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Lawrence H. Friedman - Publications

Affiliations: 
Engineering Science and Mechanics Pennsylvania State University, State College, PA, United States 
Area:
Applied Mechanics, Mechanical Engineering, Materials Science Engineering
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22 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Howell JA, Vaudin MD, Friedman LH, Cook RF. Microscale Mapping of Structure and Stress in Barium Titanate Journal of Research of the National Institute of Standards and Technology. 125. DOI: 10.6028/Jres.125.013  0.332
2018 Osborn W, Friedman LH, Vaudin M. Strain measurement of 3D structured nanodevices by EBSD. Ultramicroscopy. 184: 88-93. PMID 28863279 DOI: 10.1016/J.Ultramic.2017.08.009  0.325
2018 Cook RF, Friedman LH. Weakly anisotropic residual contact stress in silicon demonstrated by electron backscatter diffraction and expanding cavity models Applied Physics Letters. 113: 231903. DOI: 10.1063/1.5055859  0.324
2017 Gayle AJ, Friedman LH, Beams R, Bush BG, Gerbig YB, Michaels CA, Vaudin MD, Cook RF. Two-dimensional strain-mapping by electron backscatter diffraction and confocal Raman spectroscopy Journal of Applied Physics. 122: 205101. DOI: 10.1063/1.5001270  0.339
2017 Howell JA, Vaudin MD, Friedman LH, Cook RF. Stress and strain mapping of micro-domain bundles in barium titanate using electron backscatter diffraction Journal of Materials Science. 52: 12608-12623. DOI: 10.1007/S10853-017-1355-4  0.345
2016 Friedman LH, Levin I, Cook RF. Stochastic behavior of nanoscale dielectric wall buckling. Journal of Applied Physics. 119. PMID 27330220 DOI: 10.1063/1.4943615  0.335
2016 Friedman LH, Vaudin MD, Stranick SJ, Stan G, Gerbig YB, Osborn W, Cook RF. Assessing strain mapping by electron backscatter diffraction and confocal Raman microscopy using wedge-indented Si. Ultramicroscopy. 163: 75-86. PMID 26939030 DOI: 10.1016/J.Ultramic.2016.02.001  0.364
2015 Vaudin MD, Osborn WA, Friedman LH, Gorham JM, Vartanian V, Cook RF. Designing a standard for strain mapping: HR-EBSD analysis of SiGe thin film structures on Si. Ultramicroscopy. 148: 94-104. PMID 25461586 DOI: 10.1016/J.Ultramic.2014.09.007  0.334
2013 Vaudin M, Osborn W, Friedman L, Cook R. Excellent Agreement Between High Resolution EBSD and XRD Strain Measurements on Si1-xGex films on Si Microscopy and Microanalysis. 19: 690-691. DOI: 10.1017/S1431927613005448  0.317
2008 Fang L, Muhlstein CL, Collins JG, Romasco AL, Friedman LH. Continuous electrical in situ contact area measurement during instrumented indentation Journal of Materials Research. 23: 2480-2485. DOI: 10.1557/Jmr.2008.0298  0.301
2008 Friedman LH. Anisotropy and morphology of strained III-V heteroepitaxial films Physical Review B - Condensed Matter and Materials Physics. 78. DOI: 10.1103/Physrevb.78.193302  0.344
2008 Kumar C, Friedman L. Effects of elastic heterogeneity and anisotropy on the morphology of self-assembled epitaxial quantum dots Journal of Applied Physics. 104: 034902. DOI: 10.1063/1.2960560  0.358
2007 Friedman LH. Order of epitaxial self-assembled quantum dots: Linear analysis Journal of Nanophotonics. 1. DOI: 10.1117/1.2753144  0.303
2007 Friedman LH. Anisotropy and order of epitaxial self-assembled quantum dots Physical Review B - Condensed Matter and Materials Physics. 75. DOI: 10.1103/Physrevb.75.193302  0.319
2007 Fang L, Friedman LH. Analytic treatment of metallic multilayer strength at all length scales: Influence of dislocation sources Acta Materialia. 55: 1505-1514. DOI: 10.1016/J.Actamat.2006.10.012  0.379
2007 Friedman LH. Predicting and understanding order of heteroepitaxial quantum dots Journal of Electronic Materials. 36: 1546-1554. DOI: 10.1007/S11664-007-0246-X  0.315
2006 Friedman LH. Exponent for Hall-Petch behaviour of ultra-hard multilayers Philosophical Magazine. 86: 1443-1481. DOI: 10.1080/14786430500080353  0.336
2004 Friedman LH. Towards a full analytic treatment of the Hall-Petch behavior in multilayers: Putting the pieces together Scripta Materialia. 50: 763-767. DOI: 10.1016/J.Scriptamat.2003.11.045  0.318
2002 Alex Greaney P, Friedman LH, Chrzan DC. Continuum simulation of dislocation dynamics: Predictions for internal friction response Computational Materials Science. 25: 387-403. DOI: 10.1016/S0927-0256(02)00242-2  0.507
1999 Faradjian AK, Friedman LH, Chrzan DC. Frank-Read sources within a continuum simulation Modelling and Simulation in Materials Science and Engineering. 7: 479-494. DOI: 10.1088/0965-0393/7/4/301  0.52
1998 Friedman LH, Chrzan DC. Scaling Theory of the Hall-Petch Relation for Multilayers Physical Review Letters. 81: 2715-2718. DOI: 10.1103/Physrevlett.81.2715  0.457
1998 Friedman LH, Chrzan DC. Continuum analysis of dislocation pile-ups: Influence of sources Philosophical Magazine A. 77: 1185-1204. DOI: 10.1080/01418619808214247  0.508
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