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John Henry J. Scott, Ph. D. - Publications

Affiliations: 
1985-1989 California Institute of Technology, Pasadena, CA 
 1992-1997 Physics Carnegie Mellon University, Pittsburgh, PA 
 1997- National Institute of Standards and Technology, Gaithersburg, MD, United States 
Area:
electron microscopy, microanalysis, data science
Website:
https://www.nist.gov/people/john-henry-j-scott
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7 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2012 Rykaczewski K, Scott J. Best practices for quantitative in situ ESEM imaging of microscale water condensation dynamics on superhydrophobic surfaces Microscopy and Microanalysis. 18: 1136-1137. DOI: 10.1017/S1431927612007532  0.536
2012 Rykaczewski K, Scott J. In situ Cryo-FIB/SEM imaging of frost formation and ice-substrate interface on superhydrophobic surfaces Microscopy and Microanalysis. 18: 642-643. DOI: 10.1017/S1431927612005065  0.514
2011 Rykaczewski K, Scott J, Fedorov A. Electron Beam Heating of Water Droplets During in-situ ESEM Imaging of Condensation on Superhydrophobic Surfaces Microscopy and Microanalysis. 17: 1464-1465. DOI: 10.1017/S1431927611008191  0.484
2010 Davis J, Scott J, Ritchie N. Developing an X-ray Imaging Strategy Microscopy and Microanalysis. 16: 908-909. DOI: 10.1017/S1431927610059611  0.462
2007 Newbury D, Scott J, Ritchie N, Bright D, Small J. Advances in Energy Dispersive X-ray Spectrometry: The Impact of Silicon Drift Detectors (SDD) on the Characterization of Nanostructures and Nanomaterials Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607071383  0.436
2007 Newbury D, Bright D, Scott J, Michael J, Kotula P. Rapid X-ray Spectrum Imaging with the Silicon Drift Detector (SDD): Microstructural Characterization with NIST Lispix Microscopy and Microanalysis. 13. DOI: 10.1017/S1431927607071371  0.5
2006 Scott J, Ritchie N. Measuring Pixel Classification Accuracy Using Synthetic Spectrum Images Microscopy and Microanalysis. 12: 1394-1395. DOI: 10.1017/S1431927606069480  0.357
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