| Year |
Citation |
Score |
| 2020 |
Yin X, Wang Y, Chang TH, Zhang P, Li J, Xue P, Long Y, Shohet JL, Voyles PM, Ma Z, Wang X. Memristive Behavior Enabled by Amorphous-Crystalline 2D Oxide Heterostructure. Advanced Materials (Deerfield Beach, Fla.). e2000801. PMID 32319153 DOI: 10.1002/Adma.202000801 |
0.317 |
|
| 2020 |
Du D, Strohbeen PJ, Paik H, Zhang C, Genser KT, Rabe KM, Voyles PM, Schlom DG, Kawasaki JK. Control of polymorphism during epitaxial growth of hyperferroelectric candidate LiZnSb on GaSb (111)B Journal of Vacuum Science & Technology B. 38: 022208. DOI: 10.1116/1.5145217 |
0.349 |
|
| 2020 |
Shourov EH, Jacobs R, Behn WA, Krebs ZJ, Zhang C, Strohbeen PJ, Du D, Voyles PM, Brar VW, Morgan DD, Kawasaki JK. Semi-adsorption-controlled growth window for half-Heusler FeVSb epitaxial films Physical Review Materials. 4. DOI: 10.1103/Physrevmaterials.4.073401 |
0.368 |
|
| 2020 |
Chatterjee D, Voyles P. Electron Correlation Microscopy Measurements of Metallic Glass Surface Dynamics Microscopy and Microanalysis. 26: 1142-1143. DOI: 10.1017/S1431927620017080 |
0.324 |
|
| 2020 |
Francis C, Chatterjee D, Muley S, Voyles P. “Crystallography” of an Amorphous Material Using Electron Nanodiffraction Microscopy and Microanalysis. 26: 38-40. DOI: 10.1017/S1431927620013197 |
0.337 |
|
| 2020 |
Sarkar N, Vishwanadh B, Prajapat C, Babu P, Ravikumar G, Dey G, Voyles PM, Tewari R, Mishra P. Superconductivity and fluctuation effects in a fractal dimensional bulk metallic glass: Correlation with medium range order Materials Today Communications. 25: 101427. DOI: 10.1016/J.Mtcomm.2020.101427 |
0.328 |
|
| 2020 |
Liu L, Shi C, Zhang C, Voyles P, Fournelle J, Perepezko J. Microstructure, microhardness and oxidation behavior of Mo-Si-B alloys in the Moss+Mo2B+Mo5SiB2 three phase region Intermetallics. 116: 106618. DOI: 10.1016/J.Intermet.2019.106618 |
0.318 |
|
| 2019 |
Zhang C, Feng J, DaCosta LR, Voyles PM. Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks. Ultramicroscopy. 210: 112921. PMID 31978635 DOI: 10.1016/J.Ultramic.2019.112921 |
0.326 |
|
| 2019 |
Yan G, Wang Y, Zhang Z, Li J, Carlos C, German LN, Zhang C, Wang J, Voyles PM, Wang X. Enhanced Ferromagnetism from Organic-Cerium Oxide Hybrid Ultrathin Nanosheets. Acs Applied Materials & Interfaces. PMID 31686493 DOI: 10.1021/Acsami.9B15841 |
0.316 |
|
| 2019 |
Voyles PM, Gibson JM, Treacy MM. Fluctuation microscopy: a probe of atomic correlations in disordered materials Journal of Electron Microscopy. 49: 259-66. PMID 11108048 DOI: 10.1093/Oxfordjournals.Jmicro.A023805 |
0.341 |
|
| 2019 |
Strohbeen PJ, Du D, Zhang C, Shourov EH, Rodolakis F, McChesney JL, Voyles PM, Kawasaki JK. Electronically enhanced layer buckling and Au-Au dimerization in epitaxial LaAuSb films Physical Review Materials. 3. DOI: 10.1103/Physrevmaterials.3.024201 |
0.398 |
|
| 2019 |
Chatterjee D, Zhang P, Voyles PM. Electron Correlation Microscopy for Studying Fluctuating Systems In Situ Microscopy and Microanalysis. 25: 1520-1521. DOI: 10.1017/S143192761900833X |
0.31 |
|
| 2019 |
Liu L, Sun C, Zhang C, Voyles PM, Fournelle J, Handt A, Perepezko JH. Examination of B in the Mo solid solution (Moss) in Moss + Mo5SiB2 + Mo2B alloys Scripta Materialia. 163: 62-65. DOI: 10.1016/J.Scriptamat.2019.01.003 |
0.315 |
|
| 2019 |
Bapna M, Parks B, Oberdick S, Almasi H, Sun C, Voyles P, Wang W, Majetich SA. Effect of Mo capping in sub-100 nm CoFeB-MgO tunnel junctions with perpendicular magnetic anisotropy Journal of Magnetism and Magnetic Materials. 483: 34-41. DOI: 10.1016/J.Jmmm.2019.03.005 |
0.334 |
|
| 2019 |
Maldonis JJ, Xu Z, Song Z, Yu M, Mayeshiba T, Morgan D, Voyles PM. StructOpt: A modular materials structure optimization suite incorporating experimental data and simulated energies Computational Materials Science. 160: 1-8. DOI: 10.1016/J.Commatsci.2018.12.052 |
0.313 |
|
| 2019 |
Yu Z, Zhang C, Voyles PM, He L, Liu X, Nygren K, Couet A. Microstructure and microchemistry study of irradiation-induced precipitates in proton irradiated ZrNb alloys Acta Materialia. 178: 228-240. DOI: 10.1016/J.Actamat.2019.08.012 |
0.308 |
|
| 2019 |
Li X, Yang M, Jamali M, Shi F, Kang S, Jiang Y, Zhang X, Li H, Okatov S, Faleev S, Kalitsov A, Yu G, Voyles PM, Mryasov ON, Wang J. Heavy‐Metal‐Free, Low‐Damping, and Non‐Interface Perpendicular Fe
16
N
2
Thin Film and Magnetoresistance Device Physica Status Solidi (Rrl) – Rapid Research Letters. 13: 1900089. DOI: 10.1002/Pssr.201900089 |
0.641 |
|
| 2018 |
Mitchell Warden HE, Voyles PM, Fredrickson DC. Paths to Stabilizing Electronically Aberrant Compounds: A Defect-Stabilized Polymorph and Constrained Atomic Motion in PtGa. Inorganic Chemistry. PMID 30336002 DOI: 10.1021/Acs.Inorgchem.8B02353 |
0.351 |
|
| 2018 |
Yu Y, Sun C, Yin X, Li J, Cao S, Zhang C, Voyles PM, Wang X. Metastable Intermediates in Amorphous Titanium Oxide: A Hidden Role Leading to Ultra-Stable Photoanode Protection. Nano Letters. PMID 30040905 DOI: 10.1021/Acs.Nanolett.8B02559 |
