| Year |
Citation |
Score |
| 2020 |
Yin X, Wang Y, Chang TH, Zhang P, Li J, Xue P, Long Y, Shohet JL, Voyles PM, Ma Z, Wang X. Memristive Behavior Enabled by Amorphous-Crystalline 2D Oxide Heterostructure. Advanced Materials (Deerfield Beach, Fla.). e2000801. PMID 32319153 DOI: 10.1002/Adma.202000801 |
0.317 |
|
| 2020 |
Du D, Strohbeen PJ, Paik H, Zhang C, Genser KT, Rabe KM, Voyles PM, Schlom DG, Kawasaki JK. Control of polymorphism during epitaxial growth of hyperferroelectric candidate LiZnSb on GaSb (111)B Journal of Vacuum Science & Technology B. 38: 022208. DOI: 10.1116/1.5145217 |
0.349 |
|
| 2020 |
Shourov EH, Jacobs R, Behn WA, Krebs ZJ, Zhang C, Strohbeen PJ, Du D, Voyles PM, Brar VW, Morgan DD, Kawasaki JK. Semi-adsorption-controlled growth window for half-Heusler FeVSb epitaxial films Physical Review Materials. 4. DOI: 10.1103/Physrevmaterials.4.073401 |
0.368 |
|
| 2020 |
Chatterjee D, Voyles P. Electron Correlation Microscopy Measurements of Metallic Glass Surface Dynamics Microscopy and Microanalysis. 26: 1142-1143. DOI: 10.1017/S1431927620017080 |
0.324 |
|
| 2020 |
Francis C, Chatterjee D, Muley S, Voyles P. “Crystallography” of an Amorphous Material Using Electron Nanodiffraction Microscopy and Microanalysis. 26: 38-40. DOI: 10.1017/S1431927620013197 |
0.337 |
|
| 2020 |
Sarkar N, Vishwanadh B, Prajapat C, Babu P, Ravikumar G, Dey G, Voyles PM, Tewari R, Mishra P. Superconductivity and fluctuation effects in a fractal dimensional bulk metallic glass: Correlation with medium range order Materials Today Communications. 25: 101427. DOI: 10.1016/J.Mtcomm.2020.101427 |
0.328 |
|
| 2020 |
Liu L, Shi C, Zhang C, Voyles P, Fournelle J, Perepezko J. Microstructure, microhardness and oxidation behavior of Mo-Si-B alloys in the Moss+Mo2B+Mo5SiB2 three phase region Intermetallics. 116: 106618. DOI: 10.1016/J.Intermet.2019.106618 |
0.318 |
|
| 2019 |
Zhang C, Feng J, DaCosta LR, Voyles PM. Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks. Ultramicroscopy. 210: 112921. PMID 31978635 DOI: 10.1016/J.Ultramic.2019.112921 |
0.326 |
|
| 2019 |
Yan G, Wang Y, Zhang Z, Li J, Carlos C, German LN, Zhang C, Wang J, Voyles PM, Wang X. Enhanced Ferromagnetism from Organic-Cerium Oxide Hybrid Ultrathin Nanosheets. Acs Applied Materials & Interfaces. PMID 31686493 DOI: 10.1021/Acsami.9B15841 |
0.316 |
|
| 2019 |
Voyles PM, Gibson JM, Treacy MM. Fluctuation microscopy: a probe of atomic correlations in disordered materials Journal of Electron Microscopy. 49: 259-66. PMID 11108048 DOI: 10.1093/Oxfordjournals.Jmicro.A023805 |
0.341 |
|
| 2019 |
Strohbeen PJ, Du D, Zhang C, Shourov EH, Rodolakis F, McChesney JL, Voyles PM, Kawasaki JK. Electronically enhanced layer buckling and Au-Au dimerization in epitaxial LaAuSb films Physical Review Materials. 3. DOI: 10.1103/Physrevmaterials.3.024201 |
0.398 |
|
| 2019 |
Chatterjee D, Zhang P, Voyles PM. Electron Correlation Microscopy for Studying Fluctuating Systems In Situ Microscopy and Microanalysis. 25: 1520-1521. DOI: 10.1017/S143192761900833X |
0.31 |
|
| 2019 |
Liu L, Sun C, Zhang C, Voyles PM, Fournelle J, Handt A, Perepezko JH. Examination of B in the Mo solid solution (Moss) in Moss + Mo5SiB2 + Mo2B alloys Scripta Materialia. 163: 62-65. DOI: 10.1016/J.Scriptamat.2019.01.003 |
0.315 |
|
| 2019 |
Bapna M, Parks B, Oberdick S, Almasi H, Sun C, Voyles P, Wang W, Majetich SA. Effect of Mo capping in sub-100 nm CoFeB-MgO tunnel junctions with perpendicular magnetic anisotropy Journal of Magnetism and Magnetic Materials. 483: 34-41. DOI: 10.1016/J.Jmmm.2019.03.005 |
0.334 |
|
| 2019 |
Maldonis JJ, Xu Z, Song Z, Yu M, Mayeshiba T, Morgan D, Voyles PM. StructOpt: A modular materials structure optimization suite incorporating experimental data and simulated energies Computational Materials Science. 160: 1-8. DOI: 10.1016/J.Commatsci.2018.12.052 |
0.313 |
|
| 2019 |
Yu Z, Zhang C, Voyles PM, He L, Liu X, Nygren K, Couet A. Microstructure and microchemistry study of irradiation-induced precipitates in proton irradiated ZrNb alloys Acta Materialia. 178: 228-240. DOI: 10.1016/J.Actamat.2019.08.012 |
0.308 |
|
| 2019 |
Li X, Yang M, Jamali M, Shi F, Kang S, Jiang Y, Zhang X, Li H, Okatov S, Faleev S, Kalitsov A, Yu G, Voyles PM, Mryasov ON, Wang J. Heavy‐Metal‐Free, Low‐Damping, and Non‐Interface Perpendicular Fe
16
N
2
Thin Film and Magnetoresistance Device Physica Status Solidi (Rrl) – Rapid Research Letters. 13: 1900089. DOI: 10.1002/Pssr.201900089 |
0.641 |
|
| 2018 |
Mitchell Warden HE, Voyles PM, Fredrickson DC. Paths to Stabilizing Electronically Aberrant Compounds: A Defect-Stabilized Polymorph and Constrained Atomic Motion in PtGa. Inorganic Chemistry. PMID 30336002 DOI: 10.1021/Acs.Inorgchem.8B02353 |
0.351 |
|
| 2018 |
Yu Y, Sun C, Yin X, Li J, Cao S, Zhang C, Voyles PM, Wang X. Metastable Intermediates in Amorphous Titanium Oxide: A Hidden Role Leading to Ultra-Stable Photoanode Protection. Nano Letters. PMID 30040905 DOI: 10.1021/Acs.Nanolett.8B02559 |
0.34 |
|
| 2018 |
Quarterman P, Sun C, Garcia-Barriocanal J, Dc M, Lv Y, Manipatruni S, Nikonov DE, Young IA, Voyles PM, Wang JP. Demonstration of Ru as the 4th ferromagnetic element at room temperature. Nature Communications. 9: 2058. PMID 29802304 DOI: 10.1038/S41467-018-04512-1 |
0.324 |
|
| 2018 |
Zhang P, Maldonis JJ, Liu Z, Schroers J, Voyles PM. Spatially heterogeneous dynamics in a metallic glass forming liquid imaged by electron correlation microscopy. Nature Communications. 9: 1129. PMID 29555920 DOI: 10.1038/S41467-018-03604-2 |
0.325 |
|
| 2018 |
Liu X, Szlufarska I, Voyles PM. In situ Transmission Electron Microscopy of Room-temperature Plastic Deformation and Recovery in Thin 3C-SiC Microscopy and Microanalysis. 24: 1834-1835. DOI: 10.1017/S1431927618009650 |
0.323 |
|
| 2018 |
Zhang P, Wang Z, Perepezko JH, Voyles PM. Vitrification, crystallization, and atomic structure of deformed and quenched Ni60Nb40 metallic glass Journal of Non-Crystalline Solids. 491: 133-140. DOI: 10.1016/J.Jnoncrysol.2018.04.005 |
0.33 |
|
| 2017 |
Voyles PM, Maldonis JJ, Zhang P. Nanoscale structure in glasses from coherent electron nanodiffraction Acta Crystallographica Section a Foundations and Advances. 73: a126-a126. DOI: 10.1107/S0108767317098750 |
0.347 |
|
| 2017 |
He L, Xu H, Tan L, Voyles P, Sridharan K. Measurement of Irradiation-induced Swelling in Stainless Steels with a New Transmission Electron Microscopy Method Microscopy and Microanalysis. 23: 2234-2235. DOI: 10.1017/S1431927617011837 |
0.316 |
|
| 2017 |
Sun C, Street M, Jacobs R, Morgan D, Voyles PM, Binek C. Identification and Quantification of Boron Dopant Sites in Antiferromagnetic Cr2O3 Films by Electron Energy Loss Spectroscopy Microscopy and Microanalysis. 23: 1584-1585. DOI: 10.1017/S1431927617008583 |
0.32 |
|
| 2017 |
Zhang P, Liu Z, Schroers J, Voyles PM. Atomic-scale Relaxation Dynamics in the Supercooled Liquid State of a Metallic Glass Nanowire by Electron Correlation Microscopy Microscopy and Microanalysis. 23: 960-961. DOI: 10.1017/S1431927617005463 |
0.346 |
|
| 2017 |
Zhang C, Berkels B, Wirth B, Voyles PM. Joint Denoising and Distortion Correction for Atomic Column Detection in Scanning Transmission Electron Microscopy Images Microscopy and Microanalysis. 23: 164-165. DOI: 10.1017/S1431927617001507 |
0.344 |
|
| 2017 |
Maldonis JJ, Hwang J, Voyles PM. FEMSIM + HRMC: Simulation of and structural refinement using fluctuation electron microscopy for amorphous materials Computer Physics Communications. 213: 217-222. DOI: 10.1016/J.Cpc.2016.12.006 |
0.573 |
|
| 2017 |
Zhan X, Zhang P, Voyles PM, Liu X, Akolkar R, Ernst F. Effect of tungsten alloying on short-to-medium-range-order evolution and crystallization behavior of near-eutectic amorphous Ni-P Acta Materialia. 122: 400-411. DOI: 10.1016/J.Actamat.2016.10.002 |
0.356 |
|
| 2017 |
Sun C, Song Z, Rath A, Street M, Echtenkamp W, Feng J, Binek C, Morgan D, Voyles P. Local Dielectric Breakdown Path along c
-Axis Planar Boundaries in Cr2
O3
Thin Films Advanced Materials Interfaces. 4: 1700172. DOI: 10.1002/Admi.201700172 |
0.336 |
|
| 2016 |
