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Boris J. Albers, Ph.D. - Publications

Affiliations: 
2008 Yale University, New Haven, CT 
Area:
Materials Science Engineering
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5 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2012 Baykara MZ, Schwendemann TC, Albers BJ, Pilet N, Mönig H, Altman EI, Schwarz UD. Exploring atomic-scale lateral forces in the attractive regime: a case study on graphite (0001). Nanotechnology. 23: 405703. PMID 22995789 DOI: 10.1088/0957-4484/23/40/405703  0.704
2009 Albers BJ, Schwendemann TC, Baykara MZ, Pilet N, Liebmann M, Altman EI, Schwarz UD. Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensions. Nanotechnology. 20: 264002. PMID 19509455 DOI: 10.1088/0957-4484/20/26/264002  0.703
2009 Albers BJ, Schwendemann TC, Baykara MZ, Pilet N, Liebmann M, Altman EI, Schwarz UD. Three-dimensional imaging of short-range chemical forces with picometre resolution. Nature Nanotechnology. 4: 307-10. PMID 19421216 DOI: 10.1038/Nnano.2009.57  0.705
2009 Vaz CAF, Wang HQ, Ahn CH, Henrich VE, Baykara MZ, Schwendemann TC, Pilet N, Albers BJ, Schwarz UD, Zhang LH, Zhu Y, Wang J, Altman EI. Interface and electronic characterization of thin epitaxial Co3 O4 films Surface Science. 603: 291-297. DOI: 10.1016/J.Susc.2008.11.022  0.616
2008 Albers BJ, Liebmann M, Schwendemann TC, Baykara MZ, Heyde M, Salmeron M, Altman EI, Schwarz UD. Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy. The Review of Scientific Instruments. 79: 033704. PMID 18377012 DOI: 10.1063/1.2842631  0.695
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