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Helmut Baumgart - Publications

Affiliations: 
Old Dominion University, Norfolk, VA, United States 
Area:
Electronics and Electrical Engineering, Solid State Physics, Nanotechnology
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74 high-probability publications. We are testing a new system for linking publications to authors. You can help! If you notice any inaccuracies, please sign in and mark papers as correct or incorrect matches. If you identify any major omissions or other inaccuracies in the publication list, please let us know.

Year Citation  Score
2022 Barr MKS, Nadiri S, Chen DH, Weidler PG, Bochmann S, Baumgart H, Bachmann J, Redel E. Solution Atomic Layer Deposition of Smooth, Continuous, Crystalline Metal-Organic Framework Thin Films. Chemistry of Materials : a Publication of the American Chemical Society. 34: 9836-9843. PMID 36439317 DOI: 10.1021/acs.chemmater.2c01102  0.321
2021 Chen X, Zhang K, Hassan ZM, Redel E, Baumgart H. Charge Transport, Conductivity and Seebeck Coefficient in Pristine and TCNQ Loaded Preferentially Grown Metal-Organic Framework Films. Journal of Physics. Condensed Matter : An Institute of Physics Journal. PMID 33596560 DOI: 10.1088/1361-648X/abe72f  0.305
2020 Chen X, Baumgart H. Advances in Atomic Layer Deposition (ALD) Nanolaminate Synthesis of Thermoelectric Films in Porous Templates for Improved Seebeck Coefficient. Materials (Basel, Switzerland). 13. PMID 32178403 DOI: 10.3390/Ma13061283  0.391
2020 Mohammed YS, Zhang K, Heissler S, Baumgart H, Elmustafa AA. Evaluation of the mechanical properties of germanium-on-insulator (GeOI) films by Raman spectroscopy and nanoindentation Journal of Applied Physics. 128: 65104. DOI: 10.1063/5.0013454  0.394
2020 Hosseini P, Wolkersdörfer K, Wark M, Redel E, Baumgart H, Wittstock G. Morphology and Conductivity of Copper Hexacyanoferrate Films Journal of Physical Chemistry C. 124: 16849-16859. DOI: 10.1021/Acs.Jpcc.0C06114  0.362
2019 Landman U, Luedtke WD, Barnett RN, Cleveland CL, Ribarsky MW, Arnold E, Ramesh S, Baumgart H, Martinez A, Khan B. Faceting at the silicon (100) crystal-melt interface: Theory and experiment. Physical Review Letters. 56: 155-158. PMID 10032879 DOI: 10.1103/Physrevlett.56.155  0.321
2019 DeCoster ME, Chen X, Zhang K, Rost CM, Hoglund ER, Howe JM, Beechem TE, Baumgart H, Hopkins PE. Thermal Conductivity and Phonon Scattering Processes of ALD Grown PbTe–PbSe Thermoelectric Thin Films Advanced Functional Materials. 29: 1904073. DOI: 10.1002/Adfm.201904073  0.349
2018 Shrestha PR, Nminibapiel DM, Campbell JP, Ryan JT, Veksler D, Baumgart H, Cheung KP. Analysis and Control of RRAM Overshoot Current Ieee Transactions On Electron Devices. 65: 108-114. DOI: 10.1109/Ted.2017.2776860  0.579
2018 Shrestha P, Nminibapiel D, Veksler D, Campbell J, Ryan J, Baumgart H, Cheung K. Parasitic engineering for RRAM control Solid-State Electronics. 150: 41-44. DOI: 10.1016/J.Sse.2018.10.006  0.585
2018 Linseis V, Hassan ZM, Reith H, Garcia J, Nielsch K, Baumgart H, Redel E, Woias P. Complete Thermoelectric Characterization of PEDOT:PSS Thin Films with a Novel ZT Test Chip Platform Physica Status Solidi (a). 215: 1700930. DOI: 10.1002/Pssa.201700930  0.377
2017 Nminibapiel DM, Veksler D, Kim JH, Shrestha PR, Campbell JP, Ryan JT, Baumgart H, Cheung KP. Impact of RRAM Read Fluctuations on the Program-Verify Approach. Ieee Electron Device Letters : a Publication of the Ieee Electron Devices Society. 38: 736-739. PMID 28890601 DOI: 10.1109/Led.2017.2696002  0.566
