Elyse Rosenbaum - Publications

Affiliations: 
Electrical and Computer Engineering University of Illinois, Urbana-Champaign, Urbana-Champaign, IL 
Area:
Electronics and Electrical Engineering

135 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2019 Xiu Y, Thomson N, Rosenbaum E. Measurement and Simulation of On-Chip Supply Noise Induced by System-Level ESD Ieee Transactions On Device and Materials Reliability. 19: 211-220. DOI: 10.1109/Tdmr.2019.2898819  1
2017 Thomson NA, Xiu Y, Rosenbaum E. Soft-Failures Induced by System-Level ESD Ieee Transactions On Device and Materials Reliability. 17: 90-98. DOI: 10.1109/Tdmr.2017.2667712  1
2016 Mertens R, Rosenbaum E. Physical basis for CMOS SCR compact models Ieee Transactions On Electron Devices. 63: 296-302. DOI: 10.1109/Ted.2015.2502951  1
2016 Lin Y, Keel MS, Faust A, Xu A, Shanbhag NR, Rosenbaum E, Singer AC. A Study of BER-Optimal ADC-Based Receiver for Serial Links Ieee Transactions On Circuits and Systems I: Regular Papers. DOI: 10.1109/Tcsi.2016.2529284  1
2016 Meng K, Shukla V, Rosenbaum E. Full-Component Modeling and Simulation of Charged Device Model ESD Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 35: 1105-1113. DOI: 10.1109/Tcad.2015.2495196  0.52
2016 Meng Kh, Chen Z, Rosenbaum E. Compact distributed multi-finger MOSFET model for circuit-level ESD simulation Microelectronics Reliability. 63: 11-21. DOI: 10.1016/J.Microrel.2015.12.010  1
2015 Shukla V, Rosenbaum E. Charged Device Model Reliability of Three-Dimensional Integrated Circuits Ieee Transactions On Device and Materials Reliability. 15: 559-566. DOI: 10.1109/Tdmr.2015.2491308  1
2015 Meng KH, Mertens R, Rosenbaum E. Piecewise-linear model with transient relaxation for circuit-level ESD simulation Ieee Transactions On Device and Materials Reliability. 15: 464-466. DOI: 10.1109/Tdmr.2015.2466436  1
2015 Mertens R, Thomson N, Xiu Y, Rosenbaum E. Analysis of active-clamp response to power-on ESD: Power supply integrity and performance tradeoffs Ieee Transactions On Device and Materials Reliability. 15: 263-271. DOI: 10.1109/Tdmr.2015.2464222  1
2015 Meng KH, Rosenbaum E. Fast circuit simulator for transient analysis of CDM ESD Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2015.  1
2015 Keel MS, Rosenbaum E. CDM-reliable T-coil techniques for high-speed wireline receivers Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2015.  1
2014 Rosenbaum EE, Vasiljevic E, Cleland SC, Flores C, Colley NJ. The Gos28 SNARE protein mediates intra-Golgi transport of rhodopsin and is required for photoreceptor survival. The Journal of Biological Chemistry. 289: 32392-409. PMID 25261468 DOI: 10.1074/Jbc.M114.585166  0.36
2014 Rosenbaum EE, Vasiljevic E, Brehm KS, Colley NJ. Mutations in four glycosyl hydrolases reveal a highly coordinated pathway for rhodopsin biosynthesis and N-glycan trimming in Drosophila melanogaster. Plos Genetics. 10: e1004349. PMID 24785692 DOI: 10.1371/Journal.Pgen.1004349  0.36
2014 Maldonado L, Brait M, Loyo M, Sullenberger L, Wang K, Peskoe SB, Rosenbaum E, Howard R, Toubaji A, Albadine R, Netto GJ, Hoque MO, Platz EA, Sidransky D. GSTP1 promoter methylation is associated with recurrence in early stage prostate cancer. The Journal of Urology. 192: 1542-8. PMID 24769028 DOI: 10.1016/J.Juro.2014.04.082  0.44
2014 Chambers EC, Rosenbaum E. Cardiovascular health outcomes of Latinos in the Affordable Housing as an Obesity Mediating Environment (AHOME) study: a study of rental assistance use. Journal of Urban Health : Bulletin of the New York Academy of Medicine. 91: 489-98. PMID 24190105 DOI: 10.1007/S11524-013-9840-9  0.72
2014 Shukla V, Boselli G, Dissegna M, Duvvury C, Sankaralingam R, Rosenbaum E. Prediction of charged device model peak discharge current for microelectronic components Ieee Transactions On Device and Materials Reliability. 14: 801-809. DOI: 10.1109/Tdmr.2014.2342241  1
