Stefan Dilhaire - Publications

Université de Bordeaux, Talence, Nouvelle-Aquitaine, France 
Thermal quadrupole, Nanophotonics, Surface plasmon polaritons, Hot electrons, Absorption, Afm, Phonon, Acoustic imaging, Core@shell, Femtosecond pump- probe

90 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2021 Grauby S, Ben Amor A, Hallais G, Vincent L, Dilhaire S. Imaging Thermoelectric Properties at the Nanoscale. Nanomaterials (Basel, Switzerland). 11. PMID 34062797 DOI: 10.3390/nano11051199  0.329
2020 Zenji A, Rampnoux JM, Grauby S, Dilhaire S. Ultimate-resolution thermal spectroscopy in time domain thermoreflectance (TDTR) Journal of Applied Physics. 128: 65106. DOI: 10.1063/5.0015391  0.355
2019 Ben Amor A, Djomani D, Fakhfakh M, Dilhaire S, Vincent L, Grauby S. Si and Ge allotrope heterostructured nanowires: experimental evaluation of the thermal conductivity reduction. Nanotechnology. PMID 31195385 DOI: 10.1088/1361-6528/Ab29A6  0.374
2018 Petsagkourakis I, Pavlopoulou E, Cloutet E, Chen YF, Liu X, Fahlman M, Berggren M, Crispin X, Dilhaire S, Fleury G, Hadziioannou G. Correlating the Seebeck coefficient of thermoelectric polymer thin films to their charge transport mechanism Organic Electronics. 52: 335-341. DOI: 10.1016/J.Orgel.2017.11.018  0.755
2017 Lozan O, Sundararaman R, Ea-Kim B, Rampnoux JM, Narang P, Dilhaire S, Lalanne P. Increased rise time of electron temperature during adiabatic plasmon focusing. Nature Communications. 8: 1656. PMID 29162822 DOI: 10.1038/S41467-017-01802-Y  0.756
2017 d'Acremont Q, Pernot G, Rampnoux JM, Furlan A, Lacroix D, Ludwig A, Dilhaire S. High-throughput heterodyne thermoreflectance: Application to thermal conductivity measurements of a Fe-Si-Ge thin film alloy library. The Review of Scientific Instruments. 88: 074902. PMID 28764526 DOI: 10.1063/1.4986469  0.771
2017 Coffy E, Dodane G, Euphrasie S, Mosset A, Vairac P, Martin N, Baida H, Rampnoux JM, Dilhaire S. Anisotropic propagation imaging of elastic waves in oriented columnar thin films Journal of Physics D: Applied Physics. 50: 484005. DOI: 10.1088/1361-6463/Aa92Ad  0.331
2017 Furlan A, Grochla D, D'Acremont Q, Pernot G, Dilhaire S, Ludwig A. Influence of Substrate Temperature and Film Thickness on Thermal, Electrical, and Structural Properties of HPPMS and DC Magnetron Sputtered Ge Thin Films Advanced Engineering Materials. 19: 1600854. DOI: 10.1002/Adem.201600854  0.753
2016 Petsagkourakis I, Pavlopoulou E, Portale G, Kuropatwa BA, Dilhaire S, Fleury G, Hadziioannou G. Structurally-driven Enhancement of Thermoelectric Properties within Poly(3,4-ethylenedioxythiophene) thin Films. Scientific Reports. 6: 30501. PMID 27470637 DOI: 10.1038/Srep30501  0.767
2016 Casanova A, D'Acremont Q, Santarelli G, Dilhaire S, Courjaud A. Ultrafast amplifier additive timing jitter characterization and control. Optics Letters. 41: 898-900. PMID 26974074 DOI: 10.1364/Ol.41.000898  0.32
2016 Chandezon J, Rampnoux JM, Dilhaire S, Audoin B, Guillet Y. In-line femtosecond common-path interferometer in reflection mode. Optics Express. 23: 27011-9. PMID 26480362 DOI: 10.1364/Oe.23.027011  0.336
2016 Michaud J, Bechou L, Veyrie D, Laruelle F, Dilhaire S, Grauby S. Thermal Behavior of High Power GaAs-Based Laser Diodes in Vacuum Environment Ieee Photonics Technology Letters. 28: 665-668. DOI: 10.1109/Lpt.2015.2504394  0.4
