Year |
Citation |
Score |
2007 |
Ignatescu V, Blakely JM. Early morphological changes on Si(111) surfaces during UHV processing Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 25: 1449-1455. DOI: 10.1116/1.2771559 |
0.798 |
|
2007 |
Ignatescu V, Blakely JM. Morphological evidence for surface pre-melting on Si(1 1 1) Surface Science. 601: 5459-5465. DOI: 10.1016/J.Susc.2007.09.013 |
0.805 |
|
2006 |
Ignatescu V, Hsu JCM, Mayer AC, Blakely JM, Malliaras GG. Using atomic steps to control pentacene crystal orientation texture Materials Research Society Symposium Proceedings. 965: 25-30. DOI: 10.1557/Proc-0965-S14-07 |
0.781 |
|
2006 |
Ignatescu V, Hsu JCM, Mayer AC, Blakely JM, Malliaras GG. Using atomic steps to induce texture in polycrystalline pentacene films Applied Physics Letters. 89. DOI: 10.1063/1.2420778 |
0.779 |
|
2005 |
Ignatescu V, Blakely JM. Leakage currents through thin silicon oxide grown on atomically flat silicon surfaces Materials Research Society Symposium Proceedings. 849: 115-120. DOI: 10.1557/Proc-849-Kk7.11 |
0.799 |
|
2005 |
Chang KC, Blakely JM. Spontaneous formation of ridges on patterned mesas and their role in the evolution of step arrays Materials Research Society Symposium Proceedings. 849: 149-154. DOI: 10.1557/Proc-849-Kk2.5/Jj2.5/U2.5 |
0.637 |
|
2005 |
Chang KC, Blakely JM. Arrays of widely spaced atomic steps on Si(1 1 1) mesas due to sublimation Surface Science. 591: 133-141. DOI: 10.1016/J.Susc.2005.06.087 |
0.659 |
|
2005 |
Cuenat A, George HB, Chang KC, Blakely JM, Aziz MJ. Lateral templating for guided self-organization of sputter morphologies Advanced Materials. 17: 2845-2849. DOI: 10.1002/Adma.200500717 |
0.597 |
|
2005 |
Chang KC, Blakely JM. Spontaneous formation of ridges on patterned mesas and their role in the evolution of step arrays Materials Research Society Symposium Proceedings. 849: 149-154. |
0.327 |
|
2004 |
Arrays S, Chang K, Blakely JM. Spontaneous Formation of Ridges on Patterned Mesas and Their Role in the Evolution of Mrs Proceedings. 854. DOI: 10.1557/Proc-854-U2.5/Jj2.5/Kk2.5 |
0.638 |
|
2004 |
Ruiz R, Choudhary D, Nickel B, Toccoli T, Chang KC, Mayer AC, Clancy P, Blakely JM, Headrick RL, Iannotta S, Malliaras GG. Pentacene thin film growth Chemistry of Materials. 16: 4497-4508. DOI: 10.1021/Cm049563Q |
0.551 |
|
2004 |
Umbach CC, Blakely JM. Nanoscale morphologies resulting from surface treatments of display glass in vacuum Journal of Non-Crystalline Solids. 349: 267-275. DOI: 10.1016/J.Jnoncrysol.2004.08.184 |
0.369 |
|
2004 |
Chang KC, Lee D, Umbach CC, Blakely J. Scanning probe studies of atomically engineered silicon and sapphire substrates Design and Nature. 6: 637-640. |
0.487 |
|
2003 |
Chang KC, Blakely JM. Evolution of mesas on Si(111) surface under sublimation: Nanofabrication through the control of atomic steps Materials Research Society Symposium - Proceedings. 782: 317-323. DOI: 10.1557/Proc-782-A5.75 |
0.724 |
|
2002 |
Chang K, Blakely JM. A Simple Model for the Formation of Step-Free Surfaces Mrs Proceedings. 749. DOI: 10.1557/Proc-749-W16.5 |
