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Olivier Pierron, Ph.D. - Publications

Affiliations: 
2005 Pennsylvania State University, State College, PA, United States 
Area:
Materials Science Engineering
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37 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2018 Kim K, Luo H, Zhu T, Pierron ON, Graham S. Influence of Polymer Substrate Damage on the Time Dependent Cracking of SiNBarrier Films. Scientific Reports. 8: 4560. PMID 29540713 DOI: 10.1038/S41598-018-22105-2  0.44
2018 Barrios A, Gupta S, Castelluccio G, Pierron ON. Quantitative In Situ SEM High Cycle Fatigue: the Critical Role of Oxygen on Nanoscale-Void-Controlled Nucleation and Propagation of Small Cracks in Ni Microbeams. Nano Letters. PMID 29489378 DOI: 10.1021/Acs.Nanolett.8B00343  0.469
2016 Kim K, Luo H, Singh AK, Zhu T, Graham S, Pierron ON. Environmentally-Assisted Cracking In Silicon Nitride Barrier Films On PET Substrates. Acs Applied Materials & Interfaces. PMID 27643813 DOI: 10.1021/Acsami.6B06417  0.472
2016 Sadeghi-Tohidi F, Pierron ON. Extreme stress gradient effects on the fatigue behavior of Ni notched microbeams Acta Materialia. 106: 388-400. DOI: 10.1016/j.actamat.2016.01.013  0.473
2015 Hosseinian E, Pierron ON. Correction: Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films. Nanoscale. 7: 11468-70. PMID 26083001 DOI: 10.1039/c5nr90109j  0.382
2015 Sadeghi-Tohidi F, Pierron ON. Extreme stress gradient effects on microstructural fatigue crack propagation rates in Ni microbeams Applied Physics Letters. 106. DOI: 10.1063/1.4921476  0.431
2014 Sadeghi-Tohidi F, Samet D, Graham S, Pierron ON. Comparison of the cohesive and delamination fatigue properties of atomic-layer-deposited alumina and titania ultrathin protective coatings deposited at 200 °C. Science and Technology of Advanced Materials. 15: 015003. PMID 27877645 DOI: 10.1088/1468-6996/15/1/015003  0.476
2014 Sadeghi-Tohidi F, Samet D, Graham S, Pierron ON. Comparison of the cohesive and delamination fatigue properties of atomic-layer-deposited alumina and titania ultrathin protective coatings deposited at 200 °c Science and Technology of Advanced Materials. 15. DOI: 10.1088/1468-6996/15/1/015003  0.479
2014 Baumert EK, Sadeghi-Tohidi F, Hosseinian E, Pierron ON. Fatigue-induced thick oxide formation and its role on fatigue crack initiation in Ni thin films at low temperatures Acta Materialia. 67: 156-167. DOI: 10.1016/j.actamat.2013.11.057  0.567
2013 Hosseinian E, Pierron ON. Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films. Nanoscale. 5: 12532-41. PMID 24173603 DOI: 10.1039/c3nr04035f  0.359
2013 Baumert EK, Pierron ON. Interfacial cyclic fatigue of atomic-layer-deposited alumina coatings on silicon thin films. Acs Applied Materials & Interfaces. 5: 6216-24. PMID 23721232 DOI: 10.1021/am4011989  0.531
2013 Straub T, Theillet PO, Eberl C, Pierron ON. Comparison of the stress distribution and fatigue behavior of 10-and 25-μm-thick deep-reactive-ion-etched si kilohertz resonators Journal of Microelectromechanical Systems. 22: 418-429. DOI: 10.1109/JMEMS.2012.2226933  0.391
2013 Baumert EK, Pierron ON. Fatigue degradation properties of LIGA Ni films using kilohertz microresonators Journal of Microelectromechanical Systems. 22: 16-25. DOI: 10.1109/JMEMS.2012.2212422  0.558
2013 Bulusu A, Behm H, Sadeghi-Tohidi F, Bahre H, Baumert E, Samet D, Hopmann C, Winter J, Pierron O, Graham S. The mechanical reliability of flexible ALD barrier films Digest of Technical Papers - Sid International Symposium. 44: 361-364. DOI: 10.1002/j.2168-0159.2013.tb06221.x  0.495
2012 Baumert EK, Pierron ON. Fatigue properties of atomic-layer-deposited alumina ultra-barriers and their implications for the reliability of flexible organic electronics Applied Physics Letters. 101. DOI: 10.1063/1.4772471  0.466
2012 Straub T, Baumert EK, Eberl C, Pierron ON. A method for probing the effects of conformal nanoscale coatings on fatigue crack initiation in electroplated Ni films Thin Solid Films. 526: 176-182. DOI: 10.1016/j.tsf.2012.11.011  0.501
2012 Baumert EK, Pierron ON. Very high cycle fatigue crack initiation in electroplated Ni films under extreme stress gradients Scripta Materialia. 67: 45-48. DOI: 10.1016/j.scriptamat.2012.03.017  0.565
