Year |
Citation |
Score |
2010 |
Olson TS, Pylypenko S, Fulghum JE, Atanassov P. Bifunctional oxygen reduction reaction mechanism on non-platinum catalysts derived from pyrolyzed porphyrins Journal of the Electrochemical Society. 157. DOI: 10.1149/1.3248003 |
0.578 |
|
2010 |
Pylypenko S, Artyushkova K, Fulghum JE. Application of XPS spectral subtraction and multivariate analysis for the characterization of Ar+ ion beam modified polyimide surfaces Applied Surface Science. 256: 3204-3210. DOI: 10.1016/J.Apsusc.2009.12.006 |
0.611 |
|
2009 |
Barbash D, Fulghum JE, Yang J, Felton L. A novel imaging technique to investigate the influence of atomization air pressure on film-tablet interfacial thickness. Drug Development and Industrial Pharmacy. 35: 480-6. PMID 19040182 DOI: 10.1080/03639040802438381 |
0.321 |
|
2009 |
Artyushkova K, Farrar JO, Fulghum JE. Data fusion of XPS and AFM images for chemical phase identification in polymer blends Surface and Interface Analysis. 41: 119-126. DOI: 10.1002/Sia.2968 |
0.341 |
|
2008 |
Artyushkova K, Pylypenko S, Olson TS, Fulghum JE, Atanassov P. Predictive modeling of electrocatalyst structure based on structure-to-property correlations of x-ray photoelectron spectroscopic and electrochemical measurements. Langmuir : the Acs Journal of Surfaces and Colloids. 24: 9082-8. PMID 18620441 DOI: 10.1021/La801089M |
0.58 |
|
2007 |
Artyushkova K, Levendosky S, Atanassov P, Fulghum J. XPS Structural Studies of Nano-composite Non-platinum Electrocatalysts for Polymer Electrolyte Fuel Cells Topics in Catalysis. 46: 263-275. DOI: 10.1007/S11244-007-9002-Y |
0.39 |
|
2006 |
Pylypenko S, Artyushkova K, Fulghum JE, Buluy O, Aryasova N, Reznikov Y. Ion beam alignment of nematic liquid crystal on MEH-PPV-layers Molecular Crystals and Liquid Crystals. 454. DOI: 10.1080/15421400600654066 |
0.564 |
|
2006 |
Artyushkova K, Pylypenko S, Fenton J, Archuleta K, Williams L, Fulghum J. Multi-technique, multivariate analysis methods for enhanced sample characterization Microscopy and Microanalysis. 12: 1402-1403. DOI: 10.1017/S1431927606069492 |
0.542 |
|
2005 |
Dirk SM, Pylypenko S, Howell SW, Fulghum JE, Wheeler DR. Potential-directed assembly of aryl iodonium salts onto silicon {100} hydride terminated and platinum surfaces. Langmuir : the Acs Journal of Surfaces and Colloids. 21: 10899-901. PMID 16285749 DOI: 10.1021/La052311Z |
0.555 |
|
2005 |
Artyushkova K, Fulghum JE, Reznikov Y. Orientation of 5CB Molecules on Aligning Substrates Studied by Angle Resolved X-ray Photoelectron Spectroscopy Molecular Crystals and Liquid Crystals. 438: 205. DOI: 10.1080/15421400590954470 |
0.372 |
|
2005 |
Artyushkova K, Fulghum JE. Angle resolved imaging of polymer blend systems: From images to a 3D volume of material morphology Journal of Electron Spectroscopy and Related Phenomena. 149: 51-60. DOI: 10.1016/J.Elspec.2005.07.001 |
0.326 |
|
2004 |
Fu Q, Rama Rao GV, Basame SB, Keller DJ, Artyushkova K, Fulghum JE, López GP. Reversible control of free energy and topography of nanostructured surfaces. Journal of the American Chemical Society. 126: 8904-5. PMID 15264815 DOI: 10.1021/Ja047895Q |
0.355 |
|
2004 |
Fulghum J, Su L, Artyushkova K, West J, Reznikov Y. Study of Ion Beam Alignment of Liquid Crystals on Polymer Substrates Molecular Crystals and Liquid Crystals. 412: 361-368. DOI: 10.1080/15421400490440174 |
0.348 |
|
2004 |
Artyushkova K, Fulghum JE. Mathematical topographical correction of XPS images using multivariate statistical methods Surface and Interface Analysis. 36: 1304-1313. DOI: 10.1002/Sia.1841 |
0.344 |
|
2002 |
Artyushkova K, Ferryman A, Farrar J, Fulghum JE. Laboratory XPS Imaging Journal of Surface Analysis. 9: 332-338. DOI: 10.1384/Jsa.9.332 |
0.357 |
|
2002 |
Maurice PA, McKnight DM, Leff L, Fulghum JE, Gooseff M. Direct observations of aluminosilicate weathering in the hyporheic zone of an Antarctic Dry Valley stream Geochimica Et Cosmochimica Acta. 66: 1335-1347. DOI: 10.1016/S0016-7037(01)00890-0 |
0.337 |
|
2002 |