0.725 |
|
2002 |
Oliver AC, Blakely JM. A Comparison of Tunneling Through Thin Oxide Layers on Step-free and Normal Si Surfaces Mrs Proceedings. 747. DOI: 10.1557/Proc-747-V4.6 |
0.633 |
|
2001 |
Allen CG, Daniels M, Umbach CC, Blakely JM. Nanoscale Pattern Transfer Using Sputter-Induced Corrugations Formed at the Si/SiO 2 Interface Mrs Proceedings. 705. DOI: 10.1557/Proc-705-Y4.8 |
0.431 |
|
2001 |
Lee D, Blakely JM, Schroeder TW, Engstrom JR. A growth method for creating arrays of atomically flat mesas on silicon Applied Physics Letters. 78: 1349-1351. DOI: 10.1063/1.1352656 |
0.682 |
|
2001 |
Umbach CC, Blakely JM. Development of a sub-picoampere scanning tunneling microscope for oxide surfaces Applied Surface Science. 175: 746-752. DOI: 10.1016/S0169-4332(01)00110-6 |
0.53 |
|
2000 |
Lee D, Schroeder T, Engstrom J, Blakely J. A Growth Technique to Make Extensive Atomically Flat Silicon Surfaces Mrs Proceedings. 648. DOI: 10.1557/Proc-648-P10.11 |
0.659 |
|
2000 |
Oliver AC, Blakely JM. Thin SiO2 layers on Si(111) with ultralow atomic step density Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 18: 2862-2864. DOI: 10.1116/1.1320804 |
0.68 |
|
2000 |
Lee D, Blakely J. Formation and stability of large step-free areas on Si(001) and Si(111) Surface Science. 445: 32-40. DOI: 10.1016/S0039-6028(99)01034-1 |
0.658 |
|
1999 |
Oliver AC, Blakely JM. Surface and Interfacial Topography of Oxides on Si(111) With Ultra-Low Atomic Step Density Mrs Proceedings. 592: 45. DOI: 10.1557/Proc-592-45 |
0.673 |
|
1999 |
Lee D, Blakely JM. Instabilities and Point Defects at Step-Free Si(001) and (111) Terraces During High Temperature Annealing Mrs Proceedings. 587. DOI: 10.1557/Proc-587-O5.8 |
0.563 |
|
1999 |
Blakely JM, Tanaka S, Tromp RM. Atomic step dynamics on periodic semiconductor surface structures Journal of Electron Microscopy. 48: 747-752. DOI: 10.1093/Oxfordjournals.Jmicro.A023744 |
0.477 |
|
1999 |
Blakely JM, Umbach CC. Topography and lattice strain development on patterned Si surfaces Micron. 30: 3-12. DOI: 10.1016/S0968-4328(98)00037-7 |
0.582 |
|
1999 |
Tanaka S, Umbach CC, Shen Q, Blakely JM. Lattice strain in oxidized Si nanostructure arrays from X-ray measurements Thin Solid Films. 365-369. DOI: 10.1016/S0040-6090(98)01673-3 |
0.373 |
|
1997 |
Tanaka S, Umbach CC, Blakely JM, Tromp RM, Mankos M. Atomic step distributions on annealed periodic Si(001) gratings Journal of Vacuum Science and Technology. 15: 1345-1350. DOI: 10.1116/1.580587 |
0.423 |
|
1997 |
Tanaka S, Bartelt NC, Umbach CC, Tromp RM, Blakely JM. Step Permeability and the Relaxation of Biperiodic Gratings on Si(001) Physical Review Letters. 78: 3342-3345. DOI: 10.1103/Physrevlett.78.3342 |
0.42 |
|
1997 |
Umbach CC, Blakely JM. Specular and diffuse scattering of X-rays from a fusion-drawn glass surface Nuclear Instruments & Methods in Physics Research Section B-Beam Interactions With Materials and Atoms. 133: 50-56. DOI: 10.1016/S0168-583X(97)00548-X |
0.444 |
|
1997 |