0.34 |
|
| 2018 |
Quarterman P, Sun C, Garcia-Barriocanal J, Dc M, Lv Y, Manipatruni S, Nikonov DE, Young IA, Voyles PM, Wang JP. Demonstration of Ru as the 4th ferromagnetic element at room temperature. Nature Communications. 9: 2058. PMID 29802304 DOI: 10.1038/S41467-018-04512-1 |
0.324 |
|
| 2018 |
Zhang P, Maldonis JJ, Liu Z, Schroers J, Voyles PM. Spatially heterogeneous dynamics in a metallic glass forming liquid imaged by electron correlation microscopy. Nature Communications. 9: 1129. PMID 29555920 DOI: 10.1038/S41467-018-03604-2 |
0.325 |
|
| 2018 |
Liu X, Szlufarska I, Voyles PM. In situ Transmission Electron Microscopy of Room-temperature Plastic Deformation and Recovery in Thin 3C-SiC Microscopy and Microanalysis. 24: 1834-1835. DOI: 10.1017/S1431927618009650 |
0.323 |
|
| 2018 |
Zhang P, Wang Z, Perepezko JH, Voyles PM. Vitrification, crystallization, and atomic structure of deformed and quenched Ni60Nb40 metallic glass Journal of Non-Crystalline Solids. 491: 133-140. DOI: 10.1016/J.Jnoncrysol.2018.04.005 |
0.33 |
|
| 2017 |
Voyles PM, Maldonis JJ, Zhang P. Nanoscale structure in glasses from coherent electron nanodiffraction Acta Crystallographica Section a Foundations and Advances. 73: a126-a126. DOI: 10.1107/S0108767317098750 |
0.347 |
|
| 2017 |
He L, Xu H, Tan L, Voyles P, Sridharan K. Measurement of Irradiation-induced Swelling in Stainless Steels with a New Transmission Electron Microscopy Method Microscopy and Microanalysis. 23: 2234-2235. DOI: 10.1017/S1431927617011837 |
0.316 |
|
| 2017 |
Sun C, Street M, Jacobs R, Morgan D, Voyles PM, Binek C. Identification and Quantification of Boron Dopant Sites in Antiferromagnetic Cr2O3 Films by Electron Energy Loss Spectroscopy Microscopy and Microanalysis. 23: 1584-1585. DOI: 10.1017/S1431927617008583 |
0.32 |
|
| 2017 |
Zhang P, Liu Z, Schroers J, Voyles PM. Atomic-scale Relaxation Dynamics in the Supercooled Liquid State of a Metallic Glass Nanowire by Electron Correlation Microscopy Microscopy and Microanalysis. 23: 960-961. DOI: 10.1017/S1431927617005463 |
0.346 |
|
| 2017 |
Zhang C, Berkels B, Wirth B, Voyles PM. Joint Denoising and Distortion Correction for Atomic Column Detection in Scanning Transmission Electron Microscopy Images Microscopy and Microanalysis. 23: 164-165. DOI: 10.1017/S1431927617001507 |
0.344 |
|
| 2017 |
Maldonis JJ, Hwang J, Voyles PM. FEMSIM + HRMC: Simulation of and structural refinement using fluctuation electron microscopy for amorphous materials Computer Physics Communications. 213: 217-222. DOI: 10.1016/J.Cpc.2016.12.006 |
0.573 |
|
| 2017 |
Zhan X, Zhang P, Voyles PM, Liu X, Akolkar R, Ernst F. Effect of tungsten alloying on short-to-medium-range-order evolution and crystallization behavior of near-eutectic amorphous Ni-P Acta Materialia. 122: 400-411. DOI: 10.1016/J.Actamat.2016.10.002 |
0.356 |
|
| 2017 |
Sun C, Song Z, Rath A, Street M, Echtenkamp W, Feng J, Binek C, Morgan D, Voyles P. Local Dielectric Breakdown Path along c
-Axis Planar Boundaries in Cr2
O3
Thin Films Advanced Materials Interfaces. 4: 1700172. DOI: 10.1002/Admi.201700172 |
0.336 |
|
| 2016 |
Zhang P, He L, Besser MF, Liu Z, Schroers J, Kramer MJ, Voyles PM. Applications and limitations of electron correlation microscopy to study relaxation dynamics in supercooled liquids. Ultramicroscopy. PMID 27638332 DOI: 10.1016/J.Ultramic.2016.09.001 |
0.358 |
|
| 2016 |
Yankovich AB, Zhang C, Oh A, Slater TJ, Azough F, Freer R, Haigh SJ, Willett R, Voyles PM. Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images. Nanotechnology. 27: 364001. PMID 27479946 DOI: 10.1088/0957-4484/27/36/364001 |
0.302 |
|
| 2016 |
Tryputen L, Tu KH, Piotrowski SK, Bapna M, Majetich SA, Sun C, Voyles PM, Almasi H, Wang W, Vargas P, Tresback JS, Ross CA. Patterning of sub-50 nm perpendicular CoFeB/MgO-based magnetic tunnel junctions. Nanotechnology. 27: 185302. PMID 27005330 DOI: 10.1088/0957-4484/27/18/185302 |
0.319 |
|
| 2016 |
Driver MS, Beatty JD, Olanipekun O, Reid K, Rath A, Voyles P, Kelber JA. Atomic Layer Epitaxy of h-BN(0001) multilayers on Co(0001), and Molecular Beam Epitaxy growth of Graphene on h-BN(0001)/Co(0001). Langmuir : the Acs Journal of Surfaces and Colloids. PMID 26940024 DOI: 10.1021/Acs.Langmuir.5B03653 |
0.331 |
|
| 2016 |
Jiang H, He L, Morgan D, Voyles PM, Szlufarska I. Radiation-induced mobility of small defect clusters in covalent materials Physical Review B. 94. DOI: 10.1103/Physrevb.94.024107 |
0.311 |
|
| 2016 |
Maldonis J, Zhang P, He L, Gujral A, Ediger MD, Voyles PM. Fluctuation Electron Microscopy and Computational Structure Refinement for the Structure of Amorphous Materials Microscopy and Microanalysis. 22: 486-487. DOI: 10.1017/S1431927616003287 |
0.338 |
|
| 2016 |