Zhang P, He L, Besser MF, Liu Z, Schroers J, Kramer MJ, Voyles PM. Applications and limitations of electron correlation microscopy to study relaxation dynamics in supercooled liquids. Ultramicroscopy. PMID 27638332 DOI: 10.1016/J.Ultramic.2016.09.001 |
0.358 |
|
| 2016 |
Yankovich AB, Zhang C, Oh A, Slater TJ, Azough F, Freer R, Haigh SJ, Willett R, Voyles PM. Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images. Nanotechnology. 27: 364001. PMID 27479946 DOI: 10.1088/0957-4484/27/36/364001 |
0.302 |
|
| 2016 |
Tryputen L, Tu KH, Piotrowski SK, Bapna M, Majetich SA, Sun C, Voyles PM, Almasi H, Wang W, Vargas P, Tresback JS, Ross CA. Patterning of sub-50 nm perpendicular CoFeB/MgO-based magnetic tunnel junctions. Nanotechnology. 27: 185302. PMID 27005330 DOI: 10.1088/0957-4484/27/18/185302 |
0.319 |
|
| 2016 |
Driver MS, Beatty JD, Olanipekun O, Reid K, Rath A, Voyles P, Kelber JA. Atomic Layer Epitaxy of h-BN(0001) multilayers on Co(0001), and Molecular Beam Epitaxy growth of Graphene on h-BN(0001)/Co(0001). Langmuir : the Acs Journal of Surfaces and Colloids. PMID 26940024 DOI: 10.1021/Acs.Langmuir.5B03653 |
0.331 |
|
| 2016 |
Jiang H, He L, Morgan D, Voyles PM, Szlufarska I. Radiation-induced mobility of small defect clusters in covalent materials Physical Review B. 94. DOI: 10.1103/Physrevb.94.024107 |
0.311 |
|
| 2016 |
Maldonis J, Zhang P, He L, Gujral A, Ediger MD, Voyles PM. Fluctuation Electron Microscopy and Computational Structure Refinement for the Structure of Amorphous Materials Microscopy and Microanalysis. 22: 486-487. DOI: 10.1017/S1431927616003287 |
0.338 |
|
| 2016 |
Zhang P, Maldonis JJ, Besser MF, Kramer MJ, Voyles PM. Medium-range structure and glass forming ability in Zr-Cu-Al bulk metallic glasses Acta Materialia. 109: 103-114. DOI: 10.1016/J.Actamat.2016.02.006 |
0.34 |
|
| 2016 |
Quindeau A, Avci CO, Liu W, Sun C, Mann M, Tang AS, Onbasli MC, Bono D, Voyles PM, Xu Y, Robinson J, Beach GSD, Ross CA. Tm3
Fe5
O12
/Pt Heterostructures with Perpendicular Magnetic Anisotropy for Spintronic Applications Advanced Electronic Materials. 3: 1600376. DOI: 10.1002/Aelm.201600376 |
0.301 |
|
| 2015 |
He L, Zhang P, Besser MF, Kramer MJ, Voyles PM. Electron Correlation Microscopy: A New Technique for Studying Local Atom Dynamics Applied to a Supercooled Liquid. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-8. PMID 26036263 DOI: 10.1017/S1431927615000641 |
0.341 |
|
| 2015 |
He L, Gujral A, Ediger MD, Voyles PM. Fluctuation electron microscopy study of medium-range packing order in ultrastable indomethacin glass thin films Materials Research Society Symposium Proceedings. 1757: 32-37. DOI: 10.1557/Opl.2015.48 |
0.402 |
|
| 2015 |
Mevenkamp N, Binev P, Dahmen W, Voyles PM, Yankovich AB, Berkels B. Poisson noise removal from high-resolution STEM images based on periodic block matching Advanced Structural and Chemical Imaging. 1: 3. DOI: 10.1186/S40679-015-0004-8 |
0.347 |
|
| 2015 |
Yankovich AB, Berkels B, Dahmen W, Binev P, Voyles PM. High-precision scanning transmission electron microscopy at coarse pixel sampling for reduced electron dose Advanced Structural and Chemical Imaging. 1. DOI: 10.1186/S40679-015-0003-9 |
0.359 |
|
| 2015 |
Liu H, Kawami T, Moges K, Uemura T, Yamamoto M, Shi F, Voyles PM. Influence of film composition in quaternary Heusler alloy Co2(Mn,Fe)Si thin films on tunnelling magnetoresistance of Co2(Mn,Fe)Si/MgO-based magnetic tunnel junctions Journal of Physics D: Applied Physics. 48: 164001. DOI: 10.1088/0022-3727/48/16/164001 |
0.673 |
|
| 2015 |
Feng J, Kvit AV, Yankovich AB, Zhang C, Morgan D, Voyles PM. Prospects for Detecting Single Vacancies by Quantitative Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 21: 1887-1888. DOI: 10.1017/S1431927615010211 |
0.343 |
|
| 2015 |
Maldonis JJ, Zhang P, Besser M, Kramer M, Voyles PM. Medium-Range Structure of Zr-Cu-Al Bulk Metallic Glasses from Structural Refinement Based on Fluctuation Microscopy Microscopy and Microanalysis. 21: 1659-1660. DOI: 10.1017/S1431927615009071 |
0.319 |
|
| 2015 |
Wang X, Jamison L, Sridharan K, Morgan D, Voyles PM, Szlufarska I. Evidence for cascade overlap and grain boundary enhanced amorphization in silicon carbide irradiated with Kr ions Acta Materialia. 99: 7-15. DOI: 10.1016/J.Actamat.2015.07.070 |
0.303 |
|
| 2014 |
Yankovich AB, Berkels B, Dahmen W, Binev P, Sanchez SI, Bradley SA, Li A, Szlufarska I, Voyles PM. Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts. Nature Communications. 5: 4155. PMID 24916914 DOI: 10.1038/Ncomms5155 |
0.377 |
|
| 2014 |
Yankovich AB, Kvit AV, Li X, Zhang F, Avrutin V, Liu H, Izyumskaya N, Özgür Ü, Van Leer B, Morkoç H, Voyles PM. Thickness variations and absence of lateral compositional fluctuations in aberration-corrected STEM images of InGaN LED active regions at low dose. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20: 864-8. PMID 24667066 DOI: 10.1017/S1431927614000427 |
0.356 |
|
| 2014 |
Zhang P, Besser MF, Kramer MJ, Voyles PM. Medium-range Order of Zr<inf>54</inf>Cu<inf>38</inf>Al<inf>8</inf> Bulk Metallic Glass International Journal of Astrobiology. 1649. DOI: 10.1557/Opl.2014.95 |
0.343 |
|
| 2014 |
Li G, Honda Y, Liu H, Matsuda K, Arita M, Uemura T, Yamamoto M, Miura Y, Shirai M, Saito T, Shi F, Voyles PM. Effect of nonstoichiometry on the half-metallic character of Co2MnSi investigated through saturation magnetization and tunneling magnetoresistance ratio Physical Review B. 89. DOI: 10.1103/Physrevb.89.014428 |
0.642 |
|
| 2014 |
Alba-Rubio AC, O'Neill BJ, Shi F, Akatay C, Canlas C, Li T, Winans R, Elam JW, Stach EA, Voyles PM, Dumesic JA. Pore structure and bifunctional catalyst activity of overlayers applied by atomic layer deposition on copper nanoparticles Acs Catalysis. 4: 1554-1557. DOI: 10.1021/Cs500330P |
0.696 |
|
| 2014 |
He L, Zhai Y, Liu C, Jiang C, Szlufarska I, Tyburska-Puschel B, Sridharan K, Voyles P. High-Resolution Scanning Transmission Electron Microscopy Study of Black Spot Defects in Ion Irradiated Silicon Carbide Microscopy and Microanalysis. 20: 1824-1825. DOI: 10.1017/S143192761401085X |
0.336 |
|
| 2013 |
O'Neill BJ, Jackson DH, Crisci AJ, Farberow CA, Shi F, Alba-Rubio AC, Lu J, Dietrich PJ, Gu X, Marshall CL, Stair PC, Elam JW, Miller JT, Ribeiro FH, Voyles PM, et al. Stabilization of copper catalysts for liquid-phase reactions by atomic layer deposition. Angewandte Chemie (International Ed. in English). 52: 13808-12. PMID 24282166 DOI: 10.1002/Anie.201308245 |
0.672 |
|
| 2013 |
Krystofiak ES, Mattson EC, Voyles PM, Hirschmugl CJ, Albrecht RM, Gajdardziska-Josifovska M, Oliver JA. Multiple morphologies of gold-magnetite heterostructure nanoparticles are effectively functionalized with protein for cell targeting. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 19: 821-34. PMID 23745591 DOI: 10.1017/S1431927613001700 |
0.327 |
|
| 2013 |
Zhou H, Seo JH, Paskiewicz DM, Zhu Y, Celler GK, Voyles PM, Zhou W, Lagally MG, Ma Z. Fast flexible electronics with strained silicon nanomembranes. Scientific Reports. 3: 1291. PMID 23416347 DOI: 10.1038/Srep01291 |
0.326 |
|
| 2013 |
Schweiss DT, Hwang J, Voyles PM. Inelastic and elastic mean free paths from FIB samples of metallic glasses. Ultramicroscopy. 124: 6-12. PMID 23154031 DOI: 10.1016/J.Ultramic.2012.08.005 |
0.575 |
|
| 2013 |
Melgarejo ZH, Jakes JE, Hwang J, Kalay YE, Kramer MJ, Voyles PM, Stone DS. Variation of hardness and modulus across the thickness of Zr-Cu-Al metallic glass ribbons Materials Research Society Symposium Proceedings. 1520: 7-12. DOI: 10.1557/Opl.2012.1690 |
0.576 |
|
| 2013 |
Yankovich A, Berkels B, Dahmen W, Sharpley R, Binev P, Voyles P. Measuring Surface Atom Bond Length Contraction in Au and Pt Nanoparticles Using High-Precision STEM Imaging Microscopy and Microanalysis. 19: 1688-1689. DOI: 10.1017/S143192761301043X |
0.31 |
|
| 2013 |
Hwang J, Melgarejo Z, Kalay Y, Kramer M, Stone D, Voyles P. Computational Structure Refinement by Hybrid Reverse Monte Carlo Simulation Incorporating Fluctuation Electron Microscopy Microscopy and Microanalysis. 19: 794-795. DOI: 10.1017/S1431927613005965 |
0.58 |
|
| 2013 |
Shi F, Liu H, Yamamoto M, Voyles P. MnMn/O Interface Termination at the Co2MnαSi/MgO Interface in Magnetic Tunnel Junctions Investigated by Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 19: 336-337. DOI: 10.1017/S143192761300367X |
