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Stephanie N. Bogle, Ph.D. - Publications

Affiliations: 
2009 University of Illinois, Urbana-Champaign, Urbana-Champaign, IL 
Area:
Materials Science Engineering
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10 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2014 Li TT, Bogle SN, Abelson JR. Quantitative fluctuation electron microscopy in the STEM: methods to identify, avoid, and correct for artifacts. Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20: 1605-18. PMID 25033350 DOI: 10.1017/S1431927614012756  0.567
2014 Lee B, Shelby RM, Raoux S, Retter CT, Burr GW, Bogle SN, Darmawikarta K, Bishop SG, Abelson JR. Nanoscale nuclei in phase change materials: Origin of different crystallization mechanisms of Ge2Sb2Te5 and AgInSbTe Journal of Applied Physics. 115: 063506. DOI: 10.1063/1.4865295  0.675
2012 Bogle S, Rasshchupkyna M, Bugaev V, Castro-Colin M, Wochner P. Identifying Nanostructure in Metallic Glasses using Electron Cross-Correlation Analysis Microscopy and Microanalysis. 18: 1252-1253. DOI: 10.1017/S1431927612008112  0.312
2011 Wochner P, Castro-Colin M, Bogle SN, Bugaev VN. Of fluctuations and cross-correlations: finding order in disorder International Journal of Materials Research. 102: 874-888. DOI: 10.3139/146.110543  0.303
2011 Haberl B, Bogle SN, Li T, McKerracher I, Ruffell S, Munroe P, Williams JS, Abelson JR, Bradby JE. Unexpected short- and medium-range atomic structure of sputtered amorphous silicon upon thermal annealing Journal of Applied Physics. 110: 096104. DOI: 10.1063/1.3658628  0.537
2010 Bogle SN, Nittala LN, Twesten RD, Voyles PM, Abelson JR. Size analysis of nanoscale order in amorphous materials by variable-resolution fluctuation electron microscopy Ultramicroscopy. 110: 1273-1278. DOI: 10.1016/J.Ultramic.2010.05.001  0.61
2009 Lee BS, Burr GW, Shelby RM, Raoux S, Rettner CT, Bogle SN, Darmawikarta K, Bishop SG, Abelson JR. Observation of the role of subcritical nuclei in crystallization of a glassy solid. Science (New York, N.Y.). 326: 980-4. PMID 19965508 DOI: 10.1126/Science.1177483  0.451
2007 Bogle SN, Voyles PM, Khare SV, Abelson JR. Quantifying nanoscale order in amorphous materials: Simulating fluctuation electron microscopy of amorphous silicon Journal of Physics Condensed Matter. 19. DOI: 10.1088/0953-8984/19/45/455204  0.565
2007 Kwon M, Lee B, Bogle SN, Nittala LN, Bishop SG, Abelson JR, Raoux S, Cheong B, Kim K. Nanometer-scale order in amorphous Ge2Sb2Te5 analyzed by fluctuation electron microscopy Applied Physics Letters. 90: 021923. DOI: 10.1063/1.2430067  0.659
2006 Nguyen-Tran T, Suendo V, Roca I Cabarrocas P, Nittala LN, Bogle SN, Abelson JR. Fluctuation microscopy evidence for enhanced nanoscale structural order in polymorphous silicon thin films Journal of Applied Physics. 100. DOI: 10.1063/1.2360381  0.604
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