2015 Savelli G, Stein SS, Bernard-Granger G, Faucherand P, Montès L, Dilhaire S, Pernot G. Titanium-based silicide quantum dot superlattices for thermoelectrics applications. Nanotechnology. 26: 275605. PMID 26086207 DOI: 10.1088/0957-4484/26/27/275605  0.737
2015 Abbas A, Guillet Y, Rampnoux JM, Rigail P, Mottay E, Audoin B, Dilhaire S. Picosecond time resolved opto-acoustic imaging with 48 MHz frequency resolution. Optics Express. 22: 7831-43. PMID 24718159 DOI: 10.1364/Oe.22.007831  0.66
2014 Pradere C, Caumes JP, BenKhemis S, Pernot G, Palomo E, Dilhaire S, Batsale JC. Thermoreflectance temperature measurement with millimeter wave. The Review of Scientific Instruments. 85: 064904. PMID 24985839 DOI: 10.1063/1.4884639  0.761
2014 Rojo MM, Martín J, Grauby S, Borca-Tasciuc T, Dilhaire S, Martin-Gonzalez M. Decrease in thermal conductivity in polymeric P3HT nanowires by size-reduction induced by crystal orientation: new approaches towards thermal transport engineering of organic materials. Nanoscale. 6: 7858-65. PMID 24933655 DOI: 10.1039/C4Nr00107A  0.401
2014 Lozan O, Perrin M, Ea-Kim B, Rampnoux JM, Dilhaire S, Lalanne P. Anomalous light absorption around subwavelength apertures in metal films. Physical Review Letters. 112: 193903. PMID 24877942 DOI: 10.1103/Physrevlett.112.193903  0.751
2014 Altet J, González JL, Gomez D, Perpiñà X, Claeys W, Grauby S, Dufis C, Vellvehi M, Mateo D, Reverter F, Dilhaire S, Jordà X. Electro-thermal characterization of a differential temperature sensor in a 65nm CMOS IC: Applications to gain monitoring in RF amplifiers Microelectronics Journal. 45: 484-490. DOI: 10.1016/J.Mejo.2014.02.009  0.381
2013 Aissou K, Shaver J, Fleury G, Pécastaings G, Brochon C, Navarro C, Grauby S, Rampnoux JM, Dilhaire S, Hadziioannou G. Nanoscale block copolymer ordering induced by visible interferometric micropatterning: a route towards large scale block copolymer 2D crystals. Advanced Materials (Deerfield Beach, Fla.). 25: 213-7. PMID 23172715 DOI: 10.1002/Adma.201203254  0.492
2013 Muñoz Rojo M, Grauby S, Rampnoux J, Caballero-Calero O, Martin-Gonzalez M, Dilhaire S. Fabrication of Bi2Te3 nanowire arrays and thermal conductivity measurement by 3ω-scanning thermal microscopy Journal of Applied Physics. 113: 054308. DOI: 10.1063/1.4790363  0.427
2013 Grauby S, Puyoo E, Rampnoux J, Rouvière E, Dilhaire S. Si and SiGe Nanowires: Fabrication Process and Thermal Conductivity Measurement by 3ω-Scanning Thermal Microscopy The Journal of Physical Chemistry C. 117: 9025-9034. DOI: 10.1021/Jp4018822  0.787
2012 Altet J, Mateo D, Perpiñà X, Grauby S, Dilhaire S, Jordà X. Nonlinearity characterization of temperature sensing systems for integrated circuit testing by intermodulation products monitoring. The Review of Scientific Instruments. 82: 094902. PMID 21974611 DOI: 10.1063/1.3633957  0.346
2011 Pradere C, Clerjaud L, Batsale JC, Dilhaire S. High speed heterodyne infrared thermography applied to thermal diffusivity identification. The Review of Scientific Instruments. 82: 054901. PMID 21639530 DOI: 10.1063/1.3581335  0.797
