Paul M. Voyles - Publications

Affiliations: 
University of Wisconsin, Madison, Madison, WI 
Area:
Materials Science Engineering

61 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2017 Zhan X, Zhang P, Voyles PM, Liu X, Akolkar R, Ernst F. Effect of tungsten alloying on short-to-medium-range-order evolution and crystallization behavior of near-eutectic amorphous Ni-P Acta Materialia. 122: 400-411. DOI: 10.1016/j.actamat.2016.10.002  0.76
2016 Zhang P, Wang Z, Perepezko JH, Voyles PM. Elastic and inelastic mean free paths of 200keV electrons in metallic glasses. Ultramicroscopy. 171: 89-95. PMID 27649098 DOI: 10.1016/j.ultramic.2016.09.005  0.76
2016 Zhang P, He L, Besser MF, Liu Z, Schroers J, Kramer MJ, Voyles PM. Applications and limitations of electron correlation microscopy to study relaxation dynamics in supercooled liquids. Ultramicroscopy. PMID 27638332 DOI: 10.1016/j.ultramic.2016.09.001  0.4
2016 Yu M, Yankovich AB, Kaczmarowski A, Morgan D, Voyles PM. Integrated Computational and Experimental Structure Refinement for Nanoparticles. Acs Nano. PMID 27063615 DOI: 10.1021/acsnano.5b05722  0.76
2016 Tryputen L, Tu KH, Piotrowski SK, Bapna M, Majetich SA, Sun C, Voyles PM, Almasi H, Wang W, Vargas P, Tresback JS, Ross CA. Patterning of sub-50 nm perpendicular CoFeB/MgO-based magnetic tunnel junctions. Nanotechnology. 27: 185302. PMID 27005330 DOI: 10.1088/0957-4484/27/18/185302  0.76
2016 Driver MS, Beatty JD, Olanipekun O, Reid K, Rath A, Voyles P, Kelber JA. Atomic Layer Epitaxy of h-BN(0001) multilayers on Co(0001), and Molecular Beam Epitaxy growth of Graphene on h-BN(0001)/Co(0001). Langmuir : the Acs Journal of Surfaces and Colloids. PMID 26940024 DOI: 10.1021/acs.langmuir.5b03653  0.76
2016 Ho P, Tu KH, Zhang J, Sun C, Chen J, Liontos G, Ntetsikas K, Avgeropoulos A, Voyles PM, Ross CA. Domain configurations in Co/Pd and L10-FePt nanowire arrays with perpendicular magnetic anisotropy. Nanoscale. PMID 26883011 DOI: 10.1039/c5nr08865h  0.76
2016 Tyburska-Püschel B, Zhai Y, He L, Liu C, Boulle A, Voyles PM, Szlufarska I, Sridharan K. Size distribution of black spot defects and their contribution to swelling in irradiated SiC Journal of Nuclear Materials. 476: 132-139. DOI: 10.1016/j.jnucmat.2016.04.044  0.76
2016 Zhang P, Maldonis JJ, Besser MF, Kramer MJ, Voyles PM. Medium-range structure and glass forming ability in Zr-Cu-Al bulk metallic glasses Acta Materialia. 109: 103-114. DOI: 10.1016/j.actamat.2016.02.006  0.76
2015 He L, Zhang P, Besser MF, Kramer MJ, Voyles PM. Electron Correlation Microscopy: A New Technique for Studying Local Atom Dynamics Applied to a Supercooled Liquid. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-8. PMID 26036263 DOI: 10.1017/S1431927615000641  0.4
2015 He L, Gujral A, Ediger MD, Voyles PM. Fluctuation electron microscopy study of medium-range packing order in ultrastable indomethacin glass thin films Materials Research Society Symposium Proceedings. 1757: 32-37. DOI: 10.1557/opl.2015.48  0.76
2015 Schroeder DP, Aksamija Z, Rath A, Voyles PM, Lagally MG, Eriksson MA. Thermal Resistance of Transferred-Silicon-Nanomembrane Interfaces Physical Review Letters. 115. DOI: 10.1103/PhysRevLett.115.256101  0.76
