Weiwei Luo, Ph.D. - Publications
Affiliations: | 2000 | Cornell University, Ithaca, NY, United States |
Area:
Chemical Engineering, Materials Science EngineeringYear | Citation | Score | |||
---|---|---|---|---|---|
2003 | Kuo C, Luo W, Clancy P. A Tight-binding Molecular Dynamics Study of the Dissociation of Boron Clusters in c-Si Molecular Simulation. 29: 577-588. DOI: 10.1080/08927020310001601866 | 0.602 | |||
2001 | Zawadzki MT, Luo W, Clancy P. Tight-binding molecular dynamics study of vacancy-interstitial annihilation in silicon Physical Review B - Condensed Matter and Materials Physics. 63: 2052051-20520514. DOI: 10.1103/Physrevb.63.205205 | 0.513 | |||
2001 | Luo W, Yang S, Clancy P, Thompson MO. Deactivation kinetics of supersaturated boron:silicon alloys Journal of Applied Physics. 90: 2262-2268. DOI: 10.1063/1.1385360 | 0.495 | |||
2001 | Luo W, Clancy P. Identification of stable boron clusters in c-Si using tight-binding statics Journal of Applied Physics. 89: 1596-1604. DOI: 10.1063/1.1335644 | 0.582 | |||
1999 | Roberts BW, Luo W, Johnson KA, Clancy P. An order(N) tight-binding molecular dynamics study of intrinsic defect diffusion in silicon Chemical Engineering Journal. 74: 67-75. DOI: 10.1016/S1385-8947(99)00062-5 | 0.517 | |||
1998 | Luo W, Rasband PB, Clancy P, Roberts BW. Tight-binding studies of the tendency for boron to cluster in c-Si. II. Interaction of dopants and defects in boron-doped Si Journal of Applied Physics. 84: 2476-2486. DOI: 10.1063/1.368451 | 0.57 | |||
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