☰

Dieter W. Pohl - Publications

Affiliations: 
 IBM Zurich Research Laboratory 
Tree Info Similar researchers PubMed Report error

54 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2011 Pohl DW, Rodrigo SG, Novotny L. Stacked optical antennas Applied Physics Letters. 98: 023111. DOI: 10.1063/1.3541544  0.455
2008 Biagioni P, Farahani JN, Mühlschlegel P, Eisler HJ, Pohl DW, Hecht B. A simple method for producing flattened atomic force microscopy tips. Review of Scientific Instruments. 79: 16103-16103. PMID 18248075 DOI: 10.1063/1.2834875  0.586
2007 Farahani JN, Eisler H, Pohl DW, Pavius M, Flückiger P, Gasser P, Hecht B. Bow-tie optical antenna probes for single-emitter scanning near-field optical microscopy Nanotechnology. 18: 125506-125600. DOI: 10.1088/0957-4484/18/12/125506  0.697
2006 Hecht B, Mühlschlegel P, Farahani JN, Eisler H, Pohl DW, Martin OJF, Biagioni P. Prospects of resonant optical antennas for nano-analysis Chimia. 60: 765-769. DOI: 10.2533/Chimia.2006.765  0.64
2006 Mühlschlegel P, Toquant J, Pohl DW, Hecht B. Glue-free tuning fork shear-force microscope Review of Scientific Instruments. 77: 16105. DOI: 10.1063/1.2165548  0.643
2005 Farahani JN, Pohl DW, Eisler H-, Hecht B. Single quantum dot coupled to a scanning optical antenna: a tunable superemitter. Physical Review Letters. 95: 17402. PMID 16090656 DOI: 10.1103/Physrevlett.95.017402  0.597
2005 Mühlschlegel P, Eisler HJ, Martin OJ, Hecht B, Pohl DW. Resonant optical antennas. Science (New York, N.Y.). 308: 1607-9. PMID 15947182 DOI: 10.1126/Science.1111886  0.674
2005 Haumann C, Pelargus C, Frey HG, Ros R, Anselmetti D, Toquant J, Pohl DW. Stand-alone device for the electrolytic fabrication of scanning near-field optical microscopy aperture probes Review of Scientific Instruments. 76. DOI: 10.1063/1.1866253  0.522
2005 Hecht B, Eisler H, Pohl DW, Martin OJF. Nanostrukturen Optische Antennen Physik in Unserer Zeit. 36: 209-210. DOI: 10.1002/Piuz.200590077  0.553
2004 Pohl DW. Optics at the nanometre scale. Philosophical Transactions - Royal Society. Mathematical, Physical and Engineering Sciences. 362: 701-717. PMID 15306489 DOI: 10.1098/Rsta.2003.1342  0.385
2001 Baida FI, Labeke DV, Bouhelier A, Huser T, Pohl DW. Propagation and diffraction of locally excited surface plasmons Journal of the Optical Society of America a-Optics Image Science and Vision. 18: 1552-1561. PMID 11444548 DOI: 10.1364/Josaa.18.001552  0.437
2001 Bouhelier A, Huser T, Tamaru H, Güntherodt H, Pohl DW, Baida FI, Van Labeke D. Plasmon optics of structured silver films Physical Review B. 63. DOI: 10.1103/Physrevb.63.155404  0.443
2001 Bouhelier A, Toquant J, Tamaru H, Güntherodt H-, Pohl DW, Schider G. Electrolytic formation of nanoapertures for scanning near-field optical microscopy Applied Physics Letters. 79: 683-685. DOI: 10.1063/1.1389767  0.573
2000 Hecht B, Sick B, Wild UP, Deckert V, Zenobi R, Martin OJF, Pohl DW. Scanning near-field optical microscopy with aperture probes: Fundamentals and applications Journal of Chemical Physics. 112: 7761-7774. DOI: 10.1063/1.481382  0.771
1999 Bouhelier A, Huser TR, Freyland JM, Güntherodt HJ, Pohl DW. Plasmon transmissivity and reflectivity of narrow grooves in a silver film Journal of Microscopy. 194: 571-573. PMID 11388309 DOI: 10.1046/J.1365-2818.1999.00500.X  0.37