Swanson A, Blakely J. Structure and modification of silver halide thin films using scanning tunneling and atomic force microscopy Surface Science. 394: 221-234. DOI: 10.1016/S0039-6028(97)00593-1 |
0.434 |
|
1997 |
Tanaka S, Umbach CC, Blakely J. Annealing instabilities in small fabricated structures Surface Science. 372. DOI: 10.1016/S0039-6028(96)01263-0 |
0.465 |
|
1997 |
Couillard JG, Ast DG, Umbach C, Blakely JM, Moore CB, Fehlner FP. Chemical treatment of glass substrates Journal of Non-Crystalline Solids. 222: 429-434. DOI: 10.1016/S0022-3093(97)90146-0 |
0.465 |
|
1996 |
Shen Q, Umbach CC, Weselak B, Blakely JM. Lateral correlation in mesoscopic structures on the silicon (001) surface determined by grating x-ray diffuse scattering. Physical Review. B, Condensed Matter. 53: R4237-R4240. PMID 9984078 DOI: 10.1103/Physrevb.53.R4237 |
0.44 |
|
1996 |
Tanaka S, Umbach CC, Blakely JM, Tromp RM, Mankos M. Step Contours in the Development of Periodically Modulated Vicinal Surfaces Mrs Proceedings. 440. DOI: 10.1557/Proc-440-25 |
0.436 |
|
1996 |
Umbach CC, Weselak BW, Blakely JM, Shen Q. Characterization of large‐area arrays of nanoscale Si tips fabricated using thermal oxidation and wet etching of Si pillars Journal of Vacuum Science & Technology B. 14: 3420-3424. DOI: 10.1116/1.588773 |
0.415 |
|
1996 |
Tanaka S, Umbach CC, Blakely JM, Tromp RM, Mankos M. Fabrication of arrays of large step‐free regions on Si(001) Applied Physics Letters. 69: 1235-1237. DOI: 10.1063/1.117422 |
0.461 |
|
1996 |
Tanaka S, Umbach CC, Blakely JM. Fabrication of bi‐periodic sinusoidal structures on silicon Applied Physics Letters. 68: 1966-1968. DOI: 10.1063/1.115641 |
0.464 |
|
1996 |
Pirttiaho L, Blakely J. An optical method for determining the surface orientation of crystals Metallurgical and Materials Transactions a-Physical Metallurgy and Materials Science. 27: 2057-2058. DOI: 10.1007/Bf02651957 |
0.363 |
|
1995 |
Tanaka S, Umbach CC, Shen Q, Blakely JM. Strain Measurement in Two-Dimensional Nanoscale Si Gratings by High Resolution X-Ray Diffraction Mrs Proceedings. 405. DOI: 10.1557/Proc-405-109 |
0.303 |
|
1995 |
Tanaka S, Umbach CC, Shen Q, Blakely JM. Atomic Diffusion and Strain Measurement on Si Grating Structures by X-Ray Diffraction Mrs Proceedings. 380: 61. DOI: 10.1557/Proc-380-61 |
0.359 |
|
1994 |
Shen Q, Weselak B, Blakely JM. Structural study of a Si(001) grating surface by white beam x‐ray Laue photography Applied Physics Letters. 64: 3554-3556. DOI: 10.1063/1.111222 |
0.399 |
|
1994 |
Liu J, Blakely JM. Effect of sulfur on the initial stages of oxide growth on Ni(111) Applied Surface Science. 74: 43-49. DOI: 10.1016/0169-4332(94)90098-1 |
0.349 |
|
1994 |
Liu J, Blakely JM. Surface phases of the S + O binary system coadsorbed on Ni(111) Surface Science. 302: 171-178. DOI: 10.1016/0039-6028(94)91106-1 |
0.35 |
|
1994 |
Keeffe ME, Umbach CC, Blakely JM. Surface self-diffusion on Si from the evolution of periodic atomic step arrays Journal of Physics and Chemistry of Solids. 55: 965-973. DOI: 10.1016/0022-3697(94)90116-3 |
0.51 |
|
1993 |
