Jie Diao, Ph.D.
Affiliations: | 2004 | Georgia Institute of Technology, Atlanta, GA |
Area:
Chemical Engineering, Optics PhysicsGoogle:
"Jie Diao"Mean distance: (not calculated yet)
Parents
Sign in to add mentor| Dennis W. Hess | grad student | 2004 | Georgia Tech | |
| (Development of techniques to quantify chemical and mechanical modifications of polymer surfaces: Application to chemical mechanical polishing.) | ||||
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Publications
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| Diao J, Hess DW. (2005) Refractive index measurements of films with biaxial symmetry. 2. Determination of film thickness and refractive indices using polarized transmission spectra in the transparent wavelength range. The Journal of Physical Chemistry. B. 109: 12819-25 |
| Diao J, Hess DW. (2005) Refractive index measurements of films with biaxial symmetry. 1. Determination of complex refractive indices using polarized reflectance/transmittance ratio. The Journal of Physical Chemistry. B. 109: 12800-18 |
| Diao J, Hess DW. (2005) Through-plane uniformity of optical anisotropy in spin-coated biphenyl dianhydride-p-phenylenediamine films Thin Solid Films. 483: 226-231 |
| Diao J, Hess DW. (2004) Use of angle-resolved XPS to determine depth profiles based on Fick's second law of diffusion: Description of method and simulation study Journal of Electron Spectroscopy and Related Phenomena. 135: 87-104 |