Year |
Citation |
Score |
2013 |
BareiB M, Krenz PM, Szakmany GP, Tiwari BN, Kalblein D, Orlov AO, Bernstein GH, Scarpa G, Fabel B, Zschieschang U, Klauk H, Porod W, Lugli P. Rectennas Revisited Ieee Transactions On Nanotechnology. 12: 1144-1150. DOI: 10.1109/Tnano.2013.2281373 |
0.747 |
|
2013 |
Tiwari BN, Fay PJ, Bernstein GH, Orlov AO, Porod W. Effect of Read-Out Interconnects on the Polarization Characteristics of Nanoantennas for the Long-Wave Infrared Regime Ieee Transactions On Nanotechnology. 12: 270-275. DOI: 10.1109/Tnano.2013.2245338 |
0.696 |
|
2012 |
Krenz PM, Tiwari B, Szakmany GP, Orlov AO, Gonzalez FJ, Boreman GD, Porod W. Response Increase of IR Antenna-Coupled Thermocouple Using Impedance Matching Ieee Journal of Quantum Electronics. 48: 659-664. DOI: 10.1109/Jqe.2012.2189758 |
0.747 |
|
2011 |
Bareiss M, Tiwari BN, Hochmeister A, Jegert G, Zschieschang U, Klauk H, Fabel B, Scarpa G, Koblmuller G, Bernstein GH, Porod W, Lugli P. Nano Antenna Array for Terahertz Detection Ieee Transactions On Microwave Theory and Techniques. 59: 2751-2757. DOI: 10.1109/Tmtt.2011.2160200 |
0.768 |
|
2010 |
Bean JA, Tiwari B, Szakmány G, Bernstein GH, Fay P, Porod W. Antenna length and polarization response of antenna-coupled MOM diode infrared detectors Infrared Physics & Technology. 53: 182-185. DOI: 10.1016/J.Infrared.2009.11.004 |
0.662 |
|
2009 |
Tiwari B, Bean JA, Szakmány G, Bernstein GH, Fay P, Porod W. Controlled etching and regrowth of tunnel oxide for antenna-coupled metal-oxide-metal diodes Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 27: 2153. DOI: 10.1116/1.3204979 |
0.659 |
|
2009 |
Bean JA, Tiwari B, Bernstein GH, Fay P, Porod W. Thermal infrared detection using dipole antenna-coupled metal-oxide-metal diodes Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 27: 11. DOI: 10.1116/1.3039684 |
0.756 |
|
2003 |
Chakrabarti P, Tiwari BN, Kumar S. Noise analysis of an optically controlled metal semiconductor field effect transistor at microwave frequencies Optical Engineering. 42: 447-455. DOI: 10.1117/1.1532332 |
0.32 |
|
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