Andy Singh, Ph.D. - Publications
Affiliations: | 2004 | Stanford University, Palo Alto, CA |
Area:
Photoemission spectroscopyYear | Citation | Score | |||
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2017 | Singh A, Luening K, Brennan S, Homma T, Kubo N, Nowak SH, Pianetta P. Determination of copper nanoparticle size distributions with total reflection X-ray fluorescence spectroscopy. Journal of Synchrotron Radiation. 24: 283-287. PMID 28009568 DOI: 10.1107/S1600577516015484 | 0.479 | |||
2005 | Singh A, Luening K, Brennan S, Homma T, Kubo N, Pianetta P. Nucleation and growth of copper nanoparticles on silicon surfaces Physica Scripta T. 714-716. DOI: 10.1238/Physica.Topical.115A00714 | 0.51 | |||
2003 | Singh A, Baur K, Brennan S, Homma T, Kubo N, Pianetta P. Detection and characterization of trace element contamination on silicon wafers X‐Ray and Inner‐Shell Processes. 652: 472-480. DOI: 10.1063/1.1536408 | 0.481 | |||
2002 | Singh A, Baur K, Brennan S, Homma T, Kubo N, Pianetta P. X-ray absorption spectroscopy on copper trace impurities on silicon wafers Materials Research Society Symposium - Proceedings. 716: 23-28. DOI: 10.1557/Proc-716-B1.4 | 0.512 | |||
2000 | Baur K, Kerner J, Brennan S, Singh A, Pianetta P. Aluminum impurities in silicon: Investigation of x-ray Raman scattering in total reflection x-ray fluorescence spectroscopy Journal of Applied Physics. 88: 4642-4647. DOI: 10.1063/1.1312848 | 0.471 | |||
2000 | Pianetta P, Baur K, Singh A, Brennan S, Kerner J, Werho D, Wang J. Application of synchrotron radiation to TXRF analysis of metal contamination on silicon wafer surfaces Thin Solid Films. 373: 222-226. DOI: 10.1016/S0040-6090(00)01139-1 | 0.497 | |||
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