| Year |
Citation |
Score |
| 2020 |
Gu D, Jargon JA, Ryan MJ, Hubrechsen A. Influence of Noise on Scattering-Parameter Measurements Ieee Transactions On Microwave Theory and Techniques. 1-1. DOI: 10.1109/Tmtt.2020.3014627 |
0.308 |
|
| 2020 |
Manurkar P, Horansky RD, Jamroz BF, Jargon JA, Williams DF, Remley KA. Precision Millimeter-Wave-Modulated Wideband Source at 92.4 GHz as a Step Toward an Over-the-Air Reference Ieee Transactions On Microwave Theory and Techniques. 68: 2644-2654. DOI: 10.1109/Tmtt.2020.2983144 |
0.348 |
|
| 2018 |
Jargon JA, Williams DF, Sanders A. The Relationship Between Switch-Term-Corrected Scattering-Parameters and Wave-Parameters Measured With a Two-Port Vector Network Analyzer Ieee Microwave and Wireless Components Letters. 28: 951-953. DOI: 10.1109/Lmwc.2018.2867076 |
0.42 |
|
| 2017 |
Remley KA, Gordon JA, Novotny D, Curtin AE, Holloway CL, Simons MT, Horansky RD, Allman MS, Senic D, Becker M, Jargon JA, Hale PD, Williams DF, Feldman A, Cheron J, et al. Measurement Challenges for 5G and Beyond: An Update from the National Institute of Standards and Technology Ieee Microwave Magazine. 18: 41-56. DOI: 10.1109/Mmm.2017.2690882 |
0.331 |
|
| 2016 |
Cho C, Lee JG, Hale PD, Jargon JA, Jeavons P, Schlager JB, Dienstfrey A. Calibration of Time-Interleaved Errors in Digital Real-Time Oscilloscopes Ieee Transactions On Microwave Theory and Techniques. DOI: 10.1109/Tmtt.2016.2614928 |
0.325 |
|
| 2015 |
Avolio G, Raffo A, Jargon J, Hale PD, Schreurs DMMP, Williams DF. Evaluation of Uncertainty in Temporal Waveforms of Microwave Transistors Ieee Transactions On Microwave Theory and Techniques. 63: 2353-2363. DOI: 10.1109/Tmtt.2015.2432765 |
0.39 |
|
| 2015 |
Remley KA, Williams DF, Hale PD, Wang C, Jargon J, Park Y. Millimeter-Wave Modulated-Signal and Error-Vector-Magnitude Measurement With Uncertainty Ieee Transactions On Microwave Theory and Techniques. 63: 1710-1720. DOI: 10.1109/Tmtt.2015.2416180 |
0.373 |
|
| 2011 |
Wu X, Jargon JA, Paraschis L, Willner AE. ANN-Based Optical Performance Monitoring of QPSK Signals Using Parameters Derived From Balanced-Detected Asynchronous Diagrams Ieee Photonics Technology Letters. 23: 248-250. DOI: 10.1109/Lpt.2010.2098025 |
0.402 |
|
| 2010 |
Jargon JA, Wu X, Choi HY, Chung YC, Willner AE. Optical performance monitoring of QPSK data channels by use of neural networks trained with parameters derived from asynchronous constellation diagrams. Optics Express. 18: 4931-8. PMID 20389504 DOI: 10.1364/Oe.18.004931 |
0.393 |
|
| 2009 |
Jargon JA, Wu X, Willner AE. Optical Performance Monitoring Using Artificial Neural Networks Trained With Eye-Diagram Parameters Ieee Photonics Technology Letters. 21: 54-56. DOI: 10.1109/Lpt.2008.2008447 |
0.397 |
|
| 2009 |
Wu X, Jargon JA, Skoog RA, Paraschis L, Willner AE. Applications of Artificial Neural Networks in Optical Performance Monitoring Journal of Lightwave Technology. 27: 3580-3589. DOI: 10.1109/Jlt.2009.2024435 |
0.369 |
|
| 2008 |
Wu X, Christen L, Zhang B, Peng WR, Yang JY, Zhang L, Nuccio SR, Paraschis L, Jargon JA, Willner A. Synchronization monitoring of I/Q data and pulse carving misalignment for a parallel-type RZ-DQPSK transmitter by measuring RF clock tone/low frequency power Ieee Photonics Technology Letters. 20: 2138-2140. DOI: 10.1109/Lpt.2008.2007503 |
0.34 |
|
| 2007 |
Rolain Y, Van Moer W, Jargon JA, DeGroot DC. On Peculiarities of $S$-Parameter Measurements Ieee Transactions On Instrumentation and Measurement. 56: 1967-1972. DOI: 10.1109/Tim.2007.895581 |
0.664 |
|
| 2007 |
Jargon JA, Splett JD, Vecchia DF, DeGroot DC. An Empirical Model for the Warm-Up Drift of a Commercial Harmonic Phase Standard Ieee Transactions On Instrumentation and Measurement. 56: 931-937. DOI: 10.1109/TIM.2007.894886 |
0.623 |
|
| 2004 |
Jargon JA, DeGroot DC, Gupta KC. Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements. Journal of Research of the National Institute of Standards and Technology. 109: 407-27. PMID 27366621 DOI: 10.6028/Jres.109.029 |
0.679 |
|
| 2003 |
Jargon J, Gupta KC, Cidronali A, DeGroot D. Expanding definitions of gain by taking harmonic content into account International Journal of Rf and Microwave Computer-Aided Engineering. 13: 357-369. DOI: 10.1002/Mmce.10096 |
0.668 |
|
| 2001 |
Jargon JA, Gupta KC, DeGroot DC. Applications of artificial neural networks to RF and microwave measurements International Journal of Rf and Microwave Computer-Aided Engineering. 12: 3-24. DOI: 10.1002/Mmce.10014 |
0.699 |
|
| 2001 |
Jargon JA, Gupta K. Artificial neural network modeling for improved coaxial line‐reflect‐match calibrations International Journal of Rf and Microwave Computer-Aided Engineering. 11: 33-37. DOI: 10.1002/1099-047X(200101)11:1<33::Aid-Mmce4>3.0.Co;2-C |
0.419 |
|
| 2000 |
Jargon JA, Gupta KC, DeGroot DC. Artificial neural network modeling for improved on-wafer OSLT calibration standards International Journal of Rf and Microwave Computer-Aided Engineering. 10: 319-328. DOI: 10.1002/1099-047X(200009)10:5<319::Aid-Mmce7>3.0.Co;2-5 |
0.664 |
|
| 1999 |
Janezic M, Jargon J. Complex permittivity determination from propagation constant measurements Ieee Microwave and Guided Wave Letters. 9: 76-78. DOI: 10.1109/75.755052 |
0.406 |
|
| 1999 |
Jargon JA, Marks RB, Rytting DK. Robust SOLT and alternative calibrations for four-sampler vector network analyzers Ieee Transactions On Microwave Theory and Techniques. 47: 2008-2013. DOI: 10.1109/22.795076 |
0.426 |
|
| 1998 |
Milanovic V, Ozgur M, Degroot DC, Jargon JA, Gaitan M, Zaghloul ME. Characterization of broad-band transmission for coplanar waveguides on cmos silicon substrates Ieee Transactions On Microwave Theory and Techniques. 46: 632-640. DOI: 10.1109/22.668675 |
0.655 |
|
| 1992 |
Rebuldela G, Jargon JA. High Power CW Wattmeter Calibration at NIST. Journal of Research of the National Institute of Standards and Technology. 97: 673-687. PMID 28053451 DOI: 10.6028/Jres.097.031 |
0.302 |
|
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