Ferryman AC, Fulghum JE, Giannuzzi LA, Stevie FA. XPS analysis of FIB-milled Si Surface and Interface Analysis. 33: 907-913. DOI: 10.1002/Sia.1448 |
0.416 |
|
2002 |
Artyushkova K, Fulghum JE. Multivariate image analysis methods applied to XPS imaging data sets Surface and Interface Analysis. 33: 185-195. DOI: 10.1002/Sia.1201 |
0.337 |
|
2001 |
Artyushkova K, Wall B, Koenig J, Fulghum JE. Direct correlation of x-ray photoelectron spectroscopy and Fourier transform infrared spectra and images from poly(vinyl chloride)/poly(methyl methacrylate) polymer blends Journal of Vacuum Science and Technology. 19: 2791-2799. DOI: 10.1116/1.1405512 |
0.41 |
|
2001 |
Artyushkova K, Fulghum JE. Identification of chemical components in XPS spectra and images using multivariate statistical analysis methods Journal of Electron Spectroscopy and Related Phenomena. 121: 33-55. DOI: 10.1016/S0368-2048(01)00325-5 |
0.357 |
|
2001 |
Artyushkova K, Fulghum JE. Quantification of PVC-PMMA polymer blend compositions by XPS in the presence of x-ray degradation effects Surface and Interface Analysis. 31: 352-361. DOI: 10.1002/Sia.953 |
0.402 |
|
2000 |
Artyushkova K, Wall B, Koenig J, Fulghum JE. Correlative Spectroscopic Imaging: XPS and FT-IR Studies of PVC/PMMA Polymer Blends Applied Spectroscopy. 54: 1549-1558. DOI: 10.1366/0003702001948736 |
0.411 |
|
1999 |
Fulghum JE. Recent developments in high energy and spatial resolution analysis of polymers by XPS Journal of Electron Spectroscopy and Related Phenomena. 100: 331-355. DOI: 10.1016/S0368-2048(99)00054-7 |
0.352 |
|
1998 |
Thomas EA, Fulghum JE. Quantitative uses of the x-ray photoelectron spectroscopy valence band region in the analysis of polymer blends Journal of Vacuum Science and Technology. 16: 1106-1111. DOI: 10.1116/1.581241 |
0.376 |
|
1998 |
Thomas EA, Carrick AR, Fulghum JE. High‐resolution x‐ray photoelectron spectroscopy of aliphatic hydrocarbons Surface and Interface Analysis. 26: 278-289. DOI: 10.1002/(Sici)1096-9918(199804)26:4<278::Aid-Sia372>3.0.Co;2-R |
0.344 |
|
1996 |
Lawson CS, Tielsch BJ, Fulghum JE. Study of the First Row Transition Metals by X-ray Photoelectron Spectroscopy Surface Science Spectra. 4: 316-344. DOI: 10.1116/1.1247829 |
0.35 |
|
1996 |
Tielsch BJ, Fulghum JE, Surman DJ. Differential Charging in XPS. Part II: Sample Mounting and X‐ray Flux Effects on Heterogeneous Samples Surface and Interface Analysis. 24: 459-468. DOI: 10.1002/(Sici)1096-9918(199607)24:7<459::Aid-Sia139>3.0.Co;2-5 |
0.374 |
|
1996 |
Tielsch BJ, Fulghum JE. Differential Charging in XPS. Part I: Demonstration of Lateral Charging in a Bulk Insulator Using Imaging XPS Surface and Interface Analysis. 24: 28-33. DOI: 10.1002/(Sici)1096-9918(199601)24:1<28::Aid-Sia66>3.0.Co;2-G |
0.314 |
|
1994 |
Thomas EA, Zupp TA, Fulghum JE, Fredley DS, West JL. Investigation of liquid crystal alignment on polybutylmethacrylate surfaces using FTIR-ATR and XPS Molecular Crystals and Liquid Crystals. 250: 193-208. DOI: 10.1080/10587259408028206 |
0.401 |
|
1994 |
Zupp TA, Fulghum JE, Surman DJ. Imaging of polymer surfaces using X‐ray photoelectron spectroscopy Surface and Interface Analysis. 21: 79-86. DOI: 10.1002/Sia.740210204 |
0.385 |
|
1989 |
Fulghum JE, Linton RW. Evaluation of XPS for the quantitative determination of surface coverages: fluoride adsorption on hydrous ferric oxide particles Journal of Electron Spectroscopy and Related Phenomena. 49: 101-118. DOI: 10.1016/0368-2048(89)85001-7 |
0.36 |
|
1988 |
Fulghum JE, Bryan SR, Linton RW, Bauer CF, Griffis DP. Discrimination between adsorption and coprecipitation in aquatic particle standards by surface analysis techniques: lead distributions in calcium carbonates Environmental Science & Technology. 22: 463-467. DOI: 10.1021/Es00169A016 |
0.332 |
|
1988 |
Fulghum JE, Linton RW. Quantitation of coverages on rough surfaces by XPS: An overview Surface and Interface Analysis. 13: 186-192. DOI: 10.1002/Sia.740130404 |
0.366 |
|
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