0.689 |
|
| 2013 |
Xiang H, Shi FY, Rzchowski MS, Voyles PM, Chang YA. Reactive sputtering of (Co,Fe) nitride thin films on TiN-bufferd Si Applied Physics a: Materials Science and Processing. 110: 487-492. DOI: 10.1007/S00339-012-7251-5 |
0.672 |
|
| 2013 |
O'Neill BJ, Jackson DHK, Crisci AJ, Farberow CA, Shi F, Alba-Rubio AC, Lu J, Dietrich PJ, Gu X, Marshall CL, Stair PC, Elam JW, Miller JT, Ribeiro FH, Voyles PM, et al. Back Cover: Stabilization of Copper Catalysts for Liquid-Phase Reactions by Atomic Layer Deposition (Angew. Chem. Int. Ed. 51/2013) Angewandte Chemie International Edition. 52: 13824-13824. DOI: 10.1002/Anie.201309934 |
0.652 |
|
| 2013 |
O'Neill BJ, Jackson DHK, Crisci AJ, Farberow CA, Shi F, Alba-Rubio AC, Lu J, Dietrich PJ, Gu X, Marshall CL, Stair PC, Elam JW, Miller JT, Ribeiro FH, Voyles PM, et al. Rücktitelbild: Stabilization of Copper Catalysts for Liquid-Phase Reactions by Atomic Layer Deposition (Angew. Chem. 51/2013) Angewandte Chemie. 125: 14068-14068. DOI: 10.1002/Ange.201309934 |
0.651 |
|
| 2012 |
Hwang J, Melgarejo ZH, Kalay YE, Kalay I, Kramer MJ, Stone DS, Voyles PM. Nanoscale structure and structural relaxation in Zr50Cu45Al5 bulk metallic glass. Physical Review Letters. 108: 195505. PMID 23003058 DOI: 10.1103/Physrevlett.108.195505 |
0.575 |
|
| 2012 |
Yankovich AB, Kvit AV, Li X, Zhang F, Avrutin V, Liu H, Izyumskaya N, Özgür Ü, Morkoç H, Voyles PM. Absence of Lateral Composition Fluctuations in Aberration-corrected STEM Images of an InGaN Quantum Well at Low Dose Mrs Proceedings. 1432. DOI: 10.1557/Opl.2012.906 |
0.35 |
|
| 2012 |
Shi F, Xiang H, Rzchowski MS, Chang YA, Voyles PM. High-quality, smooth Fe3O4 thin films on Si by controlled oxidation of Fe in CO/CO2 Materials Research Society Symposium Proceedings. 1430: 61-66. DOI: 10.1557/Opl.2012.899 |
0.701 |
|
| 2012 |
Yankovich AB, Kvit AV, Liu HY, Li X, Zhang F, Avrutin V, Izyumskaya N, Özgür Ü, Morkoc H, Voyles PM. Pyramid nano-voids in GaN and InGaN Proceedings of Spie. 8262: 826205. DOI: 10.1117/12.912097 |
0.376 |
|
| 2012 |
Liu HY, Li X, Zhang F, Avrutin V, Izyumskaya N, Özgür Ü, Yankovich AB, Kvit AV, Voyles PM, Morkoç H. Electrical properties of ZnO:Ga as a transparent conducting oxide in InGaN based light emitting diodes Proceedings of Spie. 8262: 826226. DOI: 10.1117/12.903930 |
0.34 |
|
| 2012 |
Kvit AV, Yankovich AB, Avrutin V, Liu H, Izyumskaya N, Özgür Ü, Morkoç H, Voyles PM. Impurity distribution and microstructure of Ga-doped ZnO films grown by molecular beam epitaxy Journal of Applied Physics. 112: 123527. DOI: 10.1063/1.4769801 |
0.341 |
|
| 2012 |
Liu HY, Izyumskaya N, Avrutin V, Özgür Ü, Yankovich AB, Kvit AV, Voyles PM, Morkoç H. Donor behavior of Sb in ZnO Journal of Applied Physics. 112: 033706. DOI: 10.1063/1.4742984 |
0.328 |
|
| 2012 |
Liu HY, Avrutin V, Izyumskaya N, Özgür Ü, Yankovich AB, Kvit AV, Voyles PM, Morkoç H. Electron scattering mechanisms in GZO films grown on a-sapphire substrates by plasma-enhanced molecular beam epitaxy Journal of Applied Physics. 111: 103713. DOI: 10.1063/1.4720456 |
0.337 |
|
| 2012 |
Yankovich AB, Kvit AV, Li X, Zhang F, Avrutin V, Liu HY, Izyumskaya N, Özgür Ü, Morkoç H, Voyles PM. Hexagonal-based pyramid void defects in GaN and InGaN Journal of Applied Physics. 111: 023517. DOI: 10.1063/1.3679540 |
0.35 |
|
| 2012 |
Mattson E, Gajdardziska-Josifovska M, Voyles P, Krystofiak E, Oliver J. Understanding Gold Growth on Magnetite Nanoparticles using Probe-Corrected Scanning Transmission Electron Microscopy Microscopy and Microanalysis. 18: 358-359. DOI: 10.1017/S1431927612003649 |
0.332 |
|
| 2012 |
Shi F, Xiang H, Chang Y, Voyles P, Rzchowski M. STEM and STEM EELS Characterization of Low Defect Density, Smooth Fe3O4 Thin Films on Buffered Si by Kinetically Controlled Selective Oxidation Microscopy and Microanalysis. 18: 322-323. DOI: 10.1017/S1431927612003467 |
0.674 |
|
| 2012 |
Berkels B, Sharpley R, Binev P, Yankovich A, Shi F, Voyles P, Dahmen W. High Precision STEM Imaging by Non-Rigid Alignment and Averaging of a Series of Short Exposures Microscopy and Microanalysis. 18: 300-301. DOI: 10.1017/S1431927612003352 |
0.652 |
|
| 2012 |
Shi F, Xiang H, Yang JJ, Rzchowski MS, Chang YA, Voyles PM. Inverse TMR in a nominally symmetric CoFe/AlO x/CoFe junction induced by interfacial Fe 3O 4 investigated by STEM-EELS Journal of Magnetism and Magnetic Materials. 324: 1837-1844. DOI: 10.1016/J.Jmmm.2012.01.012 |
0.661 |
|
| 2012 |
Kalay YE, Kalay I, Hwang J, Voyles PM, Kramer MJ. Local chemical and topological order in Al-Tb and its role in controlling nanocrystal formation Acta Materialia. 60: 994-1003. DOI: 10.1016/J.Actamat.2011.11.008 |
0.581 |
|
| 2012 |
Reyes-Luyanda D, Flores-Cruz J, Morales-Pérez PJ, Encarnación-Gómez LG, Shi F, Voyles PM, Cardona-Martínez N. Bifunctional materials for the catalytic conversion of cellulose into soluble renewable biorefinery feedstocks Topics in Catalysis. 55: 148-161. DOI: 10.1007/S11244-012-9791-5 |
0.636 |
|
| 2012 |
Bradley SA, Sinkler W, Blom DA, Bigelow W, Voyles PM, Allard LF. Behavior of Pt atoms on oxide supports during reduction treatments at elevated temperatures, characterized by aberration corrected stem imaging Catalysis Letters. 142: 176-182. DOI: 10.1007/S10562-011-0756-2 |
0.308 |
|
| 2012 |
Voyles P, Hwang J. Fluctuation Electron Microscopy Characterization of Materials. 1-7. DOI: 10.1002/0471266965.Com138 |
0.627 |
|
| 2011 |
Hwang J, Voyles PM. Variable resolution fluctuation electron microscopy on Cu-Zr metallic glass using a wide range of coherent STEM probe size. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 17: 67-74. PMID 21122191 DOI: 10.1017/S1431927610094109 |
0.622 |
|
| 2011 |
Yankovich AB, Kvit AV, Li X, Zhang F, Avrutin V, Liu HY, Izyumskaya N, Özgür Ü, Morkoç H, Voyles PM. Vertical composition variation in nominally uniform InGaN layers revealed by aberration-corrected STEM imaging Proceedings of Spie. 7939. DOI: 10.1117/12.889392 |
0.348 |
|
| 2011 |
Chen K, Zhuang CG, Li Q, Weng X, Redwing JM, Zhu Y, Voyles PM, Xi XX. MgB2/MgO/MgB2 josephson junctions for high-speed circuits Ieee Transactions On Applied Superconductivity. 21: 115-118. DOI: 10.1109/Tasc.2010.2093853 |
0.317 |
|
| 2011 |
Dai W, Ferrando V, Pogrebnyakov AV, Wilke RHT, Chen K, Weng X, Redwing J, Bark CW, Eom CB, Zhu Y, Voyles PM, Rickel D, Betts JB, Mielke CH, Gurevich A, et al. High-field properties of carbon-doped MgB2 thin films by hybrid physical-chemical vapor deposition using different carbon sources Superconductor Science and Technology. 24. DOI: 10.1088/0953-2048/24/12/125014 |
0.301 |
|
| 2011 |
Xiang H, Shi FY, Rzchowski MS, Voyles PM, Chang YA. Epitaxial growth and thermal stability of Fe 4N film on TiN buffered Si(001) substrate Journal of Applied Physics. 109. DOI: 10.1063/1.3556919 |
0.661 |
|
| 2011 |
Yankovich A, Kvit A, Li X, Zhang F, Avrutin V, Liu H, Izyumskaya N, Özgür Ü, Morkoc H, Voyles P. Indium Composition Variation in Nominally Uniform InGaN Layers Discovered by Aberration-Corrected Z-contrast STEM Microscopy and Microanalysis. 17: 1386-1387. DOI: 10.1017/S143192761100780X |
0.303 |
|
| 2011 |
Hwang J, Kalay Y, Kramer M, Voyles P. Angular Correlations in Coherent Electron Nanodiffraction of a Metallic Glass Microscopy and Microanalysis. 17: 1110-1111. DOI: 10.1017/S1431927611006428 |
0.588 |
|
| 2011 |
Xiang H, Shi FY, Zhang C, Rzchowski MS, Voyles PM, Chang YA. Synthesis of Fe3O4 thin films by selective oxidation with controlled oxygen chemical potential Scripta Materialia. 65: 739-742. DOI: 10.1016/J.Scriptamat.2011.07.026 |
0.669 |
|
| 2010 |
Yi F, Tiemeijer P, Voyles PM. Flexible formation of coherent probes on an aberration-corrected STEM with three condensers. Journal of Electron Microscopy. 59: S15-21. PMID 20610414 DOI: 10.1093/Jmicro/Dfq052 |
0.332 |
|
| 2010 |
Zhu Y, Pogrebnyakov AV, Wilke RH, Chen K, Xi XX, Redwing JM, Zhuang CG, Feng QR, Gan ZZ, Singh RK, Shen Y, Newman N, Rowell JM, Hunte F, Jaroszynski J, ... ... Voyles PM, et al. Nanoscale disorder in pure and doped MgB2 thin films Superconductor Science and Technology. 23. DOI: 10.1088/0953-2048/23/9/095008 |