2017 Abdel-Fattah TM, Wixtrom A, Arias L, Zhang K, Baumgart H. Quantitative Analysis of X-ray Fluorescence Absorption and Emission for Thickness Determination of ALD-Grown Metal and Oxide Nanoscaled Films Journal of Nanoscience and Nanotechnology. 17: 5745-5750. DOI: 10.1166/Jnn.2017.13827  0.338
2017 Chen X, Wang Z, Hassan ZM, Lin P, Zhang K, Baumgart H, Redel E. Seebeck Coefficient Measurements of Polycrystalline and Highly Ordered Metal-Organic Framework Thin Films Ecs Journal of Solid State Science and Technology. 6. DOI: 10.1149/2.0161704Jss  0.351
2017 Mohammed YS, Baumgart H, Elmustafa AA. Mechanical/Structural Properties of Ag, Cu, and Ni Thin Films Ecs Journal of Solid State Science and Technology. 6. DOI: 10.1149/2.0131705Jss  0.322
2017 Nminibapiel DM, Veksler D, Shrestha PR, Kim J, Campbell JP, Ryan JT, Baumgart H, Cheung KP. Characteristics of Resistive Memory Read Fluctuations in Endurance Cycling Ieee Electron Device Letters. 38: 326-329. DOI: 10.1109/Led.2017.2656818  0.58
2017 Namkoong G, Mamun AA, Ava TT, Zhang K, Baumgart H. Impact of perovskite precursor solution temperature on charge carrier dynamics and photovoltaic performance of perovskite based solar cells Organic Electronics. 42: 228-233. DOI: 10.1016/J.Orgel.2016.12.047  0.337
2017 Bersuker G, Veksler D, Nminibapiel DM, Shrestha PR, Campbell JP, Ryan JT, Baumgart H, Mason MS, Cheung KP. Toward reliable RRAM performance: macro- and micro-analysis of operation processes Journal of Computational Electronics. 16: 1085-1094. DOI: 10.1007/S10825-017-1105-5  0.618
2016 Chen X, Lin P, Zhang K, Baumgart H, Geist B, Kochergin V. Seebeck Coefficient Enhancement of ALD PbTe/PbSe Nanolaminate Structures Deposited inside Porous Silicon Templates Ecs Journal of Solid State Science and Technology. 5: 503. DOI: 10.1149/2.0151609Jss  0.376
2015 Geist BL, Zaynetdinov M, Myers K, Zhang K, Chen X, Ramalingom Pillai A, Baumgart H, Robinson HD, Kochergin V. Fabrication and Characterization of Nanostructured Thermoelectric Materials and Devices Mrs Proceedings. 1735. DOI: 10.1557/Opl.2015.329  0.453
2015 Mamun MA, Zhang K, Baumgart H, Elmustafa AA. Nanomechanical and Morphological Characterization of Tungsten Trioxide (WO3) Thin Films Grown by Atomic Layer Deposition Ecs Journal of Solid State Science and Technology. 4: 398. DOI: 10.1149/2.0241509Jss  0.466
2015 Mamun MA, Baumgart H, Elmustafa AA. ALD Zirconium Oxide (ZrO2) Thin Films Mechanical/Structural Properties for High-Tech Applications Ecs Journal of Solid State Science and Technology. 4. DOI: 10.1149/2.0051505Jss  0.453
2015 Mamun MA, Gu D, Baumgart H, Elmustafa AA. Nanomechanical properties of platinum thin films synthesized by atomic layer deposition Surface & Coatings Technology. 265: 185-190. DOI: 10.1016/J.Surfcoat.2015.01.037  0.476
2015 Mamun MA, Zhang K, Baumgart H, Elmustafa AA. Evaluation of the nanomechanical properties of vanadium and native oxide vanadium thin films prepared by RF magnetron sputtering Applied Surface Science. 359: 30-35. DOI: 10.1016/J.Apsusc.2015.10.065  0.442
2014 Li Q, Xiong HD, Liang X, Zhu X, Gu D, Ioannou DE, Baumgart H, Richter CA. Self-assembled nanowire array capacitors: capacitance and interface state profile. Nanotechnology. 25: 135201. PMID 24584362 DOI: 10.1088/0957-4484/25/13/135201  0.357