2014 Rosenbaum E. Cohort trends in housing and household formation since 1990 Diversity and Disparities: America Enters a New Century. 181-207.  0.72
2013 Chacko JG, Onteddu S, Rosenbaum ER. Bilateral optic neuritis due to malaria. Journal of Neuro-Ophthalmology : the Official Journal of the North American Neuro-Ophthalmology Society. 33: 266-7. PMID 23912770 DOI: 10.1097/WNO.0b013e31829ff911  0.32
2013 Jack N, Rosenbaum E. Comparison of FICDM and wafer-level CDM test methods Ieee Transactions On Device and Materials Reliability. 13: 379-387. DOI: 10.1109/Tdmr.2013.2262606  1
2013 Meng KH, Rosenbaum E. Verification of snapback model by transient I-V measurement for circuit simulation of ESD response Ieee Transactions On Device and Materials Reliability. 13: 371-378. DOI: 10.1109/Tdmr.2013.2258672  1
2013 Mertens R, Rosenbaum E. A physics-based compact model for SCR devices used in ESD protection circuits Ieee International Reliability Physics Symposium Proceedings. 2B.2.1-2B.2.7. DOI: 10.1109/IRPS.2013.6531947  1
2013 Mertens R, Rosenbaum E. Separating SCR and trigger circuit related overshoot in SCR-based ESD protection circuits Electrical Overstress/Electrostatic Discharge Symposium Proceedings 1
2013 Meng KH, Rosenbaum E. Layout-aware, distributed, compact model for multi-finger MOSFETs operating under ESD conditions Electrical Overstress/Electrostatic Discharge Symposium Proceedings 1
2012 Brait M, Loyo M, Rosenbaum E, Ostrow KL, Markova A, Papagerakis S, Zahurak M, Goodman SM, Zeiger M, Sidransky D, Umbricht CB, Hoque MO. Correlation between BRAF mutation and promoter methylation of TIMP3, RARβ2 and RASSF1A in thyroid cancer. Epigenetics. 7: 710-9. PMID 22694820 DOI: 10.4161/epi.20524  0.44
2012 Rosenbaum EE, Brehm KS, Vasiljevic E, Gajeski A, Colley NJ. Drosophila GPI-mannosyltransferase 2 is required for GPI anchor attachment and surface expression of chaoptin. Visual Neuroscience. 29: 143-56. PMID 22575127 DOI: 10.1017/S0952523812000181  0.36
2012 Rosenbaum E, Begum S, Brait M, Zahurak M, Maldonado L, Mangold LA, Eisenberger MA, Epstein JI, Partin AW, Sidransky D, Hoque MO. AIM1 promoter hypermethylation as a predictor of decreased risk of recurrence following radical prostatectomy. The Prostate. 72: 1133-9. PMID 22127895 DOI: 10.1002/pros.22461  0.44
2012 Chen W, Rosenbaum E, Ker M. Diode-Triggered Silicon-Controlled Rectifier With Reduced Voltage Overshoot for CDM ESD Protection Ieee Transactions On Device and Materials Reliability. 12: 10-14. DOI: 10.1109/Tdmr.2011.2171487  0.4
2012 Kripanidhi A, Rosenbaum E. Layout sensitivities of transient external latchup Ieee International Reliability Physics Symposium Proceedings. DOI: 10.1109/IRPS.2012.6241821  1
2012 Jack N, Rosenbaum E. Comparing FICDM and wafer-level CDM test methods: Apples to oranges? Electrical Overstress/Electrostatic Discharge Symposium Proceedings 1
2012 Meng KH, Rosenbaum E. The need for transient I-V measurement of device ESD response Electrical Overstress/Electrostatic Discharge Symposium Proceedings 1
2011 Rosenbaum EE, Brehm KS, Vasiljevic E, Liu CH, Hardie RC, Colley NJ. XPORT-dependent transport of TRP and rhodopsin. Neuron. 72: 602-15. PMID 22099462 DOI: 10.1016/J.Neuron.2011.09.016  0.36
2011 Jack N, Shukla V, Rosenbaum E. Comparison of Wafer-Level With Package-Level CDM Stress Facilitated by Real-Time Probing Ieee Transactions On Device and Materials Reliability. 11: 522-530. DOI: 10.1109/Tdmr.2011.2166399  0.52
2011 Farbiz F, Rosenbaum E. Modeling and understanding of external latchup in CMOS technologies-part II: Minority carrier collection efficiency Ieee Transactions On Device and Materials Reliability. 11: 426-432. DOI: 10.1109/Tdmr.2011.2159505  1
