| Year |
Citation |
Score |
| 2019 |
Liu C, Wang J, Xu G, Kamlah M, Zhang T. An isogeometric approach to flexoelectric effect in ferroelectric materials International Journal of Solids and Structures. 162: 198-210. DOI: 10.1016/J.Ijsolstr.2018.12.008 |
0.3 |
|
| 2019 |
Cai H, Mai J, Gao Y, Huang H, Sun S, Zhang T. Surface segregation of hydrogen in free-standing Pd-H alloy nanofilms Science China Technological Sciences. 62: 1735-1746. DOI: 10.1007/S11431-019-9529-4 |
0.309 |
|
| 2017 |
Cao SG, Li Y, Wu HH, Wang J, Huang B, Zhang TY. Stress-induced cubic-to-hexagonal phase transformation in perovskite nano thin films. Nano Letters. PMID 28745511 DOI: 10.1021/Acs.Nanolett.7B02570 |
0.592 |
|
| 2016 |
Zhou XY, Huang BL, Zhang TY. Size- and temperature-dependent Young's modulus and size-dependent thermal expansion coefficient of thin films. Physical Chemistry Chemical Physics : Pccp. PMID 27426852 DOI: 10.1039/C6Cp03294J |
0.325 |
|
| 2016 |
Wang XX, Wu YH, Zhang TY, Xu XQ, Dao GH, Hu HY. Simultaneous nitrogen, phosphorous, and hardness removal from reverse osmosis concentrate by microalgae cultivation. Water Research. 94: 215-224. PMID 26954575 DOI: 10.1016/j.watres.2016.02.062 |
0.591 |
|
| 2016 |
Sun S, Zhang TY. Charge- and thickness-dependent inplane deformation of multilayer graphene thin films. Physical Chemistry Chemical Physics : Pccp. PMID 26758792 DOI: 10.1039/C5Cp06973D |
0.318 |
|
| 2016 |
Gao Y, Sun Y, Zhang T. Highly reliable and efficient atomic force microscopy based bending test for assessing Young's modulus of one-dimensional nanomaterials Applied Physics Letters. 108: 123104. DOI: 10.1063/1.4944726 |
0.301 |
|
| 2016 |
Yang XS, Wang YJ, Wang GY, Zhai HR, Dai LH, Zhang TY. Time, stress, and temperature-dependent deformation in nanostructured copper: Stress relaxation tests and simulations Acta Materialia. 108: 252-263. DOI: 10.1016/J.Actamat.2016.02.021 |
0.311 |
|
| 2015 |
Wang XJ, Hu W, Zhang TY, Mao YY, Liu NN, Wang SQ. Irbesartan, an FDA approved drug for hypertension and diabetic nephropathy, is a potent inhibitor for hepatitis B virus entry by disturbing Na(+)-dependent taurocholate cotransporting polypeptide activity. Antiviral Research. 120: 140-6. PMID 26086883 DOI: 10.1016/j.antiviral.2015.06.007 |
0.586 |
|
| 2015 |
Guo XJ, Ye XF, Wang XX, Wang J, Shi WT, Gao QB, Zhang TY, Xu JF, Zhu TT, He J. Reporting patterns of adverse drug reactions over recent years in China: analysis from publications. Expert Opinion On Drug Safety. 14: 191-8. PMID 25560528 DOI: 10.1517/14740338.2015.985647 |
0.571 |
|
| 2015 |
Hu W, Huang H, Zhang TY, Mao YY, Wang XJ, Wang SQ. CpG oligodeoxynucleotide inhibits HBV replication in a hydrodynamic injection murine model. Antiviral Therapy. 20: 289-95. PMID 25279542 DOI: 10.3851/IMP2870 |
0.579 |
|
| 2015 |
Zhou XY, Ren H, Huang BL, Zhang TY. Surface-induced size-dependent ultimate tensile strength of thin films Physics Letters, Section a: General, Atomic and Solid State Physics. 379: 471-481. DOI: 10.1016/J.Physleta.2014.10.054 |
0.596 |
|
| 2015 |
