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Shamachary Sathish - Publications

Affiliations: 
Mechanical Engineering University of Dayton, Dayton, OH, United States 
Area:
Materials Science Engineering, Mechanical Engineering
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28 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2018 Cherry M, Dierken J, Boehnlein T, Pilchak A, Sathish S, Grandhi R. Impulse excitation scanning acoustic microscopy for local quantification of Rayleigh surface wave velocity using B-scan analysis. The Review of Scientific Instruments. 89: 013706. PMID 29390649 DOI: 10.1063/1.4998936  0.362
2014 Sathish S, Welter JT, Schehl N, Jata KV. Noncontact acousto-thermal evaluation of evolving fatigue damage in polycrystalline Ti-6Al-4V Journal of Applied Physics. 115. DOI: 10.1063/1.4875098  0.305
2012 Sathish S, Welter JT, Jata KV, Schehl N, Boehnlein T. Development of nondestructive non-contact acousto-thermal evaluation technique for damage detection in materials. The Review of Scientific Instruments. 83: 095103. PMID 23020415 DOI: 10.1063/1.4749245  0.34
2012 Welter JT, Sathish S, Dierken JM, Brodrick PG, Cherry MR, Heebl JD. Broadband aperiodic air coupled ultrasonic lens Applied Physics Letters. 100. DOI: 10.1063/1.4720149  0.337
2011 Welter JT, Sathish S, Christensen DE, Brodrick PG, Heebl JD, Cherry MR. Focusing of longitudinal ultrasonic waves in air with an aperiodic flat lens. The Journal of the Acoustical Society of America. 130: 2789-96. PMID 22087907 DOI: 10.1121/1.3640841  0.32
2011 Nalladega V, Sathish S, Murray T, Shin E, Jata KV, Blodgett MP. Experimental investigation of interaction of very low frequency electromagnetic waves with metallic nanostructure Journal of Applied Physics. 109. DOI: 10.1063/1.3587238  0.679
2011 Nalladega V, Sathish S, Abburi S, Gigliotti MFX, Subramanian PR. Characterization of fatigue fracture in Ni-20 pct Cr alloys using white light interference microscopy and scanning probe microscopy Metallurgical and Materials Transactions a: Physical Metallurgy and Materials Science. 42: 1073-1088. DOI: 10.1007/S11661-010-0512-Z  0.341
2010 Nalladega V, Sathish S, Murray T, Shin E, Jata K, Blodgett M, Knopp JS. Experimental investigation of low frequency electromagnetic wave interaction with metallic nanoparticles Studies in Applied Electromagnetics and Mechanics. 33: 87-94. DOI: 10.3233/978-1-60750-554-9-87  0.31
2010 Nalladega V, Sathish S, Gigliotti M, Subramanian PR, Iorio L. Characterization of magnetoelastic properties at nanoscale using atomic force microscopy Studies in Applied Electromagnetics and Mechanics. 33: 215-222. DOI: 10.3233/978-1-60750-554-9-215  0.31
2009 Nalladega V, Sathish S, Jata K, Blodgett M, Knopp J. High resolution eddy current atomic force microscopy: Development, theoretical modeling and application Studies in Applied Electromagnetics and Mechanics. 32: 115-122. DOI: 10.3233/978-1-60750-023-0-115  0.393
2009 Kundu T, Placko D, Yanagita T, Sathish S. Micro interferometric acoustic lens: Mesh-free modeling with experimental verification Proceedings of Spie - the International Society For Optical Engineering. 7295. DOI: 10.1117/12.814936  0.314
2008 Nalladega V, Sathish S, Jata KV, Blodgett MP. Development of eddy current microscopy for high resolution electrical conductivity imaging using atomic force microscopy. The Review of Scientific Instruments. 79: 073705. PMID 18681706 DOI: 10.1063/1.2955470  0.693