2011 Farbiz F, Rosenbaum E. Modeling and understanding of external latchup in CMOS technologies-part I: Modeling latchup trigger current Ieee Transactions On Device and Materials Reliability. 11: 417-425. DOI: 10.1109/Tdmr.2011.2159504  1
2011 Jack N, Rosenbaum E. Voltage monitor circuit for ESD diagnosis Electrical Overstress/Electrostatic Discharge Symposium Proceedings 1
2010 Hoque MO, Brait M, Rosenbaum E, Poeta ML, Pal P, Begum S, Dasgupta S, Carvalho AL, Ahrendt SA, Westra WH, Sidransky D. Genetic and epigenetic analysis of erbB signaling pathway genes in lung cancer. Journal of Thoracic Oncology : Official Publication of the International Association For the Study of Lung Cancer. 5: 1887-93. PMID 21102258 DOI: 10.1097/Jto.0B013E3181F77A53  0.44
2010 Kraus A, Groenendyk J, Bedard K, Baldwin TA, Krause KH, Dubois-Dauphin M, Dyck J, Rosenbaum EE, Korngut L, Colley NJ, Gosgnach S, Zochodne D, Todd K, Agellon LB, Michalak M. Calnexin deficiency leads to dysmyelination. The Journal of Biological Chemistry. 285: 18928-38. PMID 20400506 DOI: 10.1074/Jbc.M110.107201  0.36
2010 Farbiz F, Rosenbaum E. Understanding transient latchup hazards and the impact of guard rings Ieee International Reliability Physics Symposium Proceedings. 466-473. DOI: 10.1109/IRPS.2010.5488787  1
2010 Jack N, Rosenbaum E. ESD protection for high-speed receiver circuits Ieee International Reliability Physics Symposium Proceedings. 835-840. DOI: 10.1109/IRPS.2010.5488722  1
2010 Shukla V, Rosenbaum E. CDM simulation study of a system-in-package Electrical Overstress/Electrostatic Discharge Symposium Proceedings 1
2009 Goldhaber SZ, Rosenbaum E. The Surgeon General's Call to Action Exemplifies the Role of Advocacy in Preventing Venous Thromboembolism American Journal of Medicine. 122: 791-792. PMID 19699369 DOI: 10.1016/j.amjmed.2009.02.014  0.36
2009 Rosenbaum E, Morett CR. The effect of parents' joint work schedules on infants' behavior over the first two years of life: evidence from the ECLSB. Maternal and Child Health Journal. 13: 732-44. PMID 19543818 DOI: 10.1007/S10995-009-0488-8  0.72
2009 Piazza G, Rosenbaum EJ, Pendergast W, Jacobson JO, Pendleton RC, McLaren GD, Elliott CG, Stevens SM, Patton WF, Dabbagh O, Paterno MD, Catapane E, Li Z, Goldhaber SZ. Physician alerts to prevent symptomatic venous thromboembolism in hospitalized patients. Circulation. 119: 2196-201. PMID 19364975 DOI: 10.1161/CIRCULATIONAHA.108.841197  0.36
2009 Di Sarro JP, Rosenbaum E. Oscillatory transmission line pulsing for characterization of device transient response Ieee Electron Device Letters. 30: 168-170. DOI: 10.1109/Led.2008.2009361  1
2009 Farbiz F, Rosenbaum E. A new compact model for external latchup Microelectronics Reliability. 49: 1447-1454. DOI: 10.1016/J.Microrel.2008.12.003  1
2008 Rosenbaum E. Racial/ethnic differences in asthma prevalence: the role of housing and neighborhood environments. Journal of Health and Social Behavior. 49: 131-45. PMID 18649498 DOI: 10.1177/002214650804900202  0.72
2008 Hoque MO, Kim MS, Ostrow KL, Liu J, Wisman GB, Park HL, Poeta ML, Jeronimo C, Henrique R, Lendvai A, Schuuring E, Begum S, Rosenbaum E, Ongenaert M, Yamashita K, et al. Genome-wide promoter analysis uncovers portions of the cancer methylome. Cancer Research. 68: 2661-70. PMID 18413733 DOI: 10.1158/0008-5472.CAN-07-5913  0.44
2008 Hoque MO, Begum S, Brait M, Jeronimo C, Zahurak M, Ostrow KL, Rosenbaum E, Trock B, Westra WH, Schoenberg M, Goodman SN, Sidransky D. Tissue inhibitor of metalloproteinases-3 promoter methylation is an independent prognostic factor for bladder cancer Journal of Urology. 179: 743-747. PMID 18082200 DOI: 10.1016/J.Juro.2007.09.019  0.44
2008 Di Sarro J, Rosenbaum E. A scalable SCR compact model for ESD circuit simulation Ieee International Reliability Physics Symposium Proceedings. 254-261. DOI: 10.1109/Ted.2010.2081674  1