Wu HH, Cao SG, Zhu JM, Zhang TY. The frequency-dependent behavior of a ferroelectric single crystal with dislocation arrays Acta Mechanica. 1-7. DOI: 10.1007/S00707-015-1512-2 |
0.55 |
|
| 2014 |
Wang XJ, Zhang XJ, Hu W, Zhang TY, Wang SQ. A simple and efficient strategy for the de novo construction of greater-than-genome-length hepatitis B virus replicons. Journal of Virological Methods. 207: 158-62. PMID 25025817 DOI: 10.1016/j.jviromet.2014.07.009 |
0.583 |
|
| 2014 |
Xie T, Fan CY, Liu HT, Zhao MH, Zhang T. Effect of electrostatic tractions on the fracture behavior of a piezoelectric material under mechanical and/or electric loading Theoretical and Applied Fracture Mechanics. 69: 6-16. DOI: 10.1016/J.Tafmec.2013.12.009 |
0.347 |
|
| 2014 |
Ren H, Zhang T. H concentrations and stresses in Pd nanoparticles Materials Letters. 130: 176-179. DOI: 10.1016/J.Matlet.2014.05.104 |
0.539 |
|
| 2014 |
Zhou X, Ren H, Huang B, Zhang T. Size-dependent elastic properties of thin films: surface anisotropy and surface bonding Science China Technological Sciences. 57: 680-691. DOI: 10.1007/S11431-014-5499-Z |
0.345 |
|
| 2014 |
Zhao M, Liu H, Fan C, Pan E, Zhang TY. A nonlinear bilayer beam model for an interfacial crack in dielectric bimaterials under mechanical/electrical loading International Journal of Fracture. 188: 47-58. DOI: 10.1007/S10704-014-9944-6 |
0.33 |
|
| 2013 |
Wu HH, Wang J, Cao SG, Chen LQ, Zhang TY. The unusual temperature dependence of the switching behavior in a ferroelectric single crystal with dislocations Smart Materials and Structures. 23: 025004. DOI: 10.1088/0964-1726/23/2/025004 |
0.548 |
|
| 2013 |
Zhang T, Ren H. Solute Concentrations and Strains in Nanoparticles Journal of Thermal Stresses. 36: 626-645. DOI: 10.1080/01495739.2013.784123 |
0.551 |
|
| 2013 |
Zhao M, Liu H, Fan C, Pan E, Zhang TY. Indentation stress in multi-layer delaminated thin films induced by a microwedge indenter Composites Part B: Engineering. 45: 845-851. DOI: 10.1016/J.Compositesb.2012.08.010 |
0.353 |
|
| 2013 |
Ren H, Yang X, Gao Y, Zhang T. Solute concentrations and stresses in nanograined H–Pd solid solution Acta Materialia. 61: 5487-5495. DOI: 10.1016/J.Actamat.2013.05.037 |
0.555 |
|
| 2013 |
Zhang T, Ren H. Solute Concentrations and Strains in Nanograined Materials Acta Materialia. 61: 477-493. DOI: 10.1016/J.Actamat.2012.09.060 |
0.57 |
|
| 2013 |
Wang J, Völker B, Kamlah M, Zhang T. Effects of thickness on the polarization states in epitaxial ferroelectric thin films Acta Mechanica. 224: 1225-1231. DOI: 10.1007/S00707-013-0869-3 |
0.34 |
|
| 2013 |
Zhang TY, Xie T. The charge-free zone model for electrically conductive cracks in dielectric and piezoelectric ceramics Acta Mechanica. 224: 1159-1168. DOI: 10.1007/S00707-013-0859-5 |
0.307 |
|
| 2012 |
Lu J, Ren H, Deng D, Wang Y, Chen KJ, Lau K, Zhang T. Thermally activated pop-in and indentation size effects in GaN films Journal of Physics D: Applied Physics. 45: 085301. DOI: 10.1088/0022-3727/45/8/085301 |
0.586 |
|
| 2012 |
Fan C, Zhao M, Zhu Y, Liu H, Zhang T. Analysis of micro/nanobridge test based on nonlocal elasticity International Journal of Solids and Structures. 49: 2168-2176. DOI: 10.1016/J.Ijsolstr.2012.04.028 |