2011 Theillet PO, Pierron ON. Quantifying adsorbed water monolayers on silicon MEMS resonators exposed to humid environments Sensors and Actuators, a: Physical. 171: 375-380. DOI: 10.1016/j.sna.2011.09.002  0.315
2011 Baumert EK, Theillet PO, Pierron ON. Fatigue-resistant silicon films coated with nanoscale alumina layers Scripta Materialia. 65: 596-599. DOI: 10.1016/j.scriptamat.2011.06.034  0.523
2010 Budnitzki M, Scates MC, Ritchie RO, Stach EA, Muhlstein CL, Pierron ON. The effects of cubic stiffness on fatigue characterization resonator performance Sensors and Actuators, a: Physical. 157: 228-234. DOI: 10.1016/J.Sna.2009.11.020  0.693
2010 Baumert EK, Theillet PO, Pierron ON. Investigation of the low-cycle fatigue mechanism for micron-scale monocrystalline silicon films Acta Materialia. 58: 2854-2863. DOI: 10.1016/j.actamat.2010.01.011  0.61
2009 Theillet PO, Pierron O. Low-cycle fatigue testing of silicon resonators Proceedings of Spie - the International Society For Optical Engineering. 7206. DOI: 10.1117/12.808180  0.475
2009 Theillet PO, Pierron ON. Fatigue rates of monocrystalline silicon thin films in harsh environments: Influence of stress amplitude, relative humidity, and temperature Applied Physics Letters. 94. DOI: 10.1063/1.3133357  0.51
2009 Budnitzki M, Pierron O. The influence of nanoscale atomic-layer-deposited alumina coating on the fatigue behavior of polycrystalline silicon thin films Applied Physics Letters. 94. DOI: 10.1063/1.3112565  0.565
2009 Budnitzki M, Pierron ON. Highly localized surface oxide thickening on polycrystalline silicon thin films during cyclic loading in humid environments Acta Materialia. 57: 2944-2955. DOI: 10.1016/j.actamat.2009.03.004  0.561
2007 Pierron ON, Muhlstein CL. The role of debris-induced cantilever effects in cyclic fatigue of micron-scale silicon films Fatigue and Fracture of Engineering Materials and Structures. 30: 57-63. DOI: 10.1111/j.1460-2695.2006.01042.x  0.714
2007 Pierron ON, Muhlstein CL. Notch root oxide formation during fatigue of polycrystalline silicon structural films Journal of Microelectromechanical Systems. 16: 1441-1450. DOI: 10.1109/Jmems.2007.906076  0.755
2007 Alsem DH, Pierron ON, Stach EA, Muhlstein CL, Ritchie RO. Mechanisms for fatigue of micron-scale silicon structural films Advanced Engineering Materials. 9: 15-30. DOI: 10.1002/Adem.200600269  0.75
2006 Pierron ON, Muhlstein CL. Fatigue of polycrystalline silicon films with thin surface oxides Proceedings of Spie - the International Society For Optical Engineering. 6111. DOI: 10.1117/12.646468  0.748
2006 Pierron ON, Muhlstein CL. The critical role of environment in fatigue damage accumulation in deep-reactive ion-etched single-crystal silicon structural films Journal of Microelectromechanical Systems. 15: 111-119. DOI: 10.1109/Jmems.2005.863602  0.75
2006 Pierron ON, Abnet CC, Muhlstein CL. Methodology for low- and high-cycle fatigue characterization with kHz-frequency resonators Sensors and Actuators, a: Physical. 128: 140-150. DOI: 10.1016/J.Sna.2006.01.013  0.689
2005 Glendening A, Koss DA, Motta AT, Pierron ON, Daum RS. Failure of hydrided zircaloy-4 under equal-biaxial and plane-strain tensile deformation Journal of Astm International. 2: 399-414. DOI: 10.1520/Jai12441  0.333
2005 Pierron ON, Muhlstein CL. Long-term reliability of single-crystal silicon thin films: The influence of environment on the fatigue damage accumulation rate Progress in Biomedical Optics and Imaging - Proceedings of Spie. 5716: 141-150. DOI: 10.1117/12.591219  0.727
2005 Pierron ON, MacDonald DD, Muhlstein CL. Galvanic effects in Si-based microelectromechanical systems: Thick oxide formation and its implications for fatigue reliability Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1939072  0.662
2005 Pierron ON, Muhlstein CL. The extended range of reaction-layer fatigue susceptibility of polycrystalline silicon thin films International Journal of Fracture. 135: 1-18. DOI: 10.1007/S10704-005-3469-Y  0.747
2004 Muhlstein CL, Pierron ON. Reaction-layer fatigue: Understanding the limitations of structural silicon Proceedings of Spie - the International Society For Optical Engineering. 5343: 132-144. DOI: 10.1117/12.527465  0.723
2003 Pierron ON, Koss DA, Motta AT, Chan KS. The influence of hydride blisters on the fracture of Zircaloy-4 Journal of Nuclear Materials. 322: 21-35. DOI: 10.1016/S0022-3115(03)00299-X  0.378
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