yazawa K, Kendig D, Christofferson J, Marconnet A, Shakouri A. Fast transient and steady state thermal imaging of CMOS integrated circuit chips considering package thermal boundaries Intersociety Conference On Thermal and Thermomechanical Phenomena in Electronic Systems, Itherm. 1405-1411. DOI: 10.1109/ITHERM.2012.6231584  0.397
2011 Vermeersch B, Bank JH, Christofferson J, Shakouri A. Design and thermoreflectance imaging of high-speed SiGe superlattice microrefrigerators Materials Research Society Symposium Proceedings. 1329: 1-6. DOI: 10.1557/Opl.2011.1232  0.675
2011 Alavi S, Yazawa K, Alers G, Vermeersch B, Christofferson J, Shakouri A. Thermal imaging for reliability characterization of copper vias Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 17-20. DOI: 10.1109/STHERM.2011.5767172  0.43
2010 Christofferson J, Yazawa K, Shakouri A. Picosecond transient thermal imaging using a CCD based thermoreflectance system 2010 14th International Heat Transfer Conference, Ihtc 14. 4: 93-97. DOI: 10.1115/IHTC14-22969  0.588
2010 Vermeersch B, Christofferson J, Maize K, Shakouri A, De Mey G. Time and frequency domain CCD-based thermoreflectance techniques for high-resolution transient thermal imaging Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 228-234. DOI: 10.1109/STHERM.2010.5444287  0.367
2010 Park JH, Shin S, Christofferson J, Shakouri A, Kang SM. Experimental validation of the power blurring method Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 240-244. DOI: 10.1109/STHERM.2010.5444285  0.543
2010 Kendig D, Christofferson J, Alers GB, Shakouri A. Application of thermoreflectance imaging to identify defects in photovoltaic solar cells Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 245-248. DOI: 10.1109/STHERM.2010.5444282  0.515
2009 Michel H, Coppard R, Kendig D, Christofferson J, Maize K, Shakouri A. Transient Thermal Imaging of Si/SiGe superlattice and bulk Si microrefrigerators Mrs Proceedings. 1218. DOI: 10.1557/Proc-1218-Z02-01  0.672
2009 Ezzahri Y, Christofferson J, Maize K, Shakouri A. Short time transient behavior of SiGe-based microrefrigerators Materials Research Society Symposium Proceedings. 1166: 13-19. DOI: 10.1557/Proc-1166-N01-06  0.708
2009 Singh R, Nurnus J, Bian Z, Christofferson J, Shakouri A. Temperature profile inside microscale thermoelectric module acquired using near-infrared thermoreflectance Ieee Transactions On Components and Packaging Technologies. 32: 447-452. DOI: 10.1109/Tcapt.2008.2011886  0.771
2009 Christofferson J, Ezzahri Y, Maize K, Shakouri A. Transient thermal imaging of pulsed-operation superlattice micro-refrigerators Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 45-49. DOI: 10.1109/STHERM.2009.4810741  0.654
2009 Wang X, Ezzahri Y, Christofferson J, Shakouri A. Bias-dependent MOS transistor thermal resistance and non-uniform self-heating temperature Journal of Physics D: Applied Physics. 42. DOI: 10.1088/0022-3727/42/7/075101  0.66
2009 Ezzahri Y, Christofferson J, Zeng G, Shakouri A. Short time transient thermal behavior of solid-state microrefrigerators Journal of Applied Physics. 106. DOI: 10.1063/1.3266173  0.689
2008 Christofferson J, Maize K, Ezzahri Y, Shabani J, Wang X, Shakouri A. Microscale and nanoscale thermal characterization techniques Journal of Electronic Packaging, Transactions of the Asme. 130: 0411011-0411016. DOI: 10.1115/1.2993145  0.701
2008 Maize K, Christofferson J, Shakouri A. Transient thermal imaging using thermoreflectance Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 55-58. DOI: 10.1109/STHERM.2008.4509366  0.629
2008 Singh R, Christofferson J, Bian Z, Shakouri A, Nurnus J, Schubert A. Characterization of thin-film thermoelectric micro-modules using transient harman ZT measurement and near IR thermoreflectance Materials Research Society Symposium Proceedings. 1044: 421-426.  0.472
2007 Farsiu S, Christofferson J, Eriksson B, Milanfar P, Friedlander B, Shakouri A, Nowak R. Statistical detection and imaging of objects hidden in turbid media using ballistic photons. Applied Optics. 46: 5805-22. PMID 17694130 DOI: 10.1364/Ao.46.005805  0.518