0.327 |
|
| 2012 |
Zhang T, Xie T. Effect of electrostatic tractions on the fracture behavior of a dielectric material under mechanical and/or electric loading Science China Technological Sciences. 55: 2391-2403. DOI: 10.1007/S11431-012-4985-4 |
0.314 |
|
| 2011 |
Sun X, Su YJ, Gao KW, Guo LQ, Qiao LJ, Chu WY, Zhang T. Surface Potential Distribution in an Indentation- Pre-Cracked BaTiO3 Single Crystal Journal of the American Ceramic Society. 94: 4299-4304. DOI: 10.1111/J.1551-2916.2011.04634.X |
0.311 |
|
| 2011 |
Lu J, Deng D, Wang Y, Chen KJ, Lau KM, Zhang T. Phonon deformation potentials of hexagonal GaN studied by biaxial stress modulation Aip Advances. 1: 32132. DOI: 10.1063/1.3626532 |
0.316 |
|
| 2011 |
Fan C, Zhao M, Meng L, Gao C, Zhang T. On the self-consistent, energetically consistent, and electrostatic traction approaches in piezoelectric fracture mechanics Engineering Fracture Mechanics. 78: 2338-2355. DOI: 10.1016/J.Engfracmech.2011.05.006 |
0.329 |
|
| 2011 |
Zhang T, Ren H, Wang Z, Sun S. Surface eigen-displacement and surface Poisson’s ratios of solids Acta Materialia. 59: 4437-4447. DOI: 10.1016/J.Actamat.2011.03.067 |
0.556 |
|
| 2010 |
Zhang T, Wang Z, Chan W. Eigenstress model for surface stress of solids Physical Review B. 81: 195427. DOI: 10.1103/Physrevb.81.195427 |
0.371 |
|
| 2010 |
Lu J, Wang Z, Deng D, Wang Y, Chen KJ, Lau KM, Zhang T. Determining phonon deformation potentials of hexagonal GaN with stress modulation Journal of Applied Physics. 108: 123520. DOI: 10.1063/1.3524548 |
0.339 |
|
| 2010 |
Wang Z, Liu C, Li Z, Zhang T. Size-dependent elastic properties of Au nanowires under bending and tension—Surfaces versus core nonlinearity Journal of Applied Physics. 108: 83506. DOI: 10.1063/1.3493264 |
0.312 |
|
| 2010 |
Chan WK, Zhang T. Mechanics analysis and atomistic simulations of nanobridge tests Journal of Applied Physics. 107: 23526. DOI: 10.1063/1.3294610 |
0.312 |
|
| 2010 |
Zhao M, Zhang K, Zhang T. Reissner plate theory-based study of circular and annular delamination buckling of a film on a substrate Engineering Fracture Mechanics. 77: 1479-1491. DOI: 10.1016/J.Engfracmech.2010.04.018 |
0.334 |
|
| 2010 |
Yan DJ, Huang HY, Cheung CW, Zhang TY. Fracture criterion for conductive cracks in soda-lime glass under combined mechanical and electrical loading International Journal of Fracture. 164: 185-199. DOI: 10.1007/S10704-010-9468-7 |
0.308 |
|
| 2010 |
Wang J, Kamlah M, Zhang T. Phase field simulations of low-dimensional ferroelectrics Acta Mechanica. 214: 49-59. DOI: 10.1007/S00707-010-0322-9 |
0.316 |
|
| 2009 |
Gu C, Ren H, Tu J, Zhang TY. Micro/nanobinary structure of silver films on copper alloys with stable water-repellent property under dynamic conditions. Langmuir : the Acs Journal of Surfaces and Colloids. 25: 12299-307. PMID 19754194 DOI: 10.1021/La902936U |
0.58 |
|
| 2009 |
Huang H, Li Z, Lu J, Wang Z, Wang C, Lau KM, Chen KJ, Zhang T. Microbridge tests on gallium nitride thin films Journal of Micromechanics and Microengineering. 19: 95019. DOI: 10.1088/0960-1317/19/9/095019 |
0.329 |
|
| 2008 |
