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Carmen Lilley - Publications

Affiliations: 
Electrical and Computer Engineering University of Illinois at Chicago, Chicago, IL, United States 
Area:
Electronics and Electrical Engineering, Nanoscience, Materials Science Engineering
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14 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2013 Ng PK, Fisher B, Lilley CM. Scanning tunneling microscopy and spectroscopy studies of self assembled sub 10 nm copper-silicide nanostructures on Si(110) Proceedings of the Ieee Conference On Nanotechnology. 105-109. DOI: 10.1109/NANO.2013.6720872  0.586
2012 Ng PK, Cheng JY, Fisher B, Lilley CM. In situ electrical resistivity measurement of self assembled Cu 3Si nanowires on Si(111) 2012 Ieee Nanotechnology Materials and Devices Conference, Ieee Nmdc 2012. 67-70. DOI: 10.1109/NMDC.2012.6527589  0.361
2011 Ng PK, Fisher B, Bode M, Lilley CM. Self assembled Cu nanowires on vicinal Si(001) by the E-beam evaporation method Proceedings of the Ieee Conference On Nanotechnology. 150-154. DOI: 10.1109/NANO.2011.6144548  0.302
2011 Ng PK, Fisher B, Low KB, Joshi-Imre A, Bode M, Lilley CM. High resolution analysis of self assembled Cu nanowires on vicinal Si(001) Proceedings of the Ieee Conference On Nanotechnology. 1114-1117. DOI: 10.1109/NANO.2011.6144547  0.324
2009 Huang Q, Lilley CM, Divan R. An in situ investigation of electromigration in Cu nanowires. Nanotechnology. 20: 075706. PMID 19417434 DOI: 10.1088/0957-4484/20/7/075706  0.569
2009 Huang Q, Lilley CM, Bode M. Characterization of electron surface scattering in single crystalline metallic nanowires 2009 Ieee Nanotechnology Materials and Devices Conference, Nmdc 2009. 61-63. DOI: 10.1109/NMDC.2009.5167569  0.568
2009 Huang Q, Lilley CM, Bode M. Surface scattering effect on the electrical resistivity of single crystalline silver nanowires self-assembled on vicinal Si (001) Applied Physics Letters. 95. DOI: 10.1063/1.3216836  0.552
2008 Huang Q, Lilley CM, Divan R, Bode M. Electrical failure analysis of Au nanowires Ieee Transactions On Nanotechnology. 7: 688-692. DOI: 10.1109/Tnano.2008.2006166  0.558
2008 Huang Q, Lilley CM, Bode M, Divan RS. Electrical properties of Cu nanowires 2008 8th Ieee Conference On Nanotechnology, Ieee-Nano. 549-552. DOI: 10.1109/NANO.2008.163  0.579
2008 Huang Q, Lilley CM, Bode M, Divan R. Surface and size effects on the electrical properties of Cu nanowires Journal of Applied Physics. 104. DOI: 10.1063/1.2956703  0.601
2007 Lilley CM, Huang Q, Meyer RJ. Surface effects on metallic nanowires and the stability of material properties 2007 7th Ieee International Conference On Nanotechnology - Ieee-Nano 2007, Proceedings. 267-270. DOI: 10.1109/NANO.2007.4601186  0.494
2006 Huang Q, Lilley CM, Paing KM. Contamination effect on the electrical resistivity of gold nanowires American Society of Mechanical Engineers, Electronic and Photonic Packaging, Epp. DOI: 10.1115/IMECE2006-13750  0.606
2006 Lilley CM, Huang Q. Surface contamination effects on resistance of gold nanowires Applied Physics Letters. 89. DOI: 10.1063/1.2388133  0.583
2006 Huang QJ, Paing KM, Lilley CM. Analysis of contamination in nanoscaled film structures with TEM & XPS Microscopy and Microanalysis. 12: 734-735. DOI: 10.1017/S1431927606064646  0.464
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