2008 Farbiz F, Rosenbaum E. Modeling of majority and minority carrier triggered external latchup Ieee International Reliability Physics Symposium Proceedings. 270-277. DOI: 10.1109/RELPHY.2008.4558897  1
2008 Farbiz F, Rosenbaum E. Guard ring interactions and their effect on CMOS latchup resilience Technical Digest - International Electron Devices Meeting, Iedm. DOI: 10.1109/IEDM.2008.4796690  1
2008 Rosenbaum E, Rochford JA. Generational patterns in academic performance: The variable effects of attitudes and social capital Social Science Research. 37: 350-372. DOI: 10.1016/J.Ssresearch.2007.03.003  0.72
2008 Wu W, Rosenbaum E. Migration and Housing: Comparing China with the United States Urban China in Transition. 250-267. DOI: 10.1002/9780470712870.ch11  0.72
2008 Lee J, Rosenbaum E. Voltage clamping requirements for ESD protection of inputs in 90nm CMOS technology Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 50-58.  1
2007 Wu J, Rosenbaum E, Begum S, Westra WH. Distribution of BRAF T1799A(V600E) mutations across various types of benign nevi: implications for melanocytic tumorigenesis. The American Journal of Dermatopathology. 29: 534-7. PMID 18032947 DOI: 10.1097/DAD.0b013e3181584950  0.44
2007 Farbiz F, Rosenbaum E. An investigation of external latchup Annual Proceedings - Reliability Physics (Symposium). 600-601. DOI: 10.1109/RELPHY.2007.369970  1
2007 Farbiz F, Rosenbaum E. Analytical modeling of external latchup Electrical Overstress/Electrostatic Discharge Symposium Proceedings. DOI: 10.1109/EOSESD.2007.4401772  1
2007 Bhatia K, Rosenbaum E. Layout guidelines for optimized ESD protection diodes Electrical Overstress/Electrostatic Discharge Symposium Proceedings. DOI: 10.1109/EOSESD.2007.4401727  1
2007 Friedman S, Rosenbaum E. Does suburban residence mean better neighborhood conditions for all households? Assessing the influence of nativity status and race/ethnicity Social Science Research. 36: 1-27. DOI: 10.1016/J.Ssresearch.2005.09.002  0.72
2006 Hoque MO, Feng Q, Toure P, Dem A, Critchlow CW, Hawes SE, Wood T, Jeronimo C, Rosenbaum E, Stern J, Yu M, Trink B, Kiviat NB, Sidransky D. Detection of aberrant methylation of four genes in plasma DNA for the detection of breast cancer. Journal of Clinical Oncology : Official Journal of the American Society of Clinical Oncology. 24: 4262-9. PMID 16908936 DOI: 10.1200/Jco.2005.01.3516  0.44
2006 Hoque MO, Begum S, Topaloglu O, Chatterjee A, Rosenbaum E, Van Criekinge W, Westra WH, Schoenberg M, Zahurak M, Goodman SN, Sidransky D. Quantitation of promoter methylation of multiple genes in urine DNA and bladder cancer detection. Journal of the National Cancer Institute. 98: 996-1004. PMID 16849682 DOI: 10.1093/jnci/djj265  0.44
2006 Jiang WW, Rosenbaum E, Mambo E, Zahurak M, Masayesva B, Carvalho AL, Zhou S, Westra WH, Alberg AJ, Sidransky D, Koch W, Califano JA. Decreased mitochondrial DNA content in posttreatment salivary rinses from head and neck cancer patients. Clinical Cancer Research : An Official Journal of the American Association For Cancer Research. 12: 1564-9. PMID 16533782 DOI: 10.1158/1078-0432.Ccr-05-1471  0.44
2006 Rosenbaum EE, Hardie RC, Colley NJ. Calnexin is essential for rhodopsin maturation, Ca2+ regulation, and photoreceptor cell survival. Neuron. 49: 229-41. PMID 16423697 DOI: 10.1016/J.Neuron.2005.12.011  0.36
2006 Li J, Joshi S, Barnes R, Rosenbaum E. Compact modeling of on-chip ESD protection devices using Verilog-A Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 25: 1047-1063. DOI: 10.1109/Tcad.2005.855948  0.68
2006 Li H, Zemke CE, Manetas G, Okhmatovski VI, Rosenbaum E. An automated and efficient substrate noise analysis tool Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 25: 454-468. DOI: 10.1109/Tcad.2005.854628  1