0.324 |
|
| 2010 |
Xiang H, Shi F, Rzchowski MS, Voyles PM, Chang YA. Epitaxial growth and magnetic properties of Fe3 O4 films on TiN buffered Si(001), Si(110), and Si(111) substrates Applied Physics Letters. 97. DOI: 10.1063/1.3484278 |
0.675 |
|
| 2010 |
Yi F, Hwang J, Imhoff S, Perepezko J, Voyles P. STEM Fluctuation Microscopy Characterization of an Amorphous – Protocrystalline Metal Glass Nanocomposite Microscopy and Microanalysis. 16: 1644-1645. DOI: 10.1017/S1431927610056618 |
0.588 |
|
| 2010 |
Bogle SN, Nittala LN, Twesten RD, Voyles PM, Abelson JR. Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy Ultramicroscopy. 110: 1273-1278. DOI: 10.1016/J.Ultramic.2010.05.001 |
0.402 |
|
| 2009 |
Avrutin V, Liu H, Izyumskaya N, Reshchikov MA, Özgür Ü, Kvit A, Voyles P, Morkoç H. Effect of Growth Conditions on Structural and Electrical Properties of Ga-doped ZnO Films Grown by Plasma-assisted MBE Mrs Proceedings. 1201. DOI: 10.1557/Proc-1201-H05-20 |
0.318 |
|
| 2009 |
Hwang J, Clausen AM, Cao H, Voyles PM. Reverse monte carlo structural model for a zirconium-based metallic glass incorporating fluctuation microscopy medium-range order data Journal of Materials Research. 24: 3121-3129. DOI: 10.1557/Jmr.2009.0386 |
0.594 |
|
| 2009 |
Zhu Y, Hunte F, Zhuang CG, Feng QR, Gan ZZ, Xi XX, Larbalestier DC, Voyles PM. MgO platelets and high critical field in MgB2 thin films doped with carbon from methane Superconductor Science and Technology. 22. DOI: 10.1088/0953-2048/22/12/125001 |
0.306 |
|
| 2009 |
Voyles PM. The Electron Microscopy Database: an Online Resource for Teaching and Learning Quantitative Transmission Electron Microscopy Microscopy Today. 17: 26-27. DOI: 10.1017/S1551929500054973 |
0.31 |
|
| 2009 |
Hwang J, Voyles P. Nanometer Scale Atomic Order in a Bulk Metallic Glass from Fluctuation Microscopy Microscopy and Microanalysis. 15: 770-771. DOI: 10.1017/S1431927609095373 |
0.604 |
|
| 2008 |
Stratton WG, Voyles PM. A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous composite. Ultramicroscopy. 108: 727-36. PMID 18155358 DOI: 10.1016/J.Ultramic.2007.11.004 |
0.773 |
|
| 2008 |
Pallecchi I, Ferrando V, Tarantini C, Putti M, Ferdeghini C, Zhu Y, Voyles PM, Xi XX. Increased in-field critical current density in neutron-irradiated MgB2films Superconductor Science and Technology. 22: 015023. DOI: 10.1088/0953-2048/22/1/015023 |
0.311 |
|
| 2008 |
Cedeño-Mattei Y, Perales-Perez O, Tomar MS, Roman F, Voyles PM, Stratton WG. Tuning of magnetic properties in cobalt ferrite nanocrystals Journal of Applied Physics. 103: 07E512. DOI: 10.1063/1.2838215 |
0.77 |
|
| 2008 |
Parra-Palomino A, Perales–Perez O, Singhal R, Tomar M, Hwang J, Voyles PM. Structural, optical, and magnetic characterization of monodisperse Fe-doped ZnO nanocrystals Journal of Applied Physics. 103: 07D121. DOI: 10.1063/1.2834705 |
0.603 |
|
| 2008 |
Yi F, Stratton W, Voyles P. Model of Fluctuation Electron Microscopy for a Nanocrystal /Amorphous Composite Microscopy and Microanalysis. 14: 914-915. DOI: 10.1017/S1431927608086133 |
0.776 |
|
| 2008 |
Voyles P. The Electron Microscopy Database: Example Data Sets for Teaching and Learning Quantitative TEM Microscopy and Microanalysis. 14: 82-83. DOI: 10.1017/S1431927608085991 |
0.305 |
|
| 2007 |
Hwang J, Cao H, Voyles PM. Nanometer-scale Structural Relaxation in Zr-based Bulk Metallic Glass Mrs Proceedings. 1048. DOI: 10.1557/Proc-1048-Z05-04 |
0.609 |
|
| 2007 |
Puthoff JB, Stone DS, Cao H, Voyles PM. Change in Activation Volume for Plastic Deformation of Zr-based Bulk Metallic Glass following Annealing Mrs Proceedings. 1048. DOI: 10.1557/Proc-1048-Z03-08 |
0.301 |
|
| 2007 |
Perales-Perez O, Parra-Palomino A, Singhal R, Voyles PM, Zhu Y, Jia W, Tomar MS. Evidence of ferromagnetism in Zn1−xMxO (M = Ni,Cu) nanocrystals for spintronics Nanotechnology. 18: 315606. DOI: 10.1088/0957-4484/18/31/315606 |
0.327 |
|
| 2007 |
Bogle SN, Voyles PM, Khare SV, Abelson JR. Quantifying nanoscale order in amorphous materials: Simulating fluctuation electron microscopy of amorphous silicon Journal of Physics Condensed Matter. 19. DOI: 10.1088/0953-8984/19/45/455204 |
0.361 |
|
| 2007 |
Stratton WG, Voyles PM. Comparison of fluctuation electron microscopy theories and experimental methods Journal of Physics: Condensed Matter. 19: 455203. DOI: 10.1088/0953-8984/19/45/455203 |
0.781 |
|
| 2007 |
Abelson J, Drabold D, Elliot S, Voyles P. Proceedings of the International Conference on Nanoscale Order in Amorphous and Partially Ordered Solids, Trinity College, Cambridge, UK, July 9–11, 2007 Journal of Physics: Condensed Matter. 19: 450301. DOI: 10.1088/0953-8984/19/45/450301 |
0.318 |
|
| 2007 |
Senkowicz BJ, Polyanskii A, Mungall RJ, Zhu Y, Giencke JE, Voyles PM, Eom CB, Hellstrom EE, Larbalestier DC. Understanding the route to high critical current density in mechanically alloyed Mg(B1-xCx)2 Superconductor Science and Technology. 20: 650-657. DOI: 10.1088/0953-2048/20/7/011 |
0.302 |
|
| 2007 |
Zhu Y, Larbalestier DC, Voyles PM, Pogrebnyakov AV, Xi XX, Redwing JM. Nanoscale disorder in high critical field, carbon-doped MgB2 hybrid physical-chemical vapor deposition thin films Applied Physics Letters. 91. DOI: 10.1063/1.2775088 |
0.334 |
|
| 2007 |
Zhu Y, Matsumoto A, Senkowicz BJ, Kumakura H, Kitaguchi H, Jewell MC, Hellstrom EE, Larbalestier DC, Voyles PM. Microstructures of SiC nanoparticle-doped Mg B2 Fe tapes Journal of Applied Physics. 102. DOI: 10.1063/1.2750409 |
0.341 |
|
| 2007 |
Voyles P, Yang J, Zuo J, Stemmer S. The Electron Microscopy Database: A Resource for Teaching and Learning Quantitative Methods in Electron Microscopy and Spectroscopy Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607074156 |
0.315 |
|
| 2006 |
Einspahr JJ, Voyles PM. Prospects for 3D, nanometer-resolution imaging by confocal STEM. Ultramicroscopy. 106: 1041-52. PMID 16916585 DOI: 10.1016/J.Ultramic.2006.04.018 |
0.304 |
|
| 2006 |
Kisa M, Li L, Yang J, Minton TK, Stratton WG, Voyles P, Chen X, Van Benthem K, Pennycook SJ. Homogeneous silica formed by the oxidation of Si(100) in hyperthermal atomic oxygen Journal of Spacecraft and Rockets. 43: 431-435. DOI: 10.2514/1.17323 |
0.775 |
|
| 2006 |
Stratton W, Hamann J, Perepezko J, Voyles P. Electron beam induced crystallization of amorphous Al-based alloys in the TEM Intermetallics. 14: 1061-1065. DOI: 10.1016/J.Intermet.2006.01.025 |
0.773 |
|
| 2006 |
Cao H, Ma D, Hsieh K, Ding L, Stratton WG, Voyles PM, Pan Y, Cai M, Dickinson JT, Chang YA. Computational thermodynamics to identify Zr–Ti–Ni–Cu–Al alloys with high glass-forming ability Acta Materialia. 54: 2975-2982. DOI: 10.1016/J.Actamat.2006.02.051 |
0.759 |
|
| 2006 |
Voyles PM. Imaging Single Atoms with Z-Contrast Scanning Transmission Electron Microscopy in Two and Three Dimensions Microchimica Acta. 155: 5-10. DOI: 10.1007/S00604-006-0500-6 |
0.324 |
|
| 2005 |
Stratton WG, Hamann J, Perepezko JH, Voyles PM, Mao X, Khare SV. Aluminum nanoscale order in amorphous Al92 Sm8 measured by fluctuation electron microscopy Applied Physics Letters. 86: 1-3. DOI: 10.1063/1.1897830 |
0.763 |
|
| 2005 |
Nittala LN, Twesten RD, Voyles PM, Abelson JR. Measuring the Characteristic Length Scale of Medium Range Order in Amorphous Silicon Using Variable Resolution Fluctuation Electron Microscopy Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605506779 |
0.363 |
|
| 2005 |
Kisa M, Stratton WG, Minton TK, Van Benthem K, Pennycook SJ, Voyles PM, Chen X, Li L, Yang JC. Increased ordering in the amorphous SiO x due to hyperthermal atomic oxygen Materials Research Society Symposium Proceedings. 851: 419-424. |
0.752 |
|
| 2004 |
Voyles PM, Muller DA, Kirkland EJ. Depth-dependent imaging of individual dopant atoms in silicon. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 10: 291-300. PMID 15306055 DOI: 10.1017/S1431927604040012 |
0.357 |
|
| 2004 |
Kisa M, Stratton WG, Minton TK, Benthem Kv, Pennycook SJ, Voyles PM, Chen X, Li L, Yang JC. Increased Ordering in the Amorphous SiO x due to Hyperthermal Atomic Oxygen. Mrs Proceedings. 851. DOI: 10.1557/Proc-851-Nn9.5 |
0.762 |
|
| 2004 |
