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C R. Crowell - Publications

Affiliations: 
University of Southern California, Los Angeles, CA, United States 
Area:
Electronics and Electrical Engineering
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22 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
1985 Lee SJ, Crowell CR. Parasitic source and drain resistance in high-electron-mobility transistors Solid State Electronics. 28: 659-668. DOI: 10.1016/0038-1101(85)90016-4  0.301
1980 Kao CW, Anderson CL, Crowell CR. Photoelectron injection at metal-semiconductor interfaces Surface Science. 95: 321-339. DOI: 10.1016/0039-6028(80)90145-4  0.406
1980 Kao CW, Crowell CR. IMPACT IONIZATION BY ELECTRONS AND HOLES IN InP Solid-State Electronics. 23: 881-891. DOI: 10.1016/0038-1101(80)90106-9  0.354
1979 Chwang R, Kao CW, Crowell CR. Normalized theory of impact ionization and velocity saturation in nonpolar semiconductors via a Markov chain approach Solid State Electronics. 22: 599-620. DOI: 10.1016/0038-1101(79)90134-5  0.364
1977 Crowell CR. The physical significance of the T0 anomalies in Schottky barriers Solid State Electronics. 20: 171-175. DOI: 10.1016/0038-1101(77)90180-0  0.343
1976 Anderson CL, Baron R, Crowell CR. Variable-frequency automatic capacitance/conductance system for impurity profile and deep level determination Review of Scientific Instruments. 47: 1366-1376. DOI: 10.1063/1.1134526  0.319
1976 Huang CH, Crowell CR, Univ of South Calif LA. EFFECT OF MINORITY-CARRIER INJECTION ON SCHOTTKY-BARRIER HEIGHTS THAT APPROACH THE SEMICONDUCTOR BAND GAP J Vac Sci Technol. 13: 876-883.  0.324
1975 Anderson CL, Crowell CR, Kao TW. Effects of thermal excitation and quantum-mechanical transmission on photothreshold determination of Schottky barrier height Solid State Electronics. 18: 705-713. DOI: 10.1016/0038-1101(75)90143-4  0.431
1975 Okuto Y, Crowell CR. Threshold energy effect on avalanche breakdown voltage in semiconductor junctions Solid State Electronics. 18: 161-168. DOI: 10.1016/0038-1101(75)90099-4  0.377
1974 Beguwala M, Crowell CR. Characterization of multiple deep level systems in semiconductor junctions by admittance measurements Solid State Electronics. 17: 203-214. DOI: 10.1016/0038-1101(74)90068-9  0.305
1973 Roberts GI, Crowell CR. Capacitive effects of Au and Cu impurity levels in Pt-N type Si Schottky barriers Solid State Electronics. 16: 29-38. DOI: 10.1016/0038-1101(73)90122-6  0.339
1972 Crowell CR, Nakano K. Deep level impurity effects on the frequency dependence of Schottky barrier capacitance Solid State Electronics. 15: 605-610. DOI: 10.1016/0038-1101(72)90002-0  0.326
1971 Crowell CR, Beguwala M. Recombination velocity effects on current diffusion and imref in schottky barriers Solid State Electronics. 14: 1149-1157. DOI: 10.1016/0038-1101(71)90027-X  0.356
1970 Rideout VL, Crowell CR. Effects of image force and tunneling on current transport in metal-semiconductor (Schottky barrier) contacts Solid State Electronics. 13: 993-1009. DOI: 10.1016/0038-1101(70)90097-3  0.373
1969 Crowell CR. Metal-semiconductor interfaces Surface Science. 13: 13-16. DOI: 10.1016/0039-6028(69)90232-5  0.301
1969 Crowell CR. Richardson constant and tunneling effective mass for thermionic and thermionic-field emission in Schottky barrier diodes Solid State Electronics. 12: 55-59. DOI: 10.1016/0038-1101(69)90135-X  0.36
1969 Crowell CR, Rideout VL. Normalized thermionic-field (T-F) emission in metal-semiconductor (Schottky) barriers Solid State Electronics. 12: 89-105. DOI: 10.1016/0038-1101(69)90117-8  0.374
1966 Crowell CR, Sze SM. Current transport in metal-semiconductor barriers Solid State Electronics. 9: 1035-1048. DOI: 10.1016/0038-1101(66)90127-4  0.421
1965 Crowell CR, Shore HB, LaBate EE. Surface-state and interface effects in Schottky barriers at n-type silicon surfaces Journal of Applied Physics. 36: 3843-3850. DOI: 10.1063/1.1713959  0.35
1965 Crowell CR, Sze SM. Electron-optical-phonon scattering in the emitter and collector barriers of semiconductor-metal-semiconductor structures Solid State Electronics. 8: 979-990. DOI: 10.1016/0038-1101(65)90164-4  0.387
1965 Crowell CR. The Richardson constant for thermionic emission in Schottky barrier diodes Solid State Electronics. 8: 395-399. DOI: 10.1016/0038-1101(65)90116-4  0.373
1965 Crowell CR, Sze SM. Electron-phonon collector backscattering in hot electron transistors Solid State Electronics. 8: 673-683. DOI: 10.1016/0038-1101(65)90035-3  0.375
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