2015 Wang X, Jamison L, Sridharan K, Morgan D, Voyles PM, Szlufarska I. Evidence for cascade overlap and grain boundary enhanced amorphization in silicon carbide irradiated with Kr ions Acta Materialia. 99: 7-15. DOI: 10.1016/j.actamat.2015.07.070  0.76
2014 Yankovich AB, Berkels B, Dahmen W, Binev P, Sanchez SI, Bradley SA, Li A, Szlufarska I, Voyles PM. Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts. Nature Communications. 5: 4155. PMID 24916914 DOI: 10.1038/ncomms5155  0.76
2014 Zhang P, Besser MF, Kramer MJ, Voyles PM. Medium-range Order of Zr<inf>54</inf>Cu<inf>38</inf>Al<inf>8</inf> Bulk Metallic Glass International Journal of Astrobiology. 1649. DOI: 10.1557/opl.2014.95  0.76
2014 Alba-Rubio AC, O'Neill BJ, Shi F, Akatay C, Canlas C, Li T, Winans R, Elam JW, Stach EA, Voyles PM, Dumesic JA. Pore structure and bifunctional catalyst activity of overlayers applied by atomic layer deposition on copper nanoparticles Acs Catalysis. 4: 1554-1557. DOI: 10.1021/cs500330p  0.76
2014 He L, Chu JP, Li CL, Lee CM, Chen YC, Liaw PK, Voyles PM. Effects of annealing on the compositional heterogeneity and structure in zirconium-based bulk metallic glass thin films Thin Solid Films. 561: 87-92. DOI: 10.1016/j.tsf.2013.09.042  0.76
2013 O'Neill BJ, Jackson DH, Crisci AJ, Farberow CA, Shi F, Alba-Rubio AC, Lu J, Dietrich PJ, Gu X, Marshall CL, Stair PC, Elam JW, Miller JT, Ribeiro FH, Voyles PM, et al. Stabilization of copper catalysts for liquid-phase reactions by atomic layer deposition. Angewandte Chemie (International Ed. in English). 52: 13808-12. PMID 24282166 DOI: 10.1002/anie.201308245  0.76
2013 Krystofiak ES, Mattson EC, Voyles PM, Hirschmugl CJ, Albrecht RM, Gajdardziska-Josifovska M, Oliver JA. Multiple morphologies of gold-magnetite heterostructure nanoparticles are effectively functionalized with protein for cell targeting. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 19: 821-34. PMID 23745591 DOI: 10.1017/S1431927613001700  0.76
2013 Zhou H, Seo JH, Paskiewicz DM, Zhu Y, Celler GK, Voyles PM, Zhou W, Lagally MG, Ma Z. Fast flexible electronics with strained silicon nanomembranes. Scientific Reports. 3: 1291. PMID 23416347 DOI: 10.1038/srep01291  0.76
2013 Schweiss DT, Hwang J, Voyles PM. Inelastic and elastic mean free paths from FIB samples of metallic glasses. Ultramicroscopy. 124: 6-12. PMID 23154031 DOI: 10.1016/j.ultramic.2012.08.005  0.96
2013 Melgarejo ZH, Jakes JE, Hwang J, Kalay YE, Kramer MJ, Voyles PM, Stone DS. Variation of hardness and modulus across the thickness of Zr-Cu-Al metallic glass ribbons Materials Research Society Symposium Proceedings. 1520: 7-12. DOI: 10.1557/opl.2012.1690  0.76
2013 Xiang H, Shi FY, Rzchowski MS, Voyles PM, Chang YA. Reactive sputtering of (Co,Fe) nitride thin films on TiN-bufferd Si Applied Physics a: Materials Science and Processing. 110: 487-492. DOI: 10.1007/s00339-012-7251-5  0.76
2012 Hwang J, Melgarejo ZH, Kalay YE, Kalay I, Kramer MJ, Stone DS, Voyles PM. Nanoscale structure and structural relaxation in Zr50Cu45Al5 bulk metallic glass. Physical Review Letters. 108: 195505. PMID 23003058 DOI: 10.1103/PhysRevLett.108.195505  0.76