Wang J, Zhang T. Influence of depolarization field on polarization states in epitaxial ferroelectric thin films with nonequally biaxial misfit strains Physical Review B. 77: 14104. DOI: 10.1103/Physrevb.77.014104 |
0.325 |
|
| 2008 |
Zhang T, Luo M, Chan WK. Size-dependent surface stress, surface stiffness, and Young’s modulus of hexagonal prism [111] β-SiC nanowires Journal of Applied Physics. 103: 104308. DOI: 10.1063/1.2927453 |
0.306 |
|
| 2008 |
Liu L, Zhang Y, Zhang T. Critical thickness for misfit twinning in an epilayer International Journal of Solids and Structures. 45: 3173-3191. DOI: 10.1016/J.Ijsolstr.2008.01.018 |
0.322 |
|
| 2008 |
Wang J, Zhang T. Phase field simulations of a permeable crack parallel to the original polarization direction in a ferroelectric mono-domain Engineering Fracture Mechanics. 75: 4886-4897. DOI: 10.1016/J.Engfracmech.2008.06.025 |
0.301 |
|
| 2007 |
Zhao M, Qian C, Lee SWR, Tong P, Suemasu H, Zhang T. Electro-elastic analysis of piezoelectric laminated plates Advanced Composite Materials. 16: 63-81. DOI: 10.1163/156855107779755273 |
0.3 |
|
| 2007 |
He J, Wang W, Yuan C, Zhang T, Chen G. Mechanical Properties Improvement of Waterborne Polyurethane Coating Films After Rewetting and Drying Drying Technology. 27: 534-537. DOI: 10.1080/07373930802715286 |
0.307 |
|
| 2007 |
Zhang Y, Liu L, Zhang T. Strain relaxation in heteroepitaxial films by misfit twinning: II. Equilibrium morphology Journal of Applied Physics. 101: 63502. DOI: 10.1063/1.2433547 |
0.336 |
|
| 2007 |
Liu L, Zhang Y, Zhang T. Strain relaxation in heteroepitaxial films by misfit twinning. I. Critical thickness Journal of Applied Physics. 101: 63501. DOI: 10.1063/1.2433368 |
0.337 |
|
| 2007 |
Zhao M, Yang F, Zhang T. Delamination buckling in the microwedge indentation of a thin film on an elastically deformable substrate Mechanics of Materials. 39: 881-892. DOI: 10.1016/J.Mechmat.2007.03.003 |
0.356 |
|
| 2007 |
Zhang T, Liu G, Wang T, Tong P. Application of the concepts of fracture mechanics to the failure of conductive cracks in piezoelectric ceramics Engineering Fracture Mechanics. 74: 1160-1173. DOI: 10.1016/J.Engfracmech.2006.12.012 |
0.309 |
|
| 2007 |
Zhao MH, Zhou J, Yang F, Liu T, Zhang T. Effects of substrate compliance on circular buckle delamination of thin films Engineering Fracture Mechanics. 74: 2334-2351. DOI: 10.1016/J.Engfracmech.2006.11.007 |
0.344 |
|
| 2007 |
Wang J, Zhang T. Phase field simulations of polarization switching-induced toughening in ferroelectric ceramics Acta Materialia. 55: 2465-2477. DOI: 10.1016/J.Actamat.2006.11.041 |
0.317 |
|
| 2007 |
Wang X, Zhang T. Microbridge Tests on Bilayer Thin Films Metallurgical and Materials Transactions a-Physical Metallurgy and Materials Science. 38: 2273-2282. DOI: 10.1007/S11661-007-9179-5 |
0.659 |
|
| 2006 |
Wang J, Zhang T. Size effects in epitaxial ferroelectric islands and thin films Physical Review B. 73: 144107. DOI: 10.1103/Physrevb.73.144107 |
0.323 |
|
| 2006 |
Wang X, Li J, Zhang T. Microbridge tests: I. On asymmetrical trilayer films Journal of Micromechanics and Microengineering. 16: 122-133. DOI: 10.1088/0960-1317/16/1/017 |