Zhang P, Maldonis JJ, Besser MF, Kramer MJ, Voyles PM. Medium-range structure and glass forming ability in Zr-Cu-Al bulk metallic glasses Acta Materialia. 109: 103-114. DOI: 10.1016/J.Actamat.2016.02.006 |
0.34 |
|
| 2016 |
Quindeau A, Avci CO, Liu W, Sun C, Mann M, Tang AS, Onbasli MC, Bono D, Voyles PM, Xu Y, Robinson J, Beach GSD, Ross CA. Tm3
Fe5
O12
/Pt Heterostructures with Perpendicular Magnetic Anisotropy for Spintronic Applications Advanced Electronic Materials. 3: 1600376. DOI: 10.1002/Aelm.201600376 |
0.301 |
|
| 2015 |
He L, Zhang P, Besser MF, Kramer MJ, Voyles PM. Electron Correlation Microscopy: A New Technique for Studying Local Atom Dynamics Applied to a Supercooled Liquid. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-8. PMID 26036263 DOI: 10.1017/S1431927615000641 |
0.341 |
|
| 2015 |
He L, Gujral A, Ediger MD, Voyles PM. Fluctuation electron microscopy study of medium-range packing order in ultrastable indomethacin glass thin films Materials Research Society Symposium Proceedings. 1757: 32-37. DOI: 10.1557/Opl.2015.48 |
0.402 |
|
| 2015 |
Mevenkamp N, Binev P, Dahmen W, Voyles PM, Yankovich AB, Berkels B. Poisson noise removal from high-resolution STEM images based on periodic block matching Advanced Structural and Chemical Imaging. 1: 3. DOI: 10.1186/S40679-015-0004-8 |
0.347 |
|
| 2015 |
Yankovich AB, Berkels B, Dahmen W, Binev P, Voyles PM. High-precision scanning transmission electron microscopy at coarse pixel sampling for reduced electron dose Advanced Structural and Chemical Imaging. 1. DOI: 10.1186/S40679-015-0003-9 |
0.359 |
|
| 2015 |
Liu H, Kawami T, Moges K, Uemura T, Yamamoto M, Shi F, Voyles PM. Influence of film composition in quaternary Heusler alloy Co2(Mn,Fe)Si thin films on tunnelling magnetoresistance of Co2(Mn,Fe)Si/MgO-based magnetic tunnel junctions Journal of Physics D: Applied Physics. 48: 164001. DOI: 10.1088/0022-3727/48/16/164001 |
0.673 |
|
| 2015 |
Feng J, Kvit AV, Yankovich AB, Zhang C, Morgan D, Voyles PM. Prospects for Detecting Single Vacancies by Quantitative Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 21: 1887-1888. DOI: 10.1017/S1431927615010211 |
0.343 |
|
| 2015 |
Maldonis JJ, Zhang P, Besser M, Kramer M, Voyles PM. Medium-Range Structure of Zr-Cu-Al Bulk Metallic Glasses from Structural Refinement Based on Fluctuation Microscopy Microscopy and Microanalysis. 21: 1659-1660. DOI: 10.1017/S1431927615009071 |
0.319 |
|
| 2015 |
Wang X, Jamison L, Sridharan K, Morgan D, Voyles PM, Szlufarska I. Evidence for cascade overlap and grain boundary enhanced amorphization in silicon carbide irradiated with Kr ions Acta Materialia. 99: 7-15. DOI: 10.1016/J.Actamat.2015.07.070 |
0.303 |
|
| 2014 |
Yankovich AB, Berkels B, Dahmen W, Binev P, Sanchez SI, Bradley SA, Li A, Szlufarska I, Voyles PM. Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts. Nature Communications. 5: 4155. PMID 24916914 DOI: 10.1038/Ncomms5155 |
0.377 |
|
| 2014 |
Yankovich AB, Kvit AV, Li X, Zhang F, Avrutin V, Liu H, Izyumskaya N, Özgür Ü, Van Leer B, Morkoç H, Voyles PM. Thickness variations and absence of lateral compositional fluctuations in aberration-corrected STEM images of InGaN LED active regions at low dose. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20: 864-8. PMID 24667066 DOI: 10.1017/S1431927614000427 |
0.356 |
|
| 2014 |
Zhang P, Besser MF, Kramer MJ, Voyles PM. Medium-range Order of Zr<inf>54</inf>Cu<inf>38</inf>Al<inf>8</inf> Bulk Metallic Glass International Journal of Astrobiology. 1649. DOI: 10.1557/Opl.2014.95 |
0.343 |
|
| 2014 |
Li G, Honda Y, Liu H, Matsuda K, Arita M, Uemura T, Yamamoto M, Miura Y, Shirai M, Saito T, Shi F, Voyles PM. Effect of nonstoichiometry on the half-metallic character of Co2MnSi investigated through saturation magnetization and tunneling magnetoresistance ratio Physical Review B. 89. DOI: 10.1103/Physrevb.89.014428 |
0.642 |
|
| 2014 |
Alba-Rubio AC, O'Neill BJ, Shi F, Akatay C, Canlas C, Li T, Winans R, Elam JW, Stach EA, Voyles PM, Dumesic JA. Pore structure and bifunctional catalyst activity of overlayers applied by atomic layer deposition on copper nanoparticles Acs Catalysis. 4: 1554-1557. DOI: 10.1021/Cs500330P |
0.696 |
|
| 2014 |
He L, Zhai Y, Liu C, Jiang C, Szlufarska I, Tyburska-Puschel B, Sridharan K, Voyles P. High-Resolution Scanning Transmission Electron Microscopy Study of Black Spot Defects in Ion Irradiated Silicon Carbide Microscopy and Microanalysis. 20: 1824-1825. DOI: 10.1017/S143192761401085X |
0.336 |
|
| 2013 |
O'Neill BJ, Jackson DH, Crisci AJ, Farberow CA, Shi F, Alba-Rubio AC, Lu J, Dietrich PJ, Gu X, Marshall CL, Stair PC, Elam JW, Miller JT, Ribeiro FH, Voyles PM, et al. Stabilization of copper catalysts for liquid-phase reactions by atomic layer deposition. Angewandte Chemie (International Ed. in English). 52: 13808-12. PMID 24282166 DOI: 10.1002/Anie.201308245 |
0.672 |
|
| 2013 |