2014 Zhang K, Pillai ADR, Bollenbach K, Nminibapiel D, Cao W, Baumgart H, Scherer T, Chakravadhanula VSK, Kübel C, Kochergin V. Atomic Layer Deposition of Nanolaminate Structures of Alternating PbTe and PbSe Thermoelectric Films Ecs Journal of Solid State Science and Technology. 3: P207-P212. DOI: 10.1149/2.014406Jss  0.417
2014 Nminibapiel D, Zhang K, Tangirala M, Baumgart H, Chakravadhanula VSK, Kübel C, Kochergin V. Growth of Nanolaminates of Thermoelectric Bi2Te3/Sb2Te3 by Atomic Layer Deposition Ecs Journal of Solid State Science and Technology. 3: 95. DOI: 10.1149/2.014404Jss  0.343
2014 Tangirala M, Zhang K, Nminibapiel D, Pallem V, Dussarrat C, Cao W, Adam TN, Johnson CS, Elsayed-Ali HE, Baumgart H. Physical analysis of VO2 films grown by atomic layer deposition and RF magnetron sputtering Ecs Journal of Solid State Science and Technology. 3: N89-N94. DOI: 10.1149/2.006406Jss  0.477
2014 Shrestha PR, Cheung KP, Campbell JP, Ryan JT, Baumgart H. Accurate Fast capacitance measurements for reliable device characterization Ieee Transactions On Electron Devices. 61: 2509-2514. DOI: 10.1109/Ted.2014.2325674  0.581
2014 Yuan H, Zhang K, Li H, Zhu H, Bonevich JE, Baumgart H, Richter CA, Li Q. Polarization of Bi2Te3 thin film in a floating-gate capacitor structure Applied Physics Letters. 105. DOI: 10.1063/1.4904003  0.435
2014 Zhang K, Pillai ADR, Tangirala M, Nminibapiel D, Bollenbach K, Cao W, Baumgart H, Chakravadhanula VSK, Kübel C, Kochergin V. Synthesis and characterization of PbTe thin films by atomic layer deposition Physica Status Solidi (a). 211: 1329-1333. DOI: 10.1002/Pssa.201300307  0.479
2013 Abdel-Fattah TM, Gu D, Baumgart H. Atomic Layer Deposition Grown Hafnia Nanotubes Functionalized with Gold Nanoparticle Composites Ecs Solid State Letters. 2. DOI: 10.1149/2.001303Ssl  0.373
2012 Shrestha P, Ochia A, Cheung KP, Campbell JP, Baumgart H, Harris G. High-Speed Endurance and Switching Measurements for Memristive Switches Electrochemical and Solid-State Letters. 15: H173. DOI: 10.1149/2.002206Esl  0.558
2012 Zhu H, Li Q, Yuan H, Baumgart H, Ioannou DE, Richter CA. Self-aligned multi-channel silicon nanowire field-effect transistors Solid-State Electronics. 78: 92-96. DOI: 10.1016/J.Sse.2012.05.058  0.314
2011 Zhu X, Li Q, Ioannou DE, Gu D, Bonevich JE, Baumgart H, Suehle JS, Richter CA. Fabrication, characterization and simulation of high performance Si nanowire-based non-volatile memory cells. Nanotechnology. 22: 254020. PMID 21572210 DOI: 10.1088/0957-4484/22/25/254020  0.356
2011 Tapily K, Jakes JE, Gu D, Baumgart H, Elmustafa AA. Nanomechanical study of amorphous and polycrystalline ALD HfO 2 thin films International Journal of Surface Science and Engineering. 5: 193-204. DOI: 10.1504/Ijsurfse.2011.041402  0.448
2011 Ndoye C, Tapily K, Orlowski M, Baumgart H, Gu D. Silicidation of Niobium Deposited on Silicon by Physical Vapor Deposition Journal of the Electrochemical Society. 158. DOI: 10.1149/1.3609845  0.737
2011 Tapily K, Gu D, Baumgart H, Namkoong G, Stegall D, Elmustafa AA. Mechanical and structural characterization of atomic layer deposition-based ZnO films Semiconductor Science and Technology. 26: 115005. DOI: 10.1088/0268-1242/26/11/115005  0.74
2011 Gu D, Baumgart H, Tapily K, Shrestha P, Namkoong G, Ao X, Müller F. Precise Control of Highly Ordered Arrays of Nested Semiconductor/Metal Nanotubes Nano Research. 4: 164-170. DOI: 10.1007/S12274-010-0066-9  0.746
2010 Gu D, Baumgart H, Abdel-Fattah TM, Namkoong G. Synthesis of nested coaxial multiple-walled nanotubes by atomic layer deposition. Acs Nano. 4: 753-8. PMID 20085347 DOI: 10.1021/Nn901250W  0.367