Stratton WG, Voyles PM, Hamann J, Perepezko JH. Medium-range order in high al-content amorphous alloys measured by fluctuation electron microscopy Microscopy and Microanalysis. 10: 788-789. DOI: 10.1557/Proc-806-Mm9.4 |
0.779 |
|
| 2004 |
Khare SV, Nakhmanson SM, Voyles PM, Keblinski P, Abelson JR. Evidence from atomistic simulations of fluctuation electron microscopy for preferred local orientations in amorphous silicon Applied Physics Letters. 85: 745-747. DOI: 10.1063/1.1776614 |
0.328 |
|
| 2004 |
Khare SV, Nakhmanson SM, Voyles PM, Keblinski P, Abelson JR. Evidence from simulations for orientational medium range order in fluctuation-electron-microscopy observations of a-Si Microscopy and Microanalysis. 10: 820-821. DOI: 10.1017/S1431927604880863 |
0.35 |
|
| 2003 |
Voyles PM, Chadi DJ, Citrin PH, Muller DA, Grazul JL, Northrup PA, Gossmann HJ. Evidence for a new class of defects in highly n-doped Si: donor-pair-vacancy-interstitial complexes. Physical Review Letters. 91: 125505. PMID 14525374 DOI: 10.1103/Physrevlett.91.125505 |
0.327 |
|
| 2003 |
Voyles PM, Grazul JL, Muller DA. Imaging individual atoms inside crystals with ADF-STEM. Ultramicroscopy. 96: 251-73. PMID 12871793 DOI: 10.1016/S0304-3991(03)00092-5 |
0.322 |
|
| 2003 |
Castell MR, Muller DA, Voyles PM. Dopant mapping for the nanotechnology age. Nature Materials. 2: 129-31. PMID 12612660 DOI: 10.1038/Nmat840 |
0.312 |
|
| 2003 |
Dash RK, Voyles PM, Gibson JM, Treacy MMJ, Keblinski P. A quantitative measure of medium-range order in amorphous materials from transmission electron micrographs Journal of Physics Condensed Matter. 15. DOI: 10.1088/0953-8984/15/31/317 |
0.395 |
|
| 2003 |
Gerbi JE, Voyles PM, Treacy MMJ, Gibson JM, Abelson JR. Increasing medium-range order in amorphous silicon with low-energy ion bombardment Applied Physics Letters. 82: 3665-3667. DOI: 10.1063/1.1578164 |
0.325 |
|
| 2003 |
Ho MY, Gong H, Wilk GD, Busch BW, Green ML, Voyles PM, Muller DA, Bude M, Lin WH, See A, Loomans ME, Lahiri SK, Räisänen PI. Morphology and crystallization kinetics in HfO2 thin films grown by atomic layer deposition Journal of Applied Physics. 93: 1477-1481. DOI: 10.1063/1.1534381 |
0.336 |
|
| 2003 |
Voyles PM, Abelson JR. Medium-range order in amorphous silicon measured by fluctuation electron microscopy Solar Energy Materials and Solar Cells. 78: 85-113. DOI: 10.1016/S0927-0248(02)00434-8 |
0.393 |
|
| 2003 |
Citrin PH, Voyles PM, Chadi DJ, Muller DA. A new class of defects in highly n-doped silicon Physica B-Condensed Matter. 340: 784-789. DOI: 10.1016/J.Physb.2003.09.190 |
0.332 |
|
| 2002 |
Voyles PM, Muller DA. Fluctuation microscopy in the STEM. Ultramicroscopy. 93: 147-59. PMID 12425592 DOI: 10.1017/S1431927600027203 |
0.378 |
|
| 2002 |
Voyles PM, Muller DA, Grazul JL, Citrin PH, Gossmann HJ. Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si. Nature. 416: 826-9. PMID 11976677 DOI: 10.1038/416826A |
0.334 |
|
| 2002 |
Voyles PM, Muller DA, Grazul JL, Citrin PH, Gossmann HL. Imaging Single Dopant Atoms and Nanoclusters in Highly n-type Bulk Si Microscopy and Microanalysis. 8: 1614-1615. DOI: 10.1017/S143192760210465X |
0.311 |
|
| 2001 |
Voyles PM, Gerbi JE, Treacy MM, Gibson JM, Abelson JR. Absence of an abrupt phase change from polycrystalline to amorphous in silicon with deposition temperature. Physical Review Letters. 86: 5514-7. PMID 11415289 DOI: 10.1103/Physrevlett.86.5514 |
0.369 |
|
| 2001 |
Nakhmanson SM, Mousseau N, Barkema GT, Voyles PM, Drabold DA. Models of paracrystalline silicon with a defect-free bandgap International Journal of Modern Physics B. 15: 3253-3257. DOI: 10.1142/S0217979201007580 |
0.348 |
|
| 2001 |
Nakhmanson SM, Voyles PM, Mousseau N, Barkema GT, Drabold DA. Realistic models of paracrystalline silicon Physical Review B - Condensed Matter and Materials Physics. 63: 2352071-2352076. DOI: 10.1103/Physrevb.63.235207 |
0.337 |
|
| 2001 |
Voyles PM, Zotov N, Nakhmanson SM, Drabold DA, Gibson JM, Treacy MMJ, Keblinski P. Structure and physical properties of paracrystailine atomistic models of amorphous silicon Journal of Applied Physics. 90: 4437-4451. DOI: 10.1063/1.1407319 |
0.332 |
|
| 2001 |
Voyles PM, Gerbi JE, Treacy M, Gibson JM, Abelson JR. Increased medium-range order in amorphous silicon with increased substrate temperature Journal of Non-Crystalline Solids. 45-52. DOI: 10.1016/S0022-3093(01)00652-4 |
0.372 |
|
| 2000 |
Chen X, Gibson JM, Sullivan J, Friedmann T, Voyles P. Fluctuation Microscopy Studies of Medium-range Order Structures in Amorphous Tetrahedral Semiconductors Mrs Proceedings. 638. DOI: 10.1557/Proc-638-F14.40.1 |
0.365 |
|
| 2000 |
Voyles PM, Treacy MMJ, Gibson JM. Thermodynamics of Paracrystalline Silicon Mrs Proceedings. 616. DOI: 10.1557/Proc-616-47 |
0.322 |
|
| 2000 |
Voyles PM, Treacy MMJ, Jin H, Abelson JR, Gibson JM, Yang J, Guha S, Crandall RS. Comparative Fluctuation Microscopy Study of Medium-Range Order in Hydrogenated Amorphous Silicon Deposited by Various Methods Mrs Proceedings. 609. DOI: 10.1557/Proc-609-A2.4 |
0.362 |
|
| 1999 |
Cheng J, Gibson JM, Voyles PM, Treacy MMJ, Jacobson DC. Ion-Implanted Amorphous Silicon Studied by Variable Coherence TEM Mrs Proceedings. 589. DOI: 10.1557/Proc-589-247 |
0.303 |
|
| 1999 |
Voyles PM, Treacy MMJ, Gibson JM, Jin H, Abelson JR. Experimental Methods and Data Analysis for Fluctuation Microscopy Mrs Proceedings. 589. DOI: 10.1557/Proc-589-155 |
0.359 |
|
| 1999 |
Iwai T, Voyles PM, Gibson JM, Oono Y. Method for detecting subtle spatial structures by fluctuation microscopy Physical Review B - Condensed Matter and Materials Physics. 60: 191-200. DOI: 10.1103/Physrevb.60.191 |
0.312 |
|
| 1998 |
Gibson JM, Treacy MMJ, Voyles PM, Abelson JR, Jin H. Changes in the Medium Range Order of α-Si:H Thin Films Observed by Variable Coherence Tem Mrs Proceedings. 507. DOI: 10.1557/Proc-507-837 |
0.354 |
|
| 1998 |
Gibson JM, Treacy MMJ, Voyles PM, Jin H, Abelson JR. Structural disorder induced in hydrogenated amorphous silicon by light soaking Applied Physics Letters. 73: 3093-3095. DOI: 10.1063/1.122683 |
0.343 |
|
| 1998 |
Gibson JM, Treacy MMJ, Voyles PM. Fluctuation Microscopy: A New Class of Microscopy Techniques for Probing Medium Range Order in Amorphous Materials Microscopy and Microanalysis. 4: 702-703. DOI: 10.1017/S1431927600023631 |
0.324 |
|
| Low-probability matches (unlikely to be authored by this person) |
| 2020 |
Du Q, Liu X, Fan H, Zeng Q, Wu Y, Wang H, Chatterjee D, Ren Y, Ke Y, Voyles PM, Lu Z, Ma E. Reentrant glass transition leading to ultrastable metallic glass Materials Today. 34: 66-77. DOI: 10.1016/J.Mattod.2019.09.002 |
0.299 |
|
| 2019 |
Du D, Lim A, Zhang C, Strohbeen PJ, Shourov EH, Rodolakis F, McChesney JL, Voyles P, Fredrickson DC, Kawasaki JK. High electrical conductivity in the epitaxial polar metals LaAuGe and LaPtSb Apl Materials. 7: 121107. DOI: 10.1063/1.5132339 |
0.299 |
|
| 2012 |
Yi F, Voyles PM. Analytical and computational modeling of fluctuation electron microscopy from a nanocrystal/amorphous composite. Ultramicroscopy. 122: 37-47. PMID 22982938 DOI: 10.1016/J.Ultramic.2012.07.022 |
0.297 |
|
| 2016 |
Yu M, Yankovich AB, Kaczmarowski A, Morgan D, Voyles PM. Integrated Computational and Experimental Structure Refinement for Nanoparticles. Acs Nano. PMID 27063615 DOI: 10.1021/Acsnano.5B05722 |
0.296 |
|
| 2000 |
Treacy MMJ, Voyles PM, Gibson JM. Schläfli cluster topological analysis of medium range order in paracrystalline amorphous semiconductor models Journal of Non-Crystalline Solids. 266: 150-155. DOI: 10.1016/S0022-3093(99)00794-2 |
0.296 |
|
| 2011 |
Liu HY, Li X, Liu S, Ni X, Avrutin V, Izyumskaya N, Özgür Ü, Yankovich AB, Kvit AV, Voyles PM, Reshchikov MA, Morkoç H. Optimization of ZnO:Ga properties for application as a transparent conducting oxide in InGaN-based light-emitting diodes Proceedings of Spie. 7939. DOI: 10.1117/12.875515 |
0.293 |
|
| 1998 |
Gerbi JE, Voyles P, Gibson JM, Abelson OJR. Enhanced Crystallinity of Microcrystalline Silicon Thin Films Using Deuterium in Reactive Magnetron Sputter Deposition at 230°C Mrs Proceedings. 507. DOI: 10.1557/Proc-507-429 |
0.292 |
|
| 2018 |
Zhao K, Sun C, Yu Y, Dong Y, Zhang C, Wang C, Voyles PM, Mai L, Wang X. Surface Gradient Ti-Doped MnO Nanowires for High-Rate and Long-Life Lithium Battery. Acs Applied Materials & Interfaces. PMID 30489060 DOI: 10.1021/Acsami.8B13376 |