2011 Pernot G, Michel H, Vermeersch B, Burke P, Lu H, Rampnoux JM, Dilhaire S, Ezzahri Y, Gossard A, Shakouri A. Frequency-dependent thermal conductivity in time domain thermoreflectance analysis of thin films Materials Research Society Symposium Proceedings. 1347: 1-7. DOI: 10.1557/Opl.2011.1277  0.814
2011 Dilhaire S, Pernot G, Calbris G, Rampnoux JM, Grauby S. Heterodyne picosecond thermoreflectance applied to nanoscale thermal metrology Journal of Applied Physics. 110: 114314. DOI: 10.1063/1.3665129  0.79
2011 Puyoo E, Grauby S, Rampnoux J, Rouvière E, Dilhaire S. Scanning thermal microscopy of individual silicon nanowires Journal of Applied Physics. 109: 024302. DOI: 10.1063/1.3524223  0.786
2010 Puyoo E, Grauby S, Rampnoux JM, Rouvière E, Dilhaire S. Thermal exchange radius measurement: application to nanowire thermal imaging. The Review of Scientific Instruments. 81: 073701. PMID 20687725 DOI: 10.1063/1.3455214  0.792
2010 Pernot G, Stoffel M, Savic I, Pezzoli F, Chen P, Savelli G, Jacquot A, Schumann J, Denker U, Mönch I, Deneke Ch, Schmidt OG, Rampnoux JM, Wang S, Plissonnier M, ... ... Dilhaire S, et al. Precise control of thermal conductivity at the nanoscale through individual phonon-scattering barriers. Nature Materials. 9: 491-5. PMID 20436465 DOI: 10.1038/Nmat2752  0.772
2010 Clerjaud L, Pradere C, Batsale J, Dilhaire S. Heterodyne method with an infrared camera for the thermal diffusivity estimation with periodic local heating in a large range of frequencies (25 Hz to upper than 1 kHz) Quantitative Infrared Thermography Journal. 7: 115-128. DOI: 10.3166/Qirt.7.115-128  0.784
2010 Aldrete-Vidrio E, Mateo D, Altet J, Salhi MA, Grauby S, Dilhaire S, Onabajo M, Silva-Martinez J. Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements Measurement Science and Technology. 21. DOI: 10.1088/0957-0233/21/7/075104  0.383
2009 Altet J, Aldrete-Vidrio E, Mateo D, Salhi A, Grauby S, Claeys W, Dilhaire S, Perpiñà X, Jordà X. Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization. The Review of Scientific Instruments. 80: 026101. PMID 19256677 DOI: 10.1063/1.3073963  0.381
2009 Michel H, Pernot G, Rampnoux J, Dilhaire S, Grauby S, Ezzahri Y, Shakouri A. Investigating Coherent Zone-Folded Acoustic Phonons in Si/SiGe Superlattices by Transient Thermoreflectance Technique Mrs Proceedings. 1221. DOI: 10.1557/Proc-1221-Cc08-03  0.781
2009 Grauby S, Salhi A, Rampnoux J, Claeys W, Dilhaire S. Fast Laser Scanning Imaging System for Surface Displacement Measurements Ieee Electron Device Letters. 30: 222-224. DOI: 10.1109/Led.2008.2012177  0.345
2009 Grauby S, Patino Lopez L, Salhi A, Puyoo E, Rampnoux J, Claeys W, Dilhaire S. Joule expansion imaging techniques on microlectronic devices Microelectronics Journal. 40: 1367-1372. DOI: 10.1016/J.Mejo.2008.04.016  0.771
2009 Pradère C, Batsale J, Goyhénèche J, Pailler R, Dilhaire S. Thermal properties of carbon fibers at very high temperature Carbon. 47: 737-743. DOI: 10.1016/J.Carbon.2008.11.015  0.372
2008 Dilhaire S, Rampnoux J, Pernot G, Calbris G, Grauby S, Rossignol C, Ermeneux S, Mottay E. Photothermal and photoacoustic imaging by ultrafast optical sampling The Journal of the Acoustical Society of America. 123: 3705-3705. DOI: 10.1121/1.2935125  0.767
