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Zehra Parlak, Ph.D. - Publications

Affiliations: 
2010 Georgia Institute of Technology, Atlanta, GA 
Area:
Electronics and Electrical Engineering, Mechanical Engineering
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9 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2016 Tu Q, Lange B, Parlak Z, Lopes JM, Blum V, Zauscher S. Quantitative Subsurface Atomic Structure Fingerprint for 2D Materials and Heterostructures by First-Principles Calibrated Contact-Resonance Atomic Force Microscopy. Acs Nano. PMID 27263541 DOI: 10.1021/Acsnano.6B02402  0.43
2014 Parlak Z, Tu Q, Zauscher S. Liquid contact resonance AFM: analytical models, experiments, and limitations. Nanotechnology. 25: 445703. PMID 25302928 DOI: 10.1088/0957-4484/25/44/445703  0.434
2012 Zhang J, Parlak Z, Bowers CM, Oas T, Zauscher S. Mapping mechanical properties of organic thin films by force-modulation microscopy in aqueous media. Beilstein Journal of Nanotechnology. 3: 464-74. PMID 23019540 DOI: 10.3762/Bjnano.3.53  0.36
2012 Giray Oral H, Parlak Z, Levent Degertekin F. Analysis of time-resolved interaction force mode AFM imaging using active and passive probes. Ultramicroscopy. 120: 56-63. PMID 22813887 DOI: 10.1016/J.Ultramic.2012.05.009  0.523
2011 Parlak Z, Degertekin FL. Combined quantitative ultrasonic and time-resolved interaction force AFM imaging. The Review of Scientific Instruments. 82: 013703. PMID 21280833 DOI: 10.1063/1.3514099  0.554
2011 Thatte A, Parlak Z, Degertekin FL, Salant RF. Nano/micro-scale structural properties of dynamic polymeric seals Bhr Group - 21st International Conference On Fluid Sealing. 239-248.  0.495
2009 Parlak Z, Hadizadeh R, Balantekin M, Levent Degertekin F. Controlling tip-sample interaction forces during a single tap for improved topography and mechanical property imaging of soft materials by AFM. Ultramicroscopy. 109: 1121-5. PMID 19493622 DOI: 10.1016/J.Ultramic.2009.04.006  0.5
2008 Parlak Z, Degertekin FL. Contact stiffness of finite size subsurface defects for atomic force microscopy: Three-dimensional finite element modeling and experimental verification Journal of Applied Physics. 103. DOI: 10.1063/1.2936881  0.534
2006 Onaran AG, Balantekin M, Lee W, Hughes WL, Buchine BA, Guldiken RO, Parlak Z, Quate CF, Degertekin FL. A new atomic force microscope probe with force sensing integrated readout and active tip Review of Scientific Instruments. 77. DOI: 10.1063/1.2166469  0.474
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