McLean P. Echlin, Ph.D. - Publications

Affiliations: 
2011 University of Michigan, Ann Arbor, Ann Arbor, MI 
Area:
Materials Science Engineering, Mechanical Engineering

15 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2020 Wang F, Echlin MP, Taylor AA, Shin J, Bammes B, Levin BDA, De Graef M, Pollock TM, Gianola DS. Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition. Ultramicroscopy. 220: 113160. PMID 33197699 DOI: 10.1016/j.ultramic.2020.113160  1
2018 Lenthe WC, Stinville JC, Echlin MP, Chen Z, Daly S, Pollock TM. Advanced detector signal acquisition and electron beam scanning for high resolution SEM imaging. Ultramicroscopy. 195: 93-100. PMID 30216796 DOI: 10.1016/j.ultramic.2018.08.025  1
2017 Callahan PG, Stinville JC, Yao ER, Echlin MP, Titus MS, De Graef M, Gianola DS, Pollock TM. Transmission scanning electron microscopy: Defect observations and image simulations. Ultramicroscopy. 186: 49-61. PMID 29268135 DOI: 10.1016/j.ultramic.2017.11.004  1
2017 Callahan PG, Echlin MP, Pollock TM, De Graef M. Reconstruction of Laser-Induced Surface Topography from Electron Backscatter Diffraction Patterns. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 23: 730-740. PMID 28784197 DOI: 10.1017/S1431927617012326  1
2017 Norman J, Kennedy MJ, Selvidge J, Li Q, Wan Y, Liu AY, Callahan PG, Echlin MP, Pollock TM, Lau KM, Gossard AC, Bowers JE. Electrically pumped continuous wave quantum dot lasers epitaxially grown on patterned, on-axis (001) Si. Optics Express. 25: 3927-3934. PMID 28241602  1
2016 Echlin MLP, Stinville JC, Miller VM, Lenthe WC, Pollock TM. Incipient slip and long range plastic strain localization in microtextured Ti-6Al-4V titanium Acta Materialia. 114: 164-175. DOI: 10.1016/j.actamat.2016.04.057  1
2016 Stinville JC, Echlin MP, Texier D, Bridier F, Bocher P, Pollock TM. Sub-Grain Scale Digital Image Correlation by Electron Microscopy for Polycrystalline Materials during Elastic and Plastic Deformation Experimental Mechanics. 56: 197-216. DOI: 10.1007/s11340-015-0083-4  1
2015 Lenthe WC, Echlin MP, Trenkle A, Syha M, Gumbsch P, Pollock TM. Quantitative voxel-to-voxel comparison of TriBeam and DCT strontium titanate three-dimensional data sets Journal of Applied Crystallography. 48: 1034-1046. DOI: 10.1107/S1600576715009231  1
2015 Douglas JE, Echlin MP, Lenthe WC, Seshadri R, Pollock TM. Three-dimensional multimodal imaging and analysis of biphasic microstructure in a Ti-Ni-Sn thermoelectric material Apl Materials. 3. DOI: 10.1063/1.4931764  1
2015 Titus MS, Echlin MP, Gumbsch P, Pollock TM. Dislocation injection in strontium titanate by femtosecond laser pulses Journal of Applied Physics. 118. DOI: 10.1063/1.4928772  1
2015 Echlin MP, Straw M, Randolph S, Filevich J, Pollock TM. The TriBeam system: Femtosecond laser ablation in situ SEM Materials Characterization. 100: 1-12. DOI: 10.1016/j.matchar.2014.10.023  1
2014 Echlin MP, Mottura A, Wang M, Mignone PJ, Riley DP, Franks GV, Pollock TM. Three-dimensional characterization of the permeability of W-Cu composites using a new "triBeam" technique Acta Materialia. 64: 307-315. DOI: 10.1016/j.actamat.2013.10.043  1
2013 Echlin MP, Pollock TM. A statistical sampling approach for measurement of fracture toughness parameters in a 4330 steel by 3-D femtosecond laser-based tomography Acta Materialia. 61: 5791-5799. DOI: 10.1016/j.actamat.2013.06.023  1
2012 Echlin MP, Mottura A, Torbet CJ, Pollock TM. A new TriBeam system for three-dimensional multimodal materials analysis. The Review of Scientific Instruments. 83: 023701. PMID 22380093 DOI: 10.1063/1.3680111  1
2011 Echlin MP, Husseini NS, Nees JA, Pollock TM. A new femtosecond laser-based tomography technique for multiphase materials. Advanced Materials (Deerfield Beach, Fla.). 23: 2339-42. PMID 21608045 DOI: 10.1002/adma.201003600  1
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