0.291 |
|
| 2011 |
Yi F, Voyles PM. Effect of sample thickness, energy filtering, and probe coherence on fluctuation electron microscopy experiments. Ultramicroscopy. 111: 1375-80. PMID 21864780 DOI: 10.1016/J.Ultramic.2011.05.004 |
0.291 |
|
| 2012 |
Kvit A, Yankovich A, Puchala B, Morgan D, Voyles P, Avrutin V, Liu H, Izyumskaya N, Özgür U, Morkoç H. Structural and Elemental Analysis of Heavily- Doped ZnO Microscopy and Microanalysis. 18: 392-393. DOI: 10.1017/S1431927612003819 |
0.291 |
|
| 2011 |
Sinkler W, Bradley S, Allard L, Voyles P. Use of Aberration-Corrected STEM for Direct Structure and Chemistry Analysis of Catalytic Metal Particles Microscopy and Microanalysis. 17: 1286-1287. DOI: 10.1017/S1431927611007306 |
0.289 |
|
| 2018 |
Zhang D, Sun C, Lv Y, Schliep KB, Zhao Z, Chen J, Voyles PM, Wang J. L10 Fe−Pd
Synthetic Antiferromagnet through an fcc Ru Spacer Utilized for Perpendicular Magnetic Tunnel Junctions Physical Review Applied. 9. DOI: 10.1103/Physrevapplied.9.044028 |
0.287 |
|
| 2010 |
Chen K, Zhuang CG, Li Q, Zhu Y, Voyles PM, Weng X, Redwing JM, Singh RK, Kleinsasser AW, Xi XX. High-Jc MgB2 Josephson junctions with operating temperature up to 40 K Applied Physics Letters. 96: 042506. DOI: 10.1063/1.3298366 |
0.287 |
|
| 2016 |
Zhang P, Wang Z, Perepezko JH, Voyles PM. Elastic and inelastic mean free paths of 200keV electrons in metallic glasses. Ultramicroscopy. 171: 89-95. PMID 27649098 DOI: 10.1016/J.Ultramic.2016.09.005 |
0.286 |
|
| 2016 |
Jacobs R, Zheng B, Puchala B, Voyles PM, Yankovich AB, Morgan D. Counterintuitive Reconstruction of the Polar O-Terminated ZnO Surface With Zinc Vacancies and Hydrogen. The Journal of Physical Chemistry Letters. PMID 27780360 DOI: 10.1021/Acs.Jpclett.6B02174 |
0.285 |
|
| 2015 |
He L, Jiang H, Zhai Y, Liu C, Szlufarska I, Tyburska-Puschel B, Sridharan K, Voyles P. Atomic Resolution Imaging of Black Spot Defects in Ion Irradiated Silicon Carbide Microscopy and Microanalysis. 21: 1337-1338. DOI: 10.1017/S1431927615007473 |
0.285 |
|
| 2019 |
Gibson JM, Treacy MM, Voyles PM. Atom pair persistence in disordered materials from fluctuation microscopy Ultramicroscopy. 83: 169-78. PMID 10841332 DOI: 10.1016/S0304-3991(00)00013-9 |
0.283 |
|
| 2015 |
Schmidt V, Rösner H, Peterlechner M, Wilde G, Voyles PM. Quantitative Measurement of Density in a Shear Band of Metallic Glass Monitored Along its Propagation Direction. Physical Review Letters. 115: 035501. PMID 26230801 DOI: 10.1103/Physrevlett.115.035501 |
0.28 |
|
| 2019 |
Maldonis JJ, Banadaki AD, Patala S, Voyles PM. Short-range order structure motifs learned from an atomistic model of a Zr50Cu45Al5 metallic glass Acta Materialia. 175: 35-45. DOI: 10.1016/J.Actamat.2019.05.002 |
0.28 |
|
| 2011 |
Mattson E, Krystofiak E, Voyles P, Hirschmugl C, Gajdardziska-Josifovska M, Oliver J. Synthesis, Structure, and Morphology of Magnetic Core-Shell Nanoparticles Microscopy and Microanalysis. 17: 1428-1429. DOI: 10.1017/S1431927611008014 |
0.279 |
|
| 2005 |
Kim WB, Rodriguez-Rivera GJ, Evans ST, Voitl T, Einspahr JJ, Voyles PM, Dumesic JA. Catalytic oxidation of CO by aqueous polyoxometalates on carbon-supported gold nanoparticles Journal of Catalysis. 235: 327-332. DOI: 10.1016/J.Jcat.2005.06.003 |
0.279 |
|
| 2009 |
Rodrigues D, Jiang J, Zhu Y, Voyles P, Larbalestier DC, Hellstrom EE. Flux pinning optimization of MgB2 bulk samples prepared using high-energy ball milling and addition of TaB2 Ieee Transactions On Applied Superconductivity. 19: 2797-2801. DOI: 10.1109/Tasc.2009.2018471 |
0.279 |
|
| 2014 |
Yankovich AB, Voyles PM. Precision Limits to STEM Imaging from Dynamical Scattering and Channeling of Sub-Angstrom Electron Probes Microscopy and Microanalysis. 20: 120-121. DOI: 10.1017/S1431927614002323 |
0.278 |
|
| 2011 |
Liu H, Avrutin V, Izyumskaya N, Reshchikov M, Wolgast S, Kurdak C, Yankovich A, Kvit A, Voyles P, Özgür Ü, Morkoç H. Effect of Growth Conditions on Electronic and Structural Properties of GZO Films Grown by Plasma-enhanced Molecular Beam Epitaxy on p-GaN(0001)/Sapphire Templates Mrs Proceedings. 1315. DOI: 10.1557/Opl.2011.716 |
0.278 |
|
| 1998 |
Gibson JM, Cheng J, Voyles P, TREACY M, Jacobson D. The Structure of Ion-Implanted Amorphous Silicon Mrs Proceedings. 540. DOI: 10.1557/Proc-540-27 |
0.277 |
|
| 2017 |
Voyles PM. Informatics and data science in materials microscopy Current Opinion in Solid State and Materials Science. 21: 141-158. DOI: 10.1016/J.Cossms.2016.10.001 |
0.277 |
|
| 2003 |
Voyles PM, Muller DA, Grazul JL. ADF-STEM Imaging of Dopants and Defect Nanoclusters in Si Microscopy and Microanalysis. 9: 22-23. DOI: 10.1017/S1431927603440166 |
0.277 |
|
| 2008 |
Senkowicz BJ, Mungall RJ, Zhu Y, Jiang J, Voyles PM, Hellstrom EE, Larbalestier DC. Nanoscale grains, high irreversibility field and large critical current density as a function of high-energy ball milling time in C-doped magnesium diboride Superconductor Science and Technology. 21. DOI: 10.1088/0953-2048/21/3/035009 |
0.277 |
|
| 2015 |
Yankovich AB, Feng J, Kvit A, Slater T, Haigh S, Morgan D, Voyles PM. Revealing New Atomic-scale Information about Materials by Improving the Quality and Quantifiability of Aberration-corrected STEM Data Microscopy and Microanalysis. 21: 2409-2410. DOI: 10.1017/S1431927615012829 |
0.276 |
|
| 2011 |
Batson P, Muller D, Allard L, Voyles P, Chi M, O'Keefe M. Pre-Meeting Congress on Opportunities, Artifacts and Interpretation of Aberration-Corrected Electron Microscopy Data Microscopy and Microanalysis. 17: 20-20. DOI: 10.1017/S1431927611000729 |
0.276 |
|
| 2012 |
Yankovich AB, Puchala B, Wang F, Seo JH, Morgan D, Wang X, Ma Z, Kvit AV, Voyles PM. Stable p-type conduction from Sb-decorated head-to-head basal plane inversion domain boundaries in ZnO nanowires. Nano Letters. 12: 1311-6. PMID 22268642 DOI: 10.1021/Nl203848T |
0.276 |
|
| 2020 |
Zhang C, Han R, Zhang A, Voyles P. Denoising Atomic Resolution Hyperspectral Data with Tensor Singular Value Decomposition Microscopy and Microanalysis. 26: 1722-1723. DOI: 10.1017/S143192762001911X |
0.272 |
|
| 2016 |
Tyburska-Püschel B, Zhai Y, He L, Liu C, Boulle A, Voyles PM, Szlufarska I, Sridharan K. Size distribution of black spot defects and their contribution to swelling in irradiated SiC Journal of Nuclear Materials. 476: 132-139. DOI: 10.1016/J.Jnucmat.2016.04.044 |
0.272 |
|
| 2018 |
Yin X, Chen Q, Tian P, Zhang P, Zhang Z, Voyles PM, Wang X. Ionic Layer Epitaxy of Nanometer-Thick Palladium Nanosheets with Enhanced Electrocatalytic Properties Chemistry of Materials. 30: 3308-3314. DOI: 10.1021/Acs.Chemmater.8B00575 |
0.272 |
|
| 2019 |
Combs AH, Maldonis JJ, Feng J, Xu Z, Voyles PM, Morgan D. Fast approximate STEM image simulations from a machine learning model Advanced Structural and Chemical Imaging. 5. DOI: 10.1186/S40679-019-0064-2 |
0.271 |
|
| 2004 |
Voyles PM. Potential for Optical Sectioning in Aberration-Corrected Z-contrast STEM Microscopy and Microanalysis. 10: 46-47. DOI: 10.1017/S1431927604555654 |
0.269 |
|
| 2003 |
Stratton WG, Hamann J, Perepezko JH, Voyles PM. Medium-Range Order in High Al-content Amorphous Alloys Measured by Fluctuation Electron Microscopy Mrs Proceedings. 806. DOI: 10.1557/PROC-806-MM9.4 |
0.269 |
|
| 2008 |
Zhu Y, Larbalestier DC, Gurevich A, Xi XX, Voyles PM. Nanoscale disorder in MgB2 thin films grown by hybrid physical-chemical vapor deposition Microscopy and Microanalysis. 14: 212-213. DOI: 10.1017/S1431927608081488 |
0.268 |
|
| 2011 |
Liu HY, Li X, Liu S, Ni X, Wu M, Avrutin V, Izyumskaya N, Özgür Ü, Yankovich AB, Kvit AV, Voyles PM, Morkoç H. InGaN based light emitting diodes utilizing Ga doped ZnO as a highly transparent contact to p-GaN Physica Status Solidi (C). 8: 1548-1551. DOI: 10.1002/Pssc.201000860 |
0.267 |
|
| 2001 |
Gerbi JE, Voyles PM, Treacy MMJ, Gibson JM, Chen W, Heuser BJ, Abelson JR. Control of medium range order in amorphous silicon via ion and neutral bombardment Materials Research Society Symposium - Proceedings. 664. DOI: 10.1557/Proc-664-A27.3 |
0.267 |
|
| 2009 |