Krystofiak ES, Mattson EC, Voyles PM, Hirschmugl CJ, Albrecht RM, Gajdardziska-Josifovska M, Oliver JA. Multiple morphologies of gold-magnetite heterostructure nanoparticles are effectively functionalized with protein for cell targeting. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 19: 821-34. PMID 23745591 DOI: 10.1017/S1431927613001700 |
0.327 |
|
| 2013 |
Zhou H, Seo JH, Paskiewicz DM, Zhu Y, Celler GK, Voyles PM, Zhou W, Lagally MG, Ma Z. Fast flexible electronics with strained silicon nanomembranes. Scientific Reports. 3: 1291. PMID 23416347 DOI: 10.1038/Srep01291 |
0.326 |
|
| 2013 |
Schweiss DT, Hwang J, Voyles PM. Inelastic and elastic mean free paths from FIB samples of metallic glasses. Ultramicroscopy. 124: 6-12. PMID 23154031 DOI: 10.1016/J.Ultramic.2012.08.005 |
0.575 |
|
| 2013 |
Melgarejo ZH, Jakes JE, Hwang J, Kalay YE, Kramer MJ, Voyles PM, Stone DS. Variation of hardness and modulus across the thickness of Zr-Cu-Al metallic glass ribbons Materials Research Society Symposium Proceedings. 1520: 7-12. DOI: 10.1557/Opl.2012.1690 |
0.576 |
|
| 2013 |
Yankovich A, Berkels B, Dahmen W, Sharpley R, Binev P, Voyles P. Measuring Surface Atom Bond Length Contraction in Au and Pt Nanoparticles Using High-Precision STEM Imaging Microscopy and Microanalysis. 19: 1688-1689. DOI: 10.1017/S143192761301043X |
0.31 |
|
| 2013 |
Hwang J, Melgarejo Z, Kalay Y, Kramer M, Stone D, Voyles P. Computational Structure Refinement by Hybrid Reverse Monte Carlo Simulation Incorporating Fluctuation Electron Microscopy Microscopy and Microanalysis. 19: 794-795. DOI: 10.1017/S1431927613005965 |
0.58 |
|
| 2013 |
Shi F, Liu H, Yamamoto M, Voyles P. MnMn/O Interface Termination at the Co2MnαSi/MgO Interface in Magnetic Tunnel Junctions Investigated by Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 19: 336-337. DOI: 10.1017/S143192761300367X |
0.689 |
|
| 2013 |
Xiang H, Shi FY, Rzchowski MS, Voyles PM, Chang YA. Reactive sputtering of (Co,Fe) nitride thin films on TiN-bufferd Si Applied Physics a: Materials Science and Processing. 110: 487-492. DOI: 10.1007/S00339-012-7251-5 |
0.672 |
|
| 2013 |
O'Neill BJ, Jackson DHK, Crisci AJ, Farberow CA, Shi F, Alba-Rubio AC, Lu J, Dietrich PJ, Gu X, Marshall CL, Stair PC, Elam JW, Miller JT, Ribeiro FH, Voyles PM, et al. Back Cover: Stabilization of Copper Catalysts for Liquid-Phase Reactions by Atomic Layer Deposition (Angew. Chem. Int. Ed. 51/2013) Angewandte Chemie International Edition. 52: 13824-13824. DOI: 10.1002/Anie.201309934 |
0.652 |
|
| 2013 |
O'Neill BJ, Jackson DHK, Crisci AJ, Farberow CA, Shi F, Alba-Rubio AC, Lu J, Dietrich PJ, Gu X, Marshall CL, Stair PC, Elam JW, Miller JT, Ribeiro FH, Voyles PM, et al. Rücktitelbild: Stabilization of Copper Catalysts for Liquid-Phase Reactions by Atomic Layer Deposition (Angew. Chem. 51/2013) Angewandte Chemie. 125: 14068-14068. DOI: 10.1002/Ange.201309934 |
0.651 |
|
| 2012 |
Hwang J, Melgarejo ZH, Kalay YE, Kalay I, Kramer MJ, Stone DS, Voyles PM. Nanoscale structure and structural relaxation in Zr50Cu45Al5 bulk metallic glass. Physical Review Letters. 108: 195505. PMID 23003058 DOI: 10.1103/Physrevlett.108.195505 |
0.575 |
|
| 2012 |
Yankovich AB, Kvit AV, Li X, Zhang F, Avrutin V, Liu H, Izyumskaya N, Özgür Ü, Morkoç H, Voyles PM. Absence of Lateral Composition Fluctuations in Aberration-corrected STEM Images of an InGaN Quantum Well at Low Dose Mrs Proceedings. 1432. DOI: 10.1557/Opl.2012.906 |
0.35 |
|
| 2012 |
Shi F, Xiang H, Rzchowski MS, Chang YA, Voyles PM. High-quality, smooth Fe3O4 thin films on Si by controlled oxidation of Fe in CO/CO2 Materials Research Society Symposium Proceedings. 1430: 61-66. DOI: 10.1557/Opl.2012.899 |
0.701 |
|
| 2012 |
Yankovich AB, Kvit AV, Liu HY, Li X, Zhang F, Avrutin V, Izyumskaya N, Özgür Ü, Morkoc H, Voyles PM. Pyramid nano-voids in GaN and InGaN Proceedings of Spie. 8262: 826205. DOI: 10.1117/12.912097 |
0.376 |
|
| 2012 |
Liu HY, Li X, Zhang F, Avrutin V, Izyumskaya N, Özgür Ü, Yankovich AB, Kvit AV, Voyles PM, Morkoç H. Electrical properties of ZnO:Ga as a transparent conducting oxide in InGaN based light emitting diodes Proceedings of Spie. 8262: 826226. DOI: 10.1117/12.903930 |
0.34 |
|
| 2012 |
Kvit AV, Yankovich AB, Avrutin V, Liu H, Izyumskaya N, Özgür Ü, Morkoç H, Voyles PM. Impurity distribution and microstructure of Ga-doped ZnO films grown by molecular beam epitaxy Journal of Applied Physics. 112: 123527. DOI: 10.1063/1.4769801 |
0.341 |
|
| 2012 |
Liu HY, Izyumskaya N, Avrutin V, Özgür Ü, Yankovich AB, Kvit AV, Voyles PM, Morkoç H. Donor behavior of Sb in ZnO Journal of Applied Physics. 112: 033706. DOI: 10.1063/1.4742984 |
0.328 |
|
| 2012 |
Liu HY, Avrutin V, Izyumskaya N, Özgür Ü, Yankovich AB, Kvit AV, Voyles PM, Morkoç H. Electron scattering mechanisms in GZO films grown on a-sapphire substrates by plasma-enhanced molecular beam epitaxy Journal of Applied Physics. 111: 103713. DOI: 10.1063/1.4720456 |