2008 Nalladega V, Sathish S, Brar AS. Characterization of defects in flexible circuits with ultrasonic atomic force microscopy Microelectronics Reliability. 48: 1683-1688. DOI: 10.1016/J.Microrel.2008.05.004  0.7
2006 Lee H, Mall S, Nalladega V, Sathish S, Roy A, Lafdi K. Characterization of carbon nanofibre reinforced epoxy composite using nanoindentation and AFM/UFM techniques Polymers & Polymer Composites. 14: 549-562. DOI: 10.1177/096739110601400601  0.366
2006 Nalladega V, Sathish S, Brar AS. Nondestructive Evaluation of Submicron Delaminations at Polymer/Metal Interface in Flex Circuits Quantitative Nondestructive Evaluation. 820: 1562-1569. DOI: 10.1063/1.2184708  0.707
2006 Ko RT, Blodgett MP, Sathish S, Boehnlein TR. A novel multi-frequency eddy current measurement technique for materials characterization Aip Conference Proceedings. 820: 415-422. DOI: 10.1063/1.2184558  0.352
2005 Hsieh S, Crane R, Sathish S. Understanding and predicting electronic vibration stress using ultrasound excitation, thermal profiling, and neural network modeling Nondestructive Testing and Evaluation. 20: 89-102. DOI: 10.1080/10589750500149149  0.304
2004 Martin RW, Reibel RS, Sathish S, Blodgett MP. Investigation of local rayleigh wave velocity dispersion due to surface residual stress Quantitative Nondestructive Evaluation. 700: 1192-1199. DOI: 10.1063/1.1711753  0.308
2004 Neslen CL, Mall S, Sathish S. Nondestructive Characterization of Fretting Fatigue Damage Journal of Nondestructive Evaluation. 23: 153-162. DOI: 10.1007/S10921-004-0821-5  0.304
2003 Druffner CJ, Sathish S. Atomic Force and Ultrasonic Force Microscopic Investigation of Laser‐Treated Ceramic Head Sliders Journal of the American Ceramic Society. 86: 2122-2128. DOI: 10.1111/J.1151-2916.2003.Tb03619.X  0.437
2002 Blackshire JL, Sathish S, Duncan BD, Millard M. Real-time, frequency-translated holographic visualization of surface acoustic wave interactions with surface-breaking defects. Optics Letters. 27: 1025-7. PMID 18026353 DOI: 10.1364/Ol.27.001025  0.401
2002 Blackshire JL, Sathish S. Characterization of MEMS transducer performance using near-field scanning interferometry. Ieee Transactions On Ultrasonics, Ferroelectrics, and Frequency Control. 49: 669-74. PMID 12046944 DOI: 10.1109/Tuffc.2002.1002467  0.309
2002 Blackshire JL, Sathish S. Near-field ultrasonic scattering from surface-breaking cracks Applied Physics Letters. 80: 3442-3444. DOI: 10.1063/1.1476722  0.319
1999 Sathish S, Martin RW. Scanning Acoustic Microscopy and x-ray Diffraction Investigation of Near Crack Tip Stresses Mrs Proceedings. 591: 55. DOI: 10.1557/Proc-591-55  0.362
1999 Schumaker EJ, Shen L, Ruddell MJ, Sathish S, Murray PT. Ultrasonic Force Microscopic Characterization of Nanosized Copper Particles Mrs Proceedings. 581. DOI: 10.1557/Proc-581-473  0.471
1994 Sathish S, Gremaud G, Kulik A, Richard P. V(z) of continuous wave reflection scanning acoustic microscope The Journal of the Acoustical Society of America. 96: 2769-2775. DOI: 10.1121/1.411283  0.315
1992 Mendik M, Sathish S, Kulik A, Gremaud G, Wachter P. Surface acoustic wave studies on single-crystal nickel using Brillouin scattering and scanning acoustic microscope Journal of Applied Physics. 71: 2830-2834. DOI: 10.1063/1.351013  0.33
1991 Sathish S, Mendik M, Kulik A, Gremaud G, Wachter P. Polish-induced surface damage in nickel: Scanning acoustic microscopy and Brillouin scattering study Applied Physics Letters. 59: 167-168. DOI: 10.1063/1.106008  0.339
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