0.678 |
|
| 2006 |
Gao C, Noda N, Zhang T. Dielectric breakdown model for a conductive crack and electrode in piezoelectric materials International Journal of Engineering Science. 44: 256-272. DOI: 10.1016/J.Ijengsci.2005.12.001 |
0.333 |
|
| 2005 |
Wang X, Wang J, Zhao M, Zhang T. Microbridge testing on symmetrical trilayer films Ieee\/Asme Journal of Microelectromechanical Systems. 14: 634-645. DOI: 10.1109/Jmems.2005.844804 |
0.681 |
|
| 2005 |
Wang J, Zhang T. Effects of nonequally biaxial misfit strains on the phase diagram and dielectric properties of epitaxial ferroelectric thin films Applied Physics Letters. 86: 192905. DOI: 10.1063/1.1923765 |
0.318 |
|
| 2005 |
Cao Z, Zhang T, Zhang X. Microbridge testing of plasma-enhanced chemical-vapor deposited silicon oxide films on silicon wafers Journal of Applied Physics. 97: 104909. DOI: 10.1063/1.1898449 |
0.349 |
|
| 2005 |
Zhang T, Wang X, Huang B. Microbridge testing of thin films Materials Science and Engineering: A. 409: 329-339. DOI: 10.1016/J.Msea.2005.03.118 |
0.68 |
|
| 2005 |
Zhang T, Zhao M, Gao C. The strip dielectric breakdown model International Journal of Fracture. 132: 311-327. DOI: 10.1007/S10704-005-2054-8 |
0.329 |
|
| 2004 |
Huang B, Zhao M, Zhang T. Indentation fracture and indentation delamination in ZnO film/Si substrate systems Philosophical Magazine. 84: 1233-1256. DOI: 10.1080/14786430310001653116 |
0.365 |
|
| 2004 |
Gao C, Tong P, Zhang T. Fracture mechanics for a mode III crack in a magnetoelectroelastic solid International Journal of Solids and Structures. 41: 6613-6629. DOI: 10.1016/J.Ijsolstr.2004.06.015 |
0.312 |
|
| 2004 |
Gao C, Zhao M, Tong P, Zhang T. The energy release rate and the J-integral of an electrically insulated crack in a piezoelectric material International Journal of Engineering Science. 42: 2175-2192. DOI: 10.1016/J.Ijengsci.2004.08.007 |
0.314 |
|
| 2004 |
Zhang T, Liu G, Wang Y. Failure behavior and failure criterion of conductive cracks (deep notches) in piezoelectric ceramics II: experimental verification Acta Materialia. 52: 2025-2035. DOI: 10.1016/J.Actamat.2003.12.046 |
0.314 |
|
| 2004 |
Zhang T, Zhao M, Liu G. Failure behavior and failure criterion of conductive cracks (deep notches) in piezoelectric ceramics I – the charge-free zone model Acta Materialia. 52: 2013-2024. DOI: 10.1016/J.Actamat.2003.12.041 |
0.308 |
|
| 2003 |
Zhang T, Huang B. Measurement of Residual Stress in ZnO Thin Films Deposited on Silicon Wafers by the Indentation Fracture Test Mrs Proceedings. 795: 63. DOI: 10.1557/Proc-795-U3.3 |
0.325 |
|
| 2003 |
Xu W, Zhang T. Mechanical characterization of trilayer thin films by the microbridge testing method Applied Physics Letters. 83: 1731-1733. DOI: 10.1063/1.1605799 |
0.36 |
|
| 2003 |
Zhang T, Wang T, Zhao M. Failure behavior and failure criterion of conductive cracks (deep notches) in thermally depoled PZT-4 ceramics Acta Materialia. 51: 4881-4895. DOI: 10.1016/S1359-6454(03)00331-8 |
0.316 |
|
| 2003 |
Gao C, Tong P, Zhang T. Interfacial crack problems in magneto-electroelastic solids International Journal of Engineering Science. 41: 2105-2121. DOI: 10.1016/S0020-7225(03)00206-4 |