2006 Rosenbaum E, Hyvonen S. On-chip ESD protection for RFICs Radio Design in Nanometer Technologies. 173-192.  1
2005 Rosenbaum E, Hoque MO, Cohen Y, Zahurak M, Eisenberger MA, Epstein JI, Partin AW, Sidransky D. Promoter hypermethylation as an independent prognostic factor for relapse in patients with prostate cancer following radical prostatectomy. Clinical Cancer Research : An Official Journal of the American Association For Cancer Research. 11: 8321-5. PMID 16322291 DOI: 10.1158/1078-0432.CCR-05-1183  0.44
2005 Xing M, Westra WH, Tufano RP, Cohen Y, Rosenbaum E, Rhoden KJ, Carson KA, Vasko V, Larin A, Tallini G, Tolaney S, Holt EH, Hui P, Umbricht CB, Basaria S, et al. BRAF mutation predicts a poorer clinical prognosis for papillary thyroid cancer. The Journal of Clinical Endocrinology and Metabolism. 90: 6373-9. PMID 16174717 DOI: 10.1210/jc.2005-0987  0.44
2005 Hoque MO, Topaloglu O, Begum S, Henrique R, Rosenbaum E, Van Criekinge W, Westra WH, Sidransky D. Quantitative methylation-specific polymerase chain reaction gene patterns in urine sediment distinguish prostate cancer patients from control subjects. Journal of Clinical Oncology : Official Journal of the American Society of Clinical Oncology. 23: 6569-75. PMID 16170165 DOI: 10.1200/JCO.2005.07.009  0.44
2005 Goldenberg-Cohen N, Cohen Y, Rosenbaum E, Herscovici Z, Chowers I, Weinberger D, Pe'er J, Sidransky D. T1799A BRAF mutations in conjunctival melanocytic lesions. Investigative Ophthalmology & Visual Science. 46: 3027-30. PMID 16123397 DOI: 10.1167/iovs.04-1449  0.44
2005 Rosenbaum E, Hosler G, Zahurak M, Cohen Y, Sidransky D, Westra WH. Mutational activation of BRAF is not a major event in sporadic childhood papillary thyroid carcinoma. Modern Pathology : An Official Journal of the United States and Canadian Academy of Pathology, Inc. 18: 898-902. PMID 15968271 DOI: 10.1038/modpathol.3800252  0.44
2005 Zhao M, Rosenbaum E, Carvalho AL, Koch W, Jiang W, Sidransky D, Califano J. Feasibility of quantitative PCR-based saliva rinse screening of HPV for head and neck cancer. International Journal of Cancer. Journal International Du Cancer. 117: 605-10. PMID 15929076 DOI: 10.1002/Ijc.21216  0.44
2005 Benoit NE, Goldenberg D, Deng SX, Rosenbaum E, Cohen Y, Califano JA, Shackelford WH, Wang XB, Sidransky D. Colorimetric approach to high-throughput mutation analysis. Biotechniques. 38: 635-9. PMID 15884682 DOI: 10.2144/05384Pf01  0.44
2005 LaLonde MM, Janssens H, Rosenbaum E, Choi SY, Gergen JP, Colley NJ, Stark WS, Frohman MA. Regulation of phototransduction responsiveness and retinal degeneration by a phospholipase D-generated signaling lipid. The Journal of Cell Biology. 169: 471-9. PMID 15883198 DOI: 10.1083/Jcb.200502122  0.36
2005 Hoque MO, Rosenbaum E, Westra WH, Xing M, Ladenson P, Zeiger MA, Sidransky D, Umbricht CB. Quantitative assessment of promoter methylation profiles in thyroid neoplasms. The Journal of Clinical Endocrinology and Metabolism. 90: 4011-8. PMID 15840741 DOI: 10.1210/jc.2005-0313  0.44
2005 Jiang WW, Masayesva B, Zahurak M, Carvalho AL, Rosenbaum E, Mambo E, Zhou S, Minhas K, Benoit N, Westra WH, Alberg A, Sidransky D, Koch W, Califano J. Increased mitochondrial DNA content in saliva associated with head and neck cancer. Clinical Cancer Research : An Official Journal of the American Association For Cancer Research. 11: 2486-91. PMID 15814624 DOI: 10.1158/1078-0432.Ccr-04-2147  0.44
2005 Davison JM, Rosenbaum E, Barrett TL, Goldenberg D, Hoque MO, Sidransky D, Westra WH. Absence of V599E BRAF mutations in desmoplastic melanomas. Cancer. 103: 788-92. PMID 15641040 DOI: 10.1002/cncr.20861  0.44
2005 Rosenbaum E, Argeros G. Holding the line: Housing turnover and the persistence of racial/ethnic segregation in New York City Journal of Urban Affairs. 27: 261-281. DOI: 10.1111/J.0735-2166.2005.00236.X  0.72