2009 Jakes JE, Frihart CR, Beecher JF, Moon RJ, Resto PJ, Melgarejo ZH, Suárez OM, Baumgart H, Elmustafa AA, Stone DS. Nanoindentation near the edge Journal of Materials Research. 24: 1016-1031. DOI: 10.1557/Jmr.2009.0076  0.332
2009 Gu D, Baumgart H, Namkoong G, Abdel-Fattah TM. Atomic Layer Deposition of ZrO2 and HfO2 Nanotubes by Template Replication Electrochemical and Solid State Letters. 12. DOI: 10.1149/1.3070617  0.401
2009 Gu D, Zhu M, Celler GK, Baumgart H. Size and Thickness Effect on the Local Strain Relaxation in Patterned Strained Silicon-on-Insulator Electrochemical and Solid State Letters. 12. DOI: 10.1149/1.3068300  0.347
2009 Gu D, Baumgart H, Bourdelle KK, Celler GK, Elmustafa AA. Nanomechanical Response of the Si Lattice to Hydrogen Implantation and Annealing for Layer Splitting Japanese Journal of Applied Physics. 48: 101202. DOI: 10.1143/Jjap.48.101202  0.349
2009 Zhu X, Gu D, Li Q, Ioannou DE, Baumgart H, Suehle JS, Richter CA. Silicon nanowire NVM with high-k gate dielectric stack Microelectronic Engineering. 86: 1957-1960. DOI: 10.1016/J.Mee.2009.03.095  0.377
2008 Tapily K, Jakes JE, Stone DS, Shrestha P, Gu D, Baumgart H, Elmustafa AA. Nanoindentation Investigation of HfO[sub 2] and Al[sub 2]O[sub 3] Films Grown by Atomic Layer Deposition Journal of the Electrochemical Society. 155: H545. DOI: 10.1149/1.2919106  0.751
2008 Gu D, Tapily K, Shrestha P, Zhu MY, Celler G, Baumgart H. Experimental Study of ALD HfO[sub 2] Deposited on Strained Silicon-on-Insulator and Standard SOI Journal of the Electrochemical Society. 155: G129. DOI: 10.1149/1.2898696  0.762
1995 Baumgart H, Letavic TJ, Egloff R. Evaluation of wafer bonding and etch back for SOI technology Philips Journal of Research. 49: 91-124. DOI: 10.1016/0165-5817(95)82005-1  0.394
1991 Maszara WP, Jiang BL, Yamada A, Rozgonyi GA, Baumgart H, Kock AJRd. Role of surface morphology in wafer bonding Journal of Applied Physics. 69: 257-260. DOI: 10.1063/1.347760  0.326
1989 Krumme J‐, Doormann V, Hansen P, Baumgart H, Petruzzello J, Viegers MPA. Optical recording aspects of rf magnetron‐sputtered iron‐garnet films Journal of Applied Physics. 66: 4393-4407. DOI: 10.1063/1.343934  0.371
1989 Baumgart H, Ommen AHV. Current status of the technology of silicon separated by implantation of oxygen Materials Science and Engineering B-Advanced Functional Solid-State Materials. 2: 111-122. DOI: 10.1016/0921-5107(89)90085-8  0.372
1988 Olego DJ, Baumgart H, Celler GK. Strains in Si‐on‐SiO2 structures formed by oxygen implantation: Raman scattering characterization Applied Physics Letters. 52: 483-485. DOI: 10.1063/1.99451  0.364
1988 Olego DJ, Baumgart H. Raman scattering characterization of the microscopic structure of semi‐insulating polycrystalline Si thin films Journal of Applied Physics. 63: 2669-2673. DOI: 10.1063/1.341007  0.375
1987 Weber J, Baumgart H, Petruzzello J, Celler GK. Photoluminescence Characterization of Thin Silicon-On-Insulator Films Produced by Oxygen Implantation Mrs Proceedings. 107. DOI: 10.1557/Proc-107-117  0.444
1985 Baumgart H, Phillipp F, Ramesh S, Khan B, Martinez A, Arnold E. Twin Stabilzed Planar Growth of Soi Films Mrs Proceedings. 53: 65. DOI: 10.1557/Proc-53-65  0.389
1985 Ramesh S, Martinez A, Petruzzello J, Baumgart H, Arnold E. Addressing the Problems of Agglomeration, Surface Roughness and Crystal Imperfection in Soi Films Mrs Proceedings. 53. DOI: 10.1557/Proc-53-45  0.383