1998 Hecht B, Bielefeldt H, Pohl DW, Novotny L, Heinzelmann H. Influence of detection conditions on near-field optical imaging Journal of Applied Physics. 84: 5873-5882. DOI: 10.1063/1.368902  0.707
1998 Novotny L, Hecht B, Pohl DW. Implications of high resolution to near-field optical microscopy Ultramicroscopy. 71: 341-344. DOI: 10.1016/S0304-3991(97)00066-1  0.723
1997 Hecht B, Bielefeldt H, Inouye Y, Pohl DW, Novotny L. Facts and artifacts in near-field optical microscopy Journal of Applied Physics. 81: 2492-2498. DOI: 10.1063/1.363956  0.726
1996 Hecht B, Bielefeldt H, Novotny L, Inouye Y, Pohl D. Local Excitation, Scattering, and Interference of Surface Plasmons. Physical Review Letters. 77: 1889-1892. PMID 10063197 DOI: 10.1103/Physrevlett.77.1889  0.653
1996 Pohl D, Novotny L, Hecht B, Heinzelmann H. Radiation coupling and image formation in scanning near-field optical microscopy Thin Solid Films. 273: 161-167. DOI: 10.1016/0040-6090(95)06810-4  0.71
1996 Heinzelmann H, Lacoste T, Huser T, Güntherodt H, Hecht B, Pohl D. Instrumental developments and recent experiments in near-field optical microscopy Thin Solid Films. 273: 149-153. DOI: 10.1016/0040-6090(95)06808-2  0.732
1995 Novotny L, Pohl DW, Hecht B. Scanning near-field optical probe with ultrasmall spot size Optics Letters. 20: 970-972. DOI: 10.1364/Ol.20.000970  0.718
1995 Pohl DW. Some thoughts about scanning probe microscopy, micromechanics, and storage Ibm Journal of Research and Development. 39: 701-712. DOI: 10.1147/Rd.396.0701  0.336
1995 HEINZELMANN H, HECHT B, NOVOTNY L, POHL DW. Forbidden light scanning near-field optical microscopy Journal of Microscopy. 177: 115-118. DOI: 10.1111/J.1365-2818.1995.Tb03541.X  0.724
1995 Pohl D, Durig U, Gueret P. Resolving Near‐Field Microscopy History Physics Today. 48: 74-75. DOI: 10.1063/1.2807895  0.323
1995 Hecht B, Pohl D, Heinzelmann H, Novotny L. “Tunnel” near-field optical microscopy: TNOM-2 Ultramicroscopy. 61: 99-104. DOI: 10.1016/0304-3991(95)00106-9  0.739
1995 Novotny L, Pohl DW, Hecht B. Light confinement in scanning near-field optical microscopy Ultramicroscopy. 61: 1-9. DOI: 10.1016/0304-3991(95)00095-X  0.711
1995 Hecht B, Heinzelmann H, Pohl DW. Combined aperture SNOM/PSTM: best of both worlds? Ultramicroscopy. 57: 228-234. DOI: 10.1016/0304-3991(94)00144-C  0.717
1995 Novotny L, Pohl DW, Regli P. Near-field, far-field and imaging properties of the 2D aperture SNOM Ultramicroscopy. 57: 180-188. DOI: 10.1016/0304-3991(94)00133-8  0.434
1995 Pohl DW. Near-field optics : light for the world of nano-scale science Thin Solid Films. 264: 250-254. DOI: 10.1016/0040-6090(95)05822-2  0.591
1994 Moerner WE, Plakhotnik T, Irngartinger T, Wild UP, Pohl DW, Hecht B. Near-field optical spectroscopy of individual molecules in solids. Physical Review Letters. 73: 2764-2767. PMID 10057186 DOI: 10.1103/Physrevlett.73.2764  0.73
1994 Novotny L, Pohl DW, Regli P. Light propagation through nanometer-sized structures: The two-dimensional-aperture scanning near-field optical microscope Journal of the Optical Society of America a: Optics and Image Science, and Vision. 11: 1768-1789. DOI: 10.1364/Josaa.11.001768  0.551
1994 Pohl DW. Near-field optics: Light for the world of NANO Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 12: 1441. DOI: 10.1116/1.587313  0.542
1994 Heinzelmann H, Pohl DW. Scanning near-field optical microscopy Applied Physics A. 59: 89-101. DOI: 10.1007/Bf00332200  0.55