2007 Singh R, Christofferson J, Bian Z, Nurnus J, Schubert A, Shakouri A. Characterization of Thin-film Thermoelectric Micro-modules using Transient Harman ZT Measurement and Near-IR Thermoreflectance Mrs Proceedings. 1044. DOI: 10.1557/Proc-1044-U10-01  0.76
2007 Wang X, Ezzahri Y, Christofferson J, Zhang Y, Shakouri A, Shi L, Yu C, Wang ZL. Characterization of Heat Propagation along Single Tin Dioxide Nanobelt Using the Thermoreflectance Method Mrs Proceedings. 1022. DOI: 10.1557/Proc-1022-Ii05-05  0.68
2007 Ezzahri Y, Singh R, Christofferson J, Bian Z, Shakouri A. Optimization of Si/SiGe microrefrigerators for hybrid solid-state/liquid cooling 2007 Proceedings of the Asme Interpack Conference, Ipack 2007. 2: 265-275. DOI: 10.1115/IPACK2007-33878  0.697
2007 Wang X, Ezzahri Y, Christofferson J, Zhang Y, Shakouri A, Shi L, Yu C, Wang ZL. Characterization of heat propagation along single tin dioxide nanobelt using the thermoreflectance method Materials Research Society Symposium Proceedings. 1022: 38-43.  0.476
2006 Zhang Y, Christofferson J, Shakouri A, Li D, Majumdar A, Wu Y, Fan R, Yang P. Characterization of heat transfer along a silicon nanowire using thermoreflectance technique Ieee Transactions On Nanotechnology. 5: 67-73. DOI: 10.1109/Tnano.2005.861769  0.689
2006 Zhang Y, Christofferson J, Shakouri A, Zeng G, Bowers JE, Croke ET. On-chip high speed localized cooling using superlattice microrefrigerators Ieee Transactions On Components and Packaging Technologies. 29: 395-401. DOI: 10.1109/Tcapt.2006.875884  0.608
2006 Singh R, Bian Z, Zeng G, Zide J, Christofferson J, Chou HF, Gossard A, Bowers J, Shakouri A. Transient Harman measurement of the cross-plane ZT of InGaAs/InGaAlAs superlattices with embedded ErAs nanoparticles Materials Research Society Symposium Proceedings. 886: 123-128.  0.36
2005 Singh R, Bian Z, Zeng G, Zide J, Christofferson J, Chou H, Gossard A, Bowers J, Shakouri A. Transient Harman Measurement of the Cross-plane ZT of InGaAs/InGaAlAs Superlattices with Embedded ErAs Nanoparticles Mrs Proceedings. 886. DOI: 10.1557/Proc-0886-F04-04  0.718
2005 Kozodoy P, Strand TA, Akulova YA, Fish G, Schow C, Koh PC, Bian Z, Christofferson J, Shakouri A. Thermal effects in monolithically integrated tunable laser transmitters Ieee Transactions On Components and Packaging Technologies. 28: 651-657. DOI: 10.1109/Tcapt.2005.859736  0.716
2005 Vashaee D, Christofferson J, Zhang Y, Shakouri A, Zeng G, LaBounty C, Fan X, Piprek J, Bowers JE, Croke E. Modeling and optimization of single-element bulk SiGe thin-film coolers Microscale Thermophysical Engineering. 9: 99-118. DOI: 10.1080/10893950590913459  0.713
2005 Christofferson J, Shakouri A. Thermoreflectance based thermal microscope Review of Scientific Instruments. 76. DOI: 10.1063/1.1850632  0.587
2004 Christofferson J, Shakouri A. Thermal measurements of active semiconductor micro-structures acquired through the substrate using near IR thermoreflectance Microelectronics Journal. 35: 791-796. DOI: 10.1016/J.Mejo.2004.06.009  0.657
2004 Christofferson J, Shakouri A. Camera for thermal imaging of semiconductor devices based on thermoreflectance Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 20: 87-91.  0.626
2004 Kozodoy P, Strand T, Akulova Y, Fish G, Schow C, Koh P, Bian Z, Christofferson J, Shakouri A. Thermal effects in monolithically integrated tunable laser transmitters Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 20: 177-183.  0.439
2003 Zeng G, Fan X, LaBounty C, Croke E, Zhang Y, Christofferson J, Vashaee D, Shakouri A, Bowers JE. Cooling Power Density of SiGe/Si Superlattice Micro Refrigerators Mrs Proceedings. 793. DOI: 10.1557/Proc-793-S2.2  0.758
2003 Zeng G, Shakouri A, Croke E, Zhang Y, Christofferson J, Bowers JE. SiGeC Cantilever Micro Cooler Mrs Proceedings. 793. DOI: 10.1557/Proc-793-S11.3  0.628
2003 Zhang Y, Vashaee D, Christofferson J, Shakouri A, Zeng G, Labounty C, Piprek J, Croke E. 3D electrothermal simulation of heterostructure thin film micro-coolers American Society of Mechanical Engineers, Advanced Energy Systems Division (Publication) Aes. 43: 39-48. DOI: 10.1115/IMECE2003-42767  0.719