Calderón-Ortiz E, Perales-Perez O, Voyles P, Gutierrez G, Tomar MS. MnxZn1-xFe2-yRyO4 (R=Gd, Eu) ferrite nanocrystals for magnetocaloric applications Microelectronics Journal. 40: 677-680. DOI: 10.1016/J.Mejo.2008.10.003 |
0.265 |
|
| 2014 |
He L, Chu JP, Li CL, Lee CM, Chen YC, Liaw PK, Voyles PM. Effects of annealing on the compositional heterogeneity and structure in zirconium-based bulk metallic glass thin films Thin Solid Films. 561: 87-92. DOI: 10.1016/J.Tsf.2013.09.042 |
0.264 |
|
| 2017 |
Liu C, He L, Zhai Y, Tyburska-Püschel B, Voyles P, Sridharan K, Morgan D, Szlufarska I. Evolution of small defect clusters in ion-irradiated 3C-SiC: Combined cluster dynamics modeling and experimental study Acta Materialia. 125: 377-389. DOI: 10.1016/J.Actamat.2016.12.020 |
0.262 |
|
| 2016 |
Zhang C, Oh A, Yankovich A, Slater T, Haigh S, Willett R, Voyles PM. Combining Non-Rigid Registration with Non-Local Principle Component Analysis for Atomic Resolution EDS Mapping Microscopy and Microanalysis. 22: 1406-1407. DOI: 10.1017/S143192761600787X |
0.26 |
|
| 2016 |
Kvit AV, Feng J, Zhang C, Morgan D, Voyles PM. High-precision stress mapping and defect characterization of thin films of LaMnO 3 grown on DyScO 3 substrate. Microscopy and Microanalysis. 22: 1526-1527. DOI: 10.1017/S1431927616008473 |
0.26 |
|
| 2019 |
Wang Y, Shi Y, Zhang Z, Carlos C, Zhang C, Bhawnani K, Li J, Wang J, Voyles PM, Szlufarska I, Wang X. Bioinspired Synthesis of Quasi-Two-Dimensional Monocrystalline Oxides Chemistry of Materials. 31: 9040-9048. DOI: 10.1021/Acs.Chemmater.9B03307 |
0.259 |
|
| 2017 |
Feng J, Zhang C, Zhou D, Xu Z, Morgan D, Voyles PM. Applications of High Precision STEM Imaging to Structurally Complex Materials Microscopy and Microanalysis. 23: 418-419. DOI: 10.1017/S143192761700277X |
0.259 |
|
| 2020 |
Francis C, Chatterjee D, Muley S, Voyles P. Structural Determination in Metallic Glasses from Correlations in 4D STEM Datasets Microscopy and Microanalysis. 26: 940-942. DOI: 10.1017/S1431927620016402 |
0.257 |
|
| 2016 |
Ho P, Tu KH, Zhang J, Sun C, Chen J, Liontos G, Ntetsikas K, Avgeropoulos A, Voyles PM, Ross CA. Domain configurations in Co/Pd and L10-FePt nanowire arrays with perpendicular magnetic anisotropy. Nanoscale. PMID 26883011 DOI: 10.1039/C5Nr08865H |
0.257 |
|
| 2009 |
Bailon-Ruiz SJ, Perales-Perez O, Singh SP, Voyles PM. Effect of Doping on the Structural and Optical Properties of Microwave-Assisted Synthesis of ZnSe@ZnS Core-Shell Quantum Dots Mrs Proceedings. 1207. DOI: 10.1557/Proc-1207-N10-61 |
0.256 |
|
| 2020 |
Wang X, Zhang H, Baba T, Jiang H, Liu C, Guan Y, Elleuch O, Kuech T, Morgan D, Idrobo JC, Voyles PM, Szlufarska I. Radiation-induced segregation in a ceramic. Nature Materials. PMID 32451511 DOI: 10.1038/S41563-020-0683-Y |
0.255 |
|
| 2012 |
Yankovich A, Puchala B, Wang F, Wang X, Morgan D, Kvit A, Voyles P. Head-to-head Inversion Domain Boundaries in Sb-doped p-type ZnO Nanowires Microscopy and Microanalysis. 18: 316-317. DOI: 10.1017/S1431927612003431 |
0.255 |
|
| 2015 |
Kvit AV, Feng J, Yankovich AB, Morgan D, Voyles PM. Increased Fluctuation of Interatomic Distances in Distorted Structure of Stoichiometric LaMnO3 Microscopy and Microanalysis. 21: 2413-2414. DOI: 10.1017/S1431927615012842 |
0.253 |
|
| 2006 |
Matsumoto A, Kumakura H, Kitaguchi H, Senkowicz BJ, Jewell MC, Hellstrom EE, Zhu Y, Voyles PM, Larbalestier DC. Evaluation of connectivity, flux pinning, and upper critical field contributions to the critical current density of bulk pure and SiC-alloyed MgB 2 Applied Physics Letters. 89. DOI: 10.1063/1.2357027 |
0.25 |
|
| 2000 |
Treacy MMJ, Voyles PM, Gibson JM. Topological Signatures of Medium Range Order in Amorphous Semiconductor Models Mrs Proceedings. 609. DOI: 10.1557/Proc-609-A2.5 |
0.245 |
|
| 2015 |
Schroeder DP, Aksamija Z, Rath A, Voyles PM, Lagally MG, Eriksson MA. Thermal Resistance of Transferred-Silicon-Nanomembrane Interfaces Physical Review Letters. 115. DOI: 10.1103/Physrevlett.115.256101 |
0.242 |
|
| 2023 |
Chatterjee D, Huang S, Gu K, Ju J, Yu J, Bock H, Yu L, Ediger MD, Voyles PM. Using 4D STEM to Probe Mesoscale Order in Molecular Glass Films Prepared by Physical Vapor Deposition. Nano Letters. 23: 2009-2015. PMID 36799489 DOI: 10.1021/acs.nanolett.3c00197 |
0.242 |
|
| 2022 |
Huang S, Francis C, Sunderland J, Jambur V, Szlufarska I, Voyles PM. Large Area, High Resolution Mapping of Approximate Rotational Symmetries in a PdCuSi Metallic Glass Thin Film. Ultramicroscopy. 241: 113612. PMID 36113221 DOI: 10.1016/j.ultramic.2022.113612 |
0.238 |
|
| 2003 |
Voyles PM, Muller DA, Grazul JL. Z-Contrast Imaging of Nanostructures in the STEM Microscopy and Microanalysis. 9: 264-265. DOI: 10.1017/S1431927603441329 |
0.236 |
|
| 2017 |
Feng J, Kvit AV, Zhang C, Morgan D, Voyles PM. Bayesian Statistical Model for Imaging of Single La Vacancies in LaMnO3 Microscopy and Microanalysis. 23: 1572-1573. DOI: 10.1017/S1431927617008522 |
0.236 |
|
| 2014 |
Wang X, Jamison L, Sridharan K, Voyles PM, Morgan D, Szlufarska I. Morphology of Amorphous Pockets in SiC Irradiated with 1 MeV Kr Ions Microscopy and Microanalysis. 20: 1830-1831. DOI: 10.1017/S1431927614010885 |
0.233 |
|
| 2016 |
Feng J, Kvit AV, Zhang C, Morgan D, Voyles PM. Three-Dimensional Imaging of Single La Vacancies in LaMnO 3 Microscopy and Microanalysis. 22: 902-903. DOI: 10.1017/S1431927616005353 |
0.232 |
|
| 2017 |
Almasi H, Sun CL, Li X, Newhouse-Illige T, Bi C, Price KC, Nahar S, Grezes C, Hu Q, Khalili Amiri P, Wang KL, Voyles PM, Wang WG. Perpendicular magnetic tunnel junction with W seed and capping layers Journal of Applied Physics. 121: 153902. DOI: 10.1063/1.4981878 |
0.228 |
|
| 2020 |
Zhang C, Han R, Zhang AR, Voyles PM. Denoising atomic resolution 4D scanning transmission electron microscopy data with tensor singular value decomposition. Ultramicroscopy. 219: 113123. PMID 33032160 DOI: 10.1016/j.ultramic.2020.113123 |
0.226 |
|
| 1996 |
Warner RE, Patty RA, Voyles PM, Nadasen A, Becchetti FD, Brown JA, Esbensen H, Galonsky A, Kolata JJ, Kruse J, Lee MY, Ronningen RM, Schwandt P, von Schwarzenberg J, Sherrill BM, et al. Total reaction and 2n-removal cross sections of 20-60A MeV 4,6,8He, 6-9,11Li, and 10Be on Si. Physical Review. C, Nuclear Physics. 54: 1700-1709. PMID 9971517 DOI: 10.1103/Physrevc.54.1700 |
0.224 |
|
| 2018 |
Voyles PM. Materials Design of Glasses Current Opinion in Solid State and Materials Science. 22: 39-40. DOI: 10.1016/J.Cossms.2018.04.002 |
0.224 |
|
| 2017 |
Bi C, Sun C, Xu M, Newhouse-Illige T, Voyles PM, Wang W. Electrical Control of Metallic Heavy-Metal–Ferromagnet Interfacial States Physical Review Applied. 8. DOI: 10.1103/Physrevapplied.8.034003 |
0.221 |
|
| 2001 |
Gerbi JE, Voyles PM, Treacy MMJ, Gibson JM, Chen W, Heuser BJ, Abelson JR. Control of Medium Range Order in Amorphous Silicon via Ion and Neutral Bombardment Mrs Proceedings. 664. DOI: 10.1557/PROC-664-A27.3 |
0.22 |
|
| 2023 |
Duan T, Shen Y, Imhoff SD, Yi F, Voyles PM, Perepezko JH. Nucleation kinetics model for primary crystallization in Al-Y-Fe metallic glass. The Journal of Chemical Physics. 158: 064504. PMID 36792527 DOI: 10.1063/5.0135730 |
0.219 |
|
| 2015 |
Bornhöfft M, Saltzmann T, Benke J, Voyles PM, Simon U, Wuttig M, Mayer J. Nano-diffraction in STEM and fluctuation electron microscopy of phase-change material Acta Crystallographica Section a Foundations and Advances. 71: s286-s286. DOI: 10.1107/S2053273315095637 |
0.218 |
|
| 2018 |
Rath A, Sivakumar C, Sun C, Patel SJ, Jeong JS, Feng J, Stecklein G, Crowell PA, Palmstrøm CJ, Butler WH, Voyles PM. Reduced interface spin polarization by antiferromagnetically coupled Mn segregated to the
Co2MnSi
/GaAs (001) interface Physical Review B. 97. DOI: 10.1103/Physrevb.97.045304 |
0.218 |
|
| 2003 |
Muller DA, Voyles PM, Grazul JL, Wilk GD. Exploring the physical limits of transistor scaling using STEM Microscopy and Microanalysis. 9: 1012-1013. DOI: 10.1017/S1431927603445066 |
0.217 |
|
| 2019 |
Bammes B, Zhang C, Bilhorn R, Voyles PM. Effectively Synchronizing 4D-STEM Detectors with Probe Movement Microscopy and Microanalysis. 25: 68-69. DOI: 10.1017/S1431927619001077 |
0.212 |
|
| 2020 |
