Year |
Citation |
Score |
2020 |
Vukmirovic MB, Adzic RR, Akolkar R. Copper Electrodeposition from Deep Eutectic Solvents-Voltammetric Studies Providing Insights into the Role of Substrate: Platinum vs Glassy Carbon. The Journal of Physical Chemistry. B. PMID 32497430 DOI: 10.1021/Acs.Jpcb.0C02735 |
0.412 |
|
2020 |
Shaheen NA, Mahesh I, Vukmirovic MB, Akolkar R. Hysteresis effects and roughness suppression efficacy of polyethylenimine additive in Cu electrodeposition in ethaline Electrochemistry Communications. 115: 106721. DOI: 10.1016/J.Elecom.2020.106721 |
0.431 |
|
2019 |
Shen D, Vukmirovic MB, Akolkar R. Understanding the Role of Complexation in the Charge-Transfer Kinetics of the Cu2+ + e ↔ Cu1+ Redox Reaction in Ethaline Deep Eutectic Solvent Journal of the Electrochemical Society. 166: E526-E532. DOI: 10.1149/2.1211915Jes |
0.341 |
|
2019 |
Liu X, Bolton O, Akolkar R. Experimental and Modeling Studies of the Hysteresis Behavior and Dendrite Suppression Efficacy of an Electrolyte Additive in Zinc Electrodeposition Journal of the Electrochemical Society. 166. DOI: 10.1149/2.0411913Jes |
0.304 |
|
2019 |
Joi A, Venkatraman K, Tso K, Dictus D, Dordi Y, Wu P, Pao C, Akolkar R. Editors' Choice—Interface Engineering Strategy Utilizing Electrochemical ALD of Cu-Zn for Enabling Metallization of Sub-10 nm Semiconductor Device Nodes Ecs Journal of Solid State Science and Technology. 8: 516. DOI: 10.1149/2.0181909Jss |
0.31 |
|
2019 |
Venkatraman K, Gusley R, Lesak A, Akolkar R. Electrochemistry-enabled atomic layer deposition of copper: Investigation of the deposit growth rate and roughness Journal of Vacuum Science and Technology. 37: 20901. DOI: 10.1116/1.5079560 |
0.413 |
|
2018 |
Shen D, Steinberg K, Akolkar R. Avoiding Pitfalls in the Determination of Reliable Electrochemical Kinetics Parameters for the Cu2+ → Cu1+ Reduction Reaction in Deep Eutectic Solvents Journal of the Electrochemical Society. 165. DOI: 10.1149/2.1011814Jes |
0.357 |
|
2018 |
Gong Y, Venkatraman K, Akolkar R. Communication—Electrochemical Atomic Layer Etching of Copper Journal of the Electrochemical Society. 165. DOI: 10.1149/2.0901807Jes |
0.389 |
|
2018 |
Maraschky A, Akolkar R. Mechanism Explaining the Onset Time of Dendritic Lithium Electrodeposition via Considerations of the Li+Transport within the Solid Electrolyte Interphase Journal of the Electrochemical Society. 165. DOI: 10.1149/2.0601814Jes |
0.321 |
|
2018 |
Venkatraman K, Joi A, Dordi Y, Akolkar R. Electroless atomic layer deposition of copper Electrochemistry Communications. 91: 45-48. DOI: 10.1016/J.Elecom.2018.05.007 |
0.448 |
|
2017 |
Liu X, Richtering W, Akolkar R. Investigation of the Kinetics and Mass Transport Aspects of Hydrogen Evolution during Electroless Deposition of Nickel–Phosphorus Journal of the Electrochemical Society. 164. DOI: 10.1149/2.1521707Jes |
0.31 |
|
2017 |
Venkatraman K, Dordi Y, Akolkar R. Electrochemical Atomic Layer Deposition of Cobalt Enabled by the Surface-Limited Redox Replacement of Underpotentially Deposited Zinc Journal of the Electrochemical Society. 164. DOI: 10.1149/2.0091704Jes |
0.357 |
|
2016 |
Yu L, Akolkar R. Communication-underpotential deposition of lead for investigating the early stages of electroless copper deposition on ruthenium Journal of the Electrochemical Society. 163: D247-D249. DOI: 10.1149/2.0701606Jes |
0.412 |
|
2016 |
Yu L, Vashaei Z, Ernst F, Akolkar R. Electroless deposition of copper-manganese for applications in semiconductor interconnect metallization Journal of the Electrochemical Society. 163: D374-D378. DOI: 10.1149/2.0631608Jes |
0.431 |
|
2016 |
Banik SJ, Rao KK, Akolkar R. Determination of the diffusion-adsorption properties of polymeric electrolyte additives using an additive injection method implemented on a rotating disc electrode Journal of the Electrochemical Society. 163: E241-E247. DOI: 10.1149/2.0231609Jes |
0.34 |
|
2016 |
Venkatraman K, Gusley R, Yu L, Dordi Y, Akolkar R. Electrochemical Atomic Layer Deposition of Copper: A Lead-Free Process Mediated by Surface-Limited Redox Replacement of Underpotentially Deposited Zinc Journal of the Electrochemical Society. 163. DOI: 10.1149/2.0021612Jes |
0.404 |
|
2016 |
Zhao M, Yu L, Akolkar R, Anderson AB. Mechanism of Electroless Copper Deposition from [CuIIEDTA]2– Complexes Using Aldehyde-Based Reductants Journal of Physical Chemistry C. 120: 24789-24793. DOI: 10.1021/Acs.Jpcc.6B07546 |