2012 Yi F, Voyles PM. Analytical and computational modeling of fluctuation electron microscopy from a nanocrystal/amorphous composite. Ultramicroscopy. 122: 37-47. PMID 22982938 DOI: 10.1016/j.ultramic.2012.07.022  0.76
2012 Shi F, Xiang H, Rzchowski MS, Chang YA, Voyles PM. High-quality, smooth Fe3O4 thin films on Si by controlled oxidation of Fe in CO/CO2 Materials Research Society Symposium Proceedings. 1430: 61-66. DOI: 10.1557/opl.2012.899  0.76
2012 Shi F, Xiang H, Yang JJ, Rzchowski MS, Chang YA, Voyles PM. Inverse TMR in a nominally symmetric CoFe/AlO x/CoFe junction induced by interfacial Fe 3O 4 investigated by STEM-EELS Journal of Magnetism and Magnetic Materials. 324: 1837-1844. DOI: 10.1016/j.jmmm.2012.01.012  0.76
2012 Kalay YE, Kalay I, Hwang J, Voyles PM, Kramer MJ. Local chemical and topological order in Al-Tb and its role in controlling nanocrystal formation Acta Materialia. 60: 994-1003. DOI: 10.1016/j.actamat.2011.11.008  0.76
2012 Reyes-Luyanda D, Flores-Cruz J, Morales-Pérez PJ, Encarnación-Gómez LG, Shi F, Voyles PM, Cardona-Martínez N. Bifunctional materials for the catalytic conversion of cellulose into soluble renewable biorefinery feedstocks Topics in Catalysis. 55: 148-161. DOI: 10.1007/s11244-012-9791-5  0.76
2012 Bradley SA, Sinkler W, Blom DA, Bigelow W, Voyles PM, Allard LF. Behavior of Pt atoms on oxide supports during reduction treatments at elevated temperatures, characterized by aberration corrected stem imaging Catalysis Letters. 142: 176-182. DOI: 10.1007/s10562-011-0756-2  0.76
2011 Yi F, Voyles PM. Effect of sample thickness, energy filtering, and probe coherence on fluctuation electron microscopy experiments. Ultramicroscopy. 111: 1375-80. PMID 21864780 DOI: 10.1016/j.ultramic.2011.05.004  0.76
2011 Hwang J, Voyles PM. Variable resolution fluctuation electron microscopy on Cu-Zr metallic glass using a wide range of coherent STEM probe size. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 17: 67-74. PMID 21122191 DOI: 10.1017/S1431927610094109  0.96
2011 Chen K, Zhuang CG, Li Q, Weng X, Redwing JM, Zhu Y, Voyles PM, Xi XX. MgB2/MgO/MgB2 josephson junctions for high-speed circuits Ieee Transactions On Applied Superconductivity. 21: 115-118. DOI: 10.1109/TASC.2010.2093853  0.76
2011 Dai W, Ferrando V, Pogrebnyakov AV, Wilke RHT, Chen K, Weng X, Redwing J, Bark CW, Eom CB, Zhu Y, Voyles PM, Rickel D, Betts JB, Mielke CH, Gurevich A, et al. High-field properties of carbon-doped MgB2 thin films by hybrid physical-chemical vapor deposition using different carbon sources Superconductor Science and Technology. 24. DOI: 10.1088/0953-2048/24/12/125014  0.76
2011 Xiang H, Shi FY, Rzchowski MS, Voyles PM, Chang YA. Epitaxial growth and thermal stability of Fe 4N film on TiN buffered Si(001) substrate Journal of Applied Physics. 109. DOI: 10.1063/1.3556919  0.76
2011 Xiang H, Shi FY, Zhang C, Rzchowski MS, Voyles PM, Chang YA. Synthesis of Fe3O4 thin films by selective oxidation with controlled oxygen chemical potential Scripta Materialia. 65: 739-742. DOI: 10.1016/j.scriptamat.2011.07.026  0.76