2005 Joshi S, Hyvonen S, Rosenbaum E. High-Q electrostatic discharge (ESD) protection devices for use at radio frequency (RF) and broad-band I/O pins Ieee Transactions On Electron Devices. 52: 1484-1488. DOI: 10.1109/Ted.2005.850688  0.52
2005 Li J, Li H, Barnes R, Rosenbaum E. Comprehensive study of drain breakdown in MOSFETs Ieee Transactions On Electron Devices. 52: 1180-1186. DOI: 10.1109/Ted.2005.848858  0.68
2005 Joshi S, Ida R, Rosenbaum E. Erratum: Design and optimization of vertical SiGe thyristors for On-Chip BSD protection (IEEE Transactions on Device and Materials Reliability (December 2004)) Ieee Transactions On Device and Materials Reliability. 5. DOI: 10.1109/Tdmr.2005.849957  0.52
2005 Rosenbaum E, Hyvonen S. On-Chip ESD protection for RF I/Os: Devices, circuits and models Proceedings - Ieee International Symposium On Circuits and Systems. 1202-1205. DOI: 10.1109/ISCAS.2005.1464809  1
2005 Hyvonen S, Joshi S, Rosenbaum E. Comprehensive ESD protection for RF inputs Microelectronics Reliability. 45: 245-254. DOI: 10.1016/J.Microrel.2004.05.012  0.52
2005 Hyvonen S, Rosenbaum E. Diode-based tuned ESD protection for 5.25-GHz CMOS LNAs Electrical Overstress/Electrostatic Discharge Symposium Proceedings 1
2004 Begum S, Rosenbaum E, Henrique R, Cohen Y, Sidransky D, Westra WH. BRAF mutations in anaplastic thyroid carcinoma: implications for tumor origin, diagnosis and treatment. Modern Pathology : An Official Journal of the United States and Canadian Academy of Pathology, Inc. 17: 1359-63. PMID 15195111 DOI: 10.1038/modpathol.3800198  0.44
2004 Goldenberg D, Rosenbaum E, Argani P, Wistuba II, Sidransky D, Thuluvath PJ, Hidalgo M, Califano J, Maitra A. The V599E BRAF mutation is uncommon in biliary tract cancers. Modern Pathology : An Official Journal of the United States and Canadian Academy of Pathology, Inc. 17: 1386-91. PMID 15181454 DOI: 10.1038/Modpathol.3800204  0.44
2004 Xing M, Tufano RP, Tufaro AP, Basaria S, Ewertz M, Rosenbaum E, Byrne PJ, Wang J, Sidransky D, Ladenson PW. Detection of BRAF mutation on fine needle aspiration biopsy specimens: a new diagnostic tool for papillary thyroid cancer. The Journal of Clinical Endocrinology and Metabolism. 89: 2867-72. PMID 15181070 DOI: 10.1210/jc.2003-032050  0.44
2004 Cohen Y, Rosenbaum E, Begum S, Goldenberg D, Esche C, Lavie O, Sidransky D, Westra WH. Exon 15 BRAF mutations are uncommon in melanomas arising in nonsun-exposed sites. Clinical Cancer Research : An Official Journal of the American Association For Cancer Research. 10: 3444-7. PMID 15161700 DOI: 10.1158/1078-0432.Ccr-03-0562  0.44
2004 Cohen Y, Rosenbaum E, Clark DP, Zeiger MA, Umbricht CB, Tufano RP, Sidransky D, Westra WH. Mutational analysis of BRAF in fine needle aspiration biopsies of the thyroid: a potential application for the preoperative assessment of thyroid nodules. Clinical Cancer Research : An Official Journal of the American Association For Cancer Research. 10: 2761-5. PMID 15102681 DOI: 10.1158/1078-0432.CCR-03-0273  0.44
2004 Kanj R, Rosenbaum E. Critical evaluation of SOI design guidelines Ieee Transactions On Very Large Scale Integration (Vlsi) Systems. 12: 885-894. DOI: 10.1109/Tvlsi.2004.833665  1
2004 Wu J, Rosenbaum E. Gate oxide reliability under ESD-like pulse stress Ieee Transactions On Electron Devices. 51: 1528-1532. DOI: 10.1109/Ted.2004.829894  1
2004 Joshi S, Ida R, Rosenbaum E. Design and optimization of vertical SiGe thyristors for on-chip ESD protection Ieee Transactions On Device and Materials Reliability. 4: 586-593. DOI: 10.1109/Tdmr.2004.838423  0.52
2004 Friedman S, Rosenbaum E. Nativity status and racial/ethnic differences in access to quality housing: Does homeownership bring greater parity? Housing Policy Debate. 15: 865-901.  0.72