Zhang C, Zhao Y, Jin S, Voyles P. 4D Scanning Transmission Electron Microscopy of a Twisted WS2 Multilayer Structure Microscopy and Microanalysis. 26: 628-630. DOI: 10.1017/S1431927620015330 |
0.211 |
|
| 2015 |
Yu M, Yankovich AB, Kaczmarowski A, Morgan D, Voyles PM. Integrated Computational and Experimental Structure Determination for Nanoparticles Microscopy and Microanalysis. 21: 2201-2202. DOI: 10.1017/S1431927615011782 |
0.208 |
|
| 2016 |
Peterson TA, Patel SJ, Geppert CC, Christie KD, Rath A, Pennachio D, Flatté ME, Voyles PM, Palmstrøm CJ, Crowell PA. Spin injection and detection up to room temperature in Heusler alloy/n-GaAs spin valves Physical Review B. 94. DOI: 10.1103/Physrevb.94.235309 |
0.208 |
|
| 2018 |
Pang Q, Sun C, Yu Y, Zhao K, Zhang Z, Voyles PM, Chen G, Wei Y, Wang X. H2
V3
O8
Nanowire/Graphene Electrodes for Aqueous Rechargeable Zinc Ion Batteries with High Rate Capability and Large Capacity Advanced Energy Materials. 8: 1800144. DOI: 10.1002/Aenm.201800144 |
0.207 |
|
| 2004 |
Zenner GM, Crone WC, Aura Gimm J, Lux KW, Voyles PM, Abbott NL, Cina AP, Comins AP, Tabora J, Tuchscherer P, Tuchscherer T, John Whitsett P, Widstrand CG. Turning Cutting-Edge Research into Secondary Curriculum Mrs Proceedings. 861. DOI: 10.1557/Proc-861-Pp3.3 |
0.201 |
|
| 2005 |
Einspahr JJ, Voyles PM. Confocal Scanning Transmission Electron Microscopy: Theoretical Analysis of Three-Dimensional Imaging Microscopy and Microanalysis. 11. DOI: 10.1017/S1431927605504410 |
0.2 |
|
| 2015 |
McCarthy JJ, Voyles PM, Last JA, Bittner DR, Sadkovich IW. Networked Data Storage and Analysis for the Wisconsin Regional Materials Network Microscopy and Microanalysis. 21: 371-372. DOI: 10.1017/S1431927615002652 |
0.196 |
|
| 2017 |
Sun C, Song Z, Street M, Echtenkamp W, Feng J, Binek C, Morgan D, Voyles PM. Dielectric breakdown along c-axis boundaries in magnetoelectric O2O3 for spintronic devices Microscopy and Microanalysis. 23: 1442-1443. DOI: 10.1017/S1431927617007875 |
0.193 |
|
| 2023 |
Wei J, Moore K, Bammes B, Levin BDA, Hagopian N, Jacobs R, Morgan D, Voyles PM. Deep Learning Approach for High-accuracy Electron Counting of Monolithic Active Pixel Sensor-type Direct Electron Detectors at Increased Electron Dose. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. PMID 38066670 DOI: 10.1093/micmic/ozad132 |
0.192 |
|
| 2020 |
Zhang C, Feng J, Yankovich AB, Kvit A, Berkels B, Voyles PM. Optimizing Nonrigid Registration for Scanning Transmission Electron Microscopy Image Series. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 1-9. PMID 33222719 DOI: 10.1017/S1431927620024708 |
0.189 |
|
| 2021 |
Huang S, Francis C, Ketkaew J, Schroers J, Voyles PM. Correlation symmetry analysis of electron nanodiffraction from amorphous materials. Ultramicroscopy. 232: 113405. PMID 34673441 DOI: 10.1016/j.ultramic.2021.113405 |
0.187 |
|
| 2014 |
Marks LD, Voyles PM. When is Z-Contrast D-Contrast? Microscopy Today. 22: 65-65. DOI: 10.1017/S1551929513001156 |
0.186 |
|
| 2003 |
Petruska MA, Malko AV, Voyles PM, Klimov VI. High‐Performance, Quantum Dot Nanocomposites for Nonlinear Optical and Optical Gain Applications Advanced Materials. 15: 610-613. DOI: 10.1002/Adma.200304450 |
0.183 |
|
| 1999 |
Gibson JM, Treacy MMJ, Voyles PM. Some Things Never Change - The Microcrystallite Story After 25 Years Microscopy and Microanalysis. 5: 682-683. DOI: 10.1017/S1431927600016731 |
0.179 |
|
| 2023 |
Zhang H, Liu Q, Deng L, Ma Y, Daneshmandi S, Cen C, Zhang C, Voyles PM, Jiang X, Zhao J, Chu CW, Gai Z, Li L. Room-Temperature Ferromagnetism in Epitaxial Bilayer FeSb/SrTiO(001) Terminated with a Kagome Lattice. Nano Letters. PMID 37913524 DOI: 10.1021/acs.nanolett.3c03415 |
0.178 |
|
| 2023 |
Huang S, Voyles PM. Momentum transfer resolved electron correlation microscopy. Ultramicroscopy. 256: 113886. PMID 38000289 DOI: 10.1016/j.ultramic.2023.113886 |
0.174 |
|
| 2023 |
Wei J, Moore K, Bammes B, Levin BDA, Morgan D, Voyles PM. Deep Learning Approach for High-accuracy Electron Counting of Direct Electron Detectors at Increased Electron Dose. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 702-704. PMID 37613170 DOI: 10.1093/micmic/ozad067.346 |
0.172 |
|
| 2023 |
Wei J, Blaiszik B, Scourtas A, Morgan D, Voyles PM. Benchmark Tests of Atom Segmentation Deep Learning Models with a Consistent Dataset. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 552-562. PMID 37749717 DOI: 10.1093/micmic/ozac043 |
0.167 |
|
| 2023 |
Ju J, Chatterjee D, Voyles PM, Bock H, Ediger MD. Vapor-to-glass preparation of biaxially aligned organic semiconductors. The Journal of Chemical Physics. 159. PMID 38038197 DOI: 10.1063/5.0174819 |
0.16 |
|
| 2023 |
Yu J, Chen Z, Fatina C, Chatterjee D, Bock H, Richert R, Voyles P, Ediger MD, Yu L. Engineering the glass structure of a discotic liquid crystal by multiple kinetic arrests. The Journal of Chemical Physics. 158. PMID 37218703 DOI: 10.1063/5.0149886 |
0.16 |
|
| 2021 |
Voyles P. Atomic structure of a glass imaged at last. Nature. 592: 31-32. PMID 33790449 DOI: 10.1038/d41586-021-00794-6 |
0.159 |
|
| 2020 |
Zhao Y, Zhang C, Kohler DD, Scheeler JM, Wright JC, Voyles PM, Jin S. Supertwisted spirals of layered materials enabled by growth on non-Euclidean surfaces. Science (New York, N.Y.). 370: 442-445. PMID 33093106 DOI: 10.1126/science.abc4284 |
0.156 |
|
| 2021 |
Chatterjee D, Annamareddy A, Ketkaew J, Schroers J, Morgan D, Voyles PM. Fast Surface Dynamics on a Metallic Glass Nanowire. Acs Nano. PMID 34152730 DOI: 10.1021/acsnano.1c00500 |
0.147 |
|
| 2021 |
Du D, Manzo S, Zhang C, Saraswat V, Genser KT, Rabe KM, Voyles PM, Arnold MS, Kawasaki JK. Epitaxy, exfoliation, and strain-induced magnetism in rippled Heusler membranes. Nature Communications. 12: 2494. PMID 33941781 DOI: 10.1038/s41467-021-22784-y |
0.14 |
|
| 1996 |
Warner RE, Patty RA, Voyles PM, Nadasen A, Becchetti FD, Brown JA, Esbensen H, Galonsky A, Kolata JJ, Kruse J, Lee MY, Ronningen RM, Schwandt P, Von Schwarzenberg J, Sherrill BM, et al. Total reaction and 2n-removal cross sections of 20-60A MeV 4,6,8He, 6-9,11Li, and 10Be on Si Physical Review C - Nuclear Physics. 54: 1700-1709. DOI: 10.1103/PhysRevC.54.1700 |
0.121 |
|
| 2022 |
Li Y, Annamareddy A, Morgan D, Yu Z, Wang B, Cao C, Perepezko JH, Ediger MD, Voyles PM, Yu L. Surface Diffusion Is Controlled by Bulk Fragility across All Glass Types. Physical Review Letters. 128: 075501. PMID 35244425 DOI: 10.1103/PhysRevLett.128.075501 |
0.116 |
|
| 1999 |
Iwai T, Voyles PM, Gibson JM, Oono Y. Method for detecting subtle spatial structures by fluctuation microscopy Physical Review B. 60: 191-200. DOI: 10.1103/PHYSREVB.60.191 |
0.109 |
|
| 2021 |
Annamareddy A, Li Y, Yu L, Voyles PM, Morgan D. Factors correlating to enhanced surface diffusion in metallic glasses. The Journal of Chemical Physics. 154: 104502. PMID 33722035 DOI: 10.1063/5.0039078 |
0.108 |
|
| 2021 |
Li XG, Blaiszik B, Schwarting ME, Jacobs R, Scourtas A, Schmidt KJ, Voyles PM, Morgan D. Graph network based deep learning of bandgaps. The Journal of Chemical Physics. 155: 154702. PMID 34686040 DOI: 10.1063/5.0066009 |
0.088 |
|
| 2015 |
Schmidt V, Rösner H, Peterlechner M, Wilde G, Voyles PM. Quantitative Measurement of Density in a Shear Band of Metallic Glass Monitored Along its Propagation Direction Physical Review Letters. 115. DOI: 10.1103/PhysRevLett.115.035501 |
0.084 |
|
| 2023 |
Huang S, Voyles PM. 5D-STEM of Real- and Reciprocal-space Resolved Dynamics in a Metallic Liquid. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 272-273. PMID 37613402 DOI: 10.1093/micmic/ozad067.124 |
0.081 |
|
| 2023 |
Francis C, Voyles PM. pyxem: A Scalable Mature Python Package for Analyzing 4-D STEM Data. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 685-686. PMID 37613360 DOI: 10.1093/micmic/ozad067.338 |
0.048 |
|
| 2023 |
Wei J, Voyles PM. Foundry-ML: a Platform for FAIR Machine Learning in Materials Science. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 29: 720. PMID 37613342 DOI: 10.1093/micmic/ozad067.355 |
0.034 |
|
| 2003 |
Petruska MA, Malko AV, Voyles PM, Klimov VI. High-performance, quantum dot nanocomposites for nonlinear optical and optical gain applications Advanced Materials. 15: 610-613. |
0.03 |
|
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