Stefan Dilhaire - Publications

Affiliations: 
Université de Bordeaux, Talence, Nouvelle-Aquitaine, France 
Area:
Thermal quadrupole, Nanophotonics, Surface plasmon polaritons, Hot electrons, Absorption, Afm, Phonon, Acoustic imaging, Core@shell, Femtosecond pump- probe

33 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2021 Grauby S, Ben Amor A, Hallais G, Vincent L, Dilhaire S. Imaging Thermoelectric Properties at the Nanoscale. Nanomaterials (Basel, Switzerland). 11. PMID 34062797 DOI: 10.3390/nano11051199  0.72
2020 Zenji A, Rampnoux JM, Grauby S, Dilhaire S. Ultimate-resolution thermal spectroscopy in time domain thermoreflectance (TDTR) Journal of Applied Physics. 128: 65106. DOI: 10.1063/5.0015391  0.72
2019 Ben Amor A, Djomani D, Fakhfakh M, Dilhaire S, Vincent L, Grauby S. Si and Ge allotrope heterostructured nanowires: experimental evaluation of the thermal conductivity reduction. Nanotechnology. PMID 31195385 DOI: 10.1088/1361-6528/Ab29A6  0.72
2017 Lozan O, Sundararaman R, Ea-Kim B, Rampnoux JM, Narang P, Dilhaire S, Lalanne P. Increased rise time of electron temperature during adiabatic plasmon focusing. Nature Communications. 8: 1656. PMID 29162822 DOI: 10.1038/S41467-017-01802-Y  0.68
2017 d'Acremont Q, Pernot G, Rampnoux JM, Furlan A, Lacroix D, Ludwig A, Dilhaire S. High-throughput heterodyne thermoreflectance: Application to thermal conductivity measurements of a Fe-Si-Ge thin film alloy library. The Review of Scientific Instruments. 88: 074902. PMID 28764526 DOI: 10.1063/1.4986469  0.68
2016 Petsagkourakis I, Pavlopoulou E, Portale G, Kuropatwa BA, Dilhaire S, Fleury G, Hadziioannou G. Structurally-driven Enhancement of Thermoelectric Properties within Poly(3,4-ethylenedioxythiophene) thin Films. Scientific Reports. 6: 30501. PMID 27470637 DOI: 10.1038/Srep30501  0.64
2016 Casanova A, D'Acremont Q, Santarelli G, Dilhaire S, Courjaud A. Ultrafast amplifier additive timing jitter characterization and control. Optics Letters. 41: 898-900. PMID 26974074 DOI: 10.1364/Ol.41.000898  0.32
2016 Casanova A, D'Acremont Q, Santarelli G, Dilhaire S, Courjaud A. Ultrafast amplifier additive timing jitter characterization and control Optics Letters. 41: 898-900. DOI: 10.1364/OL.41.000898  0.72
2015 Savelli G, Stein SS, Bernard-Granger G, Faucherand P, Montès L, Dilhaire S, Pernot G. Titanium-based silicide quantum dot superlattices for thermoelectrics applications. Nanotechnology. 26: 275605. PMID 26086207 DOI: 10.1088/0957-4484/26/27/275605  0.4
2015 Muñoz Rojo M, Martín J, Grauby S, Borca-Tasciuc T, Dilhaire S, Martin-Gonzalez M. Correction: Decrease in thermal conductivity in polymeric P3HT nanowires by size-reduction induced by crystal orientation: new approaches towards thermal transport engineering of organic materials. Nanoscale. 7: 4256-7. PMID 25668105 DOI: 10.1039/c5nr90020d  0.72
2014 Pradere C, Caumes JP, BenKhemis S, Pernot G, Palomo E, Dilhaire S, Batsale JC. Thermoreflectance temperature measurement with millimeter wave. The Review of Scientific Instruments. 85: 064904. PMID 24985839 DOI: 10.1063/1.4884639  0.72
2014 Rojo MM, Martín J, Grauby S, Borca-Tasciuc T, Dilhaire S, Martin-Gonzalez M. Decrease in thermal conductivity in polymeric P3HT nanowires by size-reduction induced by crystal orientation: new approaches towards thermal transport engineering of organic materials. Nanoscale. 6: 7858-65. PMID 24933655 DOI: 10.1039/C4Nr00107A  0.72
2014 Lozan O, Perrin M, Ea-Kim B, Rampnoux JM, Dilhaire S, Lalanne P. Anomalous light absorption around subwavelength apertures in metal films. Physical Review Letters. 112: 193903. PMID 24877942 DOI: 10.1103/Physrevlett.112.193903  0.68
2013 Aissou K, Shaver J, Fleury G, Pécastaings G, Brochon C, Navarro C, Grauby S, Rampnoux JM, Dilhaire S, Hadziioannou G. Nanoscale block copolymer ordering induced by visible interferometric micropatterning: a route towards large scale block copolymer 2D crystals. Advanced Materials (Deerfield Beach, Fla.). 25: 213-7. PMID 23172715 DOI: 10.1002/Adma.201203254  0.72
2011 Pradere C, Clerjaud L, Batsale JC, Dilhaire S. High speed heterodyne infrared thermography applied to thermal diffusivity identification. The Review of Scientific Instruments. 82: 054901. PMID 21639530 DOI: 10.1063/1.3581335  0.72
2011 Pernot G, Michel H, Vermeersch B, Burke P, Lu H, Rampnoux JM, Dilhaire S, Ezzahri Y, Gossard A, Shakouri A. Frequency-dependent thermal conductivity in time domain thermoreflectance analysis of thin films Materials Research Society Symposium Proceedings. 1347: 1-7. DOI: 10.1557/Opl.2011.1277  0.72
