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Sarah E. Armstrong, Ph.D. - Publications

Affiliations: 
2011 Vanderbilt University, Nashville, TN 
Area:
Electronics and Electrical Engineering
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10 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2012 Blaine RW, Atkinson NM, Kauppila JS, Armstrong SE, Hooten NC, Loveless TD, Warner JH, Holman WT, Massengill LW. Differential charge cancellation (DCC) layout as an rhbd technique for bulk CMOS differential circuit design Ieee Transactions On Nuclear Science. 59: 2867-2871. DOI: 10.1109/Tns.2012.2222441  0.569
2012 Blaine RW, Atkinson NM, Kauppila JS, Loveless TD, Armstrong SE, Holman WT, Massengill LW. Single-event-hardened CMOS operational amplifier design Ieee Transactions On Nuclear Science. 59: 803-810. DOI: 10.1109/TNS.2012.2200502  0.317
2012 Armstrong SE, Blaine RW, Holman WT, Massengill LW. Single-event analysis and hardening of mixed-signal circuit interfaces in high-speed communications devices Ieee Transactions On Nuclear Science. 59: 1027-1033. DOI: 10.1109/Tns.2012.2194166  0.569
2011 Blaine RW, Armstrong SE, Kauppila JS, Atkinson NM, Olson BD, Holman WT, Massengill LW. RHBD bias circuits utilizing sensitive node active charge cancellation Ieee Transactions On Nuclear Science. 58: 3060-3066. DOI: 10.1109/Tns.2011.2171365  0.575
2011 Armstrong SE, Loveless TD, Hicks JR, Holman WT, McMorrow D, Massengill LW. Phase-dependent single-event sensitivity analysis of high-speed A/MS circuits extracted from asynchronous measurements Ieee Transactions On Nuclear Science. 58: 1066-1071. DOI: 10.1109/Tns.2011.2125989  0.555
2011 Armstrong SE, Blaine RW, Holman WT, Massengill LW. Single-event vulnerability of mixed-signal circuit interfaces Proceedings of the European Conference On Radiation and Its Effects On Components and Systems, Radecs. 485-488. DOI: 10.1109/RADECS.2011.6131356  0.415
2011 Blaine RW, Atkinson NM, Kauppila JS, Armstrong SE, Holman WT, Massengill LW. A single-event-hardened CMOS operational amplifier design Proceedings of the European Conference On Radiation and Its Effects On Components and Systems, Radecs. 123-127. DOI: 10.1109/RADECS.2011.6131296  0.317
2010 Armstrong SE, Olson BD, Holman WT, Warner J, McMorrow D, Massengill LW. Demonstration of a differential layout solution for improved ASET tolerance in CMOS A/MS circuits Ieee Transactions On Nuclear Science. 57: 3615-3619. DOI: 10.1109/Tns.2010.2080320  0.571
2009 Armstrong SE, Olson BD, Popp J, Braatz J, Loveless TD, Holman WT, McMorrow D, Massengill LW. Single-event transient error characterization of a radiation-hardened by design 90 nm SerDes transmitter driver Ieee Transactions On Nuclear Science. 56: 3463-3468. DOI: 10.1109/Tns.2009.2033924  0.552
2009 Casey MC, Armstrong SE, Arora R, King MP, Ahlbin JR, Francis SA, Bhuva BL, McMorrow D, Hughes HL, McMarr PJ, Melinger JS, Massengill LW. Effect of total ionizing dose on a bulk 130 nm ring oscillator operating at ultra-low power Ieee Transactions On Nuclear Science. 56: 3262-3266. DOI: 10.1109/Tns.2009.2033919  0.541
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