2003 Dilhaire S, Ezzahri Y, Grauby S, Claeys W, Christofferson J, Zhang Y, Shakouri A. Thermal and thermomechanical study of micro-refrigerators on a chip based on semiconductor heterostructures International Conference On Thermoelectrics, Ict, Proceedings. 2003: 519-523. DOI: 10.1109/ICT.2003.1287563  0.676
2003 Bian Z, Christofferson J, Shakouri A, Kozodoy P. High-power operation of electroabsorption modulators Applied Physics Letters. 83: 3605-3607. DOI: 10.1063/1.1623338  0.617
2003 Zeng G, Shakouri A, Croke E, Zhang Y, Christofferson J, Bowers JE. SiGeC cantilever micro cooler Materials Research Society Symposium - Proceedings. 793: 439-445.  0.396
2003 Christofferson J, Shakouri A. Through the substrate, backside thermal measurements on active semiconductor devices using near IR thermoreflectance Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 271-275.  0.665
2003 Zhang Y, Christofferson J, Shakouri A, Zeng G, Bowers JE, Croke E. High speed localized cooling using SiGe superlattice microrefrigerators Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 61-65.  0.337
2003 Zeng G, Fan X, LaBounty C, Croke E, Zhang Y, Christofferson J, Vashaee D, Shakouri A, Bowers JE. Cooling power density of SiGe/Si superlattice micro refrigerators Materials Research Society Symposium - Proceedings. 793: 43-49.  0.692
2003 Zhang Y, Christofferson J, Vashaee D, Nguyen P, Shakouri A, Zeng G, Labounty C, Okuno Y, Chiu YJ, Bowers JE. Thin film coolers for localized temperature control in optoelectronic integrated circuits Proceedings - Electronic Components and Technology Conference. 312-316.  0.666
2003 Bian Z, Christofferson J, Shakouri A, Kozodoy P. High power operation of electroabsorption modulators Osa Trends in Optics and Photonics Series. 88: 562-566.  0.5
2002 Zhang Y, Zeng G, Singh R, Christofferson J, Croke E, Bowers JE, Shakouri A. Measurement of Seebeck coefficient perpendicular to SiGe superlattice International Conference On Thermoelectrics, Ict, Proceedings. 2002: 329-332. DOI: 10.1109/ICT.2002.1190332  0.605
2002 Zeng G, Fan X, LaBounty C, Bowers JE, Croke E, Christofferson J, Vashaee D, Zhang Y, Shakouri A. High cooling power density of SiGe/Si superlattice microcoolers Materials Research Society Symposium - Proceedings. 691: 147-152.  0.689
2001 Zeng G, Fan X, LaBounty C, Bowers JE, Croke E, Christofferson J, Vashaee D, Zhang Y, Shakouri A. High Cooling Power Density of SiGe/Si Superlattice Microcoolers Mrs Proceedings. 691. DOI: 10.1557/Proc-691-G6.6  0.755
2001 Christofferson J, Vashaee D, Shakouri A, Melese P. High resolution non-contact thermal characterization of semiconductor devices Proceedings of Spie - the International Society For Optical Engineering. 4275: 119-125. DOI: 10.1117/12.429354  0.736
2001 LaBounty C, Karim A, Fan X, Zeng G, Abraham P, Okuno Y, Bowers JE, Christofferson J, Vashaee D, Fitting A, Shakouri A, Croke E. Wafer-fused thin film cooler semiconductor laser structures International Conference On Thermoelectrics, Ict, Proceedings. 397-400.  0.613
2001 Fan X, Zeng G, LaBounty C, Vashaee D, Christofferson J, Shakouri A, Bowers JE. Integrated cooling for Si-based microelectronics International Conference On Thermoelectrics, Ict, Proceedings. 405-408.  0.596
2001 Christofferson J, Vashaee D, Shakouri A, Melese P, Croke ET. Thermoreflectance imaging of superlattice micro refrigerators Annual Ieee Semiconductor Thermal Measurement and Management Symposium. 58-62.  0.629
2001 Christofferson J, Vashaee D, Shakouri A, Melese P. Real time sub-micron thermal imaging using thermoreflectance American Society of Mechanical Engineers, Heat Transfer Division, (Publication) Htd. 369: 231-235.  0.708
2000 Christofferson J, Vashaee D, Shakouri A, Fan X, Zeng G, Labounty C, Bowers JE, Croke ET. Thermal characterization of thin film superlattice micro refrigerators Ieee International Symposium On Compound Semiconductors, Proceedings. 49-54.  0.661
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