Shen Q, Umbach CC, Weselak B, Blakely JM. X-ray diffraction from a coherently illuminated Si(001) grating surface. Physical Review. B, Condensed Matter. 48: 17967-17971. PMID 10008433 DOI: 10.1103/Physrevb.48.17967 |
0.427 |
|
1993 |
Umbach CC, Blakely JM. Epitaxy of Germanium on SI(001) Grating Templates Mrs Proceedings. 317. DOI: 10.1557/Proc-317-3 |
0.44 |
|
1993 |
Umbach CC, Keeffe ME, Blakely JM. Pairing of curved atomic steps at the extrema of periodic gratings on Si(001) Journal of Vacuum Science and Technology. 11: 1830-1836. DOI: 10.1116/1.578434 |
0.411 |
|
1993 |
Ding Y, Blakely J, Raj R. Temperature programmed desorption studies of the copper-sapphire (0001) system Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing. 162: 131-134. DOI: 10.1016/0921-5093(90)90037-4 |
0.459 |
|
1992 |
McClelland RJ, Blakely JM. Effect of surface orientation and sulfur coverage on the oxidation of carbon on Ni surfaces Surface Science. 260: 191-199. DOI: 10.1016/0039-6028(92)90032-2 |
0.369 |
|
1991 |
Keeffe ME, Umbach CC, Blakely JM. The Evolution of Periodic Step Arrays on Si by Surface Diffusion Mrs Proceedings. 237. DOI: 10.1557/Proc-237-205 |
0.474 |
|
1991 |
Umbach CC, Keeffe ME, Blakely JM. Scanning tunneling microscopy studies of phase separation on Si(001) surfaces with periodic step density Journal of Vacuum Science & Technology B. 9: 721-725. DOI: 10.1116/1.585540 |
0.501 |
|
1991 |
Umbach CC, Keeffe ME, Blakely JM. Scanning tunneling microscopy of one-dimensional periodic corrugated silicon surfaces Journal of Vacuum Science and Technology. 9: 1014-1019. DOI: 10.1116/1.577568 |
0.536 |
|
1991 |
Mukhopadhyay SM, Blakely JM. Ionic Double Layers at the Surface of Magnesium‐Doped Aluminum Oxide: Effect on Segregation Properties Journal of the American Ceramic Society. 74: 25-30. DOI: 10.1111/J.1151-2916.1991.Tb07291.X |
0.693 |
|
1989 |
Shen Q, Blakely JM, Bedzyk MJ, Finkelstein KD. Surface roughness and correlation length determined from x-ray-diffraction line-shape analysis on germanium (111). Physical Review. B, Condensed Matter. 40: 3480-3482. PMID 9992314 DOI: 10.1103/Physrevb.40.3480 |
0.348 |
|
1988 |
Shen Q, Blakely JM, Bedzyk MJ, Finkelstein KD. Surface Roughness and Correlation Length Determined from X-Ray Diffraction Line Shape Analysis on Germanium (111) Mrs Proceedings. 143: 215. DOI: 10.1557/Proc-143-215 |
0.362 |
|
1988 |
Mukhopadhyay SM, Blakely JM. Effect of Magnesia on Mass Transport at the Surface of Alumina Mrs Proceedings. 138: 415. DOI: 10.1557/Proc-138-415 |
0.658 |
|
1988 |
Mukhopadhyay SM, Jardine AP, Blakely JM, Baik S. Segregation of Magnesium and Calcium to the () Prismatic Surface of Magnesium‐Implanted Sapphire Journal of the American Ceramic Society. 71: 358-362. DOI: 10.1111/J.1151-2916.1988.Tb05054.X |
0.667 |
|
1988 |
Boucarut RA, Saijo H, Blakely JM. Segregation of carbon to the (100) surface of Ni3Fe and its effect on oxygen adsorption Applied Surface Science. 31: 413-419. DOI: 10.1016/0169-4332(88)90002-5 |
0.408 |
|
1987 |
Lad RJ, Blakely JM. Initial oxidation and sulfidation of a Ni60Fe40(100) alloy surface Surface Science. 179: 467-482. DOI: 10.1016/0039-6028(87)90070-7 |