2010 Zhu Y, Pogrebnyakov AV, Wilke RH, Chen K, Xi XX, Redwing JM, Zhuang CG, Feng QR, Gan ZZ, Singh RK, Shen Y, Newman N, Rowell JM, Hunte F, Jaroszynski J, ... ... Voyles PM, et al. Nanoscale disorder in pure and doped MgB2 thin films Superconductor Science and Technology. 23. DOI: 10.1088/0953-2048/23/9/095008  0.76
2010 Xiang H, Shi F, Rzchowski MS, Voyles PM, Chang YA. Epitaxial growth and magnetic properties of Fe3 O4 films on TiN buffered Si(001), Si(110), and Si(111) substrates Applied Physics Letters. 97. DOI: 10.1063/1.3484278  0.76
2009 Hwang J, Clausen AM, Cao H, Voyles PM. Reverse monte carlo structural model for a zirconium-based metallic glass incorporating fluctuation microscopy medium-range order data Journal of Materials Research. 24: 3121-3129. DOI: 10.1557/jmr.2009.0386  0.76
2009 Zhu Y, Hunte F, Zhuang CG, Feng QR, Gan ZZ, Xi XX, Larbalestier DC, Voyles PM. MgO platelets and high critical field in MgB2 thin films doped with carbon from methane Superconductor Science and Technology. 22. DOI: 10.1088/0953-2048/22/12/125001  0.76
2008 Stratton WG, Voyles PM. A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous composite. Ultramicroscopy. 108: 727-36. PMID 18155358 DOI: 10.1016/j.ultramic.2007.11.004  1
2008 Senkowicz BJ, Mungall RJ, Zhu Y, Jiang J, Voyles PM, Hellstrom EE, Larbalestier DC. Nanoscale grains, high irreversibility field and large critical current density as a function of high-energy ball milling time in C-doped magnesium diboride Superconductor Science and Technology. 21. DOI: 10.1088/0953-2048/21/3/035009  0.76
2008 Zhu Y, Larbalestier DC, Gurevich A, Xi XX, Voyles PM. Nanoscale disorder in MgB2 thin films grown by hybrid physical-chemical vapor deposition Microscopy and Microanalysis. 14: 212-213. DOI: 10.1017/S1431927608081488  0.76
2007 Bogle SN, Voyles PM, Khare SV, Abelson JR. Quantifying nanoscale order in amorphous materials: Simulating fluctuation electron microscopy of amorphous silicon Journal of Physics Condensed Matter. 19. DOI: 10.1088/0953-8984/19/45/455204  0.76
2007 Senkowicz BJ, Polyanskii A, Mungall RJ, Zhu Y, Giencke JE, Voyles PM, Eom CB, Hellstrom EE, Larbalestier DC. Understanding the route to high critical current density in mechanically alloyed Mg(B1-xCx)2 Superconductor Science and Technology. 20: 650-657. DOI: 10.1088/0953-2048/20/7/011  0.76
2007 Zhu Y, Larbalestier DC, Voyles PM, Pogrebnyakov AV, Xi XX, Redwing JM. Nanoscale disorder in high critical field, carbon-doped MgB2 hybrid physical-chemical vapor deposition thin films Applied Physics Letters. 91. DOI: 10.1063/1.2775088  0.76
2007 Zhu Y, Matsumoto A, Senkowicz BJ, Kumakura H, Kitaguchi H, Jewell MC, Hellstrom EE, Larbalestier DC, Voyles PM. Microstructures of SiC nanoparticle-doped Mg B2 Fe tapes Journal of Applied Physics. 102. DOI: 10.1063/1.2750409  0.76
2006 Kisa M, Li L, Yang J, Minton TK, Stratton WG, Voyles P, Chen X, Van Benthem K, Pennycook SJ. Homogeneous silica formed by the oxidation of Si(100) in hyperthermal atomic oxygen Journal of Spacecraft and Rockets. 43: 431-435. DOI: 10.2514/1.17323  0.76
2006 Matsumoto A, Kumakura H, Kitaguchi H, Senkowicz BJ, Jewell MC, Hellstrom EE, Zhu Y, Voyles PM, Larbalestier DC. Evaluation of connectivity, flux pinning, and upper critical field contributions to the critical current density of bulk pure and SiC-alloyed MgB 2 Applied Physics Letters. 89. DOI: 10.1063/1.2357027  0.76