0.337 |
|
| 2012 |
Yankovich AB, Kvit AV, Li X, Zhang F, Avrutin V, Liu HY, Izyumskaya N, Özgür Ü, Morkoç H, Voyles PM. Hexagonal-based pyramid void defects in GaN and InGaN Journal of Applied Physics. 111: 023517. DOI: 10.1063/1.3679540 |
0.35 |
|
| 2012 |
Mattson E, Gajdardziska-Josifovska M, Voyles P, Krystofiak E, Oliver J. Understanding Gold Growth on Magnetite Nanoparticles using Probe-Corrected Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 18: 358-359. DOI: 10.1017/S1431927612003649 |
0.332 |
|
| 2012 |
Shi F, Xiang H, Chang Y, Voyles P, Rzchowski M. STEM and STEM EELS Characterization of Low Defect Density, Smooth Fe3O4 Thin Films on Buffered Si by Kinetically Controlled Selective Oxidation Microscopy and Microanalysis. 18: 322-323. DOI: 10.1017/S1431927612003467 |
0.674 |
|
| 2012 |
Berkels B, Sharpley R, Binev P, Yankovich A, Shi F, Voyles P, Dahmen W. High Precision STEM Imaging by Non-Rigid Alignment and Averaging of a Series of Short Exposures Microscopy and Microanalysis. 18: 300-301. DOI: 10.1017/S1431927612003352 |
0.652 |
|
| 2012 |
Shi F, Xiang H, Yang JJ, Rzchowski MS, Chang YA, Voyles PM. Inverse TMR in a nominally symmetric CoFe/AlO x/CoFe junction induced by interfacial Fe 3O 4 investigated by STEM-EELS Journal of Magnetism and Magnetic Materials. 324: 1837-1844. DOI: 10.1016/J.Jmmm.2012.01.012 |
0.661 |
|
| 2012 |
Kalay YE, Kalay I, Hwang J, Voyles PM, Kramer MJ. Local chemical and topological order in Al-Tb and its role in controlling nanocrystal formation Acta Materialia. 60: 994-1003. DOI: 10.1016/J.Actamat.2011.11.008 |
0.581 |
|
| 2012 |
Reyes-Luyanda D, Flores-Cruz J, Morales-Pérez PJ, Encarnación-Gómez LG, Shi F, Voyles PM, Cardona-Martínez N. Bifunctional materials for the catalytic conversion of cellulose into soluble renewable biorefinery feedstocks Topics in Catalysis. 55: 148-161. DOI: 10.1007/S11244-012-9791-5 |
0.636 |
|
| 2012 |
Bradley SA, Sinkler W, Blom DA, Bigelow W, Voyles PM, Allard LF. Behavior of Pt atoms on oxide supports during reduction treatments at elevated temperatures, characterized by aberration corrected stem imaging Catalysis Letters. 142: 176-182. DOI: 10.1007/S10562-011-0756-2 |
0.308 |
|
| 2012 |
Voyles P, Hwang J. Fluctuation Electron Microscopy Characterization of Materials. 1-7. DOI: 10.1002/0471266965.Com138 |
0.627 |
|
| 2011 |
Hwang J, Voyles PM. Variable resolution fluctuation electron microscopy on Cu-Zr metallic glass using a wide range of coherent STEM probe size. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 17: 67-74. PMID 21122191 DOI: 10.1017/S1431927610094109 |
0.622 |
|
| 2011 |
Yankovich AB, Kvit AV, Li X, Zhang F, Avrutin V, Liu HY, Izyumskaya N, Özgür Ü, Morkoç H, Voyles PM. Vertical composition variation in nominally uniform InGaN layers revealed by aberration-corrected STEM imaging Proceedings of Spie. 7939. DOI: 10.1117/12.889392 |
0.348 |
|
| 2011 |
Chen K, Zhuang CG, Li Q, Weng X, Redwing JM, Zhu Y, Voyles PM, Xi XX. MgB2/MgO/MgB2 josephson junctions for high-speed circuits Ieee Transactions On Applied Superconductivity. 21: 115-118. DOI: 10.1109/Tasc.2010.2093853 |
0.317 |
|
| 2011 |
Dai W, Ferrando V, Pogrebnyakov AV, Wilke RHT, Chen K, Weng X, Redwing J, Bark CW, Eom CB, Zhu Y, Voyles PM, Rickel D, Betts JB, Mielke CH, Gurevich A, et al. High-field properties of carbon-doped MgB2 thin films by hybrid physical-chemical vapor deposition using different carbon sources Superconductor Science and Technology. 24. DOI: 10.1088/0953-2048/24/12/125014 |
0.301 |
|
| 2011 |
Xiang H, Shi FY, Rzchowski MS, Voyles PM, Chang YA. Epitaxial growth and thermal stability of Fe 4N film on TiN buffered Si(001) substrate Journal of Applied Physics. 109. DOI: 10.1063/1.3556919 |
0.661 |
|
| 2011 |
Yankovich A, Kvit A, Li X, Zhang F, Avrutin V, Liu H, Izyumskaya N, Özgür Ü, Morkoc H, Voyles P. Indium Composition Variation in Nominally Uniform InGaN Layers Discovered by Aberration-Corrected Z-contrast STEM Microscopy and Microanalysis. 17: 1386-1387. DOI: 10.1017/S143192761100780X |
0.303 |
|
| 2011 |
Hwang J, Kalay Y, Kramer M, Voyles P. Angular Correlations in Coherent Electron Nanodiffraction of a Metallic Glass Microscopy and Microanalysis. 17: 1110-1111. DOI: 10.1017/S1431927611006428 |
0.588 |
|
| 2011 |
Xiang H, Shi FY, Zhang C, Rzchowski MS, Voyles PM, Chang YA. Synthesis of Fe3O4 thin films by selective oxidation with controlled oxygen chemical potential Scripta Materialia. 65: 739-742. DOI: 10.1016/J.Scriptamat.2011.07.026 |
0.669 |
|
| 2010 |
Yi F, Tiemeijer P, Voyles PM. Flexible formation of coherent probes on an aberration-corrected STEM with three condensers. Journal of Electron Microscopy. 59: S15-21. PMID 20610414 DOI: 10.1093/Jmicro/Dfq052 |
0.332 |
|
| 2010 |