1991 Denk W, Pohl DW. Local electrical dissipation imaged by scanning force microscopy Applied Physics Letters. 59: 2171-2173. DOI: 10.1063/1.106088  0.355
1988 Pohl DW, Fischer UC, Dürig UT. Scanning near-field optical microscopy (SNOM) Journal of Microscopy. 152: 853-861. DOI: 10.1111/J.1365-2818.1988.Tb01458.X  0.562
1988 Fischer UC, Dürig UT, Pohl DW. Near‐field optical scanning microscopy in reflection Applied Physics Letters. 52: 249-251. DOI: 10.1063/1.99483  0.506
1988 Pohl DW, Möller R. ``Tracking'' tunneling microscopy Review of Scientific Instruments. 59: 840-842. DOI: 10.1063/1.1139790  0.329
1987 Gimzewski JK, Möller R, Pohl DW, Schlittler RR. Transition from tunneling to point contact investigated by scanning tunneling microscopy and spectroscopy Surface Science. 189: 15-23. DOI: 10.1016/S0039-6028(87)80409-0  0.313
1986 Dürig U, Gimzewski JK, Pohl DW. Experimental observation of forces acting during scanning tunneling microscopy. Physical Review Letters. 57: 2403-2406. PMID 10033716 DOI: 10.1103/Physrevlett.57.2403  0.325
1986 Dürig U, Pohl D, Rohner F. Near-field optical scanning microscopy with tunnel-distance regulation Ibm Journal of Research and Development. 30: 478-483. DOI: 10.1147/Rd.305.0478  0.55
1986 Pohl DW. Some design criteria in scanning tunneling microscopy Ibm Journal of Research and Development. 30: 417-427. DOI: 10.1147/Rd.304.0417  0.314
1986 Muralt P, Pohl DW. Scanning tunneling potentiometry Applied Physics Letters. 48: 514-516. DOI: 10.1063/1.96491  0.323
1986 Dürig U, Pohl DW, Rohner F. Near‐field optical‐scanning microscopy Journal of Applied Physics. 59: 3318-3327. DOI: 10.1063/1.336848  0.446
1986 Gimzewski J, Humbert A, Pohl D, Vepřek S. Scanning tunneling microscopy of nanocrystalline silicon surfaces Surface Science. 168: 795-800. DOI: 10.1016/0039-6028(86)90911-8  0.329
1984 Pohl DW, Denk W, Lanz M. Optical stethoscopy: Image recording with resolution λ/20 Applied Physics Letters. 44: 651-653. DOI: 10.1063/1.94865  0.507
1979 Pohl DW. Forced Rayleigh scattering Ibm Journal of Research and Development. 23: 604-614. DOI: 10.1147/Rd.235.0604  0.346
1979 Pohl DW. Anomalies in the Forced Rayleigh Scattering in Glasses Physical Review Letters. 43: 143-146. DOI: 10.1103/Physrevlett.43.143  0.3
1975 Pohl DW, Jaggi R, Gisler K, Weibel H. Optical and electrical properties of metallic SmS films Solid State Communications. 17: 705-708. DOI: 10.1016/0038-1098(75)90390-7  0.332
1974 Pohl D. Stacked optical memories. Applied Optics. 13: 341-346. PMID 20125985 DOI: 10.1364/Ao.13.000341  0.336
1974 Pohl DW, Badertscher R, Müller KA, Wachter P. Laser-Induced Phase Transition in the Surface of SmS Crystals. Applied Optics. 13: 95-7. PMID 20125926 DOI: 10.1364/Ao.13.000095  0.326
1974 McNelly T, Pohl D. Multiphonon Optical Spectrum of NaF Physical Review Letters. 32: 1305-1308. DOI: 10.1103/Physrevlett.32.1305  0.478
1973 Pohl DW, Schwarz SE. Thermo- and elasto-optic parameters of NaF and their implications for light scattering from second sound Physical Review B. 7: 2735-2739. DOI: 10.1103/Physrevb.7.2735  0.426
1870 Dürig U, Züger O, Pohl DW. Force sensing in scanning tunnelling microscopy: Observation of adhesion forces on clean metal surfaces Journal of Microscopy. 152: 259-267. DOI: 10.1111/J.1365-2818.1988.Tb01387.X  0.308
Show low-probability matches.