2008 Aldrete-Vidrio E, Salhi MA, Altet J, Grauby S, Mateo D, Michel H, Clerjaud L, Rampnoux JM, Rubio A, Claeys W, Dilhaire S. Using temperature as observable of the frequency response of RF CMOS amplifiers Proceedings - 13th Ieee European Test Symposium, Ets 2008. 47-52. DOI: 10.1109/ETS.2008.15  0.766
2008 Altet J, Aldrete-Vidrio E, Mateo D, Perpiñà X, Jordà X, Vellvehi M, Millán J, Salhi A, Grauby S, Claeys W, Dilhaire S. A heterodyne method for the thermal observation of the electrical behavior of high-frequency integrated circuits Measurement Science and Technology. 19: 115704. DOI: 10.1088/0957-0233/19/11/115704  0.44
2007 Grauby S, Salhi A, Rampnoux JM, Michel H, Claeys W, Dilhaire S. Laser scanning thermoreflectance imaging system using galvanometric mirrors for temperature measurements of microelectronic devices. The Review of Scientific Instruments. 78: 074902. PMID 17672785 DOI: 10.1063/1.2757473  0.415
2007 Ezzahri Y, Grauby S, Rampnoux JM, Michel H, Pernot G, Claeys W, Dilhaire S, Rossignol C, Zeng G, Shakouri A. Coherent phonons inSi∕SiGesuperlattices Physical Review B. 75. DOI: 10.1103/Physrevb.75.195309  0.781
2007 Pradere C, Batsale JC, Goyheneche JM, Pailler R, Dilhaire S. Estimation of the transverse coefficient of thermal expansion on carbon fibers at very high temperature Inverse Problems in Science and Engineering. 15: 77-89. DOI: 10.1080/17415970600574047  0.328
2007 Ezzahri Y, Grauby S, Dilhaire S, Rampnoux JM, Claeys W. Cross-plan Si∕SiGe superlattice acoustic and thermal properties measurement by picosecond ultrasonics Journal of Applied Physics. 101: 013705. DOI: 10.1063/1.2403236  0.45
2006 Rampnoux JM, Michel H, Salhi MA, Grauby S, Claeys W, Dilhaire S. Time gating imaging through thick silicon substrate: a new step towards backside characterisation Microelectronics Reliability. 46: 1520-1524. DOI: 10.1016/J.Microrel.2006.07.029  0.348
2006 Pradère C, Goyhénèche J, Batsale J, Dilhaire S, Pailler R. Thermal diffusivity measurements on a single fiber with microscale diameter at very high temperature International Journal of Thermal Sciences. 45: 443-451. DOI: 10.1016/J.Ijthermalsci.2005.05.010  0.394
2005 Rossignol C, Rampnoux JM, Perton M, Audoin B, Dilhaire S. Generation and detection of shear acoustic waves in metal submicrometric films with ultrashort laser pulses. Physical Review Letters. 94: 166106. PMID 15904252 DOI: 10.1103/Physrevlett.94.166106  0.331
2005 Dilhaire S, Grauby S, Claeys W. Thermoreflectance calibration procedure on a laser diode: application to catastrophic optical facet damage analysis Ieee Electron Device Letters. 26: 461-463. DOI: 10.1109/Led.2005.851090  0.363
2005 Grauby S, Dilhaire S, Jorez S, Claeys W. Temperature variation mapping of a microelectromechanical system by thermoreflectance imaging Ieee Electron Device Letters. 26: 78-80. DOI: 10.1109/Led.2004.841468  0.36
2005 Lopez LDP, Dilhaire S, Grauby S, Salhi MA, Ezzahri Y, Claeys W, Batsale JC. Characterization of thermoelectric devices by laser induced Seebeck electromotive force (LIS-EMF) measurement Journal of Physics D: Applied Physics. 38: 1489-1497. DOI: 10.1088/0022-3727/38/10/001  0.701
2005 Ezzahri Y, Dilhaire S, Grauby S, Rampnoux JM, Claeys W, Zhang Y, Zeng G, Shakouri A. Study of thermomechanical properties of Si∕SiGe superlattices using femtosecond transient thermoreflectance technique Applied Physics Letters. 87: 103506. DOI: 10.1063/1.2009069  0.706