0.303 |
|
| 2002 |
Zhang T, Xu W. Surface Effects on Nanoindentation Journal of Materials Research. 17: 1715-1720. DOI: 10.1557/Jmr.2002.0254 |
0.304 |
|
| 2002 |
Zhang T, Zhao M, Tong P. Fracture of piezoelectric ceramics Advances in Applied Mechanics. 38: 147-289. DOI: 10.1016/S0065-2156(02)80104-1 |
0.341 |
|
| 2002 |
Zhang TY, Zhao MH. Equilibrium depth and spacing of cracks in a tensile residual stressed thin film deposited on a brittle substrate Engineering Fracture Mechanics. 69: 589-596. DOI: 10.1016/S0013-7944(01)00098-4 |
0.348 |
|
| 2001 |
Zhao M, Fu R, Zhang T. Multiple cracks of a thin film on a ductile substrate Mrs Proceedings. 695: 391. DOI: 10.1557/Proc-695-L9.3.1 |
0.327 |
|
| 2000 |
Cheng J, Qian C, Zhao M, Lee SWR, Tong P, Zhang T. Effects of electric fields on the bending behavior of PZT-5H piezoelectric laminates Smart Materials and Structures. 9: 824-831. DOI: 10.1088/0964-1726/9/6/312 |
0.329 |
|
| 2000 |
Zhang T, Qian C, Wang T, Tong P. Interaction of an edge dislocation with a thin-film-covered crack International Journal of Solids and Structures. 37: 5465-5492. DOI: 10.1016/S0020-7683(99)00238-3 |
0.37 |
|
| 1999 |
Zhang T, Lee S, Guido LJ, Hsueh C. Criteria for formation of interface dislocations in a finite thickness epilayer deposited on a substrate Journal of Applied Physics. 85: 7579-7586. DOI: 10.1063/1.370558 |
0.333 |
|
| 1999 |
Zhang T, Su Y. The critical thickness of an epilayer deposited on a semiconductor-on-insulator compliant substrate Applied Physics Letters. 74: 1689-1691. DOI: 10.1063/1.123656 |
0.312 |
|
| 1999 |
Chen B, Zhang T, Lee S. Interaction of an edge dislocation with an elliptical hole in a rectilinearly anisotropic body Mechanics of Materials. 31: 71-93. DOI: 10.1016/S0167-6636(98)00036-2 |
0.303 |
|
| 1999 |
Zhang T, Hack JE. The equilibrium concentration of hydrogen atoms ahead of a mixed mode I mode III crack tip in single crystal iron Metallurgical and Materials Transactions a-Physical Metallurgy and Materials Science. 30: 155-159. DOI: 10.1007/S11661-999-0203-9 |
0.306 |
|
| 1998 |
Zhang T, Qian C, Wang T, Tong P. Dislocation emission from a thin-film-covered crack Mrs Proceedings. 539: 63. DOI: 10.1557/Proc-539-63 |
0.356 |
|
| 1998 |
Zhang X, Zhang T, Wong M, Zohar Y. Rapid thermal annealing of polysilicon thin films Ieee\/Asme Journal of Microelectromechanical Systems. 7: 356-364. DOI: 10.1109/84.735342 |
0.343 |
|
| 1997 |
Gao H, Zhang T, Tong P. Local and global energy release rates for an electrically yielded crack in a piezoelectric ceramic Journal of the Mechanics and Physics of Solids. 45: 491-510. DOI: 10.1016/S0022-5096(96)00108-1 |
0.314 |
|
| 1996 |
Zhang T, Qian C. Interaction of a thin-film-covered mode III crack with screw dislocations: emission of a screw dislocation dipole from the interface Mechanics of Materials. 24: 159-173. DOI: 10.1016/S0167-6636(96)00033-6 |
0.359 |
|
| 1996 |
Zhang T, Qian C. Interaction of a screw dislocation with a thin-film-covered mode III crack Acta Materialia. 44: 4513-4520. DOI: 10.1016/1359-6454(96)00066-3 |