0.682 |
|
1986 |
Ahmad M, Blakely JM. Oxidation of the (111) Surface of an Al-Be Alloy: Effect of a BeO Layer Mrs Proceedings. 83: 211. DOI: 10.1557/Proc-83-211 |
0.37 |
|
1986 |
Jardine AP, Mukhopadhyay SM, Blakely JM. Mg Implantation and Characterization of Sapphire Surfaces Mrs Proceedings. 74: 365. DOI: 10.1557/Proc-74-365 |
0.653 |
|
1986 |
Durbin SM, Blakely JM, Berman LE, Bedzyk MJ, Batterman BW. Summary Abstract: Surface structure determination using x-ray standing waves Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 4: 1329-1330. DOI: 10.1116/1.573603 |
0.324 |
|
1986 |
Lad RJ, Blakely JM. Breakup of oxide films on a Ni-Fe(100) surface by S2 impingement Applied Surface Science. 27: 318-328. DOI: 10.1016/0169-4332(86)90136-4 |
0.677 |
|
1986 |
Christensen TM, Raoul C, Blakely JM. Change in oxide epitaxy on Ni(111): Effects of oxidation temperature Applied Surface Science. 26: 408-417. DOI: 10.1016/0169-4332(86)90114-5 |
0.39 |
|
1985 |
Durbin SM, Berman LE, Batterman BW, Blakely JM. Summary Abstract: Synchrotron standing wave studies of submonolayer Au on Si(111) Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 3: 973-974. DOI: 10.1116/1.573365 |
0.311 |
|
1985 |
Baik S, Fowler DE, Blakely JM, Raj R. Segregation of Mg to the (0001) Surface of Doped Sapphire Journal of the American Ceramic Society. 68: 281-286. DOI: 10.1111/J.1151-2916.1985.Tb15323.X |
0.462 |
|
1985 |
Schrott AG, Blakely JM. Stability of clean and Au-covered Si surfaces Surface Science. 150. DOI: 10.1016/0039-6028(85)90200-6 |
0.495 |
|
1985 |
List FA, Blakely JM. Kinetics of CO formation on singular and stepped Ni surfaces Surface Science. 152: 463-470. DOI: 10.1016/0039-6028(85)90177-3 |
0.401 |
|
1984 |
Lad RJ, Schrott AG, Blakely JM. Surface Phases for Sulfur and Oxygen Coadsorbed on Ni60Fe40(100) Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 2: 856-860. DOI: 10.1116/1.572526 |
0.644 |
|
1984 |
Fowler DE, Blakely JM. Surface reconstruction of BeO{0001} during Be oxidation Surface Science. 148: 283-291. DOI: 10.1016/0039-6028(84)90582-X |
0.475 |
|
1984 |
Fowler DE, Blakely JM. The initial oxidation of the beryllium (0001) surface Surface Science. 148: 265-282. DOI: 10.1016/0039-6028(84)90581-8 |
0.39 |
|
1982 |
Greco SE, Roux JP, Blakely JM. Oxidation of the (100) surface of a NiFe alloy Surface Science. 120: 203-222. DOI: 10.1016/0039-6028(82)90282-5 |
0.412 |
|
1980 |
Hamilton JC, Blakely JM. Carbon segregation to single crystal surfaces of Pt, Pd and Co Surface Science. 91: 199-217. DOI: 10.1016/0039-6028(80)90080-1 |
0.364 |
|
1979 |
Eizenberg M, Blakely JM. Carbon interaction with nickel surfaces: Monolayer formation and structural stability Journal of Chemical Physics. 71: 3467-3477. DOI: 10.1063/1.438736 |
0.491 |
|
1979 |
Eizenberg M, Blakely JM. Carbon monolayer phase condensation on Ni(111) Surface Science. 82: 228-236. DOI: 10.1016/0039-6028(79)90330-3 |
0.373 |
|
1979 |