2005 Pradère C, Goyhénèche JM, Batsale JC, Dilhaire S, Pailler R. Specific-heat measurement of single metallic, carbon, and ceramic fibers at very high temperature Review of Scientific Instruments. 76: 064901. DOI: 10.1063/1.1927102  0.395
2005 Ezzahri Y, Patiño Lopez L, Chapuis O, Dilhaire S, Grauby S, Claeys W, Volz S. Dynamical behavior of the scanning thermal microscope (SThM) thermal resistive probe studied using Si/SiGe microcoolers Superlattices and Microstructures. 38: 69-75. DOI: 10.1016/J.Spmi.2005.04.005  0.656
2005 Grauby S, Salhi A, Claeys W, Trias D, Dilhaire S. ElectroStatic Discharge Fault Localization by Laser Probing Microelectronics Reliability. 45: 1482-1486. DOI: 10.1016/J.Microrel.2005.07.038  0.373
2004 Dilhaire S, Grauby S, Jorez S, Claeys W. Strain Energy Imaging of a Power MOS Transistor Using Speckle Interferometry Ieee Transactions On Reliability. 53: 293-296. DOI: 10.1109/Tr.2004.829165  0.316
2004 Dilhaire S, Grauby S, Claeys W. Calibration procedure for temperature measurements by thermoreflectance under high magnification conditions Applied Physics Letters. 84: 822-824. DOI: 10.1063/1.1645326  0.383
2004 Altet J, Salhi MA, Dilhaire S, Ivanov A. Calibration-free heat source localisation in ICs entirely covered by metal layers Electronics Letters. 40: 241-242. DOI: 10.1049/El:20040172  0.33
2004 Altet J, Rampnoux J, Batsale J, Dilhaire S, Rubio A, Claeys W, Grauby S. Applications of temperature phase measurements to IC testing Microelectronics Reliability. 44: 95-103. DOI: 10.1016/S0026-2714(03)00138-0  0.363
2004 Patiño-Lopez LD, Salhi MA, Dilhaire S, Grauby S, Rampnoux JM, Jorez S, Claeys W. Thermal study of PN thermoelectric couple by laser induced Seebeck EMF measurement Superlattices and Microstructures. 35: 375-387. DOI: 10.1016/j.spmi.2003.09.003  0.332
2004 Dilhaire S, Grauby S, Claeys W, Batsale J. Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy Microelectronics Journal. 35: 811-816. DOI: 10.1016/J.Mejo.2004.06.012  0.451
2004 Rossignol C, Meri H, Perton M, Audoin B, Rampnoux J, Dilhaire S. Femtosecond laser generation and detection of longitudinal and shear acoustic waves in a sub-micrometric film Physica Status Solidi (C). 1: 2745-2748. DOI: 10.1002/Pssc.200405367  0.314
2003 Grauby S, Dilhaire S, Jorez S, Lopez LD, Rampnoux JM, Claeys W. Measurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging technique. Applied Optics. 42: 1763-8. PMID 12683753 DOI: 10.1364/Ao.42.001763  0.414
2003 Marinier G, Dilhaire S, Lopez LDP, Benzohra M. Dynamic characterization of SiO 2 -Au microcantilevers using Michelson interferometer Proceedings of Spie. 5116: 406-413. DOI: 10.1117/12.498827  0.363
2003 Grauby S, Dilhaire S, Jorez S, Claeys W. Imaging setup for temperature, topography, and surface displacement measurements of microelectronic devices Review of Scientific Instruments. 74: 645-647. DOI: 10.1063/1.1520316  0.363
2003 Altet J, Salhi MA, Dilhaire S, Syal A, Ivanov A. Localisation of devices acting as heat sources in ICs covered entirely by metal layers Electronics Letters. 39: 1440-1442. DOI: 10.1049/El:20030907  0.332
