Prakaipetch Punchaipetch, Ph.D. - Publications

Affiliations: 
2000 University of North Texas, Denton, TX, United States 
Area:
Materials Science Engineering

22 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2009 Ichikawa K, Fujii M, Uraoka Y, Punchaipetch P, Yano H, Hatayama T, Fuyuki T, Yamashita I. Nonvolatile thin film transistor memory with Ferritin Journal of the Korean Physical Society. 54: 554-557. DOI: 10.3938/Jkps.54.554  0.409
2007 Ichikawa K, Uraoka Y, Punchaipetch P, Yano H, Hatayama T, Fuyuki T, Yamashita I. Low-temperature polycrystalline silicon thin film transistor flash memory with ferritin Japanese Journal of Applied Physics, Part 2: Letters. 46. DOI: 10.1143/Jjap.46.L804  0.412
2006 Punchaipetch P, Miyashita M, Uraoka Y, Fuyuki T, Sameshima T, Horii S. Improving high-κ gate dielectric properties by high-pressure water vapor annealing Japanese Journal of Applied Physics, Part 2: Letters. 45. DOI: 10.1143/Jjap.45.L120  0.411
2006 Punchaipetch P, Ichikawa K, Uraoka Y, Fuyuki T, Takahashi E, Hayashi T, Ogata K. Effect of SiO2 Tunnel oxide thickness on electron tunneling mechanism in Si nanocrystal dots floating-gate memories Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 45: 3997-3999. DOI: 10.1143/Jjap.45.3997  0.386
2006 Punchaipetch P, Ichikawa K, Uraoka Y, Fuyuki T, Tomyo A, Takahashi E, Hayashi T. Experimental investigation of tunnel oxide thickness on charge transport through Si nanocrystal dot floating gate memories Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 24: 1271-1277. DOI: 10.1116/1.2198852  0.389
2006 Punchaipetch P, Uraoka Y, Fuyuki T, Tomyo A, Takahashi E, Hayashi T, Sano A, Horii S. Enhancing memory efficiency of Si nanocrystal floating gate memories with high-κ gate oxides Applied Physics Letters. 89. DOI: 10.1063/1.2339562  0.367
2006 Ichikawa K, Punchaipetch P, Yano H, Hatayama T, Uraoka Y, Fuyuki T, Tomyo A, Takahashi E, Hayashi T, Ogata K. New fabrication technique using side-wall-type plasma-enhanced chemical-vapor deposition for a floating gate memory with a Si nanodot Journal of the Korean Physical Society. 49: 569-576.  0.307
2005 Ichikawa K, Punchaipetch P, Yano H, Hatayama T, Uraoka Y, Fuyuki T, Takahashi E, Hayashi T, Ogata K. Electron Injection into Si Nanodot Fabricated by Side-Wall Plasma Enhanced Chemical Vapor Deposition Japanese Journal of Applied Physics, Part 2: Letters. 44. DOI: 10.1143/Jjap.44.L836  0.395
2005 Driemeier C, Bastos KP, Soares GV, Miotti L, Pezzi RP, Baumvol IJR, Punchaipetch P, Pant G, Gnade BE, Wallace RM. Atomic transport and chemical stability of nitrogen in ultrathin HfSiON gate dielectrics Applied Physics a: Materials Science and Processing. 80: 1045-1047. DOI: 10.1007/S00339-004-3037-8  0.359
2004 Punchaipetch P, Okamoto T, Nakamura H, Uraoka Y, Fuyuki T, Horii S. Effect of nitrogen on electrical and physical properties of polyatomic layer chemical vapor deposition HfSixQy gate dielectrics Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 43: 7815-7820. DOI: 10.1143/Jjap.43.7815  0.407
2004 Punchaipetch P, Pant G, Kim MJ, Wallace RM, Gnade BE. Growth and characterization of hafnlum silicate films prepared by UV/ozone oxidation Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 22: 395-400. DOI: 10.1116/1.1649346  0.437
2004 Punchaipetch P, Pant G, Quevedo-Lopez MA, Yao C, El-Bouanani M, Kim MJ, Wallace RM, Gnade BE. Low-temperature deposition of hafnium silicate gate dielectrics Ieee Journal On Selected Topics in Quantum Electronics. 10: 89-100. DOI: 10.1109/Jstqe.2004.824109  0.439
2004 Nakamura H, Punchaipetch P, Yano H, Hatayama T, Uraoka Y, Fuyuki T, Horii S. Low temperature nitridation of PLCVD HfSixOy gate dielectrics using nitrogen radicals Imfedk 2004 - International Meeting For Future of Electron Devices, Kansai. 83-84. DOI: 10.1109/IMFEDK.2004.1566419  0.335
2004 Pezzi RP, Miotti L, Bastos KP, Soares GV, Driemeier C, Baumvol IJR, Punchaipetch P, Pant G, Gnade BE, Wallace RM, Rotondaro A, Visokay JM, Chambers JJ, Colombo L. Hydrogen and deuterium incorporation and transport in hafnium-based dielectric films on silicon Applied Physics Letters. 85: 3540-3542. DOI: 10.1063/1.1801682  0.345
2004 Pant G, Punchaipetch P, Kim MJ, Wallace RM, Gnade BE. Low temperature UV/ozone oxidation formation of HfSiON gate dielectric Thin Solid Films. 460: 242-246. DOI: 10.1016/J.Tsf.2004.01.109  0.432
2004 Wu J, Punchaipetch P, Wallace RM, Coffer JL. Fabrication and optical properties of erbium-doped germanium nanowires Advanced Materials. 16. DOI: 10.1002/Adma.200400162  0.304
2003 Wang AQ, Punchaipetch P, Wallace RM, Golden TD. X-ray photoelectron spectroscopy study of electrodeposited nanostructured CeO2 films Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 21: 1169-1175. DOI: 10.1116/1.1577569  0.373
2003 Punchaipetch P, Pant G, Quevedo-Lopez M, Zhang H, El-Bouanani M, Kim MJ, Wallace RM, Gnade BE. Hafnium silicate formation by ultra-violet/ozone oxidation of hafnium silicide Thin Solid Films. 425: 68-71. DOI: 10.1016/S0040-6090(02)01306-8  0.426
2002 Punchaipetch P, D'Souza NA, Brostow W, Smith JT. Mechanical properties of glass fiber composites with an epoxy resin modified by a liquid crystalline epoxy Polymer Composites. 23: 564-573. DOI: 10.1002/Pc.10457  0.465
2002 Gnade BE, Pant G, Punchaipetch P, Wallace RM. Low temperature deposition of Hafnium silicate gate dielectrics for TFTs on plastic substrates Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-Leos. 1: 305-306.  0.344
2001 Punchaipetch P, Ambrogi V, Giamberini M, Brostow W, Carfagna C, D'Souza NA. Epoxy + liquid crystalline epoxy coreacted networks: II. Mechanical properties Polymer. 43: 839-848. DOI: 10.1016/S0032-3861(01)00639-5  0.469
2001 Punchaipetch P, Ambrogi V, Giamberini M, Brostow W, Carfagna C, D'Souza NA. Epoxy + liquid crystalline epoxy coreacted networks: I. Synthesis and curing kinetics Polymer. 42: 2067-2075. DOI: 10.1016/S0032-3861(00)00505-X  0.323
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