Year |
Citation |
Score |
2020 |
Sun Y, He W, Mao Z, Jiao H, Kursun V. Monolithic 3D Carbon Nanotube Memory for Enhanced Yield and Integration Density Ieee Transactions On Circuits and Systems. 67: 2431-2441. DOI: 10.1109/Tcsi.2020.2980074 |
0.682 |
|
2019 |
Sun Y, Gu J, He W, Wang Q, Jing N, Mao Z, Qian W, Jiang L. Energy-Efficient Nonvolatile SRAM Design Based on Resistive Switching Multi-Level Cells Ieee Transactions On Circuits and Systems Ii-Express Briefs. 66: 753-757. DOI: 10.1109/Tcsii.2019.2908243 |
0.333 |
|
2018 |
Wang C, Sun Y, Hu S, Jiang L, Qian W. Variation-Aware Global Placement for Improving Timing-Yield of Carbon-Nanotube Field Effect Transistor Circuit Acm Transactions On Design Automation of Electronic Systems. 23: 1-27. DOI: 10.1145/3175500 |
0.428 |
|
2018 |
Sun Y, He W, Mao Z, Jiao H, Kursun V. Metallic-CN-Removal-Tolerant High-Yield Six-CN-MOSFET SRAM Cell for Carbon-Based Embedded Memory Ieee Transactions On Electron Devices. 65: 1230-1238. DOI: 10.1109/Ted.2018.2798667 |
0.688 |
|
2017 |
Sun Y, He W, Mao Z, Jiao H, Kursun V. High-Yield and Robust 9T SRAM Cell Tolerant to Removal of Metallic Carbon Nanotubes Ieee Transactions On Device and Materials Reliability. 17: 20-31. DOI: 10.1109/Tdmr.2017.2668761 |
0.689 |
|
2017 |
Jin W, He W, Jiang J, Huang H, Zhao X, Sun Y, Chen X, Jing N. A 0.33 V 2.5 μW cross-point data-aware write structure, read-half-select disturb-free sub-threshold SRAM in 130 nm CMOS Integration. 58: 27-34. DOI: 10.1016/J.Vlsi.2017.02.001 |
0.302 |
|
2017 |
Sun Y, He W, Mao Z, Kursun V. Variable strength keeper for high-speed and low-leakage carbon nanotube domino logic Microelectronics Journal. 62: 12-20. DOI: 10.1016/J.Mejo.2017.01.010 |
0.61 |
|
2014 |
Sun Y, Jiao H, Kursun V. A Novel Robust and Low-Leakage SRAM Cell With Nine Carbon Nanotube Transistors Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. DOI: 10.1109/Tvlsi.2014.2350674 |
0.677 |
|
2014 |
Sun Y, Kursun V. Carbon nanotubes blowing new life into NP dynamic CMOS circuits Ieee Transactions On Circuits and Systems I: Regular Papers. 61: 420-428. DOI: 10.1109/Tcsi.2013.2268131 |
0.564 |
|
2011 |
Sun Y, Kursun V. N-Type carbon-nanotube MOSFET device profile optimization for very large scale integration Transactions On Electrical and Electronic Materials. 12: 43-50. DOI: 10.4313/Teem.2011.12.2.43 |
0.598 |
|
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