Phillip E. Russell - Publications

Affiliations: 
North Carolina State University, Raleigh, NC 
Area:
Materials Science Engineering

35 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2009 Dhawan A, Gerhold M, Madison A, Fowlkes J, Russell PE, Vo-Dinh T, Leonard DN. Fabrication of nanodot plasmonic waveguide structures using FIB milling and electron beam-induced deposition. Scanning. 31: 139-46. PMID 19670460 DOI: 10.1002/Sca.20152  0.76
2008 Progl CL, Parish CM, Vitarelli JP, Russell PE. Analysis of v defects in GaN-based light emitting diodes by scanning transmission electron microscopy and electron beam induced current Applied Physics Letters. 92. DOI: 10.1063/1.2945232  0.76
2007 Batchelor AD, Leonard DN, Russell PE, Stevie FA, Griffis DP, Myneni GR. TEM and SIMS analysis of (100), (110), and (111) single crystal niobium Aip Conference Proceedings. 927: 72-83. DOI: 10.1063/1.2770680  0.76
2007 Parish CM, Russell PE. Scanning Cathodoluminescence Microscopy Advances in Imaging and Electron Physics. 147: 1-135. DOI: 10.1016/S1076-5670(07)47001-X  0.76
2006 Parish CM, Russell PE. On the use of Monte Carlo modeling in the mathematical analysis of scanning electron microscopy-electron beam induced current data Applied Physics Letters. 89. DOI: 10.1063/1.2385212  0.76
2006 Batchelor AD, Griffis DP, Russell PE. A wide range of FIB applications in a multidisciplinary analytical facility Microscopy and Microanalysis. 12: 1328-1329. DOI: 10.1017/S143192760606911X  0.76
2006 Parish CM, Progl CL, Salmon ME, Russell PE. Combined SEM electron-beam-induced current and cathodoluminescence imaging and STEM structural analysis of GaN light emitting diodes Microscopy and Microanalysis. 12: 1514-1515. DOI: 10.1017/S1431927606066578  0.76
2006 Parish CM, Progl CL, Batchelor AD, Russell PE. Application of an improved mathematical model to the analysis of cross-sectional EBIC of GaN-based LEDs Microscopy and Microanalysis. 12: 752-753. DOI: 10.1017/S1431927606066475  0.76
2006 Garetto AD, Garcia R, Griffis DP, Russell PE. Effects of beam and scan parameters on 3-dimensional carbon structure growth using electron beam induced chemistry Microscopy and Microanalysis. 12: 1284-1285. DOI: 10.1017/S1431927606065950  0.76
2005 Stevie FA, Griffis DP, Russell PE. Focused ion beam gases for deposition and enhanced etch Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice. 53-72. DOI: 10.1007/0-387-23313-X_3  0.76
2004 Mosselveld F, Makarov VV, Lundquist TR, Griffis DP, Russell PE. Circuit editing of copper and low-k dielectrics in nanotechnology devices Journal of Microscopy. 214: 246-251. DOI: 10.1111/J.0022-2720.2004.01337.X  0.76
2004 Batchelor AD, Galhouse B, Griffis DP, Stevie FA, Russell PE. A wide area scanning atomic force profiler Microscopy and Microanalysis. 10: 1106-1107. DOI: 10.1017/S1431927604887440  0.76
2003 Bender JW, Salmon ME, Russell PE. Combined atomic force microscopy and scanning tunneling microscopy imaging of cross-sectioned GaN light-emitting diodes. Scanning. 25: 45-51. PMID 12627898 DOI: 10.1002/Sca.4950250109  0.72
2003 Wang J, Griffis DP, Garcia R, Russell PE. Etching characteristics of chromium thin films by an electron beam induced surface reaction Semiconductor Science and Technology. 18: 199-205. DOI: 10.1088/0268-1242/18/4/302  0.76
2002 Gonzalez JC, Da Silva MIN, Griffis DP, Russell PE. Improvements in focused ion beam micromachining of interconnect materials Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 20: 2700-2704. DOI: 10.1116/1.1515310  0.76
2002 Leonard DN, Spontak RJ, Smith SD, Russell PE. Topological coarsening of low-molecular-weight block copolymer ultrathin films by environmental AFM Polymer. 43: 6719-6726. DOI: 10.1016/S0032-3861(02)00640-7  0.76
2002 Leonard DN, Russell PE, Smith SD, Spontak RJ. Multiscale dewetting of low-molecular-weight block copolymer ultrathin films Macromolecular Rapid Communications. 23: 205-209. DOI: 10.1002/1521-3927(20020201)23:3<205::Aid-Marc205>3.0.Co;2-X  0.76