Zhu Y, Pogrebnyakov AV, Wilke RH, Chen K, Xi XX, Redwing JM, Zhuang CG, Feng QR, Gan ZZ, Singh RK, Shen Y, Newman N, Rowell JM, Hunte F, Jaroszynski J, ... ... Voyles PM, et al. Nanoscale disorder in pure and doped MgB2 thin films Superconductor Science and Technology. 23. DOI: 10.1088/0953-2048/23/9/095008 |
0.324 |
|
| 2010 |
Xiang H, Shi F, Rzchowski MS, Voyles PM, Chang YA. Epitaxial growth and magnetic properties of Fe3 O4 films on TiN buffered Si(001), Si(110), and Si(111) substrates Applied Physics Letters. 97. DOI: 10.1063/1.3484278 |
0.675 |
|
| 2010 |
Yi F, Hwang J, Imhoff S, Perepezko J, Voyles P. STEM Fluctuation Microscopy Characterization of an Amorphous – Protocrystalline Metal Glass Nanocomposite Microscopy and Microanalysis. 16: 1644-1645. DOI: 10.1017/S1431927610056618 |
0.588 |
|
| 2010 |
Bogle SN, Nittala LN, Twesten RD, Voyles PM, Abelson JR. Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy Ultramicroscopy. 110: 1273-1278. DOI: 10.1016/J.Ultramic.2010.05.001 |
0.402 |
|
| 2009 |
Avrutin V, Liu H, Izyumskaya N, Reshchikov MA, Özgür Ü, Kvit A, Voyles P, Morkoç H. Effect of Growth Conditions on Structural and Electrical Properties of Ga-doped ZnO Films Grown by Plasma-assisted MBE Mrs Proceedings. 1201. DOI: 10.1557/Proc-1201-H05-20 |
0.318 |
|
| 2009 |
Hwang J, Clausen AM, Cao H, Voyles PM. Reverse monte carlo structural model for a zirconium-based metallic glass incorporating fluctuation microscopy medium-range order data Journal of Materials Research. 24: 3121-3129. DOI: 10.1557/Jmr.2009.0386 |
0.594 |
|
| 2009 |
Zhu Y, Hunte F, Zhuang CG, Feng QR, Gan ZZ, Xi XX, Larbalestier DC, Voyles PM. MgO platelets and high critical field in MgB2 thin films doped with carbon from methane Superconductor Science and Technology. 22. DOI: 10.1088/0953-2048/22/12/125001 |
0.306 |
|
| 2009 |
Voyles PM. The Electron Microscopy Database: an Online Resource for Teaching and Learning Quantitative Transmission Electron Microscopy Microscopy Today. 17: 26-27. DOI: 10.1017/S1551929500054973 |
0.31 |
|
| 2009 |
Hwang J, Voyles P. Nanometer Scale Atomic Order in a Bulk Metallic Glass from Fluctuation Microscopy Microscopy and Microanalysis. 15: 770-771. DOI: 10.1017/S1431927609095373 |
0.604 |
|
| 2008 |
Stratton WG, Voyles PM. A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous composite. Ultramicroscopy. 108: 727-36. PMID 18155358 DOI: 10.1016/J.Ultramic.2007.11.004 |
0.773 |
|
| 2008 |
Pallecchi I, Ferrando V, Tarantini C, Putti M, Ferdeghini C, Zhu Y, Voyles PM, Xi XX. Increased in-field critical current density in neutron-irradiated MgB2films Superconductor Science and Technology. 22: 015023. DOI: 10.1088/0953-2048/22/1/015023 |
0.311 |
|
| 2008 |
Cedeño-Mattei Y, Perales-Perez O, Tomar MS, Roman F, Voyles PM, Stratton WG. Tuning of magnetic properties in cobalt ferrite nanocrystals Journal of Applied Physics. 103: 07E512. DOI: 10.1063/1.2838215 |
0.77 |
|
| 2008 |
Parra-Palomino A, Perales–Perez O, Singhal R, Tomar M, Hwang J, Voyles PM. Structural, optical, and magnetic characterization of monodisperse Fe-doped ZnO nanocrystals Journal of Applied Physics. 103: 07D121. DOI: 10.1063/1.2834705 |
0.603 |
|
| 2008 |
Yi F, Stratton W, Voyles P. Model of Fluctuation Electron Microscopy for a Nanocrystal /Amorphous Composite Microscopy and Microanalysis. 14: 914-915. DOI: 10.1017/S1431927608086133 |
0.776 |
|
| 2008 |
Voyles P. The Electron Microscopy Database: Example Data Sets for Teaching and Learning Quantitative TEM Microscopy and Microanalysis. 14: 82-83. DOI: 10.1017/S1431927608085991 |
0.305 |
|
| 2007 |
Hwang J, Cao H, Voyles PM. Nanometer-scale Structural Relaxation in Zr-based Bulk Metallic Glass Mrs Proceedings. 1048. DOI: 10.1557/Proc-1048-Z05-04 |
0.609 |
|
| 2007 |
Puthoff JB, Stone DS, Cao H, Voyles PM. Change in Activation Volume for Plastic Deformation of Zr-based Bulk Metallic Glass following Annealing Mrs Proceedings. 1048. DOI: 10.1557/Proc-1048-Z03-08 |
0.301 |
|
| 2007 |
Perales-Perez O, Parra-Palomino A, Singhal R, Voyles PM, Zhu Y, Jia W, Tomar MS. Evidence of ferromagnetism in Zn1−xMxO (M = Ni,Cu) nanocrystals for spintronics Nanotechnology. 18: 315606. DOI: 10.1088/0957-4484/18/31/315606 |
0.327 |
|
| 2007 |
Bogle SN, Voyles PM, Khare SV, Abelson JR. Quantifying nanoscale order in amorphous materials: Simulating fluctuation electron microscopy of amorphous silicon Journal of Physics Condensed Matter. 19. DOI: 10.1088/0953-8984/19/45/455204 |
0.361 |
|
| 2007 |
Stratton WG, Voyles PM. Comparison of fluctuation electron microscopy theories and experimental methods Journal of Physics: Condensed Matter. 19: 455203. DOI: 10.1088/0953-8984/19/45/455203 |
0.781 |
|
| 2007 |
Abelson J, Drabold D, Elliot S, Voyles P. Proceedings of the International Conference on Nanoscale Order in Amorphous and Partially Ordered Solids, Trinity College, Cambridge, UK, July 9–11, 2007 Journal of Physics: Condensed Matter. 19: 450301. DOI: 10.1088/0953-8984/19/45/450301 |
0.318 |
|
| 2007 |
