| Year |
Citation |
Score |
| 2011 |
Rabenberg L. Aberration-Corrected Imaging in Transmission Electron Microscopy: An IntroductionAberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction, Rolf ErniImperial College Press, London, 2010. $88.00 (354 pp.). ISBN 978-1-84816-536-6 Physics Today. 64: 55-56. DOI: 10.1063/PT.3.1171 |
0.303 |
|
| 2010 |
Chung J, Lian G, Rabenberg L. Local Lattice Strain Measurement using Geometric Phase Analysis of Annular Dark Field Images from Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 16: 1476-1477. DOI: 10.1017/S1431927610056369 |
0.561 |
|
| 2008 |
Chung J, Rabenberg L. Effects of strain gradients on strain measurements using geometrical phase analysis in the transmission electron microscope. Ultramicroscopy. 108: 1595-602. PMID 18635317 DOI: 10.1016/j.ultramic.2008.05.010 |
0.546 |
|
| 2008 |
Chung J, Lian G, Rabenberg L. Local strain measurement in a strain-engineered complementary metal-oxide-semiconductor device by geometrical phase analysis in the transmission electron microscope Applied Physics Letters. 93: 081909. DOI: 10.1063/1.2970050 |
0.526 |
|
| 2007 |
Chung J, Rabenberg L. Measurement of incomplete strain relaxation in a silicon heteroepitaxial film by geometrical phase analysis in the transmission electron microscope Applied Physics Letters. 91: 231902. DOI: 10.1063/1.2821843 |
0.558 |
|
| 2006 |
Chung J, Rabenberg L. Two-dimensional imaging of the potential distribution within a core/shell nanowire by electron holography Journal of Materials Research. 21: 1215-1220. DOI: 10.1557/JMR.2006.0142 |
0.482 |
|
| 2006 |
Chung J, Rabenberg L. Mapping of electrostatic potentials within core-shell nanowires by electron holography Applied Physics Letters. 88: 013106. DOI: 10.1063/1.2159560 |
0.475 |
|
| 2005 |
Chung J, Zhou J, Rabenberg L. Mean Inner Potentials in Oxidized Germanium Nanowires by Electron Holography Microscopy and Microanalysis. 11: 588-589. DOI: 10.1017/S1431927605504471 |
0.378 |
|
| 2003 |
Chen X, Banerjee S, Zhou J, Rabenberg L. TEM Study Of Silicide Formation And Microstructural Development Of Ni/ Si1-xGex Microscopy and Microanalysis. 9: 508-509. DOI: 10.1017/S1431927603442542 |
0.306 |
|
| 1992 |
Qian R, Kinosky D, Hsu T, Irby J, Mahajan A, Thomas S, Anthony B, Banerjee S, Tasch A, Rabenberg L, Magee C. Growth of GexSi1−x/Si heteroepitaxial films by remote plasma chemical vapor deposition Journal of Vacuum Science & Technology a: Vacuum, Surfaces, and Films. 10: 1920-1926. DOI: 10.1116/1.578116 |
0.394 |
|
| 1991 |
Qian R, Anthony B, Hsu T, Irby J, Kinosky D, Banerjee S, Tasch A, Rabenberg L, Magee C. Crystallographic characterization of GexSi1−x/Si superlattices grown by remote plasma‐enhanced chemical vapor deposition Journal of Applied Physics. 70: 3324-3328. DOI: 10.1063/1.349265 |
0.403 |
|
| 1991 |
Chu T, Rabenberg L, Mishra RK. Evolution of the microstructure of rapidly solidified Nd‐Fe‐B permanent magnets Journal of Applied Physics. 69: 6046-6048. DOI: 10.1063/1.347765 |
0.308 |
|
| 1989 |
Jung KH, Kim YM, Chun HG, Kwong DL, Rabenberg L. Defects and Strain in GexSi1−x Layers Grown by Rapid Thermal Processing Chemical Vapor Deposition Mrs Proceedings. 148. DOI: 10.1557/Proc-148-335 |
0.371 |
|
| 1989 |
Jung KH, Kim YM, Chun HG, Kwong DL, Rabenberg L. GexSil-x Layers Grown by Rapid Thermal Processing Chemical Vapor Deposition Mrs Proceedings. 146. DOI: 10.1557/Proc-146-115 |
0.328 |
|
| 1988 |
Kim YW, Rabenberg L, Bourell DL. Identification of an η boride phase as a crystallization product of a NiMoFeB amorphous alloy Journal of Materials Research. 3: 1336-1341. DOI: 10.1557/Jmr.1988.1336 |
0.353 |
|
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