2004 Rosenbaum E, Friedman S. Generational patterns in home ownership and housing quality among racial/ethnic groups in New York City, 1999 International Migration Review. 38: 1492-1533.  0.72
2003 Joshi S, Rosenbaum E. ESD protection for broadband ICs (DC-20 GHz and beyond) Electronics Letters. 39: 906-908. DOI: 10.1049/El:20030597  1
2003 Hyvonen S, Joshi S, Rosenbaum E. Cancellation technique to provide ESD protection for multi-GHz RF inputs Electronics Letters. 39: 284-286. DOI: 10.1049/El:20030221  0.52
2003 Joshi S, Rosenbaum E. Simulator-independent compact modeling of vertical npn transistors for ESD and RF circuit simulation Microelectronics Reliability. 43: 1021-1027. DOI: 10.1016/S0026-2714(03)00130-6  1
2003 Joshi S, Rosenbaum E. Transmission line pulsed waveform shaping with microwave filters Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2003.  1
2002 Kanj R, Rosenbaum E. A critical look at design guidelines for SOI logic gates Proceedings - Ieee International Symposium On Circuits and Systems. 3.  1
2002 Joshi S, Rosenbaum E. Compact modeling of vertical ESD protection NPN transistors for RF circuits Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 2002: 292-298.  1
2001 Rosenbaum E, Friedman S. Differences in the locational attainment of immigrant and native-born households with children in New York City. Demography. 38: 337-48. PMID 11523262 DOI: 10.1353/Dem.2001.0030  0.72
2001 Juliano PA, Rosenbaum E. Accurate wafer-level measurement of BSD protection device turn-on using a modified very fast transmission-line pulse system Ieee Transactions On Device and Materials Reliability. 1: 95-103. DOI: 10.1109/7298.956702  1
2001 Li E, Rosenbaum E, Tao J, Fang P. Projecting lifetime of deep submicron MOSFETs Ieee Transactions On Electron Devices. 48: 671-678. DOI: 10.1109/16.915682  0.72
2001 Wang Y, Juliano P, Joshi S, Rosenbaum E. Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits Microelectronics Reliability. 41: 1781-1787. DOI: 10.1016/S0026-2714(01)00034-8  1
2001 Rosenbaum E, Wu J. Trap generation and breakdown processes in very thin gate oxides Microelectronics and Reliability. 41: 625-632. DOI: 10.1016/S0026-2714(01)00026-9  1
2001 Rosenbaum E, Harris LE. Low-income families in their new neighborhoods: The short-term effects of moving from Chicago's public housing Journal of Family Issues. 22: 183-210.  0.72
2001 Rosenbaum E, Harris LE. Residential mobility and opportunities: Early impacts of the moving to opportunity demonstration program in Chicago Housing Policy Debate. 12: 321-346.  0.72
2001 Kanj R, Rosenbaum E. Multiple Output Domino Logic (MODL) in SOI Ieee International Soi Conference. 59-60.  1
2001 Juliano PA, Rosenbaum E. A novel SCR macromodel for ESD circuit simulation Technical Digest - International Electron Devices Meeting. 319-322.  1
2000 Rosenbaum E, Wu J. Present understanding of gate oxide wearout European Solid-State Device Research Conference. 54-59. DOI: 10.1109/ESSDERC.2000.194717  1
2000 Chen Z, Hess K, Lee J, Lyding JW, Rosenbaum E, Kizilyalli I, Chetlur S, Huang R. On the mechanism for interface trap generation in MOS transistors due to channel hot carrier stressing Ieee Electron Device Letters. 21: 24-26. DOI: 10.1109/55.817441  1
2000 Chen D, Li E, Rosenbaum E, Kang S. Interconnect thermal modeling for accurate simulation of circuit timing and reliability Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 19: 197-205. DOI: 10.1109/43.828548  0.72
2000 Wu J, Juliano P, Rosenbaum E. Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions Electrical Overstress/Electrostatic Discharge Symposium Proceedings. 287-295. DOI: 10.1016/S0026-2714(01)00033-6  1
2000 Rosenbaum E. Urban children's living arrangements and their economic status: New York City, 1993 American Journal of Economics and Sociology. 59: 217-252.  0.72