Senkowicz BJ, Polyanskii A, Mungall RJ, Zhu Y, Giencke JE, Voyles PM, Eom CB, Hellstrom EE, Larbalestier DC. Understanding the route to high critical current density in mechanically alloyed Mg(B1-xCx)2 Superconductor Science and Technology. 20: 650-657. DOI: 10.1088/0953-2048/20/7/011 |
0.302 |
|
| 2007 |
Zhu Y, Larbalestier DC, Voyles PM, Pogrebnyakov AV, Xi XX, Redwing JM. Nanoscale disorder in high critical field, carbon-doped MgB2 hybrid physical-chemical vapor deposition thin films Applied Physics Letters. 91. DOI: 10.1063/1.2775088 |
0.334 |
|
| 2007 |
Zhu Y, Matsumoto A, Senkowicz BJ, Kumakura H, Kitaguchi H, Jewell MC, Hellstrom EE, Larbalestier DC, Voyles PM. Microstructures of SiC nanoparticle-doped Mg B2 Fe tapes Journal of Applied Physics. 102. DOI: 10.1063/1.2750409 |
0.341 |
|
| 2007 |
Voyles P, Yang J, Zuo J, Stemmer S. The Electron Microscopy Database: A Resource for Teaching and Learning Quantitative Methods in Electron Microscopy and Spectroscopy Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607074156 |
0.315 |
|
| 2006 |
Einspahr JJ, Voyles PM. Prospects for 3D, nanometer-resolution imaging by confocal STEM. Ultramicroscopy. 106: 1041-52. PMID 16916585 DOI: 10.1016/J.Ultramic.2006.04.018 |
0.304 |
|
| 2006 |
Kisa M, Li L, Yang J, Minton TK, Stratton WG, Voyles P, Chen X, Van Benthem K, Pennycook SJ. Homogeneous silica formed by the oxidation of Si(100) in hyperthermal atomic oxygen Journal of Spacecraft and Rockets. 43: 431-435. DOI: 10.2514/1.17323 |
0.775 |
|
| 2006 |
Stratton W, Hamann J, Perepezko J, Voyles P. Electron beam induced crystallization of amorphous Al-based alloys in the TEM Intermetallics. 14: 1061-1065. DOI: 10.1016/J.Intermet.2006.01.025 |
0.773 |
|
| 2006 |
Cao H, Ma D, Hsieh K, Ding L, Stratton WG, Voyles PM, Pan Y, Cai M, Dickinson JT, Chang YA. Computational thermodynamics to identify Zr–Ti–Ni–Cu–Al alloys with high glass-forming ability Acta Materialia. 54: 2975-2982. DOI: 10.1016/J.Actamat.2006.02.051 |
0.759 |
|
| 2006 |
Voyles PM. Imaging Single Atoms with Z-Contrast Scanning Transmission Electron Microscopy in Two and Three Dimensions Microchimica Acta. 155: 5-10. DOI: 10.1007/S00604-006-0500-6 |
0.324 |
|
| 2005 |
Stratton WG, Hamann J, Perepezko JH, Voyles PM, Mao X, Khare SV. Aluminum nanoscale order in amorphous Al92 Sm8 measured by fluctuation electron microscopy Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1897830 |
0.763 |
|
| 2005 |
Nittala LN, Twesten RD, Voyles PM, Abelson JR. Measuring the Characteristic Length Scale of Medium Range Order in Amorphous Silicon Using Variable Resolution Fluctuation Electron Microscopy Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605506779 |
0.363 |
|
| 2005 |
Kisa M, Stratton WG, Minton TK, Van Benthem K, Pennycook SJ, Voyles PM, Chen X, Li L, Yang JC. Increased ordering in the amorphous SiO x due to hyperthermal atomic oxygen Materials Research Society Symposium Proceedings. 851: 419-424. |
0.752 |
|
| 2004 |
Voyles PM, Muller DA, Kirkland EJ. Depth-dependent imaging of individual dopant atoms in silicon. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 10: 291-300. PMID 15306055 DOI: 10.1017/S1431927604040012 |
0.357 |
|
| 2004 |
Kisa M, Stratton WG, Minton TK, Benthem Kv, Pennycook SJ, Voyles PM, Chen X, Li L, Yang JC. Increased Ordering in the Amorphous SiO x due to Hyperthermal Atomic Oxygen. Mrs Proceedings. 851. DOI: 10.1557/Proc-851-Nn9.5 |
0.762 |
|
| 2004 |
Stratton WG, Voyles PM, Hamann J, Perepezko JH. Medium-range order in high al-content amorphous alloys measured by fluctuation electron microscopy Microscopy and Microanalysis. 10: 788-789. DOI: 10.1557/Proc-806-Mm9.4 |
0.779 |
|
| 2004 |
Khare SV, Nakhmanson SM, Voyles PM, Keblinski P, Abelson JR. Evidence from atomistic simulations of fluctuation electron microscopy for preferred local orientations in amorphous silicon Applied Physics Letters. 85: 745-747. DOI: 10.1063/1.1776614 |
0.328 |
|
| 2004 |
Khare SV, Nakhmanson SM, Voyles PM, Keblinski P, Abelson JR. Evidence from simulations for orientational medium range order in fluctuation-electron-microscopy observations of a-Si Microscopy and Microanalysis. 10: 820-821. DOI: 10.1017/S1431927604880863 |
0.35 |
|
| 2003 |
Voyles PM, Chadi DJ, Citrin PH, Muller DA, Grazul JL, Northrup PA, Gossmann HJ. Evidence for a new class of defects in highly n-doped Si: donor-pair-vacancy-interstitial complexes. Physical Review Letters. 91: 125505. PMID 14525374 DOI: 10.1103/Physrevlett.91.125505 |
0.327 |
|
| 2003 |
Voyles PM, Grazul JL, Muller DA. Imaging individual atoms inside crystals with ADF-STEM. Ultramicroscopy. 96: 251-73. PMID 12871793 DOI: 10.1016/S0304-3991(03)00092-5 |
0.322 |
|
| 2003 |
Castell MR, Muller DA, Voyles PM. Dopant mapping for the nanotechnology age. Nature Materials. 2: 129-31. PMID 12612660 DOI: 10.1038/Nmat840 |
0.312 |
|
| 2003 |