2000 Phillips JR, Griffis DP, Russell PE. Channeling effects during focused-ion-beam micromachining of copper Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 18: 1061-1065. DOI: 10.1116/1.582300  0.76
1999 Neves BR, Salmon ME, Russell PE, Troughton EB. Comparative Study of Field Emission-Scanning Electron Microscopy and Atomic Force Microscopy to Assess Self-assembled Monolayer Coverage on Any Type of Substrate. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 5: 413-419. PMID 10556351 DOI: 10.1017/S1431927699990475  0.72
1999 Neves BRA, Leonard DN, Salmon ME, Russell PE, Troughton EB. Observation of topography inversion in atomic force microscopy of self-assembled monolayers Nanotechnology. 10: 399-404. DOI: 10.1088/0957-4484/10/4/307  0.76
1999 Neves BRA, Vilela JMC, Russell PE, Reis ACC, Andrade MS. Imaging micro-cracks in gold films: A comparative study of scanning tunneling and atomic force microscopies Ultramicroscopy. 76: 61-67. DOI: 10.1016/S0304-3991(98)00071-0  0.76
1998 Shenderova O, Mewkill J, Linehan P, Brenner DW, Jarausch K, Russell PE. Evaluation of atomic force microscopy as a probe of nanoscale residual stress via atomistic simulation Materials Research Society Symposium - Proceedings. 522: 233-238. DOI: 10.1557/Proc-522-233  0.76
1996 Thaus DM, Stark TJ, Griffis DP, Russell PE. Organochloride chemically enhanced focused ion beam micromachining of permalloy Applied Physics Letters. 68: 3829-3831. DOI: 10.1063/1.116631  0.76
1993 Sawyer LC, Chen RT, Jamieson MG, Musselman IH, Russell PE. The fibrillar hierarchy in liquid crystalline polymers Journal of Materials Science. 28: 225-238. DOI: 10.1007/Bf00349055  0.76
1992 Allen PE, Griffis DP, Radzimski ZJ, Russell PE. Electron beam patterning of Si02 Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 10: 965-969. DOI: 10.1116/1.577887  0.76
1992 Griffith JE, Grigg DA, Vasile MJ, Russell PE, Fitzgerald EA. Scanning probe metrology Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 10: 674-679. DOI: 10.1116/1.577708  0.76
1992 Grigg DA, Russell PE, Griffith JE, Vasile MJ, Fitzgerald EA. Probe characterization for scanning probe metrology Ultramicroscopy. 42: 1616-1620. DOI: 10.1016/0304-3991(92)90494-5  0.76
1992 Sawyer LC, Chen RT, Jamieson MG, Musselman IH, Russell PE. Microfibrillar structures in liquid-crystalline polymers Journal of Materials Science Letters. 11: 69-72. DOI: 10.1007/Bf00724601  0.76
1991 Vasile MJ, Grigg DA, Griffith JE, Fitzgerald EA, Russell PE. Scanning probe tips formed by focused ion beams Review of Scientific Instruments. 62: 2167-2171. DOI: 10.1063/1.1142334  0.76
1990 Bumgarner S, Hofmelster S, Griffis D, Russell P. Automated peak identification applied to Auger electron spectroscopy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 2221-2225. DOI: 10.1116/1.576739  0.76
1990 Musselman IH, Russell PE. Platinum/iridium tips with controlled geometry for scanning tunneling microscopy Journal of Vacuum Science and Technology a: Vacuum, Surfaces and Films. 8: 3558-3562. DOI: 10.1116/1.576507  0.76
1990 Musselman IH, Peterson PA, Russell PE. Fabrication of tips with controlled geometry for scanning tunnelling microscopy Precision Engineering. 12: 3-6. DOI: 10.1016/0141-6359(90)90002-G  0.76
1983 Moore CA, Rocca JJ, Johnson T, Collins GJ, Russell PE. Large area electron beam annealing Applied Physics Letters. 43: 290-292. DOI: 10.1063/1.94289  0.76
1982 Russell PE, Jamjoum O, Ahrenkiel RK, Kazmerski LL, Mickelsen RA, Chen WS. Properties of the Mo-CuInSe2 interface Applied Physics Letters. 40: 995-997. DOI: 10.1063/1.92955  0.76
1978 Stiller AH, Renton JJ, Montano PA, Russell PE. Application of Mössbauer spectroscopy to monitor acid mine drainage potentials of coal seams Fuel. 57: 447-448. DOI: 10.1016/0016-2361(78)90063-7  0.76
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