2005 Stratton WG, Hamann J, Perepezko JH, Voyles PM, Mao X, Khare SV. Aluminum nanoscale order in amorphous Al92 Sm8 measured by fluctuation electron microscopy Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1897830  0.76
2005 Kim WB, Rodriguez-Rivera GJ, Evans ST, Voitl T, Einspahr JJ, Voyles PM, Dumesic JA. Catalytic oxidation of CO by aqueous polyoxometalates on carbon-supported gold nanoparticles Journal of Catalysis. 235: 327-332. DOI: 10.1016/j.jcat.2005.06.003  0.76
2005 Kisa M, Stratton WG, Minton TK, Van Benthem K, Pennycook SJ, Voyles PM, Chen X, Li L, Yang JC. Increased ordering in the amorphous SiO x due to hyperthermal atomic oxygen Materials Research Society Symposium Proceedings. 851: 419-424.  0.76
2004 Khare SV, Nakhmanson SM, Voyles PM, Keblinski P, Abelson JR. Evidence from atomistic simulations of fluctuation electron microscopy for preferred local orientations in amorphous silicon Applied Physics Letters. 85: 745-747. DOI: 10.1063/1.1776614  0.76
2004 Khare SV, Nakhmanson SM, Voyles PM, Keblinski P, Abelson JR. Evidence from simulations for orientational medium range order in fluctuation-electron-microscopy observations of a-Si Microscopy and Microanalysis. 10: 820-821. DOI: 10.1017/S1431927604880863  0.76
2003 Dash RK, Voyles PM, Gibson JM, Treacy MMJ, Keblinski P. A quantitative measure of medium-range order in amorphous materials from transmission electron micrographs Journal of Physics Condensed Matter. 15. DOI: 10.1088/0953-8984/15/31/317  0.76
2003 Ho MY, Gong H, Wilk GD, Busch BW, Green ML, Voyles PM, Muller DA, Bude M, Lin WH, See A, Loomans ME, Lahiri SK, Räisänen PI. Morphology and crystallization kinetics in HfO2 thin films grown by atomic layer deposition Journal of Applied Physics. 93: 1477-1481. DOI: 10.1063/1.1534381  0.76
2003 Petruska MA, Malko AV, Voyles PM, Klimov VI. High-performance, quantum dot nanocomposites for nonlinear optical and optical gain applications Advanced Materials. 15: 610-613.  0.76
2001 Nakhmanson SM, Mousseau N, Barkema GT, Voyles PM, Drabold DA. Models of paracrystalline silicon with a defect-free bandgap International Journal of Modern Physics B. 15: 3253-3257. DOI: 10.1142/S0217979201007580  0.76
2001 Voyles PM, Zotov N, Nakhmanson SM, Drabold DA, Gibson JM, Treacy MMJ, Keblinski P. Structure and physical properties of paracrystailine atomistic models of amorphous silicon Journal of Applied Physics. 90: 4437-4451. DOI: 10.1063/1.1407319  0.76
2001 Nakhmanson SM, Voyles PM, Mousseau N, Barkema GT, Drabold DA. Realistic models of paracrystalline silicon Physical Review B - Condensed Matter and Materials Physics. 63: 2352071-2352076.  0.76
1996 Warner RE, Patty RA, Voyles PM, Nadasen A, Becchetti FD, Brown JA, Esbensen H, Galonsky A, Kolata JJ, Kruse J, Lee MY, Ronningen RM, Schwandt P, Von Schwarzenberg J, Sherrill BM, et al. Total reaction and 2n-removal cross sections of 20-60A MeV 4,6,8He, 6-9,11Li, and 10Be on Si Physical Review C - Nuclear Physics. 54: 1700-1709. DOI: 10.1103/PhysRevC.54.1700  0.76
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