1999 Raha P, Diaz C, Rosenbaum E, Cao M, VandeVoorde P, Greene W. EOS/ESD reliability of partially depleted SOI technology Ieee Transactions On Electron Devices. 46: 429-431. DOI: 10.1109/16.740912  0.32
1998 Cheng Y, Raha P, Teng C, Rosenbaum E, Kang S. ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 17: 668-681. DOI: 10.1109/43.712099  0.4
1998 Raha P, Smith JC, Miller JW, Rosenbaum E. ESD robustness prediction and protection device design in partially depleted SOI technology Microelectronics Reliability. 38: 1723-1731. DOI: 10.1016/S0026-2714(98)00175-9  0.32
1997 Raha P, Miller JW, Rosenbaum E. Time-dependent snapback in thin-film SOI MOSFET's Ieee Electron Device Letters. 18: 509-511. DOI: 10.1109/55.641428  0.32
1997 Teng C, Cheng Y, Rosenbaum E, Kang S. iTEM: a temperature-dependent electromigration reliability diagnosis tool Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 16: 882-893. DOI: 10.1109/43.644613  0.4
1997 Rosenbaum E, Register LF. Mechanism of stress-induced leakage current in MOS capacitors Ieee Transactions On Electron Devices. 44: 317-323. DOI: 10.1109/16.557724  1
1997 Raha P, Ramaswamy S, Rosenbaum E. Heat flow analysis for EOS/ESD protection device design in SOI technology Ieee Transactions On Electron Devices. 44: 464-471. DOI: 10.1109/16.556157  1
1996 Rosenbaum E, King JC, Hu C. Accelerated testing of SiO/sub 2/ reliability Ieee Transactions On Electron Devices. 43: 70-80. DOI: 10.1109/16.477595  1
1996 Rosenbaum E. The influence of race on hispanic housing choices New York City, 1978-1987 Urban Affairs Review. 32: 217-243.  0.72
1996 Rosenbaum E. Racial/ethnic differences in home ownership and housing quality, 1991 Social Problems. 43: 403-424.  0.72
1995 Rosenbaum E, Kuusinen SB, Ko PK, Minami ER, Hu C. Circuit-Level Simulation of TDDB Failure in Digital CMOS Circuits Ieee Transactions On Semiconductor Manufacturing. 8: 370-374. DOI: 10.1109/66.401018  1
1995 Rosenbaum E. The making of a ghetto: Spatially concentrated poverty in New York City in the 1980s Population Research and Policy Review. 14: 1-27. DOI: 10.1007/Bf01255685  0.72
1995 Felsch C, Rosenbaum E. Relation between oxide degradation and oxide breakdown Annual Proceedings - Reliability Physics (Symposium). 142-148.  1
1994 Rosenbaum E. The Constraints on minority housing choices, New York City 19781987 Social Forces. 72: 725-747. DOI: 10.1093/Sf/72.3.725  0.72
1994 Di J, Rosenbaum E. Caregiving system in transition: An illustration from Shanghai, China Population Research and Policy Review. 13: 101-112. DOI: 10.1007/Bf01074324  0.72
1993 Tu RH, Rosenbaum E, Chan WY, Li CC, Minami E, Quader K, Keung Ko P, Hu C. Berkeley Reliability Tools-BERT Ieee Transactions On Computer-Aided Design of Integrated Circuits and Systems. 12: 1524-1534. DOI: 10.1109/43.256927  1
1993 Rosenbaum E, Liu Z, Hu C. Silicon dioxide breakdown lifetime enhancement under bipolar bias conditions Ieee Transactions On Electron Devices. 40: 2287-2295. DOI: 10.1109/16.249477  1
1993 Quader KN, Li CC, Tu R, Rosenbaum E, Ko PK, Hu C. A Bidirectional NMOSFET Current Reduction Model for Simulation of Hot-Carrier-Induced Circuit Degradation Ieee Transactions On Electron Devices. 40: 2245-2254. DOI: 10.1109/16.249472  1
1992 Rosenbaum E. Race and ethnicity in housing: Turnover in New York City, 1978-1987 Demography. 29: 467-486. PMID 1492879 DOI: 10.2307/2061829  0.72
1991 Rosenbaum E, Hu C. High-Frequency Time-Dependent Breakdown of SiO<inf>2</inf> Ieee Electron Device Letters. 12: 267-269. DOI: 10.1109/55.82056  1
1991 Rosenbaum E, Rofan R, Hu C. Effect of hot-carrier injection on n- and pMOSFET gate oxide integrity Ieee Electron Device Letters. 12: 599-601. DOI: 10.1109/55.119210  1
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