1985 Arnold E, Landman U, Ramesh S, Luedtke WD, Barnett RN, Cleveland CL, Martinez A, Baumgart H, Khan B. Formation of Facets at the Solid-Melt Interface in Silicon Mrs Proceedings. 53. DOI: 10.1557/Proc-53-21  0.369
1984 Baumgart H, Phillipp F. High-Voltage Electron Microscopy Investigation of Subgrain Boundaries in Recrystallized Silicon-On-Insulator Structures Mrs Proceedings. 35. DOI: 10.1557/Proc-35-593  0.416
1984 Baumgart H, Arnold E, Petruzzello J, McGee TF, Frommer MH. Structural Properties of Dielectric Layers Following CO 2 Laser Irradiation of SOI Structures Mrs Proceedings. 33: 87. DOI: 10.1557/Proc-33-87  0.414
1984 Baumgart H, Frye RC, Phillipp F, Leamy HJ. Dielectric Isolation Using Porous Silicon Mrs Proceedings. 33: 63. DOI: 10.1557/Proc-33-63  0.313
1982 Baumgart H, Celler GK, Lischner DJ, Robinson M, Sheng TT. Defect Control During Epitaxial Regrowth by Rapid Thermal Annealing Mrs Proceedings. 13: 349. DOI: 10.1557/Proc-13-349  0.305
1982 Merkle KL, Baumgart H, Uebbing RH, Phillipp F. Picosecond laser pulse irradiation of crystalline silicon Applied Physics Letters. 40: 729-731. DOI: 10.1063/1.93207  0.312
1982 Celler GK, Trimble LE, Ng KK, Leamy HJ, Baumgart H. Seeded oscillatory growth of Si over SiO2 by cw laser irradiation Applied Physics Letters. 40: 1043-1045. DOI: 10.1063/1.92998  0.38
1982 Maier M, Bimberg D, Fernholz G, Baumgart H, Phillipp F. Electrical and structural properties of p‐n junctions in cw laser annealed silicon Journal of Applied Physics. 53: 5904-5907. DOI: 10.1063/1.331432  0.332
1982 Baumgart H, Leamy HJ, Celler GK, Trimble LE. GRAIN BOUNDARY DIFFUSION IN POLYCRYSTALLINE SILICON FILMS ON SiO2 Le Journal De Physique Colloques. 43: 363-368. DOI: 10.1051/Jphyscol:1982148  0.337
1982 Leamy HJ, Chang CC, Baumgart H, Lemons RA, Cheng J. Cellular growth in micro-zone melted silicon Materials Letters. 1: 33-36. DOI: 10.1016/0167-577X(82)90036-2  0.352
1981 Baumgart H, Leamy HJ, Trimble LE, Doherty CJ, Celler G. Diffusion of Arsenic and Phosphorus in Laserprocessed-Polycrystalline-Silicon-Thin-Films Mrs Proceedings. 5: 311-316. DOI: 10.1557/Proc-5-311  0.384
1981 Trimble LE, Celler G, Ng KK, Baumgart H, Leamy HJ. Seeded Growth of Si Over SiO 2 Substrates by CW Laser Irradiation Mrs Proceedings. 4: 505-510. DOI: 10.1557/Proc-4-505  0.317
1981 Baumgart H, Phillipp F, Leamy HJ. Defect Formation in CW CO 2 Laser Annealed Silicon Mrs Proceedings. 4: 355. DOI: 10.1557/Proc-4-355  0.313
1981 Merkle KL, Uebbing RH, Baumgart H, Phillipp F. Picosecond Laser Pulse Induced Damage in Crystalline Silicon Mrs Proceedings. 4. DOI: 10.1557/Proc-4-337  0.319
1981 Rozgonyi GA, Baumgart H, Phillipp F, Uebbing R, Oppolzer H. Structural Modifications of Amorphized Silicon Surfaces Following Picosecond Laser Irradiation Mrs Proceedings. 4. DOI: 10.1557/Proc-4-177  0.3
1981 Baumgart H, Phillipp F, Rozgonyi GA, Gösele U. Slip dislocation formation during cw laser annealing of silicon Applied Physics Letters. 38: 95-97. DOI: 10.1063/1.92268  0.364
1980 Rozgonyi GA, Baumgart H, Phillipp F. Dislocation Nucleation, Growth and Suppression During Cw Laser Annealing of Silicon Mrs Proceedings. 1. DOI: 10.1557/Proc-1-193  0.335
1980 Uebbing RH, Wagner P, Baumgart H, Queisser HJ. Luminescence in slipped and dislocation-free laser-annealed silicon Applied Physics Letters. 37: 1078-1079. DOI: 10.1063/1.91869  0.33
1980 Rozgonyi GA, Baumgart H. Time Dependence Of The Nucleation Of Slip Dislocations During Laser Annealing Of Silicon Le Journal De Physique Colloques. 41. DOI: 10.1051/Jphyscol:1980414  0.321
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