Dash RK, Voyles PM, Gibson JM, Treacy MMJ, Keblinski P. A quantitative measure of medium-range order in amorphous materials from transmission electron micrographs Journal of Physics Condensed Matter. 15. DOI: 10.1088/0953-8984/15/31/317 |
0.395 |
|
| 2003 |
Gerbi JE, Voyles PM, Treacy MMJ, Gibson JM, Abelson JR. Increasing medium-range order in amorphous silicon with low-energy ion bombardment Applied Physics Letters. 82: 3665-3667. DOI: 10.1063/1.1578164 |
0.325 |
|
| 2003 |
Ho MY, Gong H, Wilk GD, Busch BW, Green ML, Voyles PM, Muller DA, Bude M, Lin WH, See A, Loomans ME, Lahiri SK, Räisänen PI. Morphology and crystallization kinetics in HfO2 thin films grown by atomic layer deposition Journal of Applied Physics. 93: 1477-1481. DOI: 10.1063/1.1534381 |
0.336 |
|
| 2003 |
Voyles PM, Abelson JR. Medium-range order in amorphous silicon measured by fluctuation electron microscopy Solar Energy Materials and Solar Cells. 78: 85-113. DOI: 10.1016/S0927-0248(02)00434-8 |
0.393 |
|
| 2003 |
Citrin PH, Voyles PM, Chadi DJ, Muller DA. A new class of defects in highly n-doped silicon Physica B-Condensed Matter. 340: 784-789. DOI: 10.1016/J.Physb.2003.09.190 |
0.332 |
|
| 2002 |
Voyles PM, Muller DA. Fluctuation microscopy in the STEM. Ultramicroscopy. 93: 147-59. PMID 12425592 DOI: 10.1017/S1431927600027203 |
0.378 |
|
| 2002 |
Voyles PM, Muller DA, Grazul JL, Citrin PH, Gossmann HJ. Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si. Nature. 416: 826-9. PMID 11976677 DOI: 10.1038/416826A |
0.334 |
|
| 2002 |
Voyles PM, Muller DA, Grazul JL, Citrin PH, Gossmann HL. Imaging Single Dopant Atoms and Nanoclusters in Highly n-type Bulk Si Microscopy and Microanalysis. 8: 1614-1615. DOI: 10.1017/S143192760210465X |
0.311 |
|
| 2001 |
Voyles PM, Gerbi JE, Treacy MM, Gibson JM, Abelson JR. Absence of an abrupt phase change from polycrystalline to amorphous in silicon with deposition temperature. Physical Review Letters. 86: 5514-7. PMID 11415289 DOI: 10.1103/Physrevlett.86.5514 |
0.369 |
|
| 2001 |
Nakhmanson SM, Mousseau N, Barkema GT, Voyles PM, Drabold DA. Models of paracrystalline silicon with a defect-free bandgap International Journal of Modern Physics B. 15: 3253-3257. DOI: 10.1142/S0217979201007580 |
0.348 |
|
| 2001 |
Nakhmanson SM, Voyles PM, Mousseau N, Barkema GT, Drabold DA. Realistic models of paracrystalline silicon Physical Review B - Condensed Matter and Materials Physics. 63: 2352071-2352076. DOI: 10.1103/Physrevb.63.235207 |
0.337 |
|
| 2001 |
Voyles PM, Zotov N, Nakhmanson SM, Drabold DA, Gibson JM, Treacy MMJ, Keblinski P. Structure and physical properties of paracrystailine atomistic models of amorphous silicon Journal of Applied Physics. 90: 4437-4451. DOI: 10.1063/1.1407319 |
0.332 |
|
| 2001 |
Voyles PM, Gerbi JE, Treacy M, Gibson JM, Abelson JR. Increased medium-range order in amorphous silicon with increased substrate temperature Journal of Non-Crystalline Solids. 45-52. DOI: 10.1016/S0022-3093(01)00652-4 |
0.372 |
|
| 2000 |
Chen X, Gibson JM, Sullivan J, Friedmann T, Voyles P. Fluctuation Microscopy Studies of Medium-range Order Structures in Amorphous Tetrahedral Semiconductors Mrs Proceedings. 638. DOI: 10.1557/Proc-638-F14.40.1 |
0.365 |
|
| 2000 |
Voyles PM, Treacy MMJ, Gibson JM. Thermodynamics of Paracrystalline Silicon Mrs Proceedings. 616. DOI: 10.1557/Proc-616-47 |
0.322 |
|
| 2000 |
Voyles PM, Treacy MMJ, Jin H, Abelson JR, Gibson JM, Yang J, Guha S, Crandall RS. Comparative Fluctuation Microscopy Study of Medium-Range Order in Hydrogenated Amorphous Silicon Deposited by Various Methods Mrs Proceedings. 609. DOI: 10.1557/Proc-609-A2.4 |
0.362 |
|
| 1999 |
Cheng J, Gibson JM, Voyles PM, Treacy MMJ, Jacobson DC. Ion-Implanted Amorphous Silicon Studied by Variable Coherence TEM Mrs Proceedings. 589. DOI: 10.1557/Proc-589-247 |
0.303 |
|
| 1999 |
Voyles PM, Treacy MMJ, Gibson JM, Jin H, Abelson JR. Experimental Methods and Data Analysis for Fluctuation Microscopy Mrs Proceedings. 589. DOI: 10.1557/Proc-589-155 |
0.359 |
|
| 1999 |
Iwai T, Voyles PM, Gibson JM, Oono Y. Method for detecting subtle spatial structures by fluctuation microscopy Physical Review B - Condensed Matter and Materials Physics. 60: 191-200. DOI: 10.1103/Physrevb.60.191 |
0.312 |
|
| 1998 |
Gibson JM, Treacy MMJ, Voyles PM, Abelson JR, Jin H. Changes in the Medium Range Order of α-Si:H Thin Films Observed by Variable Coherence Tem Mrs Proceedings. 507. DOI: 10.1557/Proc-507-837 |
0.354 |
|
| 1998 |
Gibson JM, Treacy MMJ, Voyles PM, Jin H, Abelson JR. Structural disorder induced in hydrogenated amorphous silicon by light soaking Applied Physics Letters. 73: 3093-3095. DOI: 10.1063/1.122683 |
0.343 |
|
| 1998 |
Gibson JM, Treacy MMJ, Voyles PM. Fluctuation Microscopy: A New Class of Microscopy Techniques for Probing Medium Range Order in Amorphous Materials Microscopy and Microanalysis. 4: 702-703. DOI: 10.1017/S1431927600023631 |
0.324 |
|
| Show low-probability matches. |