Tu YY, Blakely JM. Chlorine adsorption on the low index surfaces of silver: Energetics and structures Surface Science. 85: 276-288. DOI: 10.1016/0039-6028(79)90251-6 |
0.369 |
|
1977 |
Unertl WN, Blakely JM. Growth and properties of oxide films on Zn(0001) Surface Science. 69: 23-52. DOI: 10.1016/0039-6028(77)90160-1 |
0.405 |
|
1976 |
Isett LC, Blakely JM. Segregation isosteres for carbon at the (100) surface of nickel Surface Science. 58: 397-414. DOI: 10.1016/0039-6028(76)90478-7 |
0.384 |
|
1975 |
Blakely JM, Bottoms WR. Introduction to the Properties of Crystal Surfaces Physics Today. 28: 52-53. DOI: 10.1063/1.3069008 |
0.411 |
|
1974 |
Shelton JC, Patil HR, Blakely JM. Equilibrium segregation of carbon to a nickel (111) surface: A surface phase transition Surface Science. 43: 493-520. DOI: 10.1016/0039-6028(74)90272-6 |
0.406 |
|
1974 |
Danyluk S, Blakely JM. Space charge regions at silver halide surfaces: Experimental results for undoped AgCl Surface Science. 41: 359-370. DOI: 10.1016/0039-6028(74)90053-3 |
0.464 |
|
1973 |
Blakely JM, Danyluk S. Space charge regions at silver halide surfaces: Effects of divalent impurities and halogen pressure Surface Science. 40: 37-60. DOI: 10.1016/0039-6028(73)90050-2 |
0.392 |
|
1972 |
Baker JM, Blakely JM. A study of LEED intensities from cleaved beryllium and zinc surfaces Surface Science. 32: 45-77. DOI: 10.1016/0039-6028(72)90120-3 |
0.356 |
|
1971 |
Blakely JM, Schwoebel RL. Capillarity and step interactions on solid surfaces Surface Science. 26: 321-326. DOI: 10.1016/0039-6028(71)90134-8 |
0.434 |
|
1969 |
Tracy JC, Blakely JM. A study of facetting of tungsten single crystal surfaces Surface Science. 13: 313-336. DOI: 10.1016/0039-6028(69)90194-0 |
0.486 |
|
1969 |
Tracy JC, Blakely JM. The kinetics of oxygen adsorption on the /112/ and /110/ planes of tungsten. Surface Science. 15: 257-276. DOI: 10.1016/0039-6028(69)90150-2 |
0.415 |
|
1969 |
Poeppel RB, Blakely JM. Origin of equilibrium space charge potentials in ionic crystals Surface Science. 15: 507-523. DOI: 10.1016/0039-6028(69)90138-1 |
0.391 |
|
1967 |
Maiya PS, Blakely JM. Surface self-diffusion and surface energy of nickel Journal of Applied Physics. 38: 698-704. DOI: 10.1063/1.1709399 |
0.422 |
|
1966 |
Blakely JM, Che-Yu L. Changes in morphology of ionic crystals due to capillarity Acta Metallurgica. 14: 279-284. DOI: 10.1016/0001-6160(66)90085-X |
0.421 |
|
1965 |
Blakely JM, Li C. Formation energies of vacancies at a (100) sodium chloride surface Journal of Physics and Chemistry of Solids. 26: 1863-1867. DOI: 10.1016/0022-3697(65)90219-2 |
0.387 |
|
1963 |
Blakely JM, Mykura H. Studies of vacuum annealed iron surfaces Acta Metallurgica. 11: 399-404. DOI: 10.1016/0001-6160(63)90164-0 |
0.368 |
|
1962 |
Blakely JM, Jackson KA. Growth of Crystal Whiskers Journal of Chemical Physics. 37: 428-430. DOI: 10.1063/1.1701338 |
0.391 |
|
1962 |
Blakely JM, Mykura H. Surface self diffusion and surface energy measurements on platinum by the multiple scratch method Acta Metallurgica. 10: 565-572. DOI: 10.1016/0001-6160(62)90203-1 |
0.446 |
|
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