0.37 |
|
2016 |
Rao KK, Ferguson M, Murphy K, Zhao J, Lacks D, Akolkar R. Electrochemical characterization of micro-cracks in polyurethane resin films deposited on metallic surfaces Journal of Applied Electrochemistry. 46: 1237-1243. DOI: 10.1007/S10800-016-1005-6 |
0.334 |
|
2015 |
Miller A, Yu L, Blickensderfer J, Akolkar R. Electrochemical copper metallization of glass substrates mediated by solution-phase deposition of adhesion-promoting layers Journal of the Electrochemical Society. 162: D630-D634. DOI: 10.1149/2.1071514Jes |
0.418 |
|
2015 |
Banik SJ, Akolkar R. Suppressing Dendritic Growth during Alkaline Zinc Electrodeposition using Polyethylenimine Additive Electrochimica Acta. 179: 475-481. DOI: 10.1016/J.Electacta.2014.12.100 |
0.38 |
|
2014 |
Blickensderfer J, Altemare P, Thiel KO, Schreier HJ, Akolkar R. Direct electroless plating of iron-boron on copper Journal of the Electrochemical Society. 161. DOI: 10.1149/2.0471410Jes |
0.404 |
|
2014 |
Akolkar R. Modeling dendrite growth during lithium electrodeposition at sub-ambient temperature Journal of Power Sources. 246: 84-89. DOI: 10.1016/J.Jpowsour.2013.07.056 |
0.355 |
|
2013 |
Banik SJ, Akolkar R. Suppressing dendrite growth during zinc electrodeposition by PEG-200 additive Journal of the Electrochemical Society. 160. DOI: 10.1149/2.040311Jes |
0.39 |
|
2013 |
Joi A, Akolkar R, Uziel L. Pulse electrodeposition of copper-manganese alloy for application in interconnect metallization Journal of the Electrochemical Society. 160. DOI: 10.1149/2.024312Jes |
0.406 |
|
2013 |
Akolkar R. Characterizing transport limitations during copper electrodeposition of high aspect ratio through-silicon vias Ecs Electrochemistry Letters. 2. DOI: 10.1149/2.007302Eel |
0.367 |
|
2013 |
Yu L, Guo L, Preisser R, Akolkar R. Autocatalysis during electroless copper deposition using glyoxylic acid as reducing agent Journal of the Electrochemical Society. 160. DOI: 10.1149/2.002312Jes |
0.417 |
|
2013 |
Joi A, Akolkar R, Landau U. Additives for bottom-up copper plating from an alkaline complexed electrolyte Journal of the Electrochemical Society. 160. DOI: 10.1149/2.001312Jes |
0.607 |
|
2013 |
Joi A, Akolkar R, Landau U. Pulse plating of copper germanide Applied Physics Letters. 102. DOI: 10.1063/1.4801470 |
0.62 |
|
2013 |
Akolkar R. Mathematical model of the dendritic growth during lithium electrodeposition Journal of Power Sources. 232: 23-28. DOI: 10.1016/J.Jpowsour.2013.01.014 |
0.353 |
|
2012 |
Akolkar R. Analytical model for the current distribution during copper electrodeposition on resistivewafers under tafel kinetics Ecs Electrochemistry Letters. 1. DOI: 10.1149/2.011206Eel |
0.382 |
|
2009 |
Mendez J, Akolkar R, Landau U. Polyether suppressors enabling copper metallization of high aspect ratio interconnects Journal of the Electrochemical Society. 156. DOI: 10.1149/1.3211849 |
0.608 |
|
2009 |
Akolkar R, Landau U. Mechanistic analysis of the bottom-up fill in copper interconnect metallization Journal of the Electrochemical Society. 156. DOI: 10.1149/1.3156640 |
0.659 |
|
2009 |
Adolf JD, Akolkar R, Landau U. Novel high molecular weight levelers extending gap fill to smaller features Ecs Transactions. 16: 1-10. DOI: 10.1149/1.3115644 |
0.557 |
|
2008 |
Mendez J, Akolkar R, Andryushchenko T, Landau U. A mechanistic model for copper electropolishing in phosphoric acid Journal of the Electrochemical Society. 155. DOI: 10.1149/1.2801396 |
0.625 |
|
2007 |
Akolkar R, Wang YM, Kuo HH. Kinetics of the electrolytic coloring process on anodized aluminum Journal of Applied Electrochemistry. 37: 291-296. DOI: 10.1007/S10800-006-9258-0 |
0.342 |
|
2004 |
Akolkar R, Landau U. A time-dependent transport-kinetics model for additive interactions in copper interconnect metallization Journal of the Electrochemical Society. 151. DOI: 10.1149/1.1799431 |
0.618 |
|
2004 |
Akolkar R, Landau U, Kuo H, Wang YM. Modeling of the current distribution in aluminum anodization Journal of Applied Electrochemistry. 34: 807-813. DOI: 10.1023/B:Jach.0000035611.87036.36 |
0.622 |
|
2004 |
Akolkar R, Landau U. Analysis of the 'bottom-up' fill during copper metallization of semiconductor interconnects Proceedings - Electrochemical Society. 117-131. |
0.621 |
|
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