2003 Andriamonje G, Pouget V, Ousten Y, Lewis D, Danto Y, Rampnoux J, Ezzahri Y, Dilhaire S, Grauby S, Claeys W, Rossignol C, Audoin B. Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits Microelectronics Reliability. 43: 1803-1807. DOI: 10.1016/S0026-2714(03)00307-X  0.661
2003 Dilhaire S, Salhi A, Grauby S, Claeys W. Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods. Microelectronics Reliability. 43: 1609-1613. DOI: 10.1016/S0026-2714(03)00282-8  0.385
2001 Altet J, Rubio A, Schaub E, Dilhaire S, Claeys W. Thermal coupling in integrated circuits: application to thermal testing Ieee Journal of Solid-State Circuits. 36: 81-91. DOI: 10.1109/4.896232  0.412
2000 Dilhaire S, Schaub E, Claeys W, Altet J, Rubio A. Localisation of heat sources in electronic circuits by microthermal laser probing International Journal of Thermal Sciences. 39: 544-549. DOI: 10.1016/S1290-0729(00)00235-0  0.435
1999 Quintard V, Dilhaire S, Phan T, Claeys W. Temperature measurements of metal lines under current stress by high-resolution laser probing Ieee Transactions On Instrumentation and Measurement. 48: 69-74. DOI: 10.1109/19.755063  0.406
1999 Altet J, Rubio A, Claeys W, Dilhaire S, Schaub E, Tamamoto H. Journal of Electronic Testing. 14: 57-66. DOI: 10.1023/A:1008397205559  0.339
1999 Dilhaire S, Jorez S, Cornet A, Schaub E, Claeys W. Optical method for the measurement of the thermomechanical behaviour of electronic devices Microelectronics Reliability. 39: 981-985. DOI: 10.1016/S0026-2714(99)00134-1  0.363
1999 Dilhaire S, Altet J, Jorez S, Schaub E, Rubio A, Claeys W. Fault localisation in ICs by goniometric laser probing of thermal induced surface waves Microelectronics Reliability. 39: 919-923. DOI: 10.1016/S0026-2714(99)00123-7  0.347
1999 Nassim K, Joannes L, Cornet A, Dilhaire S, Schaub E, Claeys W. High-resolution interferometry and electronic speckle pattern interferometry applied to the thermomechanical study of a MOS power transistor Microelectronics Journal. 30: 1125-1128. DOI: 10.1016/S0026-2692(99)00074-9  0.381
1998 Altet J, Rubio A, Dilhaire S, Schaub E, Claeys W. BiCMOS thermal sensor circuit for built-in test purposes Electronics Letters. 34: 1307. DOI: 10.1049/El:19980947  0.326
1998 Dilhaire S, Phan T, Schaub E, Claeys W. Sondes laser et méthodologies pour l'analyse thermique à l'échelle micrométrique. Application à la microélectronique Revue GéNéRale De Thermique. 37: 49-59. DOI: 10.1016/S0035-3159(97)82466-X  0.44
1998 Dilhaire S, Cornet A, Rauzan C, Claeys W, Schaub E. Measurement of the thermomechanical behaviour of the solder-lead interface in solder joints by laser probing : a new method for measuring the bond quality Microelectronics Reliability. 38: 1293-1296. DOI: 10.1016/S0026-2714(98)00080-8  0.349
1998 Nassim K, Joannes L, Cornet A, Dilhaire S, Schaub E, Claeys W. Thermomechanical deformation imaging of power devices by electronic speckle pattern interferometry (ESPI) Microelectronics Reliability. 38: 1341-1345. DOI: 10.1016/S0026-2714(98)00079-1  0.32
1998 Dilhaire S, Phan T, Schaub E, Claeys W. Thermomechanical effects in metal lines on integrated circuits analysed with a differential polarimetric interferometer Microelectronics Reliability. 38: 1591-1597. DOI: 10.1016/S0026-2714(98)00033-X  0.409
1998 Lewis D, Dilhaire S, Phan T, Quintard V, Hornung V, Claeys W. Modelling and experimental study of heat deposition and transport in a semiconductor laser diode Microelectronics Journal. 29: 171-179. DOI: 10.1016/S0026-2692(97)00055-4  0.397
1997 Phan T, Dilhaire S, Quintard V, Lewis D, Claeys W. The method of dynamic separation and its application to quantitative thermal analysis of microelectronic devices by laser interferometry and reflectometry Measurement Science and Technology. 8: 303-316. DOI: 10.1088/0957-0233/8/3/013  0.442
1997 Phan T, Dilhaire S, Batsale J, Quintard V, Claeys W. Laser probing determination of the thermal conductivity of integrated circuit dielectric layers High Temperatures-High Pressures. 29: 81-88. DOI: 10.1068/Htec367  0.382
1997 Phan T, Dilhaire S, Quintard V, Lewis D, Claeys W. Thermomechanical study of AlCu based interconnect under pulsed thermoelectric excitation Journal of Applied Physics. 81: 1157-1168. DOI: 10.1063/1.363985  0.402
1997 Dilhaire S, Phan T, Schaub E, Claeys W. High sensitivity and high resolution differential interferometer: Micrometric polariscope for thermomechanical studies in microelectronics Microelectronics Reliability. 37: 1587-1590. DOI: 10.1016/S0026-2714(97)00116-9  0.338
1996 Quintard V, Deboy G, Dilhaire S, Lewis D, Phan T, Claeys W. Laser beam thermography of circuits in the particular case of passivated semiconductors Microelectronic Engineering. 31: 291-298. DOI: 10.1016/0167-9317(95)00351-7  0.389
1996 QUINTARD V, PARMENTIER B, PHAN T, LEWIS D, DILHAIRE S, CLAEYS W. LASER PROBE MEASUREMENTS OF QUALITY EVOLUTION OF SOLDER JOINTS DURING THERMAL CYCLING AGEING TESTS Quality and Reliability Engineering International. 12: 447-451. DOI: 10.1002/(Sici)1099-1638(199611)12:6<447::Aid-Qre66>3.0.Co;2-L  0.364
1995 Claeys W, Dilhaire S, Lewis D, Quintard V, Phan T, Aucouturier JL. Optical ammeter for integrated circuit characterization and failure analysis Quality and Reliability Engineering International. 11: 247-251. DOI: 10.1002/Qre.4680110406  0.332
1994 Claeys W, Dilhaire S, Quintard V, Lewis D, Phan T, Aucouturier JL. Interferences of Peltier thermal waves produced in ohmic contacts upon integrated circuits Le Journal De Physique Iv. 4: C7-195-C7-198. DOI: 10.1051/Jp4:1994747  0.434
1994 Claeys W, Quintard V, Dilhaire S, Lewis D, Danto Y. Early detection of ageing in solder joints through laser probe thermal analysis of the peltier effect Quality and Reliability Engineering International. 10: 289-295. DOI: 10.1002/Qre.4680100407  0.394
1994 Claeys W, Quintard V, Dilhaire S, Lewis D, Danto Y. Testing of the quality of solder joints through the analysis of their thermal behaviour with an interferometric laser probe Quality and Reliability Engineering International. 10: 237-242. DOI: 10.1002/Qre.4680100314  0.447
1993 Claeys W, Dilhaire S, Quintard V. Laser probing of thermal behaviour of electronic components and its application in quality and reliability testing Microelectronic Engineering. 24: 411-420. DOI: 10.1016/0167-9317(94)90093-0  0.412
1993 Claeys W, Dilhaire S, Quintard V, Dom JP, Danto Y. Thermoreflectance optical test probe for the measurement of current-induced temperature changes in microelectronic components Quality and Reliability Engineering International. 9: 303-308. DOI: 10.1002/Qre.4680090411  0.413
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