2010 Puyoo E, Grauby S, Rampnoux JM, Rouvière E, Dilhaire S. Thermal exchange radius measurement: application to nanowire thermal imaging. The Review of Scientific Instruments. 81: 073701. PMID 20687725 DOI: 10.1063/1.3455214  0.72
2010 Pernot G, Stoffel M, Savic I, Pezzoli F, Chen P, Savelli G, Jacquot A, Schumann J, Denker U, Mönch I, Deneke Ch, Schmidt OG, Rampnoux JM, Wang S, Plissonnier M, ... ... Dilhaire S, et al. Precise control of thermal conductivity at the nanoscale through individual phonon-scattering barriers. Nature Materials. 9: 491-5. PMID 20436465 DOI: 10.1038/Nmat2752  0.72
2010 Aldrete-Vidrio E, Mateo D, Altet J, Salhi MA, Grauby S, Dilhaire S, Onabajo M, Silva-Martinez J. Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements Measurement Science and Technology. 21. DOI: 10.1088/0957-0233/21/7/075104  0.72
2009 Altet J, Aldrete-Vidrio E, Mateo D, Salhi A, Grauby S, Claeys W, Dilhaire S, Perpiñà X, Jordà X. Heterodyne lock-in thermal coupling measurements in integrated circuits: Applications to test and characterization. The Review of Scientific Instruments. 80: 026101. PMID 19256677 DOI: 10.1063/1.3073963  0.72
2008 Aldrete-Vidrio E, Salhi MA, Altet J, Grauby S, Mateo D, Michel H, Clerjaud L, Rampnoux JM, Rubio A, Claeys W, Dilhaire S. Using temperature as observable of the frequency response of RF CMOS amplifiers Proceedings - 13th Ieee European Test Symposium, Ets 2008. 47-52. DOI: 10.1109/ETS.2008.15  0.72
2007 Grauby S, Salhi A, Rampnoux JM, Michel H, Claeys W, Dilhaire S. Laser scanning thermoreflectance imaging system using galvanometric mirrors for temperature measurements of microelectronic devices. The Review of Scientific Instruments. 78: 074902. PMID 17672785 DOI: 10.1063/1.2757473  0.72
2006 Rampnoux JM, Michel H, Salhi MA, Grauby S, Claeys W, Dilhaire S. Time gating imaging through thick silicon substrate: a new step towards backside characterisation Microelectronics Reliability. 46: 1520-1524. DOI: 10.1016/J.Microrel.2006.07.029  0.72
2005 Lopez LDP, Dilhaire S, Grauby S, Salhi MA, Ezzahri Y, Claeys W, Batsale JC. Characterization of thermoelectric devices by laser induced Seebeck electromotive force (LIS-EMF) measurement Journal of Physics D: Applied Physics. 38: 1489-1497. DOI: 10.1088/0022-3727/38/10/001  0.72
2004 Altet J, Salhi MA, Dilhaire S, Ivanov A. Calibration-free heat source localisation in ICs entirely covered by metal layers Electronics Letters. 40: 241-242. DOI: 10.1049/El:20040172  0.72
2004 Patiño-Lopez LD, Salhi MA, Dilhaire S, Grauby S, Rampnoux JM, Jorez S, Claeys W. Thermal study of PN thermoelectric couple by laser induced Seebeck EMF measurement Superlattices and Microstructures. 35: 375-387. DOI: 10.1016/j.spmi.2003.09.003  0.72
2004 Lopez LDP, Grauby S, Dilhaire S, Salhi MA, Claeys W, Lefèvre S, Volz S. Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope Microelectronics Journal. 35: 797-803. DOI: 10.1016/j.mejo.2004.06.010  0.72
2003 Grauby S, Dilhaire S, Jorez S, Lopez LD, Rampnoux JM, Claeys W. Measurement of thermally induced vibrations of microelectronic devices by use of a heterodyne electronic speckle pattern interferometry imaging technique. Applied Optics. 42: 1763-8. PMID 12683753 DOI: 10.1364/Ao.42.001763  0.72
2003 Marinier G, Dilhaire S, Lopez LDP, Benzohra M. Dynamic characterization of SiO 2 -Au microcantilevers using Michelson interferometer Proceedings of Spie. 5116: 406-413. DOI: 10.1117/12.498827  0.72
2003 Altet J, Salhi MA, Dilhaire S, Syal A, Ivanov A. Localisation of devices acting as heat sources in ICs covered entirely by metal layers Electronics Letters. 39: 1440-1442. DOI: 10.1049/El:20030907  0.72
2002 Dilhaire S, Grauby S, Jorez S, Lopez LD, Rampnoux JM, Claeys W. Surface displacement imaging by interferometry with a light emitting diode. Applied Optics. 41: 4996-5001. PMID 12206206  0.72
1999 Quintard V, Dilhaire S, Phan T, Claeys W. Temperature measurements of metal lines under current stress by high-resolution laser probing Ieee Transactions On Instrumentation and Measurement. 48: 69-74. DOI: 10.1109/19.755063  0.72
1993 Claeys W, Dilhaire S, Quintard V. Laser probing of thermal behaviour of electronic components and its application in quality and reliability testing Microelectronic Engineering. 24: 411-420. DOI: 10.1016/0167-9317(94)90093-0  0.72
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