0.365 |
|
| 1996 |
Zhang T, Tong P. Fracture mechanics for a mode III crack in a piezoelectric material International Journal of Solids and Structures. 33: 343-359. DOI: 10.1016/0020-7683(95)00046-D |
0.331 |
|
| 1995 |
Zhang T, Chu W, Xiao J. Film Effects On Ductile/Brititle Behavior In Stress-Corrosion Cracking Mrs Proceedings. 409: 207. DOI: 10.1557/Proc-409-207 |
0.332 |
|
| 1995 |
Zhang T. Anisotropic elasticity study of the critical thickness of an epilayer on a substrate with different elastic constants Journal of Applied Physics. 78: 4948-4957. DOI: 10.1063/1.359785 |
0.351 |
|
| 1995 |
Zhang T, Tong P, Ouyang H, Lee S. Interaction of an edge dislocation with a wedge crack Journal of Applied Physics. 78: 4873-4880. DOI: 10.1063/1.359775 |
0.317 |
|
| 1995 |
Zhang T. Effect of elastic constants on the critical thickness of an epilayer Physica Status Solidi (a). 152: 415-429. DOI: 10.1002/Pssa.2211520210 |
0.356 |
|
| 1995 |
Zhang T. A dislocation in a compositionally graded epilayer Physica Status Solidi (a). 148: 175-189. DOI: 10.1002/Pssa.2211480115 |
0.331 |
|
| 1994 |
Zhang T. Elastic constant effect on the critical thickness of an epilayer Mrs Proceedings. 356: 325. DOI: 10.1557/Proc-356-325 |
0.328 |
|
| 1994 |
Zhang TY, Hack JE, Guido LJ. An array of dislocations in a strained epitaxial layer. II. Work hardening Journal of Applied Physics. 75: 2363-2366. DOI: 10.1063/1.356256 |
0.305 |
|
| 1994 |
Zhang T. Effect of sample width on the energy release rate and electric boundary conditions along crack surfaces in piezoelectric materials International Journal of Fracture. 66: 33. DOI: 10.1007/Bf00020086 |
0.304 |
|
| 1993 |
Shiue S, Zhang T, Lee S. An edge dislocation near a macrocrack with a microcrack Journal of Applied Physics. 74: 6079-6087. DOI: 10.1063/1.355192 |
0.331 |
|
| 1993 |
Zhang T, Lee S. Stress intensity factors of interfacial cracks Engineering Fracture Mechanics. 44: 539-544. DOI: 10.1016/0013-7944(93)90094-9 |
0.307 |
|
| 1992 |
Zhang T, Li JCM. Interaction of an edge dislocation with an interfacial crack Journal of Applied Physics. 72: 2215-2226. DOI: 10.1063/1.351614 |
0.316 |
|
| 1992 |
Zhang TY, Hack JE. Mode-III cracks in piezoelectric materials Journal of Applied Physics. 71: 5865-5870. DOI: 10.1063/1.350483 |
0.333 |
|
| 1991 |
Zhang T, Li JCM. Interaction of a screw dislocation with an interface crack Journal of Applied Physics. 70: 744-751. DOI: 10.1063/1.349630 |
0.301 |
|
| 1987 |
Zhang T, Chu W, Ma R, Hsiao C. Hydrogen Induced Cracking in Fe-3% Si Single Crystals under Mode 2 Loading Corrosion. 43: 70-77. DOI: 10.5006/1.3583120 |
0.305 |
|
| 1986 |
Zhang T, Chu W, Li Y, Hsiao C. Hydrogen-induced delayed fracture under mode II loading Metallurgical and Materials Transactions a-Physical Metallurgy and Materials Science. 17: 717-725. DOI: 10.1007/Bf02643993 |
0.306 |
|
| 1985 |
Zhang T, Chu W, Hsiao C. Tetragonal distortion field of hydrogen atoms in iron Metallurgical and Materials Transactions a-Physical Metallurgy and Materials Science. 16: 1649-1653. DOI: 10.1